• Title/Summary/Keyword: Piezoelectric layer

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Pyroelectric Properties on the Orientation of SBN Thin Film (SBN 박막의 배향도에 따른 초전특성 변화)

  • Lee, Chae-Jong;Lee, Hee-Young;Kim, Jeong-Joo;Cho, Sang-Hee
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.06a
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    • pp.366-367
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    • 2006
  • Different orientated SBN thin films were deposited by Ion Beam Sputtering, and electric properties were measured on each orientation. Ferroelectric $Sr_xBa_{1-x}Nb_2O_6$(SBN) has excellent electro-optic, photo-refractive, piezoelectric, pyroelectric properties. SBN thin film has been deposited by various method, of sol-gel, PLD, CVD, sputtering, etc.. To avoid lead pollution of Pb-system perovskite ferroelectric materials. SBN thin films were fabricated for pyroelectric IR sensor. Using the ceramic target of the same composition and Pt(100)/$TiO_2/SiO-2$/Si(100) substrate, crystallization and orientation behavior as well as electric properties of the films were examined. Seed layer and thin films thickness was controlled to observe the effect on preferred orientation. We measured I-V, C-V, P-E hysteresis to characterize electric-properties on each orientations.

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Studies on Fabrication and Characteristics of $Al_{0.3}Ga_0.7N/GaN$ Heterojunction Field Effect Transistors for High-Voltage and High-Power Applications (고전압과 고전력 응용을 위한 $Al_{0.3}Ga_0.7N/GaN$ 이종접합 전계효과 트랜지스터의 제작 및 특성에 관한 연구)

  • Kim, Jong-Wook;Lee, Jae-Seung;Kim, Chang-Suk;Jeong, Doo-Chan;Lee, Jae-Hak;Shin, Jin-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.38 no.8
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    • pp.13-19
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    • 2001
  • We report on the fabrication and characterization of $Al_{0.3}Ga_{0.7}N$ HFETs with different barrier layer thickness which were grown using plasma-assisted molecular beam epitaxy (PAMBE). The barrier thickness of $Al_{0.3}Ga_{0.7}N$/GaN HFETs could be optimized in order to maximize 2 dimensional electron gas induced by piezoelectric effect without the relaxation of $Al_{0.3}Ga_{0.7}N$ layer. $Al_{0.3}Ga_{0.7}N$/GaN (20 nm/2 mm) HFET with 0.6 ${\mu}m$-long and 34 ${\mu}m$-wide gate shows saturated current density ($V_{gs}=1\;V$) of 1.155 A/mm and transconductance of 250 ms/mm, respectively. From high frequency measurement, the fabricated $Al_{0.3}Ga_{0.7}N$/GaN HFETs showed $F_t=13$ GHz and $F_{max}=48$ GHz, respectively. The uniformity of less than 5% could be obtained over the 2 inch wafer. In addition to the optimization of epi-layer structure, the relation between breakdown voltage and high frequency characteristics has been examined.

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Fabrication and Evaluation of a VHF Focusing Ultrasonic Transducer Made of PVDF Piezoelectric Film (PVDF 압전막을 이용한 초고주파 집속 초음파 트랜스듀서의 제작 및 특성 평가)

  • Yoon, Ju-Ho;Oh, Jung-Hwan;Kim, Jung-Soon;Kim, Moo-Joon;Ha, Kang-Lyeol
    • The Journal of the Acoustical Society of Korea
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    • v.30 no.4
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    • pp.215-222
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    • 2011
  • In order to obtain high resolution images, a focusing ultrasonic transducer operated in very high frequency (VHF) range was fabricated and its characteristics were evaluated. A 9-${\mu}m$ thick PVDF film with only one metalized surface for electric ground was adhered to a CCP (Copper-clad polyimide) film by using epoxy. It was pressed by a metal ball to form a concave surface and its rear side was filled with the epoxy. The radius of curvature and the f-number of the fabricated transducer are 7.5 mm and 1.7, respectively. The pulse-echo measurement results from a target located at the focal point showed that the frequency bandwidth was 35.0 MHz and the insertion loss near the peak frequency of approximately 40 MHz was about 60 dB. Those values agreed well with the simulation results by the KLM equivalent circuit analysis including the effect of the epoxy bonding layer. When the image of thin copper lines by the 35 MHz transducer of the UBM (Ultrasonic Backscattering Microscope) system was compared with the image by the transducer fabricated in this study, the fabricated transducer was observed that the axial resolution was improved although the lateral resolution was degraded.

Structural characterization of nonpolar GaN using high-resolution transmission electron microscopy (HRTEM을 이용한 비극성 GaN의 구조적 특성 분석)

  • Kong, Bo-Hyun;Kim, Dong-Chan;Kim, Young-Yi;Ahn, Cheol-Hyoun;Han, Won-Suk;Choi, Mi-Kyung;Bae, Young-Sook;Woo, Chang-Ho;Cho, Hyung-Koun;Moon, Jin-Young;Lee, Ho-Seong
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.06a
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    • pp.23-23
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    • 2009
  • GaN-based nitride semiconductors have attracted considerable attention in high-brightness light-emitting-diodes (LEDs) and laser diodes (LDs) covering from green to ultraviolet spectral range. LED and LD heterostructures are usually grown on (0001)-$Al_2O_3$. The large lattice mismatch between $Al_2O_3$ substrates and the GaN layers leads to a high density of defects(dislocations and stacking faults). Moreover, Ga and N atoms are arranged along the polar [0001] crystallographic direction, which leads to spontaneous polarization. In addition, in the InGaN/GaN MQWs heterostructures, stress applied along the same axis can also give rise to piezoelectric polarization. The total polarization, which is the sum of spontaneous and piezoelectric polarizations, is aligned along the [0001] direction of the wurtzite heterostructures. The change in the total polarization across the heterolayers results in high interface charge densities and spatial separation of the electron and hole wave functions, redshifting the photoluminescence peak and decreasing the peak intensity. The effect of polarization charges in the GaN-based heterostructures can be eliminated by growing along the non-polar [$11\bar{2}0$] (a-axis) or [$1\bar{1}00$] (m-axis) orientation instead of thecommonly used polar [0001] (c-axis). For non-polar GaN growth on non-polar substrates, the GaN films have high density of planar defects (basal stacking fault BSFs, prismatic stacking fault PSFs), because the SFs are formed on the basal plane (c-plane) due to their low formation energy. A significant reduction in defect density was recently achieved by applying blocking layer such as SiN, AlN, and AlGaN in non-polar GaN. In this work, we were performed systematic studies of the defects in the nonpolar GaN by conventional and high-resolution transmission electron microscopy.

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Nanostructured energy harvesting devices and their applications for IoT sensor networks (나노구조체 에너지 하베스팅 소자와 IoT 센서 네트워크의 융합 연구)

  • Yoon, Chongsei;Jeon, Buil;Yoon, Giwan
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.25 no.5
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    • pp.719-730
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    • 2021
  • We have demonstrated a sandwich-type ZnO-based piezoelectric energy harvesting nanogenerator, namely ZCZ-NG device, composed of symmetrically stacked layers of ZnO/carbon tape/ZnO structure. Especially, we have adopted a conductive double-sided adhesive carbon tape in an effort to fabricate a high-quality ZCZ-NG device, leading to its superior output performance in terms of the peak-to-peak output voltage. Effects of the device size, ZnO layer thickness, and bending strain rate on the device performance have been investigated by measuring the output voltage. Moreover, to evaluate the effectiveness of the fabricated ZCZ-NG devices, we have experimentally implemented a sensor network testbed which can utilize the output voltages of ZCZ-NG devices. This sensor network testbed consists of several components such as Arduino-based transmitter and receiver nodes, wirelessly transmitting the sensed information of each node. We hope that this research combining the ZnO-based energy harvesting devices and IoT sensor networks will contribute to the development of more advanced energy harvester-driven IoT sensor networks in the future.

다양한 온도에서 열처리한 씨앗 층 위에 열수화법을 이용한 ZnO 나노 막대의 성장

  • Bae, Yeong-Suk;Kim, Yeong-Lee;Kim, Dong-Chan;Gong, Bo-Hyeon;An, Cheol-Hyeon;Choe, Mi-Gyeong;U, Chang-Ho;Han, Won-Seok;Jo, Hyeong-Gyun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.06a
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    • pp.433-433
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    • 2009
  • ZnO-based materials have been extensively studied for optoelectronic applications due to their superiors physical properties such as wide direct bandgap (~3.37 eV), large exciton binding energy (~60 meV), high transparency in the visible region, and low cost. Especially, one-dimensional (1D) ZnO nanostructures have attracted considerable attention owing to quantum confinement effect and high crystalline quality. Additionally, various nanostructures of ZnO such as nanorods, nanowires, nanoflower, and nanotubes have stimulated the interests because of their semiconducting. and piezoelectric properties. Among them, vertically aligned ZnO nanorods can bring the improved performance in various promising photoelectric fields including piezo-nanogenerators, UV lasers, dye sensitized solar cells, and photo-catalysis. In this work, we studied the effect of the annealing temperature of homo seed layers on the formation of ZnO nanorods grown by hydrothermal method. The effect of annealing temperature of seed layer on the length and orientation of the nanorods was investigated scanning electron microscopy investigation. Transmission electron microscopy and X-ray diffraction measurement were performed to understand the effect of annealing temperatures of seed layers on the formation of nanorods. Moreover, the optical properties of the seed layers and the nanorods were studied by room temperature photoluminescence.

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Aeromechanical stability analysis and control of helicopter rotor blades (헬리콥터 회전날개깃의 안정성 해석과 제어)

  • Kim, J.S.;Chattopadhyay, Aditi
    • Journal of the Korean Society for Aviation and Aeronautics
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    • v.9 no.1
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    • pp.59-69
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    • 2001
  • The rotor blade is modeled using a composite box beam with arbitrary wall. The active constrained damping layers are bonded to the upper and lower surfaces of the box beam to provide active and passive damping. A finite element model, based on a hybrid displacement theory, is used in the structural analysis. The theory is capable of accurately capturing the transverse shear effects in the composite primary structure, the viscoelastic and the piezoelectric layers within the ACLs. A reduced order model is derived based on the Hankel singular value. A linear quadratic Gaussian (LQG) controller is designed based on the reduced order model and the available measurement output. However, the LQG control system fails to stabilize the perturbed system although it shows good control performance at the nominal operating condition. To improve the robust stability of LQG controller, the loop transfer recovery (LTR) method is applied. Numerical results show that the proposed controller significantly improves rotor aeromechanical stability and suppresses rotor response over large variations in rotating speed by increasing lead-lag modal damping in the coupled rotor-body system.

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Crystallization and Electrical Properties of SBM Thin Films by IBSD Process (IBSD법에 의한 SBN60 강유전체 박막의 배향 및 전기적 특성)

  • Jeong, Seong-Won;Jang, Jae-Hoon;Lee, Hee-Young
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.07b
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    • pp.869-873
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    • 2004
  • [ $Sr_xBa_{1-x}Nb_2O_6$ ] (SBN, $0.25{\leq}x{\leq}0.75$) ceramic is a ferroelectric material with tetragonal tungsten bronze (TTB) type structure, which has a high pyroelectric coefficient, piezoelectric, and a photo refractive properties. In this study, SBN60(x=0.6) thin film was manufactured by ion beam sputtering technique. Using the prepared SBN60 target in $Ar/O_2$ atmosphere as-deposited SBN60 thin film on Pt(100)/$TiO_2/SiO_2/Si$ substrate crystallization and orientation behavior as well as electric properties of SBN60 thin film were examined. SBN60 deposition up to $3000{\AA}$ in thickness, SBN60 thin film was heat-treated at $650^{\circ}C{\sim}800^{\circ}C$. The orientation was shown primarily along (001) plane from XRD pattern where working pressure was $4.3{\times}10^{-4}$ torr. The deposited layer was uniform, preferred orientatin and crystallization behavior resulted in the change of $O_2$ ratio was observed. In electric propertie of Pt/SBN60/Pt thin film capacitor remnant polarization (2Pr) value was $10{\mu}C/cm^2$, the coercive filed (Ec) 50 kV/cm, and the dielectric constant 615, respectively.

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Design of a Piezocomposite Generating Element and Its Characteristics (압전-복합재료 발전 소자의 설계 및 특성)

  • Tien, Minh Tri;Kim, Jong-Hwa;Goo, Nam-Seo
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.34 no.7
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    • pp.867-872
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    • 2010
  • Unused energy derived from sources in nature can be captured and stored for future use, for example, to recharge a battery or power a device; this process of capturing and storing energy is called energy harvesting. Extensive investigations are being carried out in order to use piezoelectricity to harvest the energy generated by body movements or machine vibrations. This paper presents a simple analytical model that describes the output voltage effectiveness of a Piezocomposite Generating Element (PCGE) from vibration and its experimental verification. PCGE is composed of carbon/epoxy, PZT, and glass/epoxy layers. During the manufacturing process, the stacked layers were cured at $177^{\circ}C$ in an autoclave, which created residual stresses in PCGE and altered the piezoelectric properties of the PZT layer. In the experiments, three kinds of lay-up configurations of PCGE were considered to verify the proposed prediction model and to investigate its capability to convert oscillatory mechanical energy into electrical energy. The predicted performance results are in good agreement with observed experimental ones.

Influence of gate insulator treatment on Zinc Oxide thin film transistors.

  • Kim, Gyeong-Taek;Park, Jong-Wan;Mun, Yeon-Geon;Kim, Ung-Seon;Sin, Sae-Yeong
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2010.05a
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    • pp.54.2-54.2
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    • 2010
  • 최근까지는 주로 비정질 실리콘이 디스플레이의 채널층으로 상용화 되어왔다. 비정질 실리콘 기반의 박막 트랜지스터는 제작의 경제성 및 균일성을 가지고 있어서 널리 상용화되고 있다. 하지만 비정질 실리콘의 구조적인 문제인 낮은 전자 이동도(< $1\;cm^2/Vs$)로 인하여 디스플레이의 대면적화에 부적합하며, 광학적으로 불투명한 특성을 갖기 때문에 차세대 디스플레이의 응용에 불리한 점이 있다. 이런 문제점의 대안으로 현재 국내외 여러 연구 그룹에서 산화물 기반의 반도체를 박막 트랜지스터의 채널층으로 사용하려는 연구가 진행중이다. 산화물 기반의 반도체는 밴드갭이 넓어서 광학적으로 투명하고, 상온에서 증착이 가능하며, 비정질 실리콘에 비해 월등히 우수한 이동도를 가짐으로 디스플레이의 대면적화에 유리하다. 특히 Zinc Oxide의 경우, band gap이 3.4eV로써, transparent conductors, varistors, surface acoustic waves, gas sensors, piezoelectric transducers 그리고 UV detectors 등의 많은 응용에 쓰이고 있다. 또한, a-Si TFTs에 비해 ZnO-based TFTs의 경우 우수한 소자 성능과 신뢰성을 나타내며, 대면적 제조시 우수한 균일성 및 낮은 생산비용이 장점이다. 그러나 ZnO-baesd TFTs의 경우 일정한 bias 아래에서 threshold voltage가 이동하는 문제점이 displays의 소자로 적용하는데 매우 중요하고 문제점으로 여겨진다. 특히 gate insulator와 channel layer사이의 interface에서의 defect에 의한 charge trapping이 이러한 문제점들을 야기한다고 보고되어진다. 본 연구에서는 Zinc Oxide 기반의 박막 트랜지스터를 DC magnetron sputtering을 이용하여 상온에서 제작을 하였다. 또한, $Si_3N_4$ 기판 위에 electron cyclotron resonance (ECR) $O_2$ plasma 처리와 plasma-enhanced chemical vapor deposition (PECVD)를 통하여 $SiO_2$ 를 10nm 증착을 하여 interface의 개선을 시도하였다. 그리고 TFTs 소자의 출력 특성 및 전이 특성을 평가를 하였고, 소자의 field effect mobility의 값이 향상을 하였다. 또한 Temperature, Bias Temperature stability의 조건에서 안정성을 평가를 하였다. 이러한 interface treatment는 안정성의 향상을 시킴으로써 대면적 디스플레의 적용에 비정질 실리콘을 대체할 유력한 물질이라고 생각된다.

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