• 대한수학회지
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• 제54권3호
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• pp.1049-1061
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• 2017

The paper presents a characterization of stable random measures, giving a canonical form of their Laplace transform. Domain of attraction of stable random measures is concerned in a theorem showing that a random measure belongs to domain of attraction of any stable random measures if and only if it varies regularly at infinity.

• JSTS:Journal of Semiconductor Technology and Science
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• 제15권2호
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• pp.184-193
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• 2015

This paper proposes a cost-efficient and automatic method for large data acquisition from a test chip without expensive equipment to characterize random process variation in an integrated circuit. Our method requires only a test chip, a personal computer, a cheap digital-to-analog converter, a controller and multimeters, and thus large volume measurement can be performed on an office desk at low cost. To demonstrate the proposed method, we designed a test chip with a current model logic driver and an array of 128 current mirrors that mimic the random process variation of the driver's tail current mirror. Using our method, we characterized the random process variation of the driver's voltage due to the random process variation on the driver's tail current mirror from large volume measurement data. The statistical characteristics of the driver's output voltage calculated from the measured data are compared with Monte Carlo simulation. The difference between the measured and the simulated averages and standard deviations are less than 20% showing that we can easily characterize the random process variation at low cost by using our cost-efficient automatic large data acquisition method.

• JSTS:Journal of Semiconductor Technology and Science
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• 제15권3호
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• pp.374-380
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• 2015

As semiconductor devices are being scaled down, random variation becomes a critical issue, especially in the case of static random access memory (SRAM). Thus, there is an urgent need for statistical methodologies to analyze the impact of random variations on the SRAM. In this paper, we propose a novel sampling method based on the concept of a confidence ellipse. Results show that the proposed method estimates the SRAM margin metrics in high-sigma regimes more efficiently than the standard Monte Carlo (MC) method.

• 제어로봇시스템학회:학술대회논문집
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• 제어로봇시스템학회 1993년도 한국자동제어학술회의논문집(국제학술편); Seoul National University, Seoul; 20-22 Oct. 1993
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• pp.451-455
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• 1993

Interaction between system and disturbance results in system with time-dependent parameter. Parameter variation due to interaction has random characteristics. Most of the randomly varying parameters in control problem is regarded as white noise random process which is not a realistic model. In real situation those random variation is colored noise random process. Modified F-P-K equation is proposed to get the response of the random parametric system using some correction factor. Proposed technique is employed to obtain the colored noise parametric system response and confirmed via Monte-Carlo Simulation.

• 산업경영시스템학회지
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• 제13권21호
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• pp.81-90
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• 1990

In stratified random sampling a simple random sample must be taken in each stratum to reduce the maximum gain in precision given the minimum cost. The purpose of this paper is to deal with the propertics of the estimates and variances and obtain the economic design of stratified random sampling through the optimum allocation of the sample sizes. In addition, the between stratum variation and the within stratum variation is stratifying the population are described.

• Structural Engineering and Mechanics
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• 제20권3호
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• pp.293-312
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• 2005

In this paper, free vibration of rotating beam with random properties is studied. The cross-sectional area, elasticity modulus, moment of inertia, shear modulus and density are modeled as random fields and the rotational speed as a random variable. To study uncertainty, stochastic finite element method based on second order perturbation method is applied. To discretize random fields, the three methods of midpoint, interpolation and local average are applied and compared. The effects of rotational speed, setting angle, random property variances, discretization scheme, number of elements, correlation of random fields, correlation function form and correlation length on "Coefficient of Variation" (C.O.V.) of first mode eigenvalue are investigated completely. To determine the significant random properties on the variation of first mode eigenvalue the sensitivity analysis is performed. The results are studied for both Timoshenko and Bernoulli-Euler rotating beam. It is shown that the C.O.V. of first mode eigenvalue of Timoshenko and Bernoulli-Euler rotating beams are approximately identical. Also, compared to uncorrelated random fields, the correlated case has larger C.O.V. value. Another important result is, where correlation length is small, the convergence rate is lower and more number of elements are necessary for convergence of final response.

• 한국전산구조공학회논문집
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• 제30권1호
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• pp.23-30
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• 2017

입자 복합재료는 입자의 형상, 크기 그리고 분포의 산포특성으로 인해 물성치의 편차가 존재하고, 입자 복합재료를 사용한 시스템의 거동 또한 산포가 존재한다. 하지만 입자의 산포특성을 고려하기 어려우므로 균질화법을 사용하여 시스템의 거동을 해석하거나 국부영역에서 미세구조를 적용하여 해석한다. 본 연구에서는 입자의 랜덤적 산포특성을 고려하기 위해 RMDFs(random morphology description functions)를 사용하여 랜덤 미세구조를 생성하였고, 단면 1차 모멘트를 사용하여 가우시안 함수의 수(N)와 입자의 산포특성의 관계를 분석하였다. 그리고 랜덤 미세구조 구조물의 거동을 분석하기 위하여 랜덤 미세구조를 전체에 반영한 외팔보에 multi-scale 해석을 수행하였다. 그 결과 입자의 산포특성과 외팔보의 처짐의 편차는 N의 증가에 따라 감소하고 N=200에서 수렴하는 것을 확인하였다.

• JSTS:Journal of Semiconductor Technology and Science
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• 제14권1호
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• pp.8-22
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• 2014

In the past few decades, CMOS logic technologies and devices have been successfully developed with the steady miniaturization of the feature size. At the sub-30-nm CMOS technology nodes, one of the main hurdles for continuously and successfully scaling down CMOS devices is the parametric failure caused by random variations such as line edge roughness (LER), random dopant fluctuation (RDF), and work-function variation (WFV). The characteristics of each random variation source and its effect on advanced device structures such as multigate and ultra-thin-body devices (vs. conventional planar bulk MOSFET) are discussed in detail. Further, suggested are suppression methods for the LER-, RDF-, and WFV-induced threshold voltage (VTH) variations in advanced CMOS logic technologies including the double-patterning and double-etching (2P2E) technique and in advanced device structures including the fully depleted silicon-on-insulator (FD-SOI) MOSFET and FinFET/tri-gate MOSFET at the sub-30-nm nodes. The segmented-channel MOSFET (SegFET) and junctionless transistor (JLT) that can suppress the random variations and the SegFET-/JLT-based static random access memory (SRAM) cell that enhance the read and write margins at a time, though generally with a trade-off between the read and the write margins, are introduced.

• 대한기계학회논문집
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• 제16권9호
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• pp.1691-1699
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• 1992

The experimental results of fatigue crack propagation under constant amplitude loading show that intra-and inter-specimen variability exist. In this paper, a stochastic model for the estimation of mean and variance of crack propagation life is presented To take into account the intra-specimen variability, the material resistance against crack propagation is treated as an 1-dimensional spatial stochastic process, i. e. random field, varying along the propagation path. For the inter-specimen variability, C in paris equation is assumed to be a random variable. Compared with experimental results reported, the present method well estimate the variation in fatigue crack propagation life. And it is confirmed that the thicker the specimen thickness is, the less the variation of propagation life is.

• 한국소음진동공학회:학술대회논문집
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• 한국소음진동공학회 1993년도 추계학술대회논문집; 반도아카데미, 26 Nov. 1993
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• pp.55-59
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• 1993

Interaction between system and disturbance results in system with time-dependent parameter. Parameter variation due to interaction has random characteristics. Most of the randomly varying parameters in control problem is regarded as white noise random process, which is not a realistic model. In real situation those random variation is colored noise random process. Modified F-P-K equation is proposed to get the response of the random parametric system using some correction factor. Proposed technique is employed to obtain the colored noise parametric system response and confirmed via Monte-Carlo Simulation.