• Title/Summary/Keyword: Powerful Beam

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A GTS-based Sensor Data Gathering under a Powerful Beam Structure (파워 빔 구조에서 GTS 기반 센서 데이터 수집 방안)

  • Lee, Kil Hung
    • Journal of Korea Society of Digital Industry and Information Management
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    • v.10 no.1
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    • pp.39-45
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    • 2014
  • This paper proposes an architecture of a sensor network for gathering data under a powerful beam cluster tree architecture. This architecture is used when there is a need to gather data from sensor node where there is no sink node connected to an existing network, or it is required to get a series of data specific to an event or time. The transmit distance of the beam signal is longer than that of the usual sensor node. The nodes of the network make a tree network when receiving a beam message transmitting from the powerful root node. All sensor nodes in a sink tree network synchronize to the superframe and know exactly the sequence value of the current superframe. When there is data to send to the sink node, the sensor node sends data at the corresponding allocated channel. Data sending schemes under the guaranteed time slot are tested and the delay and jitter performance is explained.

Establishment of Gun Head Unit for Electron Beam Machining System (전자빔건 헤드유니트의 설계와 제작)

  • Kang J.H.;Lee C.H.;Choi J.H.
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2005.06a
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    • pp.1875-1878
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    • 2005
  • It is not efficient and scarcely out of the question to use commercial expensive electron beam lithography system widely used for semiconductor fabrication process for the manufacturing application field of various devices in the small business scope. Then scanning electron microscope based electron beam machining system is maybe regarded as a powerful model can be used for it simply. To get a complete suite of thus proper system, column unit build up with electron beam gun head unit is necessarily required more than anything else to modify scanning electron microscope. In this study, various components included ceramic isolation plate and main body which are essentially constructed for electron beam gun head unit are designed and manufactured. And this electron beam gun head unit will be used for next connected study in the development step of scanning electron microscope based electron beam machining system.

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Design for High Voltage Generator of Electron Beam Manufacturing System (전자빔 가공기를 위한 고전압 발생 장치 설계)

  • 임선종;강재훈;이찬홍
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2004.10a
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    • pp.564-567
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    • 2004
  • In the manufacture of integrated circuits, photolithography is the lowest yield step in present production lines. Electron beams form a powerful set of tools with which to attack this problem. Electron beams can be used to make patterns that are smaller than can a photolithography. We design a high voltage generator of electron beam manufacturing system. For this purpose, first, the configuration of electron beam manufacturing system was analyzed. Second, the basic configuration of a high voltage generator and test results were presented.

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A Study on the Valid Dynamic Modeling for the Slewing and Vibration Suppression Control of Beam (보의 회전 및 진동제어를 위한 동적 모델 타당성 연구)

  • 곽문규;남상현
    • Journal of KSNVE
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    • v.11 no.2
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    • pp.292-300
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    • 2001
  • This research is concerned with the validation of the modeling technique and controller design for slewing beam structures. When cantilever beam rotates about axes perpendicular to the undeformed beam's longitudinal axis, it experiences inertial loading. Hence, the beam vibrates from the initial stage of slewing. In this paper, the analytical model for a single slewing flexible beam with surface bonded piezoelectric sensor and actuator is developed using the Hamilton's principle with discretization by the assumed mode method. Comparisons with the theoretical model are made based upon the frequency responses and time responses. A new factor called the coupling coefficient is introduced to incorporate the discrepancies between the theoretical and experimental results. The slewing is achieved by applying the PID control, which is found to be less sensitive to vibrations. The vibrations are controlled by PPF controller, which is found to be effective in suppressing residual vibrations after slewing. The vibrations occurred during slewing is difficult to control because the piezoceramic actuator is not powerful enough to overcome inertial loadings.

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Continuous variation characteristics of pulse width in short cavity dye laser (단공진기 색소레이저의 펄스폭 연속가변 특성)

  • 김용평
    • Korean Journal of Optics and Photonics
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    • v.10 no.6
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    • pp.512-517
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    • 1999
  • Quenched dye laser (QDL), which operates with relaxation oscillation mode, is one of the most powerful source for ultra-short pulse light. In this paper, the output characteristics of QDL is theoretically analyzed by a computer simulation. The QDL is assumed that the laser dye is Rhodamine 6G which has the oscillation wavelength of 590 nrn and that the active length is 5 mm and that the pumping source is XeCllaser which has oscillation wavelength of 308 nm. It is revealed ilim the pulse width of short cavity dye laser reduced less than 1/100 than pumping pulse duration and has the linear relationship with spatial width of pumping beam approximately. In addition, it is revealed that the short cavity dye laser is a powerful candidate of pulse width variable light source, which is adjusted by spatial size of pumping beam_ beam_

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An Efficient and Accurate Method for Calculating Nonlinear Diffraction Beam Fields

  • Jeong, Hyunjo;Cho, Sungjong;Nam, Kiwoong;Lee, Janghyun
    • Journal of the Korean Society for Nondestructive Testing
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    • v.36 no.2
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    • pp.102-111
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    • 2016
  • This study develops an efficient and accurate method for calculating nonlinear diffraction beam fields propagating in fluids or solids. The Westervelt equation and quasilinear theory, from which the integral solutions for the fundamental and second harmonics can be obtained, are first considered. A computationally efficient method is then developed using a multi-Gaussian beam (MGB) model that easily separates the diffraction effects from the plane wave solution. The MGB models provide accurate beam fields when compared with the integral solutions for a number of transmitter-receiver geometries. These models can also serve as fast, powerful modeling tools for many nonlinear acoustics applications, especially in making diffraction corrections for the nonlinearity parameter determination, because of their computational efficiency and accuracy.

Application of 상Strut-and-Tie상 Model for the Detailing of Beam-Column Joints (보-기둥 접합부의 배근상세를 위한 Strut-and-Tie Model)

  • 강원호
    • Proceedings of the Korea Concrete Institute Conference
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    • 1994.04a
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    • pp.53-58
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    • 1994
  • Beam-column joints of the skeleton structure can be classified as geometrical D-region, where the assumption of Bernoulli is not applicable. For the detailing of D-region in concrete structure, "Strut-and-Tie' Model is a very powerful tool, which has been widely used by practical engineers. This paper shows how the methodology of Strut-and-Tie Model can be applied for the various cases of beam-column joints. We can find this mechanical model does not give only an appropriate answer to the given problem but also a better insight to the structral behavior of beam-column joints.

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Establishment of Column Unit for Electron Beam Machining System (전자빔 가공시스템용 경통의 구축)

  • 강재훈;이찬홍;최종호
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2004.10a
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    • pp.1017-1020
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    • 2004
  • It is not efficient and scarcely out of the question to use commercial expensive electron beam lithography system widely used for semiconductor fabrication process for the manufacturing application field of various devices in the small business scope. Then scanning electron microscope based electron beam machining system is maybe regarded as a powerful model can be used for it simply. To get a complete suite of thus proper system, column unit build up with several electo-magnetic lens is necessarily required more than anything else to modify scanning electron microscope. In this study, various components included several electro-magnetic lens and main body which are essentially constructed for column unit are designed and manufactured. And this established column unit will be used for next connected study in the development step of scanning electron microscope based electron beam machining system.

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Novel reforming of pyrolized fuel oil by electron beam radiation for pitch production

  • Jung, Jin-Young;Park, Mi-Seon;Kim, Min Il;Lee, Young-Seak
    • Carbon letters
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    • v.15 no.4
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    • pp.262-267
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    • 2014
  • Pyrolized fuel oil (PFO) was reformed by novel electron beam (E-beam) radiation, and the elemental composition, chemical bonds, average molecular weight, solubility, softening point, yields, and density of the modified patches were characterized. These properties of modified pitch were dependent on the reforming method (heat or E-beam radiation treatment) and absorbed dose. Aromaticity ($F_a$), average molecular weight, solubility, softening point, and density increased in proportion to the absorbed dose of E-beam radiation, with the exception of the highest absorbed dose, due to modification by free radical polymerization and the powerful energy intensity of E-beam treatment. The H/C ratio and yield exhibited the opposite trend for the same reason. These results indicate that novel E-beam radiation reforming is suitable for the preparation of aromatic pitch with a high ${\beta}$-resin content.

Study on Surface Damage of Specimen for Transmission Electron Microscopy(TEM) Using Focused Ion Beam(FIB) (집속 이온빔을 이용한 투과 전자 현미경 시편의 표면 영향에 관한 연구)

  • Kim, Dong-Sik
    • 전자공학회논문지 IE
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    • v.47 no.2
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    • pp.8-12
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    • 2010
  • TEM is a powerful tool for semiconductor material analyses in structure or biological sample in micro structure. TEM observation need to make to coincide specimens for special purpose. in this paper, we have experimented for minimum surface damage on bulk wafer and patterned specimen by various conditions such as accelerating energy, depth of ion beam, ion milling types, and etc. in various specimen preparation methods by FIB (Focus Ion Beam). The optimal qualified specimens are contain low mounts of surface damage(about 5 nm) on patterned specimen.