1 |
Quercioli, F., Tiribilli, B., Ascoli, C., Baschieri, P. and Frediani, C., 1999, "Monitoring of an Atomic Force Microscope Cantilever with a Compact Disk Pickup," Rev. Sci. Instrum., Vol. 70, pp. 3620-3624.
DOI
|
2 |
Hwu, E.-T., Huang, K.-Y., Hung, S.-K. and Hwang, I.-S., 2006, "Measurement of Cantilever Displacement Using a Compact Disk/Digital Versatile Disk Pickup Head," Jpn. J. Appl. Phys., Vol.45, pp.2368-2371.
DOI
|
3 |
Lee, S.H. and Jung, K. S., 2008, "Precision Displacement Measurement Using Astigmatism," Trans. of the KSPE, Vol. 25, No. 7, pp. 87-94.
|
4 |
U.S. Patent, 5,440,920, 1995, Scanning Force Microscope with Beam Tracking Lens.
|
5 |
Shusteff, M., Burg, T.P. and Manalis, S. R., 2006, "Measuring Boltzmann's Contstant with a Low-Cost Atomic Force Microscope: An Undergraduate Experiment," Am. J. Phys. 74, 10, pp.873-879.
DOI
ScienceOn
|