• Title/Summary/Keyword: NbR

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Dielectric Properties and Ordering Structures of Pb(Fe1/2Ta1/2)O3-Pb(Fe1/2Nb1/2)O3 Solid Solutions (Pb(Fe1/2Ta1/2)O3-Pb(Fe1/2Nb1/2)O3 고용체의 유전특성 및 질서배열구조)

  • Woo, Byong-Chul;Kim, Byung-Kook;Lee, Jong-Ho;Park, Hyun-Min;Kim, Byong-Ho
    • Journal of the Korean Ceramic Society
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    • v.39 no.9
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    • pp.863-870
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    • 2002
  • The Single phase $Pb(Fe_{1/2}Ta_{1/2})O_3$ (x=0.0∼1.0) solid solutions were successfully synthesized and their ordering structures as well as dielectric properties were investigated ${{r(Nb^{5+})=r(Ta^{5+})=0.78 {\AA},\;AW(Nb^{5+})=92.91,\;AW(Ta^{5+})=180.95}}$. While $Pb(Fe_{1/2}Ta_{1/2})O_3$ showed typical relaxor ferroelectric characteristics such as dielectric relaxation and diffuse phase transition, the sharpeness of the phase transition increased as $Ta^{5+}$ was replaced by $Nb^{5+}$ and finally $Pb(Fe_{1/2}Nb_{1/2})O_3$ showed normal ferroelectric characteristics with no dielectric relaxation. By using Raman spectroscopy, it was revealed that the $Fe^{3+}\;and\;Ta^{5+}\;of\;Pb(Fe_{1/2}Ta_{1/2})O_3$ were stoichiometrically 1:1 ordered within the short range which can be hardly probed even by TEM. Also, The degree of ordering in $Pb(Fe_{1/2}Ta_{1/2})O_3$ decreased as $Ta^{5+}$ was replaced by $Nb^{5+}$ and finally $Fe^{3+}\;and\;Nb^{5+}\;of\;Pb(Fe_{1/2}Nb_{1/2})O_3$ were completely disordered. The relaxor ferroelectric characteristics of $Pb(Fe_{1/2}Ta_{1/2})O_3$ could be correlated with the stoichiometric 1:1 ordering of B-site cations within the short range which can be hardly probed even by TEM. Also, the decrease of the relaxor ferroelectric characteristics with the replacement of $Ta^{5+}\;by\;Nb^{5+}$ could be correlated with the weakening of the ordering and the normal ferroelectric characteristics of $Pb(Fe_{1/2}Nb_{1/2})O_3$ could be correlated with the complete disordering of B-site cations.

The Microwave Dielectric Properties of $ZnNb_2O_{6}$ Ceramics with Sintering Temperature and CuO Addition (소결온도와 CuO 첨가에 따른 $ZnNb_2O_{6}$ 세라믹스의 마이크로파 유전특성)

  • 김정훈;김지헌;배선기;이성갑;이영희
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.53 no.7
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    • pp.347-351
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    • 2004
  • The $ZnNb_2O_{6}$ ceramics with CuO(1, 3, 5wt%) were prepared by the conventional mixed oxide method. The ceramics were sintered at the temperature of $950^{\circ}C$$1075^{\circ}C$ for 3hr in air The structural properties and the microwave dielectric properties of $ZnNb_2O_{6}$ ceramics were investigated with sintering temperature and the addition of CuO. Increasing the addition of CuO, the peak of second phase($Cu_3Nb_2O_{8}$) was increased. The grain size of the $ZnNb_2O_{6}$ ceramics with CuO was increased with CuO addition at same temperature. The dielectric constant of $ZnNb_2O_{6}$ ceramics with CuO was increased with sintering temperature and CuO addition. While the quality factor of the $ZnNb_2O_{6}$ ceramics with lwt% CuO depended on sinterability, the quality factor of $ZnNb_2O_{6}$ with 3wt% and 5wt% CuO depended on second Phase due to the CuO addition. The optimum dielectric Properties of $\varepsilon$$_{r}$ = 21.73 Q${\times}$f = 19,276 were obtained from the condition of 3wt% CuO addition and sintering temperature of $1025^{\circ}C$(3hr).

The effects of $Cr_2O_3$ addition on piezoelectric characteristics of $Pb(Mn_{1/3}Nb_{2/3})O_3+PZT$ ceramics for substrates of high-frequency devices (고주파소자의 기판용 $Pb(Mn_{1/3}Nb_{2/3})O_3+PZT$ 세라믹스의 압전특성에 $Cr_2O_3$의 첨가가 미치는 영향)

  • 이개명;백동수;윤석진;홍재일;박창엽
    • Electrical & Electronic Materials
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    • v.5 no.1
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    • pp.14-27
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    • 1992
  • 핫프레스법으로 제작된 0.05Pb(M $n_{1}$3/N $b_{2}$3/) $O_{3}$+ 0.95Pb(Z $r_{0.47}$ $Ti_{0.53}$) $O_{3}$ 세라믹스에 있어서 C $r_{2}$ $O_{3}$의 첨가량이 그 시편의 구조적특성, 유전특성, 압전특성, 온도안정성 및 포아손비에 미치는 영향이 조사되었다. C $r_{2}$ $O_{3}$의 첨가량의 범위가 0.3~0/75[wt%]인 시편만이 포아손비가 1/3이상으로 주파수저하형 에너지포획소자의 기판으로 사용될 수 있으며 이 중에서 C $r_{2}$ $O_{3}$의 첨가량이 0.5[wt%]인 시편이 보다 우수한 압전특성과 안정된 주파수 온도특성을 갖고 있다. 있다.

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Fabrecation and Characterization of $SrBi_2TaNbO_9$ Ferroelectric Thin Film Prepared by Sol-Gel Method (SOL-GEL법을 이용한 $SrBi_2TaNbO_9$ 강유전성 박막 제조 및 특성 평가)

  • 이진한;박상준;장건익
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.07a
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    • pp.94-98
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    • 2000
  • Polycrystalline SBTN ferroelectric thin films were prepared by sol-gel method with various Nb mole ratios on Pt/ $SiO_2$/Si (100) substrates. The films were annealed at different temperatures and characterized in terms of phase and microstructure. Relatively a well saturated hysteresis pattern was obtained at x =0.2 in S $r_{0.8}$B $i_{2.3}$(T $a_{1-x}$ N $b_{x}$)$_2$ $O_{9+}$$\alpha$/ thin films. At an applied voltage of 5V, the dielectric constant ($\varepsilon$$_{r}$) and dissipation factor (tan $\delta$) of typical S $r_{0.8}$B $i_{2.3}$(T $a_{1-x}$ N $b_{x}$)$_2$ $O_{9+}$$\alpha$/ thin film (x=0.2) were about 236.2 and 0.034. Measured remanent polarization (2Pr) and coercive field (Ec) were 4.28C/c $m_2$, and 38.88kv/cm respectively. No fatigue was observed up to 6$\times$10$_{10}$ switching cycles at 5V and the normalized polarization reduced by a factor of only 4%.%. 4%.%. 4%.%.%.%.%.

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Dielectric and Piezoelectric Properties of (K,Na)NbO3 Ceramics with the amount of K4CuNb8O23 Addition (K4CuNb8O23 첨가에 따른 (K,Na)NbO3 세라믹스의 유전 및 압전특성)

  • Seo, Byeong-Ho;Yoo, Ju-Hyun;Mah, Suk-Burm;Jeong, Yeong-Ho
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.22 no.11
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    • pp.930-934
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    • 2009
  • In this study, in order to develop excellent lead-free composition ceramics for piezoelectric transformer, ($K_4CuNb_8O_{23}$) added $(K_{0.5}Na_{0.5})(Nb_{0.96}Sb_{0.04})O_3$ ceramics were fabricated using conventional mixed oxide method and their piezoelectric and dielectric properties were investigated as a fu+EY50nction of the amount of KCN addition. With increasing the amount of KCN addition, density and mechanical quality factor(Qm), electromechanical coupling factor (Kp) were increased up to 1.2 mol% and then decreased. At the 1.2 mol% KCN added specimen, mechanical quality factor (Qm), electromechanical coupling factor (Kp), density and dielectric constant (${\varepsilon}r$) showed the optimal values of 781, 0.445, $4.42\;g/cm^3$ and 443, respectively, for piezoelectric transformer application.

Microwave Dielectric Properties of the LiNb3O8-TiO2 Ceramic System with the Addition of Low Firing Agents (저온 소결제 첨가에 의한 LiNb3O8-TiO2계 세라믹스의 마이크로파 유전 특성)

  • Choi, Myung-Ho;Kim, Nam-Chul
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.21 no.6
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    • pp.517-523
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    • 2008
  • The microwave dielectric properties of $LiNb_3O_8-TiO_2$ based ceramics with low firing agents, CuO, $Bi_2O_3$, $B_2O_3$, $SiO_2$, $TiO_2$, were investigated to improve the sintering condition for the LTCC system. According to the X-ray diffraction and SEM, the ceramics of $LiNb_3O_8-TiO_2$ with low firing agents showed no significant second phases within a range of experiments, and fine microstructures. By adding the low firing agents, the sintering temperature decreased from $1200^{\circ}C$ to $925^{\circ}C$. Based on the results of electrical measurements, the $LiNb_3O_8-TiO_2$ ceramics showed a promising microwave dielectric properties for LTCC applications, those are ${\varepsilon}_r$ (dielectric constant) = 44, Q f (quality factor) = 18000, and ${\tau}_f$ (the temperature coefficient of resonant frequency) = $-1.5\;ppm/^{\circ}C$.

The microwave dielectric properties of $Bi_{(1-x)}Tm_xNbO_4$ (마이크로파 유전체 $Bi_{(1-x)}Tm_xNbO_4$의 유전특성)

  • Hwang, Chang-Gyu;Jang, Gun-Eik
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.07b
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    • pp.662-665
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    • 2002
  • The microwave dielectric properties and the microstructures of $Tm_2O_3$-modified $BiNbO_4$ ceramics were investigated. $Bi_{(1-x)}Tm_xNbO_4$ ceramics combined with orthorhombic and triclinic phases were identified at sintering temperatures of $920{\sim}960^{\circ}C$. The apparent density decreased slightly with the increasing Tm content. Regardless of the Tm content the dielectric constant $(\varepsilon_r)$ of all compositions except x=0.1 in $Bi_{(1-x)}Tm_xNbO_4$ ceramics saturated at the range of 42~44. The $Q{\times}f_0$ values of 6,000-12,000(GHz) were obtained for all compositions when the sintering temperatures were in the range of $920{\sim}960^{\circ}C$. The temperature coefficient of the resonant frequency$(\tau_f)$ can be also adjusted with increasing the amount of the doped Tm from a positive value of $+15ppm/^{\circ}C$ to a negative value of $-20ppm/^{\circ}C$. The $Bi_{(1-x)}Tm_xNbO_4$ ceramics can be possibly applied to multilayer microwave devices with low processing temperatures.

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Microwave Dielectric Properties of Sb substituted $BiNbO_4$ Ceramics (Sb 치환에 따른 $BiNbO_4$ 세라믹스의 고주파 유전특성의 변화)

  • Lim, Hyouk;Oh, Young-Jei;Chio, Seo-Young
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.07b
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    • pp.646-649
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    • 2002
  • The microwave dielectric properties and the structure of $Sb_2O_5$ modified $BiNb_xSb_{1-x}O_4$ ceramics were investigated. The structure of these ceramics were orthohombic phase at all sintering temperatures and there were not the second phase. These ceramics added sintering additive such as CuO and $V_2O_5$ were sinterable at a low temperature$(880^{\circ}C{\sim}960^{\circ}C)$ by liquid phase. Dielectric properties of $BiNb_xSb_{1-x}O_4$ ceramics were also improved than these of $BiNbO_4$ ceramics. The content of modified atom controlled the microstructure, dielectric constant and quality factor. As a result, We could obtain following result; ${\varepsilon}r$=42~44, $Q{\cdot}f_0$=20,000~42,000GHz, $\tau_f=-7{\sim}-28ppm/^{\circ}C$.

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Electric Properties of MFIS Capacitors using Pt/LiNbO3/AlN/Si(100) Structure (Pt/LiNbO3/AlN/Si(100) 구조를 이용한 MFIS 커패시터의 전기적 특성)

  • Jung, Soon-Won;Kim, Kwang-Ho
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.17 no.12
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    • pp.1283-1288
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    • 2004
  • Metal-ferroelectric-insulator-semiconductor(WFIS) capacitors using rapid thermal annealed LiNbO$_3$/AlN/Si(100) structure were fabricated and demonstrated nonvolatile memory operations. The capacitors on highly doped Si wafer showed hysteresis behavior like a butterfly shape due to the ferroelectric nature of the LiNbO$_3$ films. The typical dielectric constant value of LiNbO$_3$ film in the MFIS device was about 27, The gate leakage current density of the MFIS capacitor was 10$^{-9}$ A/cm$^2$ order at the electric field of 500 kV/cm. The typical measured remnant polarization(2P$_{r}$) and coercive filed(Ec) values were about 1.2 $\mu$C/cm$^2$ and 120 kV/cm, respectively The ferroelectric capacitors showed no polarization degradation up to 10$^{11}$ switching cycles when subjected to symmetric bipolar voltage pulses of 1 MHz. The switching charges degraded only by 10 % of their initial values after 4 days at room temperature.e.

Dielectric and Ferroelectric Properties of Nb Doped BNT-Based Relaxor Ferroelectrics

  • Maqbool, Adnan;Hussain, Ali;Malik, Rizwan Ahmed;Zaman, Arif;Song, Tae Kwon;Kim, Won-Jeong;Kim, Myong-Ho
    • Korean Journal of Materials Research
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    • v.25 no.7
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    • pp.317-321
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    • 2015
  • The effects of Nb doping on the crystal structure, microstructure, and dielectric ferroelectric and piezoelectric properties of $(Bi_{0.5}Na_{0.5})_{0.935}Ba_{0.065}Ti_{(1-x)}Nb_xO_3-0.01SrZrO_3$ (BNBTNb-SZ, with ${\chi}=0$, 0.01 and 0.02) ceramics have been investigated. X-ray diffraction patterns revealed that all ceramics have a pure perovskite structure with tetragonal symmetry. The grain size of the ceramics slightly decreased and a change in grain morphology from square to spherical shape was observed in the Nb-doped samples. The maximum dielectric constant temperature ($T_m$) increases with increasing amount of Nb; however, ferroelectric-relaxor transition temperature ($T_{F-R}$) and maximum dielectric constant (${\varepsilon}_m$) values decrease gradually. Nb addition disrupted the polarization hysteresis loops of the BNBT-SZ ceramics by leading a reduction in the remnant polarization coercive field and piezoelectric constant.