• Proceedings of the IEEK Conference
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• 2008.06a
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• pp.855-856
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• 2008

In this paper, we studied the performance evaluation of a vehicular rear-view camera through quantifying the image quality based on several objective criteria from the ISO (International Organization for Standardization). In addition, various experimental environments are defined considering the conditions under which a rear-view camera may need to operate. The process for evaluating the performance of a rear-view camera is composed of five objective criteria: noise test, resolution test, OECF (opto-electronic conversion function) test, color characterization test, and pincushion and barrel distortion tests. The proposed image quality quantification method then expresses the results of each test as a single value, allowing easy evaluation.

• ETRI Journal
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• v.24 no.5
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• pp.398-400
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• 2002

Using $Cr_2O_3$ thin film, we developed a novel etch-stop technique for the protection of silicon surface morphology during deep ion coupled plasma etching of silica layers. With this technique we were able to etch a silica trench with a depth of over 20 ${\mu}m$ without any damage to the exposed silicon terrace surface. This technique should be well applicable to fabricating silica planar lightwave circuit platforms for opto-electronic hybrid integration.

• Proceedings of the Optical Society of Korea Conference
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• 2000.02a
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• pp.224-225
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• 2000

Transparent and hard materials such as sapphire are used for many industrial applications as optical windows, hard materials on mechanical contact against abrasion, and substrate materials for opto-electronic semiconductor devices such as blue LED and blue LD etc. The materials should be cut along the proper shapes possible to be used for each application. In case of blue LED, the blue LED wafer should be cut to thousands of blue LED pieces at the final stage of the manufacturing process. The process of cutting the wafer is usually divided into two steps. The wafer is scribed along the proper shapes in the first step. It is inserted between transparent flexible sheets for easy handling. And then, it is broken and split in the next step. Harder materials such as diamonds are usually used to scribe the wafer, while it has a problem of low depth of scribing and abrasion of the harder material itself. The low depth of scribing can induce failure in breaking the wafer along the scribed line. It was also known that the expensive diamond tip should be replaced frequently for the abrasion. (omitted)

• Journal of the Optical Society of Korea
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• v.17 no.3
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• pp.237-241
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• 2013

This paper presents an efficient evolutionary method to optimize the gain ripple of multi-pumps photonic crystal fiber Raman amplifier using the Fuzzy Adaptive Modified PSO (FAMPSO) algorithm. The original PSO has difficulties in premature convergence, performance and the diversity loss in optimization as well as appropriate tuning of its parameters. The feasibility and effectiveness of the proposed hybrid algorithm is demonstrated and results are compared with the PSO algorithm. It is shown that FAMPSO has a high quality solution, superior convergence characteristics and shorter computation time.

• Proceedings of the Korean Society of Broadcast Engineers Conference
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• 2009.01a
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• pp.76-79
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• 2009

This paper investigates the performance of a vehicular rear-view camera through quantifying the image quality based on several objective criteria from the ISO (International Organization for Standardization). In addition, various experimental environments are defined considering the conditions under which a rear-view camera may need to operate. The process for evaluating the performance of a rear-view camera is composed of five objective criteria: noise test, resolution test, OECF (opto-electronic conversion function) test, color characterization test, and pincushion and barrel distortion tests. The proposed image quality quantification method then expresses the results of each test as a single value, allowing easy evaluation. In experiments, the performance evaluation results are analyzed and compared with those for a regular digital camera.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.08a
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• pp.206-206
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• 2010

1차원 나노 소재 중 ZnO 나노선은 우수한 전기적, 광학적 특성으로 최근 센서, 디스플레이등 다양한 정보전자 소자에 활용 가능성이 높아지고 있다. 현재 보고된 ZnO 나노선 소자는 주로 단일선이나 랜덤 네트워크 형태로 제작되어 소자의 공정성, 재현성 및 균일성 확보가 매우 중요한 이슈가 된다. 본 연구에서는 화학기상증착법으로 성장한 ZnO 나노선을 슬라이딩 트랜스퍼 공정을 통하여 원하는 기판에 정렬된 형태로 전이하여 전계방출소자 (field effect transistor) 어레이를 제작하고 그 특성을 분석하였다. 또한, p-형으로 도핑된 Si 기판을 패터닝하여 정렬된 ZnO 나노선과 pn-정션 소자를 제작하여 정류특성과 electroluminescence 특성을 분석, 설명하였다.

• Applied Science and Convergence Technology
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• v.23 no.6
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• pp.387-391
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• 2014

Self-assembled InAlAs/AlGaAs quantum dots (QDs) on GaAs substrates were grown by using modified molecular epitaxy beam in Stranski-Krastanov method. In order to study the structural and optical properties of InAlAs/AlGaAs QDs, atomic force microscopy (AFM) and photoluminescence (PL) measurements are conducted. The size and uniformity of QDs have been observed from the AFM images. The average widths and heights of QDs are increased as the deposition time increases. The PL spectra of QDs are composed of two peaks. The PL spectra of QDs were analyzed by the excitation laser power- and temperature-dependent PL, in which two PL peaks are attributed to two predominant sizes of QDs.

• Journal of the Korean institute of surface engineering
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• v.35 no.5
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• pp.289-294
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• 2002

ZnTe films have been grown on (100) GaAs substrate with two representative problems. The one is lattice mismatch, the other is thermal expansion coefficients mismatch of ZnTe /GaAs. It claims here, the relationship of film thickness and defects distribution with (100) ZnTe/GaAs using hot wall epitaxy (HWE) growth was investigated by transmission electron microscopy (TEM). It analyzed on the two-sort side using TEM with cross-sectional transmission electron microscopy (XTEM) and high-resolution electron microscopy (HREM). Investigation into the nature and behavior of dislocations with dependence-thickness in (100) ZnTe/ (100) GaAs hetero-structures grown by transmission electron microscopy (TEM). This defects range from interface to 0.7 $\mu\textrm{m}$ was high density, due to the large lattice mismatch and thermal expansion coefficients. The defects of low density was range 0.7$\mu\textrm{m}$~1.8$\mu\textrm{m}$. In the thicker range than 1.8$\mu\textrm{m}$ was measured hardly defects.

• Korean Journal of Optics and Photonics
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• v.3 no.4
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• pp.280-287
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• 1992

The nonlinear optical properties of semiconductors and semiconductor microstructures have been the subject of intense research, not only from a fundamental physics point of view, but also for their potential applications to future opto-electronic devices. In this paper, steady-state and time-resolved nonlinear optical spectroscopic techniques to investigate the microscopic world of semiconductor materials were briefly described.

• Proceedings of the KIEE Conference
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• 1998.07g
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• pp.2464-2466
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• 1998

A switch is a component with two or more ports that selectively transmits, redirects, or blocks optical power in a fiber transmission line. Our switch uses rotation mechanism using stepping motor, hence the common optical fiber can scan and allign to one of the arrayed N optical fibers to provide optical path by electronic precise control. The developed switch is consisted of switching module and its control module. The performance parameters of a switching loss and a repeatability are considered very important. We performed the study to reduce the switching loss and improve the repeatability of switch. The switch can be widely used as a test instrument of optical device and of optical cable in factory, also of optical cable monitoring systems.