• Journal of Korea Multimedia Society
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• v.18 no.12
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• pp.1439-1444
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• 2015

Measuring spectral reflectance can be regarded as obtaining inherent color parameters, and spectral reflectance has been used in image processing. Model-based spectrum recovering, one of the method for obtaining spectral reflectance, uses ordinary camera with multiple illuminations. Conventional model-based methods allow to recover spectral reflectance efficiently by using only a few parameters, however it requires some parameters such as power spectrum of illuminations and spectrum sensitivity of camera. In this paper, we propose an enhanced model-based spectrum recovering method without pre-measured parameters: power spectrum of illuminations and spectrum sensitivity of camera. Instead of measuring each parameters, spectral reflectance can be efficiently recovered by estimating and using the spectrum characteristic matrix which contains spectrum parameters: basis function, power spectrum of illumination, and spectrum sensitivity of camera. The spectrum characteristic matrix can be easily estimated using captured images from scenes with color checker under multiple illuminations. Additionally, we suggest fast recovering method preserving positive constraint of spectrum by nonnegative basis function of spectral reflectance. Results of our method showed accurately reconstructed spectral reflectance and fast constrained estimation with unmeasured camera and illumination. As our method could be conducted conveniently, measuring spectral reflectance is expected to be widely used.

• Proceedings of the Materials Research Society of Korea Conference
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• 1999.05a
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• pp.112-112
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• 1999

• Korean Journal of Agricultural Science
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• v.40 no.2
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• pp.163-167
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• 2013

Objective of the study was to compare reflectance spectrum in the blade and the vein parts of cabbage and kale leaves. A total 6 cabbage and kale leaves were taken from a plant factory in Chungnam National University, Korea. Spectra data were collected with a UV/VIS/NIR spectrometer (model: USB2000, Ocean Optics, FL, USA) in the wavelength region of 190 - 1130 nm. Median filter smoothing method was selected to preprocess the obtained spectra data. We computed reflectance difference by subtraction of averaged spectrum from individual spectrum. To estimate correlation at different parts of cabbage and kale leaves, cross - correlation method was used. Differences between cabbage and kale leaves are clearly manifested in the green, red and near - infrared ranges. The percent reflectance of cabbage leaves in the NIR wavelength band was higher than that of kale leaves. Reflectance in the blade part was higher than in the vein part by 18%. Reflectance difference in the different parts of cabbage and kale leaves were clear in all of the wavelength bands. Standard deviation of reflectance difference in the vein part was greater for kale, while the value in the blade part was greater for cabbage leaves. Standard deviation of cross - correlation increased from 0.092 in the first sensor (UV/VIS) and 0.007 in the second sensor (NIR) to 0.099 and 0.015, respectively.

• Journal of Biosystems Engineering
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• v.33 no.1
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• pp.63-68
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• 2008

This study was carried out to find a useful method to predict hardness of tomato using optical spectrum data. Optical spectrum of reflectance and transmittance data were collected processed by 9 kind of preprocessing methods-normalizations of mean, maximum and range, SNV (standard normal variate), MSC (multiplicative scatter correction), the first derivative and second derivative of Savitzky-Golay and Norris-Gap. With the preprocessed and non-processed original spectrum data, prediction models of hardness of tomato were developed using analytical tools of PLS (partial least squares) and MLR (multiple linear regression) and tested for their validation. The test of validation resulted that the analytical tools of PLS and MLR output similar performances while the transmittance spectra showed much better result than the reflectance spectra.

• Bulletin of the Korean Chemical Society
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• v.27 no.10
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• pp.1677-1680
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• 2006

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.19 no.6
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• pp.293-297
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• 2009

In this paper, we made three kinds of porous silicon samples (single layer, distributed Bragg reflector, and microcavity) by electrochemical etching p-type silicon substrate. And then, we investigated their reflectance spectrum properties. We found that the number of fringe patterns and the maximum reflectivity of porous silicon multilayer increased compared with a porous silicon sinlge layer. In addition, we can observe that the DBR (distributed Bragg reflector) porous silicon has a full-width at half-maximum about 33 nm which is narrower than the porous silicon single layer and porous silicon microcavity.

• Journal of Biosystems Engineering
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• v.22 no.2
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• pp.247-255
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• 1997

This study was conducted to develop regression models predicting sugar and acid contents in intact fruits nondestructively by using the second derivative of absorbance spectrum measured with a spectrophotometer wavelength range of 400nm to 2, 400nm. The correlation analysis was made in wavelength range of 600nm to 1, 100nm and 600nm to 2, 400nm respectively, in order to examine the feasibility of using a real time spectrophotometer, which covers the former range, in predicting sugar and acid contents. The second derivative data of the spectrum were obtained by varying smoothing size and derivative size of the original absorbance spectrum. SAS statistical package program was used for the regression analysis. The sugar contents of Fuji apple, Shingo pear md Yumyung peach could be predicted with SEPs of 0.40, 1.17 and 0.77 respectively, in the spectrum range of 600 to 1, 100nm. The highest correlation coefficient of the titratible acidity of apple was -0.45 at 2, 346nm and regression models indicated determination coefficient less than 0.47.

• Proceedings of the Korean Society for Agricultural Machinery Conference
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• 2000.11c
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• pp.521-524
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• 2000

Nearinfra-red(NIR) reflectance NIR a spectra (400 to 2,100 nm) were collected on 32 beef samples to find feasibility of predicting beef tenderness. The study to predict beef tenderness was accomplished with the stepwise second differential data of the collected NIR spectra. Beef tenderness was measured by Warner-Bratzler(WB) shear force using a Universal Testing Machine(UTM). After modeling the relation between Warner-Bratzler shear force and NIR spectrum of 19 samples among the 32 beef samples, the verification was carried out through predicting the other 13 samples. The SEC and R$^2$ values in the prediction equation were 9.07(N) and 0.6463, respectively. The SEP and R$^2$ were 14.8(N) and 0.7082 (wave length 552 nm, 1988 nm) respectively. The result implied that it was possible to predict the beef tenderness using NIR spectrum and that the tenderness could be predicted non-destructively in real time.

• Proceedings of the Korean Society of Agricultural Engineers Conference
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• 2000.10a
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• pp.507-512
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• 2000

The main objective of this study is to provide a soil surface information, which represent a soil reflectance spectrum, by remote sensing technology. The soil reflectance of the soil was measured using a spectroradiometer in the wavelength range from 300nm to 1100nm. Measurements of soil reflectance have been made in four different soils. The results suggest that the reflectance properties of soils are related to their mineral composition and soil moisture. Increasing soil moisture resulted in an decrease in the rate of reflectance which leads to parallel curves of soil reflectance spectra. The soil line representing the relationship between red and near-infrared soil reflectance is characterized by soil types.

• Korean Journal of Optics and Photonics
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• v.14 no.3
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• pp.266-271
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• 2003

The reflectance spectrum of optical films thicker than a few microns shows an intensity oscillation due to interference. Since the spectral period of the oscillation is inversely related to film thickness, the thickness of an optical film can be determined from the spectral frequency of the oscillation. For rapid data processing, the spectral frequency is obtained by use of a Fast Fourier Transformation technique. The conventional method of applying a Fast Fourier Transformation to the reflectance spectrum versus photon energy is modified so as to clear the ambiguity in choosing the proper effective refractive index value and to prevent the broadening of the Fourier transformed peak due to the refractive index dispersion. This technique of modified Fast Fourier Transformation is suggested by the authors for the first time to their knowledge. From the analysis of the calculated reflectance spectrum of a 30-${\mu}{\textrm}{m}$-thick dielectric film. it is shown to improve the accuracy in determining film thickness by a great amount. The improved accuracy of the modified Fast Fourier Transformation is also confirmed from the analysis of the reflectance spectra of a sample with 80-${\mu}{\textrm}{m}$-thick cover layer and 13-${\mu}{\textrm}{m}$-thick spacer layer on a PC substrate.