• 한국전기전자재료학회논문지
• /
• 제14권9호
• /
• pp.762-767
• /
• 2001

We report the white light emission from the multilayer organic electroluminescent(EL) device using exciplex emission. The exciplex at 500nm originated between poly(N-vinylcarvazole)(PVK) and 2,5-bis(5'-tert-butyl-2-benzoxazoly)thiophene(BBOT) and exciplex of 50nm originated from N,N'-diphenyl-N,N'-(3-methyphenyl)-1,1'-biphenyl-4,4'-diamine(TPD) and BBOT were observed. Also, the energy transfer from PVK to BBOT and poly(3-hexylthiophene)(P3HT) in mixed emitting materials was occurred. The electroluminescence(EL) spectra of organic EL device which have a device structure of ITO/CuPc(5nm)/emitting layer(100nm)/BBOT(30nm)/LiF(1.4nm)/Al(200nm) were slightly changed as a function of the applied voltage. The luminance fo 12.3 ${\mu}$W/$\textrm{cm}^2$ was achieved at 20V and EL spectrum measured at 20V corresponds to Commission Internationale de L\`Eclairage(CIE) coordinates of x=0.29 and y=0.353.

• 한국공작기계학회논문집
• /
• 제11권6호
• /
• pp.111-117
• /
• 2002

The high quality and a nearly stoichometric growth of $Cd_{1-y} Zn_y$/Te(y＝0.04) epilayers have been successfully grown on GaAs substrate by hot wall epitaxy (HWE) by optimizing the growth condition including the preheating treatment and Cd reservoir temperature. The relationship between quality and thickness was examined and best value of FWHM from X-ray rocking curve of 121 arcsec are obtained. Also, emission peaks related to the recombination of free excitons such as the ground state and the first excited state were observed in the PL spectrum at 4.2K. The ($A^0$, X) emission related to Cd vacancy and deep level emission was not measured. These results indicated that the grown CZT/GaAs epilayer was high qualify and purity.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2006년도 하계학술대회 논문집 Vol.7
• /
• pp.184-185
• /
• 2006

Two-step growth to incorporate the Mg atoms in the ZnO nanorods fabricate by thermal evaporation process and also utilized the ZnO film as a template. In the first step of low temperature, Zn seed metals with low melting temperature formed the droplet, and then MgZnO ternary nanorods were grown by injecting oxygen and evaporating Mg atoms in high temperature process of the second step. The vertical growth of the MgZnO nanorods with large-area distribution and uniformity was successfully performed on the ZnO template. We investigated the shape of the vertically grown 1-D MgZnO nanorods and characterized the optical and crystal properties. We confirmed the incorporation of Mg atoms by the EDS and PL spectrum.

• Macromolecular Research
• /
• 제17권5호
• /
• pp.319-324
• /
• 2009

A new $\pi$-conjugated polymer, poly[(2-methoxy-(5-(2-(4-oxyphenyl)-5-phenyl-1,3,4-oxadiazole)-hexyloxy))-1,4-pheny1ene-1,2-etheny1ene-alt-(10-hexyl-3,7-phenothiazine )-1,2-ethenylene] (PTOXDPPV), was synthesized by the Heck coupling reaction. The electron transporting unit, conjugated 1,3,4-oxadiazo1e (OXD), is attached on the main chain via linear 1,6-hexamethylenedioxy chain. The band gap and photoluminescence (PL) maximum of PTOXDPPV are 2.35 eV and 565 nm, respectively. These values are very close to those of po1y[(2,5-didecyloxy-1,4-phenylene-1,2-etheny1ene )-alt-(l0-hexyl-3,7-phenothiazine)-1,2-ethenylene] (PTPPV), which does not have OXD pendant. The estimated HOMO energy level of PTOXDPPV was -4.98 eV, which is very close to that of PTPPV (-4.91 eV). The maximum wavelength of EL device based on PTOXDPPV and PTPPV appeared at 587 and 577 nm, respectively. In the PL and EL spectrum, the emission from OXD pendant was not observed. This indicates that the energy transfer from OXD pendants to main chain is occurred completely. The EL device based on PTOXD-PPV (ITO/PEDOT/PTOXDPPV/AI) has an efficiency of 0.033 cd/A, which is significantly higher than the device based on PTPPV (ITO/PEDOT/PTPPV/AI) ($4.28{\times}10^{-3}\;cd/A$). From the results, we confirm that the OXD pendants in PTOXDPPV facilitate hole-electron recombination processes in the emissive layer effectively.

• 한국재료학회지
• /
• 제8권7호
• /
• pp.591-595
• /
• 1998

이 연구에서는 HVPE법으로 두께가 350$\mu\textrm{m}$, 면적이 100$\textrm{mm}^2$인 크랙이 없는 freestanding GaN 단결정 기판을 제작하고, 그 특성을 조사하였다. 제작된 GaN 기판의 격자상수는 $c_{o}$ =5.18486$\AA$이었고, 이중 X-선 회절피크의 반치폭은 650 arcsec 이었다. 10K의 온도에서 측정한 PL 스펙트럼은 에너지 밴드 갭 부근에서 중성 도너와 중성 억셉터에 구속된 여기자 및 자유여기자의 소멸에 의한 발광과 결정 결함고 관계하는 깊은 준위에 의한 1.8eV 부근 발광으로 구성되었다. 또한 라만 E2(high)모드 주파수는 567cm-1로서 벌크 GaN 단결정의 값과 같았다. 한편, GaN 기판의 전기저항도형은 n형이었고, 전기 비저항은 0.02$\Omega$.cm이었으며, 캐리어 이동도와 농도는 각각 283$\textrm{cm}^2$/V.s와 1.1$\times$$10^{18}$$cm^{-3}$이었다.

• 한국결정성장학회지
• /
• 제11권4호
• /
• pp.180-183
• /
• 2001

Developed Edge-defined film-fed growth (EFG)법으로 $YVO_{4}$ 및 Nd:$YVO_{4}$ 단결정을 성장하였으며 성장된 결정의 광학적 특성을 측정하였다. $YVO_{4}$ 및 Nd:$YVO_{4}$ 단결정 모두 투명하였으며, 결정성장 동안 융액 표면 온도의 균질 및 meniscus의 안정화로 고품질의 결정을 얻을 수 있었다. 투과 및 흡수 스펙트럼 측정 결과에서 $YVO_{4}$ 단결정은 340 nm에서 1000 nm까지 대체로 넓은 영역에서 높은 투과율이 나타났지만, Nd:$YVO_{4}$ 단결정은 532, 593, 753, 807, 888 nm의 특정한 영역에서 흡수 peak들이 나타남을 획인할 수 있었다. 또한 Photoluminescence (PL) 스펙트럼을 측정한 결과, 800~900 nm의 영역에서 에너지 방출을 관찰할 수 있었다.

• 한국결정성장학회지
• /
• 제6권2호
• /
• pp.220-228
• /
• 1996

두 개의 siliconit 발열체를 써서 이단 전기로를 제작하여 수직 Bridgman법으로 CdTe 단결정을 성장시켰다. 상단전기로의 최고온부를 $1150^{\circ}C$로 고정시키고 하단전기로를 $800^{\circ}C$로 하였을 때, $22.51150^{\circ}C$/cm의 온도 기울기를 얻었다. 성장된 시료의 X$.$선 회절 실험으로부터 얻은 격자상수 $a_0$는 6.482$\AA$이었고, 실온에서 광흡수 측정으로부터 얻은 밴드갭 에너지는 1.478eV이었다. 광발광(PL) 실험으로부터, 구속된 엑시톤 방출 피크가 각각 ($A^0$, X) (1.5902, 1.5887ev), (h,$D^o$) (1.5918 eV) 그리고 ($D^o$, X) (1.5928, 1.5932 eV)의 방출 피크로 분리되는 것을 확인할 수 있었으며, 중성주개와 중성받개의 결합에너지와 이온화에너지를 계산하였다.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2004년도 추계학술대회 논문집 Vol.17
• /
• pp.230-233
• /
• 2004

The stochiometric mix of evaporating materials for the $CuInS_2$ single crystal thin films was prepared from horizontal furnance. Using extrapolation method of X-ray diffraction patterns for the $CuInS_2$ polycrystal, it was found tetragonal structure whose lattice constant $a_0$ and $c_0$ were $5.524\;{\AA}$ and $11.142\;{\AA}$, respectively. To obtain the single crystal thin films, $CuInS_2$ mixed crystal was deposited on throughly etched semi-insulator GaAs(100) substrate by the hot wall epitaxy (HWE) system. The source and substrate temperature were 640 t and 430 t, respectively and the thickness of the single crystal thin films was $2{\mu}m$. Hall effect on this sample was measured by the method of van dot Pauw and studied on carrier density and temperature dependence of mobility. The carrier density and mobility deduced from Hall data are $9.64{\times}10^{22}/m^3,\;2.95{\times}10^{-2}\;m^2/V{\cdot}s$ at 293 K, respectively The optical energy gaps were found to be 1.53 eV at room temperature. From the photocurrent spectrum by illumination of perpendicular light on the c - axis of the thin film, we have found that the values of spin orbit coupling splitting ${\Delta}So$ and the crystal field splitting ${\Delta}Cr$ were 0.0211 eV and 0.0045 eV at 10 K, respectively. From PL peaks measured at 10K, 807.7nm (1.5350ev) mean Ex peak of the free exciton emission, also 810.3nm (1.5301eV) expresses $I_2$ peak of donor-bound exciton emission and 815.6nm (1.5201eV) emerges $I_1$ peak of acceptor-bound exciton emission. In addition, the peak observed at 862.0nm (1.4383eV) was analyzed to be PL peak due to donor-acceptor pair(DAP).

• 한국재료학회지
• /
• 제8권3호
• /
• pp.229-237
• /
• 1998

열적으로 이온화된 N과 증기상태의 Ga을 $300~730^{\circ}C$의 온도 범위에서 직접 반응시켜 (001)Si과 (00.1)사파이어 기판 위에 GaN박막의 성장 초기 단계에서는 GaN의 성장률이 증가한 후, 결정 핵을 중심으로 수평방향으로서 성장과 합체에 의하여 성장률의 변화가 일정 값에 달하였다. 이 연구에서 성장한 GaN박막에 대한 XPS분석 결과 낮은 온도에서 성장된 GaN박막은 진공 chamber 내의 산소가 성장된 박막 내에 많이 혼입 되어 있음을 알 수 있었다. 낮은 온도, 짧은 시간 동안 성장된 표면은 Ga덩어리들도 도포 되었다. 그러나, 기판온도와 성장시간이 증가함에 따라 이들은 피라미드 형태의 결정들로 성장된 후 원형고리 형태의 결정으로 합체되었다. 특히 N-소스의 공급이 충분한 경우에는 판상의 결정으로 성장되었다. 20K의 온도에서 측정된 PL스펙트럼에서는 3.32eV와 3.38eV에서 불순물과 관련된 발광이 관찰되었다.

• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
• /
• pp.420-420
• /
• 2012

ZnO seed layer were deposited on quartz substrate by sol-gel method and prism-like Al-doped ZnO nanorods (AZO nanorods) were grown on ZnO seed layer by hydrothermal method with various Al concentration ranging from 0 to 2.0 at.%. Structural and optical properties of the AZO nanorods were investigated by field-emission scanning electron microscopy (FE-SEM), X-ray diffraction (XRD), photoluminescence (PL). The diameter of the AZO nanorods was smaller than undoped ZnO nanorods and its diameter of the AZO nanorods decreased with increasing Al concentration. In XRD spectrum, it was observed that stress and full width at half maximum (FWHM) of the AZO nanorods decreased and the 'c' lattice constant increased as the Al concentration increased. From undoped ZnO nanorods, it was observed that the green-red emission peak of deep-level emission (DLE) in PL spectra. However, after Al doping, not only a broad green emission peak but also a blue emission peak of DLE were observed.