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Reflectance spectrum properties of DBR and microcavity porous silicon  

Kim, Young-You (Department of Physics, Kongju National University)
Kim, Han-Jung (Department of Physics, Kongju National University)
Abstract
In this paper, we made three kinds of porous silicon samples (single layer, distributed Bragg reflector, and microcavity) by electrochemical etching p-type silicon substrate. And then, we investigated their reflectance spectrum properties. We found that the number of fringe patterns and the maximum reflectivity of porous silicon multilayer increased compared with a porous silicon sinlge layer. In addition, we can observe that the DBR (distributed Bragg reflector) porous silicon has a full-width at half-maximum about 33 nm which is narrower than the porous silicon single layer and porous silicon microcavity.
Keywords
Porous silicon; Single layer; Multilayer; DBR; Microcavity; Reflectance spectrum;
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Times Cited By KSCI : 3  (Citation Analysis)
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