• Title/Summary/Keyword: Polycrystalline structure

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Preparation and Characterization of Ordered Perovskite (CaLa) (MgMo) $_6$

  • Choy, Jin-Ho;Hong, Seung-Tae;Suh, Hyeong-Mi
    • Bulletin of the Korean Chemical Society
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    • v.9 no.6
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    • pp.345-349
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    • 1988
  • The polycrystalline powder of (CaLa) (MgMo)$O_6$ has been prepared at $1350^{\circ}C$ in $H_2/H_2O$ and $N_2$ flowing atmosphere. The powder X-ray diffraction pattern indicates that (CaLa) (MgMo)$O_6$ has a monoclinic perovskite structure with the lattice constants $a_0=b_0=7.901(1){\AA}$, $c =7.875(1){\AA}\;and\;{\gamma}=89^{\circ}$16'(1'), which can be reduced to orthorhombic unit cell, a = 5.551(1) ${\AA}$, b = 5.622(1) ${\AA}$ and c = 7.875(1) ${\AA}$. The infrared spectrum shows two strong absorption bands with their maxima at 590($ν_3$) and 380($ν_4$) cm, which are attributed to $2T_{1u}$ modes indicating the existence of highly charged molybdenum octahedron $MoO_6$ in the crystal lattice. According to the magnetic susceptibility measurement, the compound follows the Curie-Weiss law below room temperature with the effective magnetic moment 1.83(1)$_{{\mu}B}$, which is well consistent with that of spin only value (1.73 $_{\mu}_B$) for $Mo^{5+}$ with $4d^1$-electronic configuration within the limit of experimental error. From the thermogravimetric analysis, it has been confirmed that (CaLa) (MgMo)$O_6$ decomposes gradually into $CaMoO_4,\;MoO_3,\;MgO,\;La_2O_3$ and unidentified phases due to the oxidation of $Mo^{5+}$ to $Mo^{6+}$.

Short-range magnetic order in La1-xBaxCoO3 cobaltites

  • Long, Phan The;Petrov, Dimitar N.;Cwik, J.;Dang, N.T.;Dongquoc, Viet
    • Current Applied Physics
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    • v.18 no.11
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    • pp.1248-1254
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    • 2018
  • Magnetization versus temperature and magnetic-field measurements, M(T, $H_a$), have been carried out to study the magnetic and critical properties of polycrystalline $La_{1-x}Ba_xCoO_3$ (x = 0.3 and 0.5) cobaltites. These compounds with the density of ${\sim}6.2g/cm^3$ crystallized in the $R{\bar{3}}c$ rhombohedral and $Pm{\bar{3}}m$ cubic structures, respectively. With an applied field $H_a=200Oe$, M(T) data have revealed that the samples with x = 0.3 and 0.5 exhibit the ferromagnetic-paramagnetic (FM-PM) phase transition at the Curie temperature points $T_C=202$ and 157 K, respectively. At 4.2 K, the saturation magnetization ($M_{sat}$) decreases from 35.9 emu/g for x = 0.3-26.1 emu/g for x = 0.5. Particularly, the critical-behavior analyses in the vicinity of $T_C$ reveal all samples undergoing a second-order phase transition, with critical exponent values (${\beta}=0.328$ and ${\gamma}=1.251$ for x = 0.3, and ${\beta}=0.331$ and ${\gamma}=1.246$ for x = 0.5) close to those expected for the 3D Ising model. This proves short-range magnetic order existing in $La_{1-x}Ba_xCoO_3$. We believe that magnetic inhomogeneities due to the mixture of hole-rich FM regions (confined in the trivalent-cobalt hole-poor anti-FM matrix) and uniaxial anisotropy prevent long-range order in $La_{1-x}Ba_xCoO_3$.

Growth and thermal annealing of polycrystalline Ga2O3/diamond thin films on Si substrates (다결정 산화갈륨/다이아몬드 이종 박막 성장 및 열처리 효과 연구)

  • Seo, Ji-Yeon;Kim, Tae-Gyu;Shin, Yun-Ji;Jeong, Seong-Min;Bae, Si-Young
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.31 no.6
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    • pp.233-239
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    • 2021
  • In this study, Ga2O3/diamond layers were grown on Si substrates to improve the thermal characteristics of Ga2O3 materials. Firstly, diamond thin film was grown on Si substrates by hot-filament chemical vapor deposition. Afterward, Ga2O3 layer was grown in the growth temperature range of from 450~600℃ by mist chemical vapor deposition. We found that layer separation happens at the Ga2O3/diamond interface at the growth temperature of 500℃. This is attributed to the different thermal expansion coefficient of the mixture of amorphous and crystalline structures during cooling process. Therefore, this study might contribute to the heat-sink-layer bonded power semiconductor applications by stabilizing the thermal properties at Ga2O3/diamond interface.

Prospecting endophytic colonization in Waltheria indica for biosynthesis of silver nanoparticles and its antimicrobial activity

  • Nirmala, C.;Sridevi, M.
    • Advances in nano research
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    • v.13 no.4
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    • pp.325-339
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    • 2022
  • Endophytes ascertain a symbiotic relationship with plants as promoters of growth, defense mechanism etc. This study is a first report to screen the endophytic population in Waltheria indica, a tropical medicinal plant. 5 bacterial and 3 fungal strains in leaves, 3 bacterial and 1 yeast species in stems were differentiated morphologically and identified by biochemical and molecular methods. The phylogenetic tree of the isolated endophytes was constructed using MEGA X. Silver nanoparticles were biosynthesized from a rare endophytic bacterium Cupriavidus metallidurans isolated from the leaf of W. indica. The formation of silver nanoparticles was confirmed by UV-Visible spectrophotometer that evidenced a strong absorption band at 408.5 nm of UV-Visible range with crystalline nature and average particle size of 16.4 nm by Particle size analyzer. The Fourier Transform Infra-Red spectrum displayed the presence of various functional groups that stabilized the nanoparticles. X-ray diffraction peaks were conferred to face centered cubic structure. Transmission Electron Microscope and Scanning Electron Microscope revealed the spherical-shaped, polycrystalline nature with the presence of elemental silver analyzed by Energy Dispersive of X-Ray spectrum. Selected area electron diffraction also confirmed the orientation of AgNPs at 111, 200, 220, 311 planes similar to X-ray diffraction analysis. The synthesized nanoparticles are evaluated for antimicrobial activity against 7 bacterial and 3 fungal pathogens. A good zone of inhibition was observed against pathogenic bacteria than fungal pathogens. Thus the study could hold a key aspect in drug discovery research and other pharmacological conducts of human clinical conditions.

Synthesis and characterization of Pb10-xCux(PO4)6O polycrystalline samples

  • Huiwon Kim;Minsik Kong;Minjae Kim;Seohee Kim;Jong Mok Ok
    • Progress in Superconductivity and Cryogenics
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    • v.25 no.4
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    • pp.5-9
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    • 2023
  • Lee, Kim, et al. reported in July 2023 that a modified lead apatite material, Pb10-xCux(PO4)6O (0.9 < x < 1.1), exhibited superconductivity at room temperature and atmospheric pressure [1, 2]. However, their X-ray diffraction data clearly showed the presence of impurity phases, including Cu2S, raising uncertainty about the sample quality. Subsequent studies have been conducted; however, different samples exhibited various physical properties. To verify the recipe for the sample growth process, we synthesized samples following the methodology outlined in the reference [1, 2]. An analysis of the structure and physical properties of the synthesized sample reaffirms the critical importance of high-quality sample growth.

Preparation of dielectric Bi4-xLaxTi3O12 (x~2) from K2La2Ti3O10 via exfoliation and restacking routes (박리화와 재적층법을 통한 K2La2Ti3O10부터 유전성 Bi4-xLaxTi3O12(x~2)의 합성)

  • Jeon, A Young;Ko, Jieun;Kim, Jong-Young
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.23 no.1
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    • pp.14-19
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    • 2013
  • We have successfully synthesized $Bi_{4-x}La_xTi_3O_{12}$ (x~2) having Aurivillius-type layered perovskite structure from exfoliated layered perovskite oxide of $K_2La_2Ti_3O_{10}$ with Ruddlesden-Popper structure. The reaction between the exfoliated lanthanum titanate nanosheets and BiOCl nanocrystal resulted in the formation of polycrystalline $Bi_{4-x}La_xTi_3O_{12}$ (x~2) after heating above $700^{\circ}C$. Colloidal suspension of the nanosheets could be obtained by intercalating ethylamine (EA) into the protonated lanthanum titanate, $H_2La_2Ti_3O_{10}$, derived from $K_2La_2Ti_3O_{10}$. Transmission electron microscopic (TEM) analysis show that the exfoliated lanthanium titanate nanosheets have a thickness of a few nano meters. According to X-ray diffraction (XRD) analysis, the exfoliated lanthanium titanate was found to be transformed into $Bi_{4-x}La_xTi_3O_{12}$ (x~2) after restacking with BiOCl and subsequent thermal treatment at > $700^{\circ}C$.

Growth of Hexagonal Boron Nitride Thin Films on Silicon Using a Single Source Precursors

  • Boo, Jin-Hyo;Lee, Soon-Bo;Casten Rohr;Wilson Ho
    • Proceedings of the Korean Vacuum Society Conference
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    • 1998.02a
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    • pp.120-120
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    • 1998
  • Boron nitride (BN) films have attracted a growing interest for a variety of t technological applications due to their excellent characteristics, namely hardness, c chemical inertness, and dielectrical behavior, etc. There are two crystalline phases 1551; of BN that are analogous to phases of carbon. Hexagonal boron nitride (h-BN) has a a layered s$\sigma$ucture which is spz-bonded structure similar to that of graphite, and is t the stable ordered phase at ambient conditions. Cubic boron nitride (c-BN) has a z zinc blende structure with sp3-bonding like as diamond, 따ld is the metastable phase a at ambient conditions. Among of their prototypes, especially 삼Ie c-BN is an i interesting material because it has almost the same hardness and thermal c conductivity as di없nond. C Conventionally, significant progress has been made in the experimental t techniques for synthesizing BN films using various of the physical vapor deposition 밍ld chemical vapor deposition. But, the major disadvantage of c-BN films is that t they are much more difficult to synthesize than h-BN films due to its narrow s stability phase region, high compression stress, and problem of nitrogen source c control. Recent studies of the metalorganic chemical vapor deposition (MOCVD) of I III - V compound have established that a molecular level understanding of the d deposition process is mandatory in controlling the selectivity parameters. This led t to the concept of using a single source organometallic precursor, having the c constituent elements in stoichiometric ratio, for MOCVD growth of 삼Ie required b binary compound. I In this study, therefore, we have been carried out the growth of h-BN thin f films on silicon substrates using a single source precursors. Polycrystalline h-BN t thin films were deposited on silicon in the temperature range of $\alpha$)() - 900 $^{\circ}$C from t the organometallic precursors of Boron-Triethylamine complex, (CZHs)3N:BRJ, and T Tris(dimethylamino)Borane, [CH3}zNhB, by supersonic molecular jet and remote p plasma assisted MOCVD. Hydrogen was used as carrier gas, and additional nitrogen w was supplied by either aDlIDonia through a nozzle, or nitrogen via a remote plasma. T The as-grown films were characterized by Fourier transform infrared spectroscopy, x x-ray pthotoelectron spectroscopy, Auger electron spectroscopy, x-ray diffraction, t transmission electron diffraction, optical transmission, and atomic force microscopy.roscopy.

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Study on Growth and Opto-Electrical Characterization of $CdS_{1-x}Se_{x}$ Thin Film using Chemical Bath Deposition Method (CBD 방법에 의한 $CdS_{1-x}Se_{x}$ 박막의 열처리에 따른 광전기적 특성)

  • Hong, K.J.;Choi, S.P.;Lee, S.Y.;You, S.H.;Shin, Y.J.;Lee, K.K.;Suh, S.S.;Kim, H.S.;Yun, E.H.;Kim, S.U.;Shin, Y.J.;Jeong, T.S.;Shin, H.K.;KIm, T.S.;Moon, J.D.;Jeon, S.L.
    • Journal of Sensor Science and Technology
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    • v.4 no.1
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    • pp.51-63
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    • 1995
  • Polycrystalline $CdS_{1-x}Se_{x}$ thin films were grown on ceramic substrate using a chemical bath deposition method. They were annealed at various temperature and X-ray diffraction patterns were measured by X-ray diffractometer in order to study $CdS_{1-x}Se_{x}$ polycrystal structure using extrapolation method of X-ray diffraction patterns for the CdS, CdSe samples annealed in $N_{2}$ gas at $550^{\circ}C$ it was found hexagonal structure which had the lattice constant $a_{0}=4.1364{\AA}$, $c_{0}=6.7129{\AA}$ in CdS and $a_{0}=4.3021{\AA}$, $c_{0}=7.0142{\AA}$ in CdSe, respectively. Hall effect on these samples was measured by Van der Pauw method and then studied on carrier density and mobility depending on temperature. We measured also spectral response, sensitivity(${\gamma}$), maximum allowable power dissipation and response time on these samples.

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Growth of Thin Film using Chemical Bath Deposition Method and Their Photoconductive Characterics ($Cd_{1-x}Zn_{x}S$ 박막의 성장과 광전도 특성)

  • Lee, S.Y.;Hong, K.J.;You, S.H.;Shin, Y.J.;Lee, K.K.;Suh, S.S.;Kim, H.S.;Yun, E.H.;Kim, S.U.;Park, H.S.;Shin, Y.J.;Jeong, T.S.;Shin, H.K.;Kim, T.S.;Moon, J.D.;Lee, C.I.;Jeon, S.L.
    • Journal of Sensor Science and Technology
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    • v.4 no.3
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    • pp.60-70
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    • 1995
  • Polycrystalline $Cd_{1-x}Zn_{x}S$ thin film were grown on slide glass(corning-2948) substrate using a chemical bath deposition (C.B.D) method. They were annealed at various temperature and X -ray diffraction patterns were measured by X-ray diffractometor in order to study $Cd_{1-x}Zn_{x}S$ polycrystal structure using extrapolation method of X-ray diffraction patterns for the CdS, ZnS sample annealed in $N_{2}$ gas at $550^{\circ}C$. It was found hexagonal structure which had the lattice constant $a_{0}\;=\;4.1364{\AA}$, $c_{0}\;=\;6.7129{\AA}$ in CdS and $a_{0}\;=\;3.8062{\AA}$, $c_{0}\;=\;6.2681{\AA}$ in ZnS, respectively. Hall effect on these sample was measured by Van der Pauw method and then studied on carrier density and mobility depending on temperature. We measured also spectral response, sensitivity maximum allowable power dissipation and response time on these sample.

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Preparation of CeO$_2$ Thin Films as an Insulation Layer and Electrical Properties of Pt/$SrBi_2$$Ta_2$$O_9$/$CeO_24/Si MFISFET (절연층인 CeO$_2$박막의 제조 및 Pt/$SrBi_2$$Ta_2$$O_9$/$CeO_24/Si MFISFET 구조의 전기적 특성)

  • Park, Sang-Sik
    • Korean Journal of Materials Research
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    • v.10 no.12
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    • pp.807-811
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    • 2000
  • CeO$_2$ and SrBi$_2$Ta$_2$O$_{9}$ (SBT) thin films for MFISFET (Metal-ferroelectric-insulator-semiconductor-field effect transistor) were deposited by r.f. sputtering and pulsed laser ablation method, respectively. The effects of sputtering gas ratio(Ar:O$_2$) during deposition for CeO$_2$ films were investigated. The CeO$_2$ thin films deposited on Si(100) substrate at $600^{\circ}C$ exhibited (200) preferred orientation. The preferred orientation, Brain size and surface roughness of films decreased with increasing oxygen to argon gas ratio. The films deposited under the condition of Ar:O$_2$= 1 : 1 showed the best C- V characteristics. The leakage current of films showed the order of 10$^{-7}$ ~10$^{-8}$ A at 100kV/cm. The SBT thin films on CeO$_2$/Si substrate showed dense microstructure of polycrystalline phase. From the C-V characteristics of MFIS structure with SBT film annealed at 80$0^{\circ}C$, the memory window width was 0.9V at 5V The leakage current density of Pt/SBT/CeO$_2$/Si structure annealed at 80$0^{\circ}C$ was 4$\times$10$^{-7}$ /$\textrm{cm}^2$ at 5V.

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