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Manufacture and characteristic evaluation of Amorphous Indium-Gallium-Zinc-Oxide (IGZO) Thin Film Transistors

  • Seong, Sang-Yun;Han, Eon-Bin;Kim, Se-Yun;Jo, Gwang-Min;Kim, Jeong-Ju;Lee, Jun-Hyeong;Heo, Yeong-U
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.08a
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    • pp.166-166
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    • 2010
  • Recently, TFTs based on amorphous oxide semiconductors (AOSs) such as ZnO, InZnO, ZnSnO, GaZnO, TiOx, InGaZnO(IGZO), SnGaZnO, etc. have been attracting a grate deal of attention as potential alternatives to existing TFT technology to meet emerging technological demands where Si-based or organic electronics cannot provide a solution. Since, in 2003, Masuda et al. and Nomura et al. have reported on transparent TFTs using ZnO and IGZO as active layers, respectively, much efforts have been devoted to develop oxide TFTs using aforementioned amorphous oxide semiconductors as their active layers. In this thesis, I report on the performance of thin-film transistors using amorphous indium gallium zinc oxides for an active channel layer at room temperature. $SiO_2$ was employed as the gate dielectric oxide. The amorphous indium gallium zinc oxides were deposited by RF magnetron sputtering. The carrier concentration of amorphous indium gallium zinc oxide was controlled by oxygen pressure in the sputtering ambient. Devices are realized that display a threshold voltage of 1.5V and an on/off ration of > $10^9$ operated as an n-type enhancement mode with saturation mobility with $9.06\;cm^2/V{\cdot}s$. The devices show optical transmittance above 80% in the visible range. In conclusion, the fabrication and characterization of thin-film transistors using amorphous indium gallium zinc oxides for an active channel layer were reported. The operation of the devices was an n-type enhancement mode with good saturation characteristics.

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Vulnerability Assessment for Fine Particulate Matter (PM2.5) in the Schools of the Seoul Metropolitan Area, Korea: Part II - Vulnerability Assessment for PM2.5 in the Schools (인공지능을 이용한 수도권 학교 미세먼지 취약성 평가: Part II - 학교 미세먼지 범주화)

  • Son, Sanghun;Kim, Jinsoo
    • Korean Journal of Remote Sensing
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    • v.37 no.6_2
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    • pp.1891-1900
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    • 2021
  • Fine particulate matter (FPM; diameter ≤ 2.5 ㎛) is frequently found in metropolitan areas due to activities associated with rapid urbanization and population growth. Many adolescents spend a substantial amount of time at school where, for various reasons, FPM generated outdoors may flow into indoor areas. The aims of this study were to estimate FPM concentrations and categorize types of FPM in schools. Meteorological and chemical variables as well as satellite-based aerosol optical depth were analyzed as input data in a random forest model, which applied 10-fold cross validation and a grid-search method, to estimate school FPM concentrations, with four statistical indicators used to evaluate accuracy. Loose and strict standards were established to categorize types of FPM in schools. Under the former classification scheme, FPM in most schools was classified as type 2 or 3, whereas under strict standards, school FPM was mostly classified as type 3 or 4.

MgFe$_2$/GeO$_2$ AR Coating on o-type(100) Cz Silicon Solar Cells

  • Lim, D.G.;Lee, I.;Lee, U.J.;Yi, J.
    • Transactions on Electrical and Electronic Materials
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    • v.1 no.4
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    • pp.11-15
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    • 2000
  • This paper presents a process optimization of antireflection (AR) coating on crystalline Si solar cells. Theoretical and experimental investigations were performed on a double-layer AR(DLAR) coating of MgFe$_2$/GeO$_2$. We investigated GeO$_2$ films as an AR layer because they have a proper refractive index of 2.46 and demonstrate the same lattice constant as Si substrate. RF sputter grown GeO$_2$ film showed deposition temperature strong dependence. The GeO$_2$ at 400$\^{C}$ exhibited a strong (111) preferred orientation and the lowest surface roughness of 6.87 $\AA$. Refractive index of MgFe$_2$film was measured as 1.386 for the most of growth temperature. An optimized DLAR coating showed a reflectance as low as 2.04% in the wavelengths ranged from 0.4 ㎛ to 1.1 ㎛. Solar cells with a structure of MgFe$_2$/GeO$_2$/Ag/N$\^$+//p-type Si/P$\^$+//Al were investigated with the without DLAR coatings. We achieved the efficiency of solar cells greater than 15% with 3.12% improvement with DLAR coatings. Further details about MgFe$_2$,GeO$_2$ films, and cell fabrication parameters are presented in this paper.

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A routing protocol based on Context-Awareness for Energy Conserving in MANET

  • Chen, Yun;Lee, Kang-Whan
    • Journal of information and communication convergence engineering
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    • v.5 no.2
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    • pp.104-108
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    • 2007
  • Ad hoc networks are a type of mobile network that function without any fixed infrastructure. One of the weaknesses of ad hoc network is that a route used between a source and a destination is to break during communication. To solve this problem, one approach consists of selecting routes whose nodes have the most stable link cost. This paper proposes a method for improving the low power distributed MAC. This method is based on the context awareness of the each nodes energy in clustering. We propose to select a new scheme to optimize energy conserving between the clustering nodes in MANET. And this architecture scheme would use context-aware considering the energy related information such as energy, RF strength, relative distances between each node in mobile ad hoc networks. The proposed networks scheme could get better improve the awareness for data to achieve and performance on their clustering establishment and messages transmission. Also, by using the context aware computing, according to the condition and the rules defined, the sensor nodes could adjust their behaviors correspondingly to improve the network routing.

A Study on Poly-Si Solar Cell of Novel Structure with the Reduced Effects of Grain Boundaries (결정입계 영향을 줄인 새로운 구조의 다결정 실리콘 모양전지에 관한 연구)

  • Lim, Dong-Gun;Lee, Su-Eun;Park, Sung-Hyun;Yi, Jun-Sin
    • Proceedings of the KIEE Conference
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    • 1999.07d
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    • pp.1738-1740
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    • 1999
  • This paper deals with a novel structure of poly-Si solar cell. A solar cell conversion efficiency was degraded by grain boundary effect in Polycrystalline silicon. To reduce grain boundary effect, we performed a preferential grain boundary etching, $POCl_3$ n-type emitter doping, and then ITO film growth on poly-Si. Among the various preferential etchants, Schimmel etch solution exhibited the best result having grain boundary etch depth about $10{\mu}m$. RF magnetron sputter grown ITO films showed a low resistivity of $10^{-4}\Omega-cm$ and high transmittance of 85%. With well fabricated poly-Si solar cells. we were able to achieve as high as 15% conversion efficiency at the input power of 20mW/$cm^2$.

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Performance of OLED Fabricated on the ITO Deposited by Facing Target Sputtering (대향식 스퍼터링법으로 증착된 ITO 양극 위에 제작된 OLED 성능)

  • Yoon, Chul;Kim, Sang-Ho
    • Journal of the Korean institute of surface engineering
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    • v.41 no.5
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    • pp.199-204
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    • 2008
  • Indium tin oxide (ITO) has been commonly used as an anode for organic light emitting diode (OLED), because of its relatively high work function, high transmittance, and low resistance. The ITO was mostly deposited by capacitive type DC or RF sputtering. In this study we introduced a new facing target sputtering method. On applying this new sputtering method, the effect of fundamental deposition parameters such as substrate heating and post etching were investigated in relation to the resultant I-V-L characteristics of OLED. Three kinds of ITOs deposited at room temperature, at $400^{\circ}C$ and at $400^{\circ}C$ with after surface modification by $O_2$ plasma etching were compared. The OLED on ITO deposited with substrate heating and followed by etching showed better I-V-L characteristics, which starts to emit light at 4 volts and has luminescence of $65\;cd/m^2$ at 9 volts. The better I-V-L characteristics were ascribed to the relevant surface roughness with uniform micro-extrusions and to the equi-axed micromorphology of ITO surface.

Nano-granular Co-Fe-Al-Q Soft Ferromagnetic Thin Films for RF Electromagnetic-noise Filters

  • Sohn, Jae-Cheon;Byun, Dong-Jin
    • Transactions on Electrical and Electronic Materials
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    • v.7 no.1
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    • pp.42-50
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    • 2006
  • Co-Fe-Al-O nano-granular thin films with high electrical resistivity, fabricated by radio frequency magnetron sputtering under an $Ar+O_2$ atmosphere, are found to show good soft magnetic properties in the GHz frequency range. The real part value of the relative permeability is 260 at low frequencies and this value is maintained up to the GHz frequency range. A non-integrated type noise filter on a coplanar waveguide transmission line is demonstrated by using the Co-Fe-Al-O nano-granular thin film with the dimensions of $4\;mm(l){\times}4\;mm(w){\times}0.1\;{\mu}m(t)$. The insertion loss is very low being less than 0.3 dB and this low value is maintained up to 2 GHz. At a ferromagnetic resonance frequency of 3.3 GHz, the degree of noise suppression is measured to be 3 dB. This level of noise attenuation is small for real applications, but there is much room for further improvement by increasing the magnetic volume and integrating the magnetic thin film into the CPW transmission line.

Analysis of Amorphous Carbon Hard Mask and Trench Etching Using Hybrid Coupled Plasma Source

  • Park, Kun-Joo;Lee, Kwang-Min;Kim, Min-Sik;Kim, Kee-Hyun;Lee, Weon-Mook
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.11a
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    • pp.74-74
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    • 2009
  • The ArF PR mask was. developed to overcome the limit. of sub 40nm patterning technology with KrF PR. But ArF PR difficult to meet the required PR selectivity by thin PR thickness. So need to the multi-stack mask such as amorphous carbon layer (ACL). Generally capacitively coupled plasma (CCP) etcher difficult to make the high density plasma and inductively coupled plasma (ICP) type etcher is more suitable for multi stack mask etching. Hybrid Coupled Plasma source (HCPs) etcher using the 13.56MHz RF power for ICP source and 2MHz and 27.12MHz for bias power was adopted to improve the process capability and controllability of ion density and energy independently. In the study, the oxide trench which has the multi stack layer process was investigated with the HCPs etcher (iGeminus-600 model DMS Corporation). The results were analyzed by scanning electron microscope (SEM) and it was found that etching characteristic of oxide trench profile depend on the multi-stack mask.

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Ranging the Distance Between Wireless Sensor Nodes Using the Deviation Correction Method of Received Signal Strength (수신신호세기의 편차 보정법을 이용한 무선센서노드 간의 거리 추정)

  • Lee, Jin-Young;Kim, Jung-Gyu
    • IEMEK Journal of Embedded Systems and Applications
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    • v.7 no.2
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    • pp.71-78
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    • 2012
  • Based on the Zigbee-based wireless sensor network, I suggest the way to reduce errors between the short distance, improving the accuracy of the presumed distance by revising the deviation of RSSI(Received Signal Strength Indication) values is to estimate the distance using only the RF signal power without the additional hardware. In general, the graph measured by RSSI values shows the proximity values which are ideally reduced in proportion to the distance under the free outdoor space in which LOS(Line-Of-Sight) is guaranteed. However, if the result of the received RSSI values are each substituted to the formula, it can produce a larger margin of error and less accurate measurement since it is based upon the premise that this free space is not affected by reflected waves or obstacles caused by the ground and electronic jamming engendered by the environment. Therefore, the purpose of this study is to reduce the margin of errors between the distances and to measure the proximity values with the ideal type of graph by suggesting the way to revise the received RSSI values in the light of these reflected waves or obstacles and the electronic jamming. In conclusion, this study proves that errors are reduced by comparing the proposed deviation correction method to the revised RSSI value.

RF-magnetron sputtering 방법으로 성장시킨 Ga-doped ZnO 박막의 성장 온도 변화에 따른 영향

  • Kim, Yeong-Lee;U, Chang-Ho;An, Cheol-Hyeon;Bae, Yeong-Suk;Gong, Bo-Hyeon;Kim, Dong-Chan;Jo, Hyeong-Gyun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.06a
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    • pp.9-9
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    • 2009
  • 1 wt % Ga-dope ZnO (ZnO:Ga) thin films with n-type semiconducting behavior were grown on c-sapphire substrates by radio frequency magnetron sputtering at various growth temperatures. The room temperature grown ZnO:Ga film showed the faint preferred orientation behavior along the c-axis with small domain size and high density of stacking faults, despite limited surface diffusion of the deposited atoms. The increase in the growth temperature in the range between $300\sim550^{\circ}C$ led to the granular shape of epitaxial ZnO:Ga films due to not enough thermal energy and large lattice mismatch. The growth temperature above $550^{\circ}C$ induced the quite flat surface and the simultaneous improvement of electrical carrier concentration and carrier mobility, $6.3\;\times\;10^{18}/cm^3$ and $27\;cm^2/Vs$, respectively. In addition, the increase in the grain size and the decrease in the dislocation density were observed in the high temperature grown films. The low-temperature photoluminescence of the ZnO:Ga films grown below $450^{\circ}C$ showed the redshift of deep-level emission, which was due to the transition from $Zn_j$ to $O_i$ level.

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