• Title/Summary/Keyword: Negative shift

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The Effect of External DC Electric Field on the Atmospheric Corrosion Behaviour of Zinc under a Thin Electrolyte Layer

  • Liang, Qinqin;YanYang, YanYang;Zhang, Junxi;Yuan, Xujie;Chen, Qimeng
    • Corrosion Science and Technology
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    • v.17 no.2
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    • pp.54-59
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    • 2018
  • The effect of external DC electric field on atmospheric corrosion behavior of zinc under a thin electrolyte layer (TEL) was investigated by measuring open circuit potential (OCP), cathodic polarization curve, and electrochemical impedance spectroscopy (EIS). Results of OCP vs. time curves indicated that the application of external DC electric field resulted in a negative shift of OCP of zinc. Results of cathodic polarization curves measurement and EIS measurement showed that the reduction current of oxygen increased while charge transfer resistance ($R_{ct}$) decreased under the external DC electric field. Variation of OCP negative shift, reduction current of oxygen, and $R_{ct}$ increase with increasing of external DC electric field strength as well as the effect of external DC electric field on double-layer structure in the electrode/electrolyte interface and ions distribution in thin electrolyte layer were analyzed. All results showed that the external DC electric field could accelerate the corrosion of zinc under a thin electrolyte layer.

Mutagenicity of River Water of Nakdong River Estuary in Korea (낙동강 하구수의 변이원성에 대한 연구)

  • ;;Ryuich Otsu
    • Journal of Environmental Science International
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    • v.10 no.1
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    • pp.35-39
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    • 2001
  • The mutagenicity of the river water of Nakdong river estuary was determined by Ames test using the blue rayon suspension method. Samples were collected from 10 sites in the estuary once in each season of 1998. The samples collected from the sites where industrial waste discharge on May were mutagenic, but the other samples were not mutagenic. The sample collected from the site 1 located near the industrial area (Hadan-dong) were highly mutagenic in the TA98 with (+S9) and without (-S9) mix as well as in the TA100 with (+S9) and without (-S9) S9 mix, suggesting that the river water of this site is polluted by direct and indirect mutagens of frame-shift type as well as direct and indirect mutagens of base-replacement type. The positive mutagenicity, although relatively low, was also detected in TA98 with (+S9) and without (-S9) S9 mix in the extract of the site 4 near the industrial area(Jangrim-dong), suggesting that the primary mutation type is frame-shift. The negative mutagenicity from July to December at the sites (1-4) near the industrial area seems to be affected by the low economic growth rate in 1998 in Korea. On the other hand, the negative mutagenicity in all extracts collected from the sites 5-10 near the residential area where living sewage discharge, suggests that the river water was not polluted by mutagens.

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A study on the growth of $Al_2{O_3}$ insulation films and its application ($Al_2{O_3}$절연박막의 형성과 그 활용방안에 관한 연구)

  • 김종열;정종척;박용희;성만영
    • Electrical & Electronic Materials
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    • v.7 no.1
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    • pp.57-63
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    • 1994
  • Aluminum oxide($Al_2{O_3}$) offers some unique advantages over the conventional silicon dioxide( $SiO_{2}$) gate insulator: greater resistance to ionic motion, better radiation hardness, possibility of obtaining low threshold voltage MOS FETs, and possibility of use as the gate insulator in nonvolatile memory devices. We have undertaken a study of the dielectric breakdown of $Al_2{O_3}$ on Si deposited by GAIVBE technique. In our experiments, we have varied the $Al_2{O_3}$ thickness from 300.angs. to 1400.angs. The resistivity of $Al_2{O_3}$ films varies from 108 ohm-cm for films less than 100.angs. to 10$_{13}$ ohm-cm for flims on the order of 1000.angs. The flat band shift is positive, indicating negative charging of oxide. The magnitude of the flat band shift is less for negative bias than for positive bias. The relative dielectric constant was 8.5-10.5 and the electric breakdown fields were 6-7 MV/cm(+bias) and 11-12 MV/cm (-bias).

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A Study on the Relationship between Working Patterns and Health Conditions and Eating Habits of Workers in the Gyeongnam Area (경남지역 일부 직장인들의 근무형태와 건강상태, 식습관의 관련성 연구)

  • Seo, Eun Hee
    • The Korean Journal of Food And Nutrition
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    • v.33 no.3
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    • pp.266-278
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    • 2020
  • This study was conducted with 375 workers in Changwon to examine the effects of working patterns on dietary habits and health. A self-administered questionnaire was conducted July 22 October 30, 2019. According to the results of the dietary habits and health related factors analysis, non-shift administrative workers showed significantly higher rates of green tea intake (p<0.05), and shift production workers showed significantly higher smoking rates (p<0.001) and waist circumferences (p<0.01). According to the results of the Pearson's correlation coefficient analysis, work hours showed negative correlations with job satisfaction (r=0.22, p<0.01) and positive correlations with perceived stress level (r=0.14, p<0.01). Temporary workers showed negative correlations with feel job satisfaction(r=0.14, p<0.01), perceived stress level (r=0.12, p<0.05), and concern about health (r=0.13, p<0.05). Diabetes showed positive correlations with hypertension (r=0.20, p<0.01), low HDL cholesterolemia (r=0.22, p<0.01), abdominal obesity (r=0.13, p<0.05), and hypertriglyceridemia(r=0.22, p<0.01). Based on these results, this researcher proposes that continuous attention and support of industries and communities are necessary for nutritional education and counseling relative to improving workers' dietary lives as well as disease prevention and control.

A Decomposition Analysis of FDI Inflow into Korea - Shift-Share Analysis, 2003-2006 - (한국 외국인직접투자 유입요인의 분해분석 - 변이할당분석, 2003-2006 -)

  • Lee, Sanghack;Cheong, Kiwoong;Kim, Jeongsook
    • International Area Studies Review
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    • v.13 no.3
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    • pp.145-161
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    • 2009
  • Applying the shift-share analysis, this paper decomposes FDI inflow into Korea for the period of 2003-2006. The paper finds that Korea has been lagging behind the world average in absorbing inward FDI, thereby recording negative aggregate industry-mix effects and negative aggregate competitive effects as well. However, the following industries have recorded positive competitive effect: electrical and electronic equipment, motor vehicles and other transport equipment, hotels and restaurants, transport, storage and communications, finance, and business services. In a nutshell, Korea is revealed to have competitive advantage in absorbing inward FDI in a few manufacturing industries and most of service industries. Government policies should accordingly be focused on these industries to encourage more inward FDIs.

Influence of Channel Thickness Variation on Temperature and Bias Induced Stress Instability of Amorphous SiInZnO Thin Film Transistors

  • Lee, Byeong Hyeon;Lee, Sang Yeol
    • Transactions on Electrical and Electronic Materials
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    • v.18 no.1
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    • pp.51-54
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    • 2017
  • TFTs (thin film transistors) were fabricated using a-SIZO (amorphous silicon-indium-zinc-oxide) channel by RF (radio frequency) magnetron sputtering at room temperature. We report the influence of various channel thickness on the electrical performances of a-SIZO TFTs and their stability, using TS (temperature stress) and NBTS (negative bias temperature stress). Channel thickness was controlled by changing the deposition time. As the channel thickness increased, the threshold voltage ($V_{TH}$) of a-SIZO changed to the negative direction, from 1.3 to -2.4 V. This is mainly due to the increase of carrier concentration. During TS and NBTS, the threshold voltage shift (${\Delta}V_{TH}$) increased steadily, with increasing channel thickness. These results can be explained by the total trap density ($N_T$) increase due to the increase of bulk trap density ($N_{Bulk}$) in a-SIZO channel layer.

Interaction between Norfolxacin and Single Stranded DNA

  • 여정아;조태섭;Kim, Seog K.;문형랑;준길자;남원우
    • Bulletin of the Korean Chemical Society
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    • v.19 no.4
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    • pp.449-457
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    • 1998
  • We compared various spectroscopic properties of a norfloxacin-single stranded DNA complex with those of norfloxacin-double stranded DNA complex. Norfloxacin binds to both double-and single stranded DNA, and we observed the following spectroscopic changes for both complexes: hypochromism in the norfloxacin absorption region in the absorption spectrum, the characteristic induced CD spectrum consisting of a weak positive band at 323 nm and a strong positive band at 280-300 nm followed by a negative band in the 260 nm region, a strong decrease in the fluorescence intensity and a red-shift in the fluorescence emission spectrum, and shorter fluorescence decay times. These results indicate that the environments of the bound norfloxacin in both DNAs are similar, although the equilibrium constant of the norfloxacin-single stranded DNA was twice as high as the norfloxacin-double stranded DNA complex. Both complexes were thermodynamically favored with similar negative Δ$G^o$. Negative Δ$H^o$ terms contribute to these spontaneous reactions; Δ$S^o$ term was unfavorable.

Characterization of oxygen plasma by using a langmuir probe in the inductively coupled plasma (정전 탐침을 이용한 유도 결합형 반응기에서 발생하는 산소 플라즈마의 특성연구)

  • 김종식;김곤호;정태훈;염근영;권광호
    • Journal of the Korean Vacuum Society
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    • v.9 no.4
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    • pp.428-435
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    • 2000
  • Negative ion generation in an inductively coupled oxygen plasma was investigated by using a Langmuir probe. It was observed that the probe current ratio of the positive ion saturation current and the negative current which is consisted of the electron current and the negative ion current, and also the potential difference between the floating potential and plasma potential vary with the RF input power and more sensitively with the operating pressure, respectively. Results show that the operating condition to achieve the maximum probe current ratio and the minimum potential difference shift from the low pressure region to the high pressure regions with increasing the input power. It implies that the generation of the negative oxygen ions increases and the recombination of the positive and negative ions are enhanced in the plasma.

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Effects of Remanent Polarization State and Internal Field in Ferroelctric Film on the Hydrogen-induced Degradation Characteristics in Pt/Pb(Zr, Ti)O3/Pt Capacitor (강유전막의 잔류 분극 상태와 내부 전계가 Pt/Pb(Zr,Ti)O3/Pt 커패시터의 수소 열화 특성에 미치는 영향)

  • Kim, Dong-Cheon;Lee, Gang-Un;Lee, Won-Jong
    • Korean Journal of Materials Research
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    • v.12 no.1
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    • pp.75-81
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    • 2002
  • The ferroelectric properties of Pb(Zr,Ti)O$_3$[PZT] films degrade when the films with Pt top electrodes are annealed in hydrogen containing environment. This is due to the reduction activity of atomic hydrogen that is generated by the catalytic activity of the Pt top electrode. At the initial stage of hydrogen annealing, oxygen vacancies are formed by the reduction activity of hydrogen mainly at the vicinity of top Pt/PZT interface, resulting in a shift of P-E (polarization-electric field) hysteresis curve toward the negative electric field direction. As the hydrogen annealing time increases, oxygen vacancies are formed inside the PZT film by the inward diffusion of hydrogen ions, as a result, the polarization degrades significantly and the degree of P-E curve shift decreases gradually. The direction and the magnitude of the remnant polarization in the PZT film affect the motion of hydrogen ions which determines the degradation of polarization characteristics and the shift in the P-E hysteresis curve of the PZT capacitor during hydrogen annealing. When the remnant polarization is formed in the PZT film by applying a pre-poling voltage prior to hydrogen annealing, the direction of the P-E curve shift induced by hydrogen annealing is opposite to the polarity of the pre-poling voltage. The hydrogen-induced degradation behavior of the PZT capacitor is also affected by the internal field that has been generated in the PZT film by the charges located at the top interface prior to hydrogen annealing.

Analysis of Instability Mechanism under Simultaneous Positive Gate and Drain Bias Stress in Self-Aligned Top-Gate Amorphous Indium-Zinc-Oxide Thin-Film Transistors

  • Kim, Jonghwa;Choi, Sungju;Jang, Jaeman;Jang, Jun Tae;Kim, Jungmok;Choi, Sung-Jin;Kim, Dong Myong;Kim, Dae Hwan
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.15 no.5
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    • pp.526-532
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    • 2015
  • We quantitatively investigated instability mechanisms under simultaneous positive gate and drain bias stress (SPGDBS) in self-aligned top-gate amorphous indium-zinc-oxide thin-film transistors. After SPGDBS ($V_{GS}=13V$and $V_{DS}=13V$), the parallel shift of the transfer curve into a negative $V_{GS}$ direction and the increase of on current were observed. In order to quantitatively analyze mechanisms of the SPGDBS-induced negative shift of threshold voltage (${\Delta}V_T$), we experimentally extracted the density-of-state, and then analyzed by comparing and combining measurement data and TCAD simulation. As results, 19% and 81% of ${\Delta}V_T$ were taken to the donor-state creation and the hole trapping, respectively. This donor-state seems to be doubly ionized oxygen vacancy ($V{_O}^{2+}$). In addition, it was also confirmed that the wider channel width corresponds with more negative ${\Delta}V_T$. It means that both the donor-state creation and hole trapping can be enhanced due to the increase in self-heating as the width becomes wider. Lastly, all analyzed results were verified by reproducing transfer curves through TCAD simulation.