• Title/Summary/Keyword: RBS 분석

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SNU 1.5-MV 직렬형 반데그라프 가속기를 이용한 러더포드 후방산란 분광법에 의한 소재의 표면적층 분석

  • 박혜일;배영덕;박준교;김명섭;곽종구;김창석
    • Nuclear Engineering and Technology
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    • v.27 no.1
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    • pp.141-153
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    • 1995
  • SNU 1.5-MV 직렬형 반데그라프 가속기로부터 얻은 0.5~2.2 MeV He$^{++}$ 빔을 이용하여 러더포드 후방산란 분광법 (RBS, Rutherford Backscattering Spectrometry)으로 여러가지 시료의 표면적층을 분석하였다. 먼저 RBS 분석계통의 신뢰성을 확인하기 위하여 Micromatter사와 Charles Evans & Associates에서 제작한 14종 33개의 표준시료들에 대한 후방산란 실험을 수행하여, 각 층의 두께, 원소조성비 및 주입 이온의 깊이, 분포폭을 측정하였다. 결정된 이 값들은 제시된 값과 3% 이내로 일치하였다 이와 같이 본 RBS 분석계통의 신뢰성을 확인한 후, 분석을 의뢰받은 22종 87개의 시료에 대해, 빔에너지. 후방산란의 기하학적 구조 등의 최적 조건하에서 후방산란 실험을 수행하였다 그 결과, 분석가능한 두께의 한계를 벗어난 2종 3개의 시료를 제외한 나머지 모든 시료에 대해 각 층의 두께, 원소조성비 및 농도분포를 결정할 수 있었으며, 측정치의 통계오차는 8% 이내였다. 다양한 종류의 많은 시료들에 대한 표면적층 분석을 수행한 경험을 통하여, RBS 분석에서 신뢰도 높은 결과를 얻기 위해 분석계통에서 필수적으로 고려해야 할 요소들을 파악할 수 있었으며, 분석 결과에 대한 신뢰도는 분석 계통의 체계화뿐만 아니라 시료의 상태에 따라 크게 좌우됨을 알 수 있었다. 결론적으로 주의 깊은 시료준비와 RBS 분석계통의 최적화를 통해 신뢰도 높은 표면적층 분석이 가능함을 확인하였다.

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Continuous Clock Synchronization and Packet Loss Tolerance Scheme for Enhancing Performance of Reference Broadcast Synchronization (RBS 성능향상을 위한 연속 클럭 동기화 및 패킷 손실 보상 기법)

  • Do, Trong-Hop;Park, Konwon;Jung, Jaein;Yoo, Myungsik
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.39B no.5
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    • pp.296-303
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    • 2014
  • Reference Broadcast Synchronization (RBS) is one of the most prominent synchronization protocols in wireless sensor nework. Given that the broadcasting medium is available, RBS can give very high accuracy of synchronization. However, RBS uses instantaneous synchronization and results in time discontinuity, which might cause serious faults in the distributed system. Also, RBS lacks packet loss tolerance, which brings about degraded performance in severe conditions of wireless channel. In this paper, the problem of time discontinuity in RBS is pointed out and the effect of packet loss on the performance of RBS is examined. Then, a continuous synchronization and a packet loss tolerance mechanism for RBS are proposed, and the result is verified through simulations.

Analysis of Magnetic Multi-layers by RBS and PIXE (후방산란법(RBS)/양성자 여기 X-선 방출법(PIXE)을 이용한 다층자성박막의 두께 및 조성 정량분석)

  • 송종한;김태곤;전기영;황정남;신윤하;김영만;장성호;김광윤
    • Journal of the Korean Magnetics Society
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    • v.11 no.6
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    • pp.272-277
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    • 2001
  • A spin valve structure of Ta/NiFe/CoFe/Cu/CoFe/Ru/CoFe/FeMn/Ta which has a synthetic antiferromagnet (CoFe/Ru/CoFe), was fabricated by using a magnetron sputtering system. The thickness and composition of magnetic free and pinned layers affect the magnetic properties such as exchange interaction strength of each layer and so on. Even though Rutherford Backscattering Spectrometry (RBS) has advantages of quantitative and non-destructive analysis, it is almost impossible to determine the thickness and composition of magnetic thin films using lBS because of its poor mass resolution for a higher atom number (Z>20). In this study, quantitative analysis of the element composition and thickness for the spin valve sample was performed by combining both Proton Induced X-ray Emission Spectrometry (PIXE), which is one of element specific analysis techniques, and grazing-exit RBS with a highly improved depth resolution and absolute quantitative analysis. For the quantitative analysis, standardization of PIXE was carried out with NiFe, CoFe, and FeMn layers, which are one of constituent layers of spin valve films. Through PIXE standardization and the aid of PHE experimental results of the spin valve sample, ire overlapped signal in a grazing-exit RBS spectrum were successfully resolved and the thickness of the Ru layer was determined with a resolution of ∼1 .

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RBS Analysis on the Si0.9Ge0.1 Epitaxial Layer for the fabrication of SiGe HBT (SiGe HBT 제작을 위한 실리콘 게르마늄 단결정 박막의 RBS 분석)

  • 한태현;안호명;서광열
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.17 no.9
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    • pp.916-923
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    • 2004
  • In this paper, the strained Si$_{0.9}$Ge$_{0.1}$ epitaxial layers grown by a reduced pressure chemical vapor deposition (RPCVD) on Si (100) were characterized by Rutherford backscattering spectrometery (RBS) for the fabrication of an SiGe heterojunction bipolar transistor(HBT). RBS spectra of the ${Si}_0.9{Ge}_0.1$epitaxial layers grown on the Si substrates which were implanted with the phosphorus (P) ion and annealed at a temperature between $850^{\circ}C$ - $1000^{\circ}C$ for 30min were analyzed to investigate the post thermal annealing effect on the grown${Si}_0.9{Ge}_0.1$epitaxial layer quality. Although a damage of the substrates by P ion-implantation might be cause of the increase of RBS yield ratios, but any defects such as dislocation or stacking fault in the grown ${Si}_0.9{Ge}_0.1$ epitaxial layer were not found in transmission electron microscope (TEM) photographs. The post high temperature rapid thermal annealing (RTA) effects on the crystalline quality of the ${Si}_0.9{Ge}_0.1$ epitaxial layers were also analyzed by RBS. The changes in the RBS yield ratios were negligible for RTA a temperature between $900^{\circ}C$ - $1000^{\circ}C$for 20 sec, or $950^{\circ}C$for 20 sec - 60 sec. A SiGe HBT array shows a good Gummel characteristics with post RTA at $950^{\circ}C$ for 20 sec.sec.sec.

Effects of PZ Strength on Cyclic Seismic Performance of RBS Steel Moment Connections (RBS 철골모멘트접합부의 내진성능에 대한 패널존 강도의 영향)

  • Lee, Cheol-Ho;Kim, Jae-Hoon
    • Journal of the Earthquake Engineering Society of Korea
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    • v.10 no.3 s.49
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    • pp.149-158
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    • 2006
  • The reduced beam section (RBS) steel moment connection has performed well in past numerous tests. However there still remain several design issues that should be further examined. One such issue on RBS connection performance is the panel zone strength. Although a significant amount of test data are available, a specific recommendation for a desirable range of panel zone strength versus beam strength has yet to be proposed. In this paper, the effects of panel zone strength on the cyclic performance of RBS connection are investigated based on the available test database from comprehensive independent testing programs. A criterion for a balanced panel zone strength that assures sufficient plastic rotation capacity while reducing the amount of beam buckling is proposed. Numerical studies to supplement the test results are then presented based on the validated finite element analysis. Satisfactory numerical simulation achieved in this study also indicates that numerical analysis based on quality finite element modeling can supplement or replace, at least in part, the costly full-scale cyclic testing of steel moment connections.

Visualizing Method of 4D Object by Weight of Construction Risk Factors (4D객체 활용에 의한 건설공사 리스크 인자별 중요도 시각화 기법연구)

  • Kang, Leen-Seok;Park, Seo-Young;Kim, Chang-Hak;Moon, Hyoun-Seok
    • Proceedings of the Korean Institute Of Construction Engineering and Management
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    • 2006.11a
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    • pp.571-573
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    • 2006
  • This study suggests a reasonable method for visualizing risk management level by risk weight linked with 4D model. This study defines risk management procedures as preparation, identification, analysis, response and management to manage potential risks in the construction project. The modules for computerizing in this system consist of planning, construction, application of WBS (Work Breakdown Structure) and RBS (Risk Breakdown Structure), and risk analysis. The final results include a method for visualizing risk level by each element of the project by using 4D simulation technique. It can be used as a visualized risk management tool instead of current system using numerical data.

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Surface Analysis of Modified Polymer Samples by X-Ray Photoelectron Spectroscopy and Rutherford Backscattering Spectroscopy (X-선 광전자 분광법 및 라더포드 후방산란법에 의한 개질된 고분자 시료의 표면분석)

  • Park, Sung-Woo;Kim, Dong-Hwan;Kim, Young-Man;Park, Byung-Sun;Han, Wan-Soo;Suh, Bae-Suk
    • Analytical Science and Technology
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    • v.7 no.3
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    • pp.301-313
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    • 1994
  • X-Ray Photoelectron Spectroscopy(XPS) and Rutherford Backscattering Spectroscopy(RBS) are used for the analysis of additives, examination of chemical structure and determination of identity with qualitative and quantitative analysis of surface elements, binding energy level and depth profiling in the surface. We analyzed surface of polyethylene, acrylonitrile butadien rubber, polypropylene, glass, fiber and paper treated with $XeF_2$ or C-F plasma by XPS and RBS. It was found that fluoro element was penetrated to sample surface and the distribution of surface elements are different than untreated samples.

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TEM을 이용한 Ion Implanted Sample의 관찰 및 분석

  • Baek, Mun-Cheol;Gwon, O-Jun
    • ETRI Journal
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    • v.9 no.3
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    • pp.106-114
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    • 1987
  • Ion implantation 공정은 VLSI processing의 필수적인 기술로서 그 중요성이 더해가고 있다. 그러나 고 energy의 ion주입에 따른 defect의 발생 및 그 제어기술이 문제가 되고 있으며, 이러한 기술의 개발을 위해서는 그 defect의 정밀관찰 및 분석이 필요하다. 여기에서는 이와 같은 분석기술에 대하여 TEM을 이용한 분석사례를 들어 정리하였다. 그리고 RBS, SIMS 등 분석 기술과의 combination에 대하여 고찰하였다.

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Seismic Design and Testing of Reduced Beam Section Steel Moment Connections with Bolted Web Attachment (웨브를 볼트로 접합한 보 플랜지 절취형(RBS) 철골모멘트접합부의 내진설계 및 성능평가)

  • Lee, Cheol Ho;Kim, Jae Hoon
    • Journal of Korean Society of Steel Construction
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    • v.17 no.6 s.79
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    • pp.689-697
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    • 2005
  • Recent test results on reduced beam section (RBS) steel moment connections show that specimens with a bolted web connection tend to perform poorly due to premature brittle fracture of the beam flange at the weld access hole. A review of previous test results indicates that the higher incidence of base metal fracture in bolted-web specimens is related, at least in part, to the web bolt slippage and the high stress concentration at the weld access hole with the lowest material toughness. The practice of providing web bolts uniformly along the beam depth based on the classical beam theory is questioned in this paper. A new seismic design procedure, which is more consistent with the actual load path identified from the analytical and experimental studies, is proposed together with improved connection details. A test specimen designed following the proposed procedure exhibited a cyclic connection rotation capacity sufficient for special moment frames without fracture.

RSB를 이용한 As 이온 주입된 실리콘 시료분석

  • Lee, Sang-Hwan;Gwon, O-Jun;Lee, Won-Hyeong
    • ETRI Journal
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    • v.10 no.3
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    • pp.242-246
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    • 1988
  • 반도체 소자에서 $N^+$ 접합에 이용되는 As 이온주입된 시편을 RBS(Rutherford backscattering spectrometry)법으로 분석하였다. Random 스펙트럼으로부터 $R_p$, $\DeltaR_p$, As의 최대농도를 구하고 channeled 스펙트럼으로부터 이온 주입에 의한 결정 손상층의 두께와 열처리 후 interstitial site에서 substitutional site로 치환된 As의 비를 구하였다.

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