• Title/Summary/Keyword: Refractive Index Structure

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Photoinduced Singlemode Waveguide in Optical Fluoride Glasses Using Plasma Filaments

  • Cho, Sung-Hak
    • Journal of the Optical Society of Korea
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    • v.7 no.3
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    • pp.156-159
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    • 2003
  • Permanent structure of photoinduced singlemode waveguide in optical fluoride glasses was demonstrated using the self-channeled plasma filament excited by a femtosecond (110 fs) Ti:sapphire laser ($λ_p$ = 800 nm). The photoinduced refractive index modification in ZBLAN glasses reached a length of approximately 10 - 15 mm from the input surface of the optical glass with the diameters ranging from 5 to 8 ${\mu}{\textrm}{m}$ at input intensities more than l.0 ${\times}$ $10^{12}$ W/$\textrm{cm}^2$. The graded refractive index profiles were fabricated to be a symmetric form from the center of an optical fluoride glass and a maximum value of refractive index change (ㅿn) was measured to be l.3${\times}$$10^{-2}$. The beam profile of the output beam transmitted through the modified region showed that the photoinduced refractive index modification produced a permanent structure of singlemode waveguide.

Refractive Index Changes of Polymer Film by Photochemical Reactions (광반응에 의한 고분자 필름의 굴절률 변화)

  • 조정환;신미영;이종하;김성수;송기국
    • Polymer(Korea)
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    • v.28 no.6
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    • pp.545-550
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    • 2004
  • The refractive index of thin copolymer film was controlled by photo-degradation of chromophores in the copolymer. FTIR and UV/Vis spectroscopy were employed to elucidate the effect of chemical structure on refractive index changes after photobleaching. The decrease of refractive index of the film by photobleaching can be ascribed to the decrease of polarizability of polymer molecules through breakage of C =C bond in the chromophore. Due to the selective photoreaction of the chromophores which align along the film plane, refractive index of the copolymer film measured in TE mode decreases faster than that in TM mode. Polarized ATR-FTIR spectroscopy was used to verify such a difference in refractive index of the film.

Effective Refractive Index of Dye-Sensitized Solar Cell Using Transmittance and Reflectance Measurements (투과 및 반사율 측정을 이용한 염료감응태양전지의 유효 굴절률 모델링)

  • Kim, Hyeong Seok;Lee, Joocheol;Shin, Myunghun
    • Current Photovoltaic Research
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    • v.3 no.3
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    • pp.91-96
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    • 2015
  • Optical modeling and characterization of transparent dye-sensitized solar cells (DSC) are presented to design and estimate DSC devices numerically. In order to model the inhomogeneous active layer of DSC, the porous structure of titanium oxide ($TiO_2$) and dye mixture, we prepared films consisting of layer by layer of the DSC's basic materials sequentially, and characterized the optical parameters of the films with the effective refractive index, which was extracted from the transmittance and reflectance measurements in ultra violet to near infra-red range. By using the effective refractive index, we made the optical model for DSC, and demonstrated that the optical model based on effective refractive index can be used to design and evaluate the performance of transparent-type DSC modules.

The reflection characteristic of one-dimensional photonic crystal using by chalcogenide thin films (칼코게나이드 박막을 이용한 일차원 photonic crystal의 반사 특성)

  • Lee, Jung-Tae;Shin, Kyung;Yeo, Cheol-Ho;Ku, Dae-Sung;Kim, Jong-Bin;Chung, Hong-Bay
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.11a
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    • pp.120-123
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    • 2002
  • In this study it had an excellent optical characteristic, it followed in the creation rate and the refractive index regulation to the ease. Chalcogenide produced the $As_{45}Se_{45}Te_{10}$ thin film and the $MgF_{2}$ thin film. It measured thin film plan simulation, and the thin film has a 1 -dimensional photonic band gap. The chalcogenide $As_{45}Se_{45}Te_{10}$ thin film was measured with the fact that it has a high refractive index (2.6~2.9). The $As_{45}Se_{45}Te_{10}$ and $MgF_{2}$ thin film, have a high refractive index and a low refractive index, it used a simulation and planed period 5-pairs structure, the result was from 500nm to 800nm. It will be able to confirm the characteristic which most of the incidence light reflects, the He-Ne (632.8nm) laser was irradiated in the thin film which stabilized the thin film. $As_{45}Se_{45}Te_{10}$ (high refractive index layer: H) and $MgF_{2}$ (low refractive index layer: L) results which plans the thin film with glass/LHLHLLHLHL/air structure, 632.8nm against transmitance, increased a lot. An application possibility with the filter against a specific wave length was confirmed.

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Effect of process parameter of DC pulsed sputtering on optical reflectance of multi-layer thin films (DC펄스 스퍼터링 공정 변수가 다층 박막의 광 반사율에 미치는 영향)

  • Chung, Youn-Gil;Park, Hyun-Sik
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.17 no.10
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    • pp.9-12
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    • 2016
  • The process parameters of DC pulsed sputtering to produce a multi-layer thin film with light reflectance at a specific wavelength region were studied. The optical simulation of multi-layer thin films of the silicon dioxide ($SiO_2$) films with a low refractive index and the titanium dioxide ($TiO_2$) films with a high refractive index was done. Under a DC pulsed sputtering power of 2kW and 200 sccm(standard cubic centimeter per minute) argon gas, the silicon dioxide films with a refractive index of 1.46 in the range of oxygen gas ratios of 12% and a titanium dioxide film with a refractive index of 2.27 in the range of oxygen gas ratios of 1% were produced. The multi-layer structure of high refractive index/low refractive index/high refractive index was designed and fabricated. The characteristics of the fabricated multi-layer thin film structure showed a reflectance of more than 45% in the range, 780 to 1200nm. This multi-layer structure is expected to be used to block the near infrared wavelength light.

Effect of Additives on the Refractive Index of B2O3-SiO2-Al2O3 Glasses for Photolithographic Process in Electronic Micro Devices

  • Won, Ju-Yeon;Hwang, Seong-Jin;Lee, Jung-Ki;Kim, Hyung-Sun
    • Korean Journal of Materials Research
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    • v.20 no.7
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    • pp.370-373
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    • 2010
  • In fabricating plasma display panels, the photolithographic process is used to form patterns of barrier ribs with high accuracy and high aspect ratio. It is important in the photolithographic process to control the refractive index of the photosensitive paste. The composition of this paste for photolithography is based on the $B_2O_3-SiO_2-Al_2O_3$ glass system, including additives of alkali oxides and rare earth oxides. In this work, we investigated the density, structure and refractive index of glasses based on the $B_2O_3-SiO_2-Al_2O_3$ system with the addition of $Li_2O$, $K_2O$, $Na_2O$, CaO, SrO, and MgO. The refractive index of the glasses containing K2O, Na2O and CaO was similar to that of the [BO3] fraction while that of the SrO, MgO and Li2O containing glasses were not correlated with the coordination fraction. The coordination number of the boron atoms was measured by MAS NMR. The refractive index increased with a decrease of molar volume due to the increase in the number of non-bridging oxygen atoms and the polarizability. The lowest refractive index (1.485) in this study was that of the $B_2O_3-SiO_2-Al_2O_3-K_2O$ glass system due to the larger ionic radius of $K^+$. Based on our results, it has been determined that the refractive index of the $B_2O_3-SiO_2-Al_2O_3$ system should be controlled by the addition of alkali oxides and alkali earth oxides for proper formation of the photosensitive paste.

Effect of refractive index difference between core and cladding on the characteristics of a vertical directional coupler using the double sided deep ridge waveguide structure (Double Sided Deep Ridge 도파관 구조를 가지는 수직 방향성 결합기의 코어와 클래딩의 굴절율 차이가 소자의 특성에 미치는 영향)

  • Yun, Jeong-Hyeon;Jeong, Byeong-Min;Kim, Bu-Gyun
    • Proceedings of the Optical Society of Korea Conference
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    • 2004.02a
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    • pp.300-301
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    • 2004
  • Effect of refractive index difference between core and cladding on the characteristics of a vertical directional coupler using double sided deep ridge waveguide structure is investigated.

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Measurement of Effective Refractive Index of Anodic Aluminum Oxide Using a Prism Coupler

  • Gong, Su-Hyun;Cho, Y.H.;Stolz, Arnaud;Gokarna, Anisha;Dogheche, Elhadj;Ryu, Sang-Wan
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.08a
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    • pp.195-195
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    • 2010
  • In recent years, Anodic aluminum oxide(AAO) has become popular and attractive materials. It can be easily fabricated and self-organized pore structures. It has been widely used as a biosensor membrane, photonic crystal for optical circuit and template for nanotube growth etc. In previous papers, the theory was developed that AAO shows anisotropic optical properties, since it has anisotropic structure with numerous cylindrical pores. It gives rise to the anisotropy of the refractive index called as birefringence. It can be used as conventional polarizing elements with high efficiency and low cost. Therefore, we would like to compare the theory and experimental results in this study. One method which can measure effective refractive index of thin film is the prism coupling technique. It can give accurate results fast and simply. Furthermore, we can also measure separately the refractive index with different polarization using polarization of the laser (TE mode and TM mode). We calculated the effective refractive index with effective medium approximations (EMAs) by pore size in the SEM image. EMAs are physical models that describe the macroscopic system as the homogeneous and typical method of all mean field theories.

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Optical Properties of UV LEDs depending on Encapsulate Method using Silicone Encapsulants with Different Refractive Indices (굴절률이 다른 실리콘 봉지재의 봉지 방법에 따른 UV-A LED의 광 특성에 관한 연구)

  • Kim, Wan-Ho;Koo, Dai-Hyoung;Noh, Ju-Hyun;Lee, Kyung-Won;Jeon, Sie-Wook;Kim, Jae-Pil;Yeo, In-Seon
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.29 no.3
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    • pp.39-44
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    • 2015
  • Optical characteristics including the radiant flux and viewing angle of UV LEDs were investigated according to both silicone encapsulants with different refractive indexes and lens shapes. Lead frame was fabricated using the enhanced heat dissipation characteristics with a heat slug structure and the reflector based on EMC(Epoxy Mold Compound) material. Four types of lens shapes were designed and their optical characteristics depending on the refractive index of silicone encapsulants were evaluated. The maximum radiant flux can be achieved when the height of lens are 1.32mm and 1.08mm for silicone encapsulants with low and high refractive indexes, respectively. Depending on the encapsulating method, the viewing angle changes from $148.9^{\circ}$ to $130.2^{\circ}$ for low refractive index and from $145.3^{\circ}$ to $136.8^{\circ}$ for high refractive index. As a result, it is found that the optical characteristics of UV LEDs can be controled through both encapsulating method and the refractive index of encapsulants.

The Effects of Turbulent Atmosphere on Terrestrial Optical ASK Communication Systems (교란대기가 ASK 지상 광통신(光通信)시스템에 미치는 영향)

  • Hong, Kwon-Eui;Kim, June-Hwan;Jung, Jin-Ho;Kim, Yung-Kwon
    • Journal of IKEEE
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    • v.1 no.1 s.1
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    • pp.156-163
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    • 1997
  • Since the wireless optical communications system transmits informations through the atmosphere, it is subject to many effects of the constituent materials of atmosphere. The turbulence effect always exists in both clear and cloudy days. It causes a beam wandering, breathing, and scintillation. These disadvantageous phenomena degrade the performance of an optical communications system. In this paper, I designed a refractive index measuring system and subcarrier ASK optical communications system. Through this system I measured refractive index in May and in August. From these measurements, the minimum value of the refractive index in these period was about ${\approx}10^{-15}[m^{-2/3}]$ at night time and the maximum value was about ${\approx}10^{-12}[m^{-2/3}]$ at day time. The refractive index structure parameter. BER(bit error rate), and the burst length were measured simultaneously in these measurements. the theoretically predicted BER and the measured values showed a good agreement.

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