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http://dx.doi.org/10.6111/JKCGCT.2021.31.6.233

Growth and thermal annealing of polycrystalline Ga2O3/diamond thin films on Si substrates  

Seo, Ji-Yeon (Korea Institute of Ceramic Engineering and Technology, Energy and Environmental Division)
Kim, Tae-Gyu (School of Mechatronics Engineering, Pusan National University)
Shin, Yun-Ji (Korea Institute of Ceramic Engineering and Technology, Energy and Environmental Division)
Jeong, Seong-Min (Korea Institute of Ceramic Engineering and Technology, Energy and Environmental Division)
Bae, Si-Young (Korea Institute of Ceramic Engineering and Technology, Energy and Environmental Division)
Abstract
In this study, Ga2O3/diamond layers were grown on Si substrates to improve the thermal characteristics of Ga2O3 materials. Firstly, diamond thin film was grown on Si substrates by hot-filament chemical vapor deposition. Afterward, Ga2O3 layer was grown in the growth temperature range of from 450~600℃ by mist chemical vapor deposition. We found that layer separation happens at the Ga2O3/diamond interface at the growth temperature of 500℃. This is attributed to the different thermal expansion coefficient of the mixture of amorphous and crystalline structures during cooling process. Therefore, this study might contribute to the heat-sink-layer bonded power semiconductor applications by stabilizing the thermal properties at Ga2O3/diamond interface.
Keywords
$Ga_2O_3$; Diamond; Annealing; Phase transition; Hetero structure;
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