• 전기학회논문지
• /
• 제67권4호
• /
• pp.538-542
• /
• 2018

In order to generate a clock source with low cost and high performance in system on chip(SoC), a relaxation oscillator with stable output characteristics according to PVT(process, voltage and temperature) fluctuation require a low area and a low power. In this paper, we propose a solution to reduce the current loss caused by parasitic components in the conventional relaxation oscillator. Since the slew rate of the bias current and the capacitor are adjusted to be the same through the proposed solution, a relaxation oscillator with low area characteristics is designed for the same clock source frequency implementation. The proposed circuit is designed using the TSMC CMOS 0.18um process. The Simulation results show that the relaxation oscillator using the proposed solution can prevent the current loss of about $279{\mu}A$ and reduce the total chip area by 20.8% compared with the conventional oscillator in the clock source frequency of 96 MHz.

• JSTS:Journal of Semiconductor Technology and Science
• /
• 제16권6호
• /
• pp.728-735
• /
• 2016

A 70 MHz temperature-compensated on-chip CMOS relaxation oscillator for mobile display driver ICs is proposed to reduce frequency variations. The proposed oscillator compensates for frequency variation with respect to temperature by adjusting the bias currents to control the change in delay of comparators with temperature. A bandgap reference (BGR) is used to stabilize the bias currents with respect to temperature and supply voltages. Additional temperature compensation for the generated frequency is achieved by optimizing the resistance in the BGR after measuring the output frequency. In addition, a trimming circuit is implemented to reduce frequency variation with respect to process. The proposed relaxation oscillator is fabricated using 45 nm CMOS technology and occupies an active area of $0.15mm^2$. The measured frequency variations with respect to temperature and supply voltages are as follows: (i) ${\pm}0.23%$ for changes in temperature from -30 to $75^{\circ}C$, (ii) ${\pm}0.14%$ for changes in $V_{DD1}$ from 2.2 to 2.8 V, and (iii) ${\pm}1.88%$ for changes in $V_{DD2}$ from 1.05 to 1.15 V.