• 제목/요약/키워드: Organic vapor

검색결과 760건 처리시간 0.029초

바이오필터 기술의 원리와 적용에 관한 고찰 (Principle and Application of Biofiltration)

  • 남궁완;박준석;이노섭
    • 유기물자원화
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    • 제8권1호
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    • pp.60-68
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    • 2000
  • 바이오필터 기술은 수백 ppmC의 저농도 배가스를 처리하는 데에 있어 효과적이며, 비용이 저렴하고 환경적으로 건전한 처리방법이다. 적용범위로는 폐수처리장, 퇴비화시설, 음식물가공공장에서 발생되는 악취를 비롯하여 매립지가스 및 토양증기추출(SVE, soil vapor extraction)시 발생되는 휘발성 배가스의 처리등이 있다. 바이오필터 기술을 효과적으로 적용하기 위해서는 문헌연구를 꼼꼼하게 실시 한 후 실험실규모, 파일롯트규모, 그리고 현장규모로 점차 확대하여 실시하는 것이 바람직하다. 본고에서는 바이오필터 기술의 원리, 설계인자, 운전조건, 적용사례, 그리고 경제성 평가를 중심으로 고찰하였다.

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Flexible Plastic ITO Substrates for OLED using Vapor-Polymerized Parylene C

  • Lee, Kyu-Chul;Choi, Soo-Hyun;Cho, Sung-M;Choi, Kang-Yong;Lee, Jung-Kyu
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2004년도 Asia Display / IMID 04
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    • pp.973-974
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    • 2004
  • We report the fabrication of flexible plastic ITO substrates and the measurement of oxidant permeation through the substrates. The plastic ITO substrates are composed of multiple organic and inorganic thin films. The organic thin films are deposited by vapor polymerization and the inorganic films are deposited by ion beam sputtering. In order to estimate the oxidant permeation rate, the pure Ca film is formed on the substrates and the amount of CaO produced by the oxidation of Ca is measured.

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Process Controllability and Stability in Organic Vapor Phase Deposition

  • Schwambera, M.;Gersdorff, M.;Reinhold, M.;Meyer, N.;Strauch, G.;Marheineke, B.;Heuken, M.;Zhou, T.X.;Ngo, T.;Brown, J.J.;Shtein, M.;Forrest, S.R.
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2004년도 Asia Display / IMID 04
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    • pp.824-827
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    • 2004
  • High performance green $Ir(ppy)_3$-based phosphorescent OLEDs (PHOLEDs) have been fabricated by organic vapor phase deposition ($OVPD^{TM}$). In addition to demonstrating both efficiency and operational device lifetime comparable to devices built by vacuum thermal evaporation, we report on the controllability and stability of the $OVPD^{TM}$ process. Specifically, run-to-run and day-to-day deposition rate reproducibility of better than 2 % for three consecutive days is demonstrated.

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Investigation on HT-AlN Nucleation Layers and AlGaN Epifilms Inserting LT-AlN Nucleation Layer on C-Plane Sapphire Substrate

  • Wang, Dang-Hui;Xu, Tian-Han
    • Journal of the Optical Society of Korea
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    • 제20권1호
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    • pp.125-129
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    • 2016
  • In this study, we have investigated a high-temperature AlN nucleation layer and AlGaN epilayers on c-plane sapphire substrate by low-pressure metal-organic chemical vapor deposition (LP-MOCVD). High resolution X-ray diffraction (HRXRD), atomic force microscopy (AFM), scanning electron microscope (SEM) and Raman scattering measurements have been exploited to study the crystal quality, surface morphology, and residual strain of the HT-AlN nucleation layer. These analyses reveal that the insertion of an LT-AlN nucleation layer can improve the crystal quality, smooth the surface morphology of the HT-AlN nucleation layer and further reduce the threading dislocation density of AlGaN epifilms. The mechanism of inserting an LT-AlN nucleation layer to enhance the optical properties of HT-AlN nucleation layer and AlGaN epifilm are discussed from the viewpoint of driving force of reaction in this paper.

In-situ SiN 박막을 이용하여 성장한 GaN 박막의 특성 연구 (A Study of Properties of GaN grown using In-situ SiN Mask by MOCVD)

  • 김덕규;박춘배
    • 한국전기전자재료학회논문지
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    • 제18권6호
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    • pp.582-586
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    • 2005
  • We have grown GaN layers with in-situ SiN mask by metal organic chemical vapor deposition (MOCVD) and study the physical properties of the GaN layer. We have also investigate the effect of the SiN mask on its optical property. By inserting a SiN mask, (102) the full width at half maximum (FWHM) decreased from 480 arcsec to 409 arcsec and threading dislocation (TD) density decreased from $3.21\times10^9\;cm^{-2}\;to\;9.7\times10^8\;cm^{-2}$. The PL intensity of GaN with SiN mask improved 2 times to that without SiN mask. We have thus shown that the SiN mask improved significantly the physical and optical properties of the GaN layer.

Textured Ni 기판 위에 YBCO coated conductor 모재용 NiO 완충층 제조 (Fabrication of NiO buffer film on textured Ni substrate for YBCO coated conductor)

  • Sun, Jong-Won;Kim, Hyoung-Seop;Jung, Choon-Ghwan;Lee, Hee-Gyoun
    • Progress in Superconductivity
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    • 제3권1호
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    • pp.125-129
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    • 2001
  • NiO buffer layers were deposited on texture Ni tapes fur YBCO coated conductors by MOCVD(metal organic chemical vapor deposition) method, using a single solution source. Variables were deposition temperature and flow rate of $0_2$carrier gas. At higher temperatures, The NiO(111) texture was well developed, but the NiO(200) texture was developed at low temperatures. The best result was obtained at the deposition temperature of$ 470^{\circ}C$ and the gas flow rate of 200 sccm. FWHM value of $\omega$-scan fur NiO(200) of the film and $\Phi$-scan for NiO(111) of the film was $4.2^{\circ}$ and $7^{\circ}$, respectively.

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플라즈마동합법에 의한 유기피막의 성장기정에 관한 연구 (A Study on Growth Mechanism of Organic Thin Films by the Plasma Polymerization)

  • 이덕철;한상옥;박구범
    • 대한전기학회논문지
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    • 제36권1호
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    • pp.29-35
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    • 1987
  • TPolystyrene thin films are prepared by glow discharge of sytrene monomer vapor th establish the growth mechanism of organic thin films by the plasma polymerization. As the discharge parameters, discharge current(5mA-20mA), frequency (10kHz-50kHz, 13.56MHz), gaspressure (0.2torr-1.5torr), and discharge time(2min-12min)are adopted. Plasma-polymerized filmsof styrene vapor are identified as polystyrene by IR spectra. The thickness of plasma-polymerized films increases with gas pressure, frequency and discharge current in the region of the low frequency and below the allowed gas pressure where the polymerization occurs. It is suggested that the growth mechanism can be explained by ionic reaction in d.c. and low frequency region, and by radical reaction in high frequency region.

Hot-wall MOCVD에 의한 $RuO_2$ 박막의 특성 (Characterization of $RuO_2$ Thin Films by Hot-wall Metal Organic Chemical Vapor Deposition)

  • 신웅철;윤순길
    • 한국세라믹학회지
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    • 제33권9호
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    • pp.969-976
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    • 1996
  • RuO2 thin films were deposited on SiO2(1000 $\AA$)/Si by hot-wall Metal Organic Chemical Vapor Depositon. The crystallinity of RuO2 thin films increased with increasing deposition temperature and the preferred orienta-tion of RuO2 films converted (200) plane to (101) plane with increasing film thicknesses. Such a change in preferred orientation was influenced on the crystallographic structure and the residual stress of RuO2 thin films. The resistivity of the 2700$\AA$-thick RuO2 thin films deposted at 30$0^{\circ}C$ was 52.7$\mu$$\Omega$-cm and they could be applicable to bottom electrodes of high dielectric materials. However the resistivity of RuO2 thin films increased with decreasing film thicknesses. The grain size and the resistivity of RuO2 thin films were densified with increasing the annealing temperature and showed the decrease of resistivity.

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Enhanced Control of OLED Deposition Processes by OVPD(R)

  • Schwambera, M.;Meyer, N.;Keiper, D.;Heuken, M.;Hartmann, S.;Kowalsky, W.;Farahzadi, A.;Niyamakom, P.;Beigmohamadi, M.;Wuttig, M.
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2007년도 7th International Meeting on Information Display 제7권1호
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    • pp.336-339
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    • 2007
  • The enhanced control of OLED deposition processes by Organic Vapor Phase Deposition $(OVPD^{(R)})$ is discussed. $OVPD^{(R)}$ opens a wide space of process control parameters. It allows the accurate and individual control of deposition layer properties like morphology and precise mixing of multi component layers (co-deposition) in comparison to conventional deposition manufacturing processes like e. g. VTE (vacuum thermal evaporation).

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Direct Liquid Injection Metal Organic Chemical Vapor Deposition of $HfO_2$ Thin Films Using $Hf(dimethylaminoethoxide)_4$.

  • 송문균;강상우;이시우
    • 한국반도체및디스플레이장비학회:학술대회논문집
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    • 한국반도체및디스플레이장비학회 2003년도 추계학술대회 발표 논문집
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    • pp.45-49
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    • 2003
  • 본 논문에서는 gate 산화막을 위한 Hf oxide 박막을 $Hf(dmae)_4$ (dmae=dimethylaminoethoxide) 전구체로 Direct Liquid Injection Metal Organic Chemical Vapor Deposition (DLI-MOCVD)방법을 이용하여 p-type Si(100) 기판 위에 증착하였다. 이 전구체를 이용하여 $150^{\circ}C$의 낮은 증착 온도에서도 낮은 carbon 농도와 roughness를 가지는 양질의 박막을 증착할 수 있었다. 증착된 박막은 비정질 구조를 나타내었지만 annealing 온도를 증가시킴에 따라서 결정성(monoclinic phase)을 나타내었다. $500{\AA}$으로 증착한 박막을 C-V 와 I-V curve를 통하여 전기적 특성을 평가하였다. 열처리 온도가 증가함에 따라 유효유전상수(k)는 증가하지만 열처리 온도가 $900^{\circ}C$ 이상이 되면 계면층의 형성에 의해 유효유전상수는 감소하게 되고 이에 따라 누설 전류도 감소하게 된다. 산소분위기 $800^{\circ}C$에서 annealing한 $HfO_2$ 박막의 유전상수는 20.1이고, 누설 전류 밀도는 SV에서 $2.2\times10^{-6}A/\textrm{cm}^2$ 로 좋은 전기적 특성을 가진다.

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