• Title/Summary/Keyword: Phase Shifting Technique

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Stress Analysis of a Curved Beam Plate by using Photoelastic Fringe Phase Shifing Technique (광탄성 프린지 위상 이동법을 이용한 곡선보평판의 응력 해석)

  • Baek, Tae-Hyeon;Kim, Myeong-Su;Kim, Su-Il
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.24 no.9 s.180
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    • pp.2313-2318
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    • 2000
  • The method of photoelasticity allows one to obtain principal stress differences and principal stress directions in a photoelastic model. In the classical approach, the photoelastic parameters are measured manually point by point. This is time consuming and requires skill in the identification and measurement of photoelastic data. Fringe phase shifting method has been recently developed and widely used to measure and analyze fringe data in photo-mechanics. This paper presents the test results of photoelastic fringe phase shifting method for the stress analysis of a curved beam plate. The technique used here requires four phase stepped photoelastic images obtained from a circular polariscope by rotating the analyzer at 0˚, 45˚, 90˚ and 135˚. Experimental results are compared with those of ANSYS and calculated by the simple beam theory. Good agreement among the results can be observed.

2-step Phase-shifting Digital Holographic Optical Encryption and Error Analysis

  • Jeon, Seok-Hee;Gil, Sang-Keun
    • Journal of the Optical Society of Korea
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    • v.15 no.3
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    • pp.244-251
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    • 2011
  • We propose a new 2-step phase-shifting digital holographic optical encryption technique and analyze tolerance error for this cipher system. 2-step phase-shifting digital holograms are acquired by moving the PZT mirror with phase step of 0 or ${\pi}$/2 in the reference beam path of the Mach-Zehnder type interferometer. Digital hologram with the encrypted information is Fourier transform hologram and is recorded on CCD camera with 256 gray-level quantized intensities. The decryption performance of binary bit data and image data is analyzed by considering error factors. One of the most important errors is quantization error in detecting the digital hologram intensity on CCD. The more the number of quantization error pixels and the variation of gray-level increase, the more the number of error bits increases for decryption. Computer experiments show the results to be carried out encryption and decryption with the proposed method and the graph to analyze the tolerance of the quantization error in the system.

3-D Surface Profile Measurement Using An Acousto-optic Tunable Filter Based Spectral Phase Shifting Technique

  • Kim, Dae-Suk;Cho, Yong-Jai
    • Journal of the Optical Society of Korea
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    • v.12 no.4
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    • pp.281-287
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    • 2008
  • An acousto-optic tunable filter based 3-D micro surface profile measurement using an equally spaced 5 spectral phase shifting is described. The 5-bucket spectral phase shifting method is compared with a Fourier-transform method in the spectral domain. It can provide a fast measurement capability while maintaining high accuracy since it needs only 5 pieces of spectrally phase shifted imaging data and a simple calculation in comparison with the Fourier transform method that requires full wavelength scanning data and relatively complicated computation. The 3-D profile data of micro objects can be obtained in a few seconds with an accuracy of ${\sim}10nm$. The 3-D profile method also has an inherent benefit in terms of being speckle-free in measuring diffuse micro objects by employing an incoherent light source. Those simplicity and practical applicability is expected to have diverse applications in 3-D micro profilometry such as semiconductors and micro-biology.

Quantitative Interpretation of Holographic Fringe by Using Phase Shifting Method and Digital Image Processing (위상변이법과 디지탈 영상처리를 이용한 홀로그래피 간섭무늬의 정량적 해석)

  • 고영욱;권영하;강대임;박승옥
    • Transactions of the Korean Society of Mechanical Engineers
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    • v.16 no.9
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    • pp.1728-1735
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    • 1992
  • Holographic interferometry technique has been used for the measurement of whole-field deformation with high sensitivity. However there are some difficulties in quantitatively analyzing the holographic fringes. Recently, quantitative and automatic fringe analysis by using phase shifting method in interferometry has been studied in many fields. In this paper, a real time holographic interferometry system and a phase shifting method combined with digital image processing technique are employed to record and quantitatively analyze holographic fringe patterns. To evaluate our system and analyze errors, comparison of measured deformation with theoretical deformation of cantilever beam was carried out. The accuracy of 4.5% in our system was verified We have tried to apply this method to quantitatively measure the deformation of turbine blade under the bending force.

Application of DMD for Phase Shifting in Moire Topology (DMD를 이용한 위상천이 모아레 3차원 형상 측정)

  • Jeong, Kyung-Seok;Jung, Yong-Sang
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.12 no.6
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    • pp.2457-2462
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    • 2011
  • The need for rapid and accurate measurement of 3-dimensional objects is increasing due to the paradigmatic shift in manufacturing from mass production to small batch production. A three dimensional measurement technique which can provide the dimensional information of the object manufactured or to be manufactured has been developed. This method is based on phase shifting moire topology. Digital-Micromirror-Device (DMD) has been used in generating phase shifting moire fringes. And the mechanically moving optical components used for phase shifting, which might result in measurement errors, have been replaced by the DMD. Inherent $2\pi$-ambiguity problem, occurring in the calculation of phase from the light intensity distribution due to the nature of arctangent function, has been overcome by adapting the phase unwrapping method. The advantage of this technique is the easy change of the range and the resolution of the measurement by simply changing the computer generated grid pattern with the appropriate combination of projection lens of various focal length.

Phase error compensation for three-dimensional shape measurement based on a phase-shifting method (위상천이법을 이용한 삼차원 형상측정에서 위상오차 보정)

  • Park, Yoon-Chang;Ahn, Seong-Joon;Kang, Moon-Ho;Kwon, Young-Chul;Ahn, Seung-Joon
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.10 no.11
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    • pp.3023-3030
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    • 2009
  • In this paper, a prediction and compensation method for the error in the phase measured by using the proportionality between two wavelengths in the TW-PMP (Two-wavelength Phase Measuring Profilometry) is proposed and experimental results are shown to verify the usefulness of the proposed method. For sample object, firstly, a phase-shifting with a quite large number of steps is adopted in measurement, compared with the conventional phase-shifting method, secondly, a 3-3 step phase-shifting method is used to measure the same object which is applied to high-speed 3D shape measurement, and then, measured results from these two phase-shifting methods are compared to calculate measurement noises. From the experimental results applying the proposed compensation method to the measured beat phase and absolute phase, it has proven that noises are decreased by 90% and 17.2% for each case.

A New Algorithm for Determination of Reference Phases in Phase-Shifting Interferometry (위상변이간섭법에서 기준위상 결정을 위한 새로운 알고리즘 개발)

  • 한건수
    • Korean Journal of Optics and Photonics
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    • v.4 no.4
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    • pp.397-402
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    • 1993
  • This paper presents a new computational algorithm of phase-shifting interferometry which can effectively eliminate the uncertainty errors of the reference phases encountered in obtaining multiple interferograms. The algorithm treats the reference phases as additional unknowns and determines their exact values by analyzing interferograms using numerical least square technique. A series of simulations prove that this algorithm can improve measuring accuracy being unaffected by the nonlinear and random errors of phase-shifters.

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A Study on the Determination of Displacement by Applied Laser Measurement (레이저응용계측에 의한 변위 정량화에 관한 연구)

  • 김경석;홍진후;강기수;최지은
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2000.11a
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    • pp.93-96
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    • 2000
  • This study discusses a non-contact optical technique, phase shifting electronic speckle pattern interferometry, that is well suited for a deformation measurement. However, the phase shifting method has difficulties for determinating a deformation quantitatively beacuse of the characteristics of arctan function. In order to solve this problem, phase unwrapping methods has been studied during the last few years. In this study, using phase unwrapping based on line by line scanning phase shifted fringe patterns are studied to determinate a deformation quantitatively. Also least square fitting method is applied to reduce noise and improve image resolution.

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Polarization Phase-shifting Technique for the Determination of a Transparent Thin Film's Thickness Using a Modified Sagnac Interferometer

  • Kaewon, Rapeepan;Pawong, Chutchai;Chitaree, Ratchapak;Bhatranand, Apichai
    • Current Optics and Photonics
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    • v.2 no.5
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    • pp.474-481
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    • 2018
  • We propose a polarization phase-shifting technique to investigate the thickness of $Ta_2O_5$ thin films deposited on BK7 substrates, using a modified Sagnac interferometer. Incident light is split by a polarizing beam splitter into two orthogonal linearly polarized beams traveling in opposite directions, and a quarter-wave plate is inserted into the common path to create an unbalanced phase condition. The linearly polarized light beams are transformed into two circularly polarized beams by transmission through a quarter-wave plate placed at the output of the interferometer. The proposed setup, therefore, yields rotating polarized light that can be used to extract a relative phase via the self-reference system. A thin-film sample inserted into the cyclic path modifies the output signal, in terms of the phase retardation. This technique utilizes three phase-shifted intensities to evaluate the phase retardation via simple signal processing, without manual adjustment of the output polarizer, which subsequently allows the thin film's thickness to be determined. Experimental results show that the thicknesses obtained from the proposed setup are in good agreement with those acquired by a field-emission scanning electron microscope and a spectroscopic ellipsometer. Thus, the proposed interferometric arrangement can be utilized reliably for non-contact thickness measurements of transparent thin films and characterization of optical devices.

Digital Holographic microscopy based on phase shifting technique (위상천이가법에 의한 디지털 홀로그래피 마이크로스코피에 관한 연구)

  • Park, Kwang-Hee;Chai, Pyung-Seak;Eun, Jae-Jeang
    • Journal of the Institute of Convergence Signal Processing
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    • v.12 no.3
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    • pp.181-187
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    • 2011
  • In this thesis, digital in-line holographic microscopy has been implemented with enhanced phase shifting technique. It was demonstrated that the zero-order diffraction noise and the twin image can be eliminated by phase-shifting interferometry very effectively. Also the experimental and numerical reconstruction has been incorporated into one set-up operating in real time. Experimental results and the analysis of the phase map indicate that the proposed system can be very useful for the measurement of microscopic objects and 3-D microscopy.