• 제목/요약/키워드: Optical microscope

검색결과 1,392건 처리시간 0.027초

포토닉 밴드갭 광결정의 제작과 선형 및 비선형 광학 특성 연구 (Fabrication and Linear & Nonlinear Optical Characterization of Photonic Crystals)

  • Ha Na Yeong;U Yeon Gyeong;Hwang Ji-Su;Jang Hye-Jeong;Park Byeong-Ju;U Jeong-Won
    • 한국광학회:학술대회논문집
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    • 한국광학회 2002년도 하계학술발표회
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    • pp.162-163
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    • 2002
  • 1-D photonic band-gap structure is identified in a cholesteric liquid crystal system. The optical transmission spectrum is measured and compared with the theoretical analysis. Nonlinear transmission is measured near the band edge. Also 3-D photonic band-gap structures are fabricated from dielectric colloidal polystyrene beads through a centrifuge method. The fabricated photonic crystals exhibit opalescent colors under white light and show a clear diffraction peak dependent on the incident angle of the light beam. Also the scanning electron microscope image was taken to verify the face-centered cubic crystal structure. Bragg's law and Snell's law are employed to describe the position of angle resolved diffraction peaks. It was shown that the optically deduced effective refractive index and lattice constants were in good agreement with the crystal structure identified by scanning electron microscope.

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정밀 광학 부품의 복굴절 측정 방법에 관한 연구 (A Study on The Birefringence Measurement in Precision Optical Product)

  • 민인기;고영배;권창오;윤경환
    • Design & Manufacturing
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    • 제6권1호
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    • pp.90-94
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    • 2012
  • Recently, injection molding process became more popular than ever to produce large quantities of high precision products. Extensive studies have been conducted for reducing the residual stresses and birefringence in injection-molded optical products. Flow-induced and thermally-induced stresses and birefringence have been found as two main sources during injection molding process. Generally, quantitative value of birefringence can be measured with polarizing microscope using the compensator. However, it is difficult to measure low order retardation with microscope, so developing a measurement system for low order optical path difference is in need. In the present paper, a system using Photo Elastic Modulator (PEM) is demonstrated to measure low phase retardation in injection-molded products.

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Measurement Resolution of Edge Position in Digital Optical Imaging

  • Lee, Sang-Yoon;Kim, Seung-Woo
    • International Journal of Precision Engineering and Manufacturing
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    • 제1권1호
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    • pp.49-55
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    • 2000
  • The semiconductor industry relies on digital optical imaging for the overlay metrology of integrated circuit patterns. One critical performance demand in the particular application of digital imaging is placed on the edge resolution that is defined as the smallest detectable displacement of an edge from its image acquired in digital from. As the critical feature size of integrated circuit patterns reaches below 0.35 micrometers, the edge resolution is required to be less than 0.01 micrometers. This requirement is so stringent that fundamental behaviors of digital optical imaging need to be explored especially for the precision coordinate metrology. Our investigation reveals that the edge resolution shows quasi-random characteristics, not being simply deduced from relevant opto-electronic system parameters. Hence, a stochastic upper bound analysis is made to come up with the worst edge resolution that can statistically well predict actual indeterminate edge resolutions obtained with high magnification microscope objectives.

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A New Method for Measuring Refractive Index with a Laser Frequency-shifted Feedback Confocal Microscope

  • Zhou, Borui;Wang, Zihan;Shen, Xueju
    • Current Optics and Photonics
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    • 제4권1호
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    • pp.44-49
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    • 2020
  • In this paper, a new method is presented to measure the refractive index of single plain glass or multilayered materials, based on a laser frequency-shifted confocal feedback microscope. Combining the laser frequency-shifted feedback technique and the confocal effect, the method can attain high axial-positioning accuracy, stability and sensitivity. Measurements of different samples are given, including N-BK7 glass, Silica plain glass, and a microfluidic chip with four layers. The results for N-BK7 glass and Silica plain glass show that the measurement uncertainty in the refractive index is better than 0.001. Meanwhile, the feasibility of this method for multilayered materials is tested. Compared to conventional methods, this system is more compact and has less difficulty in sample processing, and thus is promising for applications in the area of refractive-index measurement.

마이크로 캔틸레버 굽힘 측정을 위한 센싱시스템 (Sensing System for Measuring Deflection of Microcantilever)

  • 김현철;이상헌
    • 대한기계학회논문집B
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    • 제36권9호
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    • pp.961-964
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    • 2012
  • 원자현미경에서 시편의 높이정보를 얻기 위한 마이크로 캔틸레버의 굽힘은 optical lever 방식이나 간섭원리에 기반한 방식으로 이루어졌으나, 부피와 가격적인 측면에서 이들 방식은 많은 개선의 여지를 가지고 있다. 따라서 본 논문에서는 이전 방식의 단점을 극복하기 위하여, 간단한 구조로 구현이 가능한 비점 수차방식을 기반으로한 광픽업헤드를 이용하여 마이크로 캔틸레버의 굽힘 측정시스템을 개발하였다. 개발된 시스템은 실험실에서 제작한 원자현미경에 적용하여 그 가능성을 확인하였다.