• Proceedings of the Materials Research Society of Korea Conference
• /
• 2012.05a
• /
• pp.93.2-93.2
• /
• 2012

연료전지는 전기화학반응을 이용한 발전 장치로서 기존 장치에 비하여 발전 효율이 높아 화석연료를 사용하면서 현재 당면 과제인 $CO_2$ 배출량 절감이 가능하고, 환경 보전성이 우수하여 미래의 전원으로 많은 연구개발이 진행되고 있다. 특히 제3세대 연료전지라 불리는 고체산화물 연료전지(Solid Oxide Fuel Cell이하 SOFC)는 고가의 외부 개질 장치 없이도 연료가 갖는 화학에너지를 연소과정 없이, 공기와 $H_2$, CO, $CH_4$와 같은 환원성 가스를 공급받아 $600{\sim}1000^{\circ}C$에서 전기화학적 반응을 통하여 직접 전기를 얻는 방식이며, 낮은 소음과 진동으로 인하여 온 사이트(On-site) 발전이 가능한 장점이 있는 연료전지이다. Decalcomanie는 전사용지에 Screen printing하여 건조 후 coating하는 방법으로 기존의 여러 coating 방법보다 다전지셀 제작이나 Buffer layer의 적용이 용이하고, 소재의 크기나 두께조절이 간편하며, 구성층의 표면조도나 굴곡에 대응이 용이한 방법이다. 새로운 Decalcomanie를 사용하여 평관형 다전지식 SOFC Cell 제작 및 각 Buffer layer에 적용, Screen printing법과 동일한 Cell 제조 후 MPD와 Impedance 분석을 통하여 Support 위에 전사지를 이용, 적층한 Cell의 전기화학적 특성에 관하여 분석하였다.

• Korean Journal of Materials Research
• /
• v.27 no.8
• /
• pp.403-408
• /
• 2017

We investigated the effect of ZnO buffer layer on the formation of ZnO thin film by ultrasonic assisted spray pyrolysis deposition. ZnO buffer layer was formed by wet solution method, which was repeated several times. Structural and optical properties of the ZnO thin films deposited on the ZnO buffer layers with various cycles and at various temperatures were investigated by field-emission scanning electron microscopy, X-ray diffraction, and photoluminescence spectrum analysis. The structural investigations showed that three-dimensional island shaped ZnO was formed on the bare Si substrate without buffer layers, while two-dimensional ZnO thin film was deposited on the ZnO buffer layers. In addition, structural and optical investigations showed that the crystalline quality of ZnO thin film was improved by introducing the buffer layers. This improvement was attributed to the modulation of the surface energy of the Si surface by the ZnO buffer layer, which finally resulted in a modification of the growth mode from three to two-dimensional.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2008.06a
• /
• pp.297-297
• /
• 2008

Buffer layers play an important role in the development of high critical current density coated conductor. $LaMnO_3$, $SrTiO_3$ and $BaZrO_3$ buffer layers were compatible with MgO surfaces and also provide a good template for growing high current density REBCO(RE=Rare earth) films. Systematic studies on the influences of pulsed laser deposition parameters (deposition temperature, deposition pressure, processing gas, laser energy density, etc.) on microstructure and texture properties of $LaMnO_3$, $SrTiO_3$ and $BaZrO_3$ films as buffer layer deposited on ion-beam assisted deposition MgO (IBAD_MgO) template by pulse laser deposition method, were carried out. These results will be presented together with the discussion on the possible use of this material in HTS coated conductor as buffer.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2013.08a
• /
• pp.203.1-203.1
• /
• 2013

Zinc oxide (ZnO) nanocrystalline thin films on various growth temperatures for active layer and different buffer layer thickness were grown by plasma-assisted molecular beam epitaxy (PA-MBE) on Si substrates. The ZnO active layer were grown with various growth temperature from 500 to $800^{\circ}C$ and the ZnO buffer layer were grown for different time from 5 to 40 minutes. To investigate the structural and optical properties of the ZnO thin films, scanning electron microscope (SEM), X-ray diffractometer (XRD), and photoluminescence (PL) spectroscopy were used, respectively. In the SEM images, the ZnO thin films have high densification of grains and good roughness and uniformity at $800^{\circ}C$ for active layer growth temperature and 20 minutes for buffer layer growth time, respectively. The PL spectra of ZnO buffer layers and active layers display sharp near band edge (NBE) emissions in UV range and broad deep level emissions (DLE) in visible range. The intensity of NBE peaks for the ZnO thin films significantly increase with increase in the active layer growth temperature. In addition, the NBE peak at 20 minutes for buffer layer growth time has the largest emission intensity and the intensity of DLE peaks decrease with increase in the growth time.

• Proceedings of the Korean Institute of Surface Engineering Conference
• /
• 2015.11a
• /
• pp.306-307
• /
• 2015

유기태양전지의 대표적 Hole Transporting Layer(HTL)로는 전도성 고분자인 PEDOT:PSS이다. PEDOT:PSS는 약산성의 물질로 전극을 부식시켜 디바이스의 효율을 감소시키기 때문에 PEDOT:PSS를 대체하기 위한 Buffer층에 대한 연구가 활발히 진행되어지고 있다. PEDOT:PSS를 대체할 수 있는 Nickel Oxide(NiO) Buffer 층은 wide band-gab으로 Hole Transporting Layer와 Electron Blocking Layer 역할을 동시에 하여 디바이스의 효율을 향상시킬 수 있으며, 디바이스의 수명을 향상시킬 수 있다는 장점이 있다. NiO는 용액공정과 Sputter 증착 방법으로 형성할 수 있는데, 용액공정은 고온공정이 요구되어지고 Sputter 증착방법은 산화되기 쉬운 전극위에서는 전극의 손상을 발생한다. 본 연구에서는 이러한 단점을 해결하기 위해서 Ni을 Magnetron Sputter로 증착한 후 Ion Beam 처리를 통해 산화시켜 NiO 층을 형성하는 방법을 연구하였다. 본 연구에서 제안한 NiO형성 방법으로 유기태양전지를 제작하여 PEDOT:PSS를 Buffer층으로 사용한 태양전지와 Voc가 0.72 V로 유사하게 나와 NiO가 Buffer층으로 잘 형성된 것을 확인하였다.

• Corrosion Science and Technology
• /
• v.2 no.5
• /
• pp.212-218
• /
• 2003

Electronic properties of passive films formed on Ti at film formation potentials $(E_f)V_{SCE}$ in pH 8.5 buffer solution and in an artificial seawater were examined through the photocurrent measurement and Mott-Schottky analysis. The passive films formed on Ti in pH 8.5 buffer solution exhibited a n-type semiconductor with a band gap energys $(E_g);E_g^{n=2}=3.4$ eV for nondirect electron transition, and $E_g^{n=0.5}=3.7$ eV for direct electron transition. These band gap values were almost same as those for the passive films formed in artificial seawater, indicating that chloride ion ($Cl^-$ in solution did not affect the electronic structure of the passive film on Ti. $E_g$ for passive films formed on Ti were found to be greater than those ($E_g^{n=0.5}=3.1$ eV, $E_g^{n=2}=3.4$) for a thermal oxide film formed on Ti in air at $400^{\circ}C$. The disorder energy of passive film, determined from the absorption tail of photocurrent spectrum, was much greater than that for the thermal oxide film farmed on Ti in air at $400^{\circ}C$. The greater $E_g$ and the higher disorder energy for the passive film compared with those for the thermal oxide fIlm suggest that the passive film on Ti exhibited more disorded structure than the thermal oxide film. The donor density (about $2.4{\times}10^{20}cm^{-3}$) for the passive film formed in artificial seawater was greater than that (about $20{\times}10^{20}cm^{-3}$) formed in pH 8.5 buffer solution, indicating that $Cl^-$ increased the donor density for the passive film on Ti.

• Korean Journal of Metals and Materials
• /
• v.49 no.10
• /
• pp.811-817
• /
• 2011

In this study, we have investigated the role of a metal oxide hole injection layer (HIL) between an Indium Tin Oxide (ITO) electrode and an organic hole transporting layer (HTL) in organic light emitting diodes (OLEDs). Nickel Oxide films were deposited at different deposition times of 0 to 60 seconds, thus leading to a thickness from 0 to 15 nm on ITO/glass substrates. To study the influence of NiO film thickness on the properties of OLEDs, the relationships between NiO/ITO morphology and surface properties have been studied by UV-visible spectroscopy measurements and AFM microscopy. The dependences of the I-V-L properties on the thickness of the NiO layers were examined. Comparing these with devices without an NiO buffer layer, turn-on voltage and luminance have been obviously improved by using the NiO buffer layer with a thickness smaller than 10 nm in OLEDs. Moreover, the efficiency of the device ITO/NiO (< 5 nm)/NPB/$Alq_3$/ LiF/Al has increased two times at the same operation voltage (8V). Insertion of a thin NiO layer between the ITO and HTL enhances the hole injection, which can increase the device efficiency and decrease the turn-on voltage, while also decreasing the interface roughness.

• Journal of the Korean Chemical Society
• /
• v.53 no.4
• /
• pp.466-470
• /
• 2009

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2007.06a
• /
• pp.240-241
• /
• 2007

In general, high temperature superconducting coated conductors have intermediary buffers layer consisting of seed, diffusion barrier and cap layers. Simplification of the oxide materials buffer architecture in the fabrication of high temperature superconducting coated conductors is required because the deposition of multi-layers buffer architecture leads to a longer manufacturing time and a higher cost process of coated conductors. Thus, single buffer layer deposition seems to be important for practical coated conductor manufacturing process. In this study, a single gradient layered buffer deposition process of YZO for low cost coated conductors has been tried using DC reactive sputtering technique. About several thick YZO gradient single buffer layers deposited by DC co-sputtering process were found to act as a diffusion layer.

• Journal of the Korean Ceramic Society
• /
• v.52 no.3
• /
• pp.224-227
• /
• 2015

In this work, the properties of Indium-Zinc-Tin-Oxide (IZTO) thin films, deposited on polyethylene naphthalate (PEN) with a $SiO_2$ buffer layer, were analyzed with different working pressures. After depositing the $SiO_2$ buffer layer on PEN substrates by plasma-enhanced chemical vapor deposition (PECVD), the IZTO thin films were deposited by RF magnetron sputtering with 1 to 7-mTorr working pressure. All the IZTO thin films show an amorphous structure, regardless of the working pressure. The best morphological, electrical, and optical properties are obtained at 3-mTorr working pressure, with a surface roughness of 2.112-nm, a sheet resistance of $8.87-{\Omega}/sq$, and a transmittance at 550-nm of 88.44%. These results indicate that IZTO thin films deposited on PEN have outstanding electrical and optical properties, and the PEN plastic substrate is a suitable material for display devices.