Analytical Science and Technology (분석과학)

The Korean Society of Analytical Sciences (한국분석과학회)
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Surface Analysis of Modified Polymer Samples by X-Ray Photoelectron Spectroscopy and Rutherford Backscattering Spectroscopy

X-선 광전자 분광법 및 라더포드 후방산란법에 의한 개질된 고분자 시료의 표면분석

  • Park, Sung-Woo (Division of Chemical Analysis, The National Institute of Scientific Investigation) ;
  • Kim, Dong-Hwan (Division of Chemical Analysis, The National Institute of Scientific Investigation) ;
  • Kim, Young-Man (Advanced Analysis Center, Korea Institute of Science and Technology) ;
  • Park, Byung-Sun (Electronics and Telecommunications Research Institute) ;
  • Han, Wan-Soo (Department of Chemistry, Mokwon University) ;
  • Suh, Bae-Suk (Department of Chemistry, Catholic University Medical College)
  • 박성우 (국립과학수사연구소 화학분석과) ;
  • 김동환 (국립과학수사연구소 화학분석과) ;
  • 김영만 (한국과학기술연구원 특성분석센터) ;
  • 박병선 (전자통신연구소) ;
  • 한완수 (목원대학교 화학과) ;
  • 서배석 (카톨릭대학 화학과)
  • Received : 1994.07.18
  • Published : 1994.09.25
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Abstract

X-Ray Photoelectron Spectroscopy(XPS) and Rutherford Backscattering Spectroscopy(RBS) are used for the analysis of additives, examination of chemical structure and determination of identity with qualitative and quantitative analysis of surface elements, binding energy level and depth profiling in the surface. We analyzed surface of polyethylene, acrylonitrile butadien rubber, polypropylene, glass, fiber and paper treated with $XeF_2$ or C-F plasma by XPS and RBS. It was found that fluoro element was penetrated to sample surface and the distribution of surface elements are different than untreated samples.

X-선 광전자분광법(XPS)과 라더포드 후방산란법(RBS)은 첨가제 분석, 화학구조 규명은 물론 시료 표면 원소의 정성 및 정량, 결합에너지 준위, 수직분포 분석을 통한 동일성 판정 등에 응용할 수 있다. $XeF_2$와 C-F plasma로 표면을 처리한 polyethylene, acrylonitrile butadien rubber, polypropylene, glass, fiber 및 paper를 XPS와 RBS로 분석한 결과 불소원자가 시료의 표면에 침투한 것을 확인할 수 있었으며, 표면 원소의 분포가 미처리된 시료의 표면원소 분포와 차이가 있었다.

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