• Title/Summary/Keyword: Raman analysis

Search Result 463, Processing Time 0.028 seconds

Raman Chemical Imaging Technology for Food and Agricultural Applications

  • Qin, Jianwei;Kim, Moon S.;Chao, Kuanglin;Cho, Byoung-Kwan
    • Journal of Biosystems Engineering
    • /
    • v.42 no.3
    • /
    • pp.170-189
    • /
    • 2017
  • Purpose: This paper presents Raman chemical imaging technology for inspecting food and agricultural products. Methods The paper puts emphasis on introducing and demonstrating Raman imaging techniques for practical uses in food analysis. Results & Conclusions: The main topics include Raman scattering principles, Raman spectroscopy measurement techniques (e.g., backscattering Raman spectroscopy, transmission Raman spectroscopy, and spatially offset Raman spectroscopy), Raman image acquisition methods (i.e., point-scan, line-scan, and area-scan methods), Raman imaging instruments (e.g., excitation sources, wavelength separation devices, detectors, imaging systems, and calibration methods), and Raman image processing and analysis techniques (e.g., fluorescence correction, mixture analysis, target identification, spatial mapping, and quantitative analysis). Raman chemical imaging applications for food safety and quality evaluation are also reviewed.

Surface analysis using Raman spectroscopy during semiconductor processing (라만 분광법을 이용한 반도체 공정 중 표면 분석)

  • Tae Min Choi;JinUk Yoo;Eun Su Jung;Chae Yeon Lee;Hwa Rim Lee;Dong Hyun Kim;Sung Gyu Pyo
    • Journal of the Korean institute of surface engineering
    • /
    • v.57 no.2
    • /
    • pp.71-85
    • /
    • 2024
  • This article provides an overview of Raman spectroscopy and its practical applications for surface analysis of semiconductor processes including real-time monitoring. Raman spectroscopy is a technique that uses the inelastic scattering of light to provide information on molecular structure and vibrations. Since its inception in 1928, Raman spectroscopy has undergone continuous development, and with the advent of SERS(Surface Enhanced Raman Spectroscopy), TERS(Tip Enhanced Raman Spectroscopy), and confocal Raman spectroscopy, it has proven to be highly advantageous in nano-scale analysis due to its high resolution, high sensitivity, and non-destructive nature. In the field of semiconductor processing, Raman spectroscopy is particularly useful for substrate stress and interface characterization, quality analysis of thin films, elucidation of etching process mechanisms, and detection of residues.

Analysis of Temperature Effects on Raman Silicon Photonic Devices

  • Kim, Won-Chul;Park, Dong-Wook
    • Journal of the Optical Society of Korea
    • /
    • v.12 no.4
    • /
    • pp.288-297
    • /
    • 2008
  • Recent research efforts on study of silicon photonics utilizing stimulated Raman scattering have largely overlooked temperature effects. In this paper, we incorporated the temperature dependences into the key parameters governing wave propagation in silicon waveguides with Raman gain and investigated how the temperature affects the solution of the coupled-mode equations. We then carried out, as one particular application example, a numerical analysis of the performance of wavelength converters based on stimulated Raman scattering at temperatures ranging from 298 K to 500 K. The analysis predicted, among other things, that the wavelength conversion efficiency could decrease by as much as 12 dB at 500 K in comparison to that at the room temperature. These results indicate that it is necessary to take a careful account of temperature effects in designing, fabricating, and operating Raman silicon photonic devices.

Polarized Raman Spectroscopic Studies of Syndiotactic Polypropylene (편광 Raman 분광법을 이용한 Syndiotactic Polypropylene에 관한 연구)

  • 진정희;임현주;김성수;송기국
    • Polymer(Korea)
    • /
    • v.26 no.6
    • /
    • pp.745-751
    • /
    • 2002
  • The anisotropic Raman scattering properties of oriented syndiotactic poly propylene have been investigated using FT-Raman spectrometer in which the fluore scent problem of polymer samples can be removed. To assign the observed Raman bands to their respective symmetry species, the anisotropic scattering results for four different combinations of incident and scattered polarization were compared with those predicted by normal coordinate analysis and infrared dichroism measurement data.

Comparison of Near-Infrared Spectroscopy with Raman Spectroscopy from the Point of Nondestructive Analysis of Biological Materials

  • Takeyuki Tanaka;Hidetoshi Sato;Jung, Young-Mee;Yukihiro Ozaki
    • Near Infrared Analysis
    • /
    • v.1 no.2
    • /
    • pp.9-20
    • /
    • 2000
  • Recently, near-infrared (NIR) spectroscopy and Raman spectroscopy have received keen interest as powerful techniques for nondestructive analysis of biological materials. The purpose of this review paper is to compare the advantages of NIR and Raman spectroscopy in the nondestructive analysis. Both methods are quite unique and often complementary. For example. NIR spectroscopy is very useful in monitoring in situ the content of components inside biological materials while Raman spectroscopy is very suitable for identifying micro-components on the surface of biological materials. In this article specific characters of the two spectroscopic methods are discussed first and then several examples of applications of NIR and Raman spectroscopy to the biological nondestructive analysis are introduced.

Structural Study of the Activated Carbon Fiber using Laser Raman Spectroscopy

  • Roh, Jae-Seung
    • Carbon letters
    • /
    • v.9 no.2
    • /
    • pp.127-130
    • /
    • 2008
  • This study aims to find a correlation between XRD and Raman result of the activated carbon fibers as a function of its activation degrees. La of the isotropic carbon fiber prepared by oxidation in carbon dioxide gas have been observed using laser Raman spectroscopy. The basic structural parameters of the fibers were evaluated by XRD as well, and compared with Raman result. The La of the carbon fibers were measured to be 25.5 ${\AA}$ from Raman analysis and 23.6 ${\AA}$ from XRD analysis. La of the ACFs were 23.6 ${\AA}$ and 20.4 ${\AA}$, respectively, representing less ordered through activation process. It seems that the $I_D/I_G$ of Raman spectra were related to crystallite size(La). Raman spectroscopy has demonstrated its unique ability to detect structural changes during the activation of the fibers. There was good correlation between the La value obtained from Raman and XRD.

Application Study of Raman Micro-Spectroscopy for Analysis on Corrosion Compound of Iron Artifacts (철제유물 부식화합물 분석의 표준데이터 확보를 위한 라만 분광법 적용성 연구)

  • Park, Hyung Ho;Lee, Jae Sung;Yu, Jae Eun
    • 보존과학연구
    • /
    • s.32
    • /
    • pp.89-98
    • /
    • 2011
  • It is quite difficult to identify its corrosion compound because they have a wide variety of crystal structures and they are mixed with two component. This study was conducted with the standard iron corrosion compounds through the analysis by Raman Micro-Spectroscopy, which aims to obtain standard Raman Data. To assess the reliability of standard iron corrosion compounds, SEM-EDS analysis and XRD analysis were conducted. Through SEM-EDS analysis, the elements of corrosion compound matched with those of standards iron corrosion compounds except Goethite. XRD analysis showed that the structures of corrosion compounds were identical to those of standard iron corrosion compounds, however, it was identified that Iron sulfate ($FeSO_4{\cdot}6H_2O$) is the Rozenite ($FeSO_4{\cdot}4H_2O$). Through Raman Micro-Spectroscopy analysis, the new peak was detected from the wavenumbers of hydroxide and iron oxide. It is considered that it is due to changes in the wavelength of the laser. As the wavenumbers of iron chloride and iron sulfate have been identified, eight kinds of Raman Data were obtained. It can be considered to contribute to cultral heritage for iron objects that Raman Micro-Spectroscopy analysis which is relatively easy to compare material properties and structures can be highly applicable to the research on cultural heritage with the limited amount of samples.

  • PDF

Structural Study of the Oxidized High Modulus Carbon Fiber using Laser Raman Spectroscopy

  • Roh, Jae-Seung;Kim, Suk-Hwan
    • Carbon letters
    • /
    • v.10 no.1
    • /
    • pp.38-42
    • /
    • 2009
  • This study aims to find a correlation between XRD and Raman result of the oxidized high modulus carbon fibers as a function of its oxidation degrees, and compare with the isotropic carbon fiber reported early. La of the high modulus carbon fiber prepared by oxidation in carbon dioxide gas have been observed using laser Raman spectroscopy. The basic structural parameters of the fibers were evaluated by XRD as well. The La of the original high modulus carbon fibers were measured to be 144 ${\AA}$ from Raman analysis and 135 ${\AA}$ from XRD analysis. La of the 92% oxidized fiber were 168 ${\AA}$ by using Raman and 182 ${\AA}$ by using XRD. There was some correlation between the La value obtained from Raman and XRD. However the La value changes of the high modulus carbon fiber through whole oxidation process showed opposite tendency compare with the isotropic carbon fiber because of the fiber structure basically.

Comparison of Depth Profiles of CIGS Thin Film by Micro-Raman and XPS (마이크로 라만 및 XPS를 이용한 CIGS 박막의 두께방향 상분석 비교)

  • Beak, Gun Yeol;Jeon, Chan-Wook
    • Current Photovoltaic Research
    • /
    • v.4 no.1
    • /
    • pp.21-24
    • /
    • 2016
  • Chalcopyrite based (CIGS) thin films have considered to be a promising candidates for industrial applications. The growth of quality CIGS thin films without secondary phases is very important for further efficiency improvements. But, the identification of complex secondary phases present in the entire film is crucial issue due to the lack of powerful characterization tools. Even though X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and normal Raman spectroscopy provide the information about the secondary phases, they provide insufficient information because of their resolution problem and complexity in analyzation. Among the above tools, a normal Raman spectroscopy is better for analysis of secondary phases. However, Raman signal provide the information in 300 nm depth of film even the thickness of film is > $1{\mu}m$. For this reason, the information from Raman spectroscopy can't represent the properties of whole film. In this regard, the authors introduce a new way for identification of secondary phases in CIGS film using depth Raman analysis. The CIGS thin films were prepared using DC-sputtering followed by selenization process in 10 min time under $1{\times}10^{-3}torr$ pressure. As-prepared films were polished using a dimple grinder which expanded the $2{\mu}m$ thick films into about 1mm that is more than enough to resolve the depth distribution. Raman analysis indicated that the CIGS film showed different secondary phases such as, $CuIn_3Se_5$, $CuInSe_2$, InSe and CuSe, presented in different depths of the film whereas XPS gave complex information about the phases. Therefore, the present work emphasized that the Raman depth profile tool is more efficient for identification of secondary phases in CIGS thin film.

Raman Detection of Protein Interfacial Conformations

  • Jang, Mi-Jin;Cho, Il-Young;Callahan, Patricia
    • BMB Reports
    • /
    • v.30 no.5
    • /
    • pp.352-355
    • /
    • 1997
  • The surface adsorbed protein conformations onto the vaccine adjuvants were observed with a Raman spectroscopy by using the maximum adsorption conditions described previously. The adsorbed state Raman vibrational spectra and subsequent spectral analysis display no conformational changes for BSA or IgG relative to their native species in solution.

  • PDF