• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2015년도 제49회 하계 정기학술대회 초록집
• /
• pp.157-157
• /
• 2015

Recently, the growing interest in organic microelectronic devices including OLEDs has led to an increasing amount of research into their many potential applications in the area of flexible electronic devices based on plastic substrates. However, these organic devices require a gas barrier coating to prevent the permeation of water and oxygen because organic materials are highly susceptible to water and oxygen. In particular, high efficiency OLEDs require an extremely low water vapor transition rate (WVTR) of $1{\times}10^{-6}g/m^2day$. The Key factor in high quality inorganic gas barrier formation for achieving the very low WVTR required ($1{\times}10^{-6}g/m^2day$) is the suppression of defect sites and gas diffusion pathways between grain boundaries. In this study NBAS process was introduced to deposit enhanced film density single gas barrier layer with a low WVTR. Fig. 1. shows a schematic illustration of the NBAS apparatus. The NBAS process was used for the $Al_2O_3$ nano-crystal structure films deposition, as shown in Fig. 1. The NBAS system is based on the conventional RF magnetron sputtering and it has the electron cyclotron resonance (ECR) plasma source and metal reflector. $Ar^+$ ion in the ECR plasma can be accelerated into the plasma sheath between the plasma and metal reflector, which are then neutralized mainly by Auger neutralization. The neutral beam energy is controlled by the metal reflector bias. The controllable neutral beam energy can continuously change crystalline structures from an amorphous phase to nanocrystal phase of various grain sizes. The $Al_2O_3$ films can be high film density by controllable Auger neutral beam energy. we developed $Al_2O_3$ high dense barrier layer using NBAS process. We can verified that NBAS process effect can lead to formation of high density nano-crystal structure barrier layer. As a result, Fig. 2. shows that the NBAS processed $Al_2O_3$ high dense barrier layer shows excellent WVTR property as a under $2{\times}10^{-5}g/m^2day$ in the single barrier layer of 100nm thickness. Therefore, the NBAS processed $Al_2O_3$ high dense barrier layer is very suitable in the high efficiency OLED application.

• 한국자기학회지
• /
• 제11권5호
• /
• pp.184-188
• /
• 2001

DC-스퍼터를 이용하여 기판온도를 실온과 20$0^{\circ}C$로 변화시켜 , 균일한 내부구조를 갖는 구조와 결정립내부에 미세한 자가정렬나노구조(SONS)를 갖는 Co-22%Cr 합금 박막을 각각 제조하고 이들의 미세구조와 도메인구조를 투과전자현미경(TEM)과 자기력현미경(MFM)을 이용하여 확인하였다. Co가 먼저 부식되도록 조치하고 관찰한 투과전자현미경 결과, 실온에서 제작된 박막의 경우에는 결정립 내부가 균일한 조성을 보인 반면, 기판온도가 20$0^{\circ}C$인 Co-22%Cr합금 박막은 결정립 내부에 SONS를 형성하여 판상의 미세 Co-과잉상을 가지는 특이한 미세구조를 가지는 것을 확인하였다. 자기력현미경에 의해 확인된 결과, SONS가 없는 시편(기판온도를 실온으로 유지한 경우)은 주기 5000 정도의 미로형 도메인(domains)이 생겼다. 미로형 도메인은 결정간의 교환에너지가 큰 경우 발생하는 구조로서 고밀도 자기기록이 불리할 것이 예상되었다. 이와 비교해서 SONS가 생성된 (기판온도를 20$0^{\circ}C$로 유지한 경우)시편은 주기 500 정도의 매우 미세한 구형 도메인을 보였다. 미세구형 도메인은 각 도메인간의 교환에너지가 작아 열적 변화에도 데이터가 안정하므로 고밀도 기록에 유리하다고 예상되었다.

• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
• /
• pp.100-101
• /
• 2012

The plasma damage free and room temperature processedthin film deposition technology is essential for realization of various next generation organic microelectronic devices such as flexible AMOLED display, flexible OLED lighting, and organic photovoltaic cells because characteristics of fragile organic materials in the plasma process and low glass transition temperatures (Tg) of polymer substrate. In case of directly deposition of metal oxide thin films (including transparent conductive oxide (TCO) and amorphous oxide semiconductor (AOS)) on the organic layers, plasma damages against to the organic materials is fatal. This damage is believed to be originated mainly from high energy energetic particles during the sputtering process such as negative oxygen ions, reflected neutrals by reflection of plasma background gas at the target surface, sputtered atoms, bulk plasma ions, and secondary electrons. To solve this problem, we developed the NBAS (Neutral Beam Assisted Sputtering) process as a plasma damage free and room temperature processed sputtering technology. As a result, electro-optical properties of NBAS processed ITO thin film showed resistivity of $4.0{\times}10^{-4}{\Omega}{\cdot}m$ and high transmittance (>90% at 550 nm) with nano- crystalline structure at room temperature process. Furthermore, in the experiment result of directly deposition of TCO top anode on the inverted structure OLED cell, it is verified that NBAS TCO deposition process does not damages to the underlying organic layers. In case of deposition of transparent conductive oxide (TCO) thin film on the plastic polymer substrate, the room temperature processed sputtering coating of high quality TCO thin film is required. During the sputtering process with higher density plasma, the energetic particles contribute self supplying of activation & crystallization energy without any additional heating and post-annealing and forminga high quality TCO thin film. However, negative oxygen ions which generated from sputteringtarget surface by electron attachment are accelerated to high energy by induced cathode self-bias. Thus the high energy negative oxygen ions can lead to critical physical bombardment damages to forming oxide thin film and this effect does not recover in room temperature process without post thermal annealing. To salve the inherent limitation of plasma sputtering, we have been developed the Magnetic Field Shielded Sputtering (MFSS) process as the high quality oxide thin film deposition process at room temperature. The MFSS process is effectively eliminate or suppress the negative oxygen ions bombardment damage by the plasma limiter which composed permanent magnet array. As a result, electro-optical properties of MFSS processed ITO thin film (resistivity $3.9{\times}10^{-4}{\Omega}{\cdot}cm$, transmittance 95% at 550 nm) have approachedthose of a high temperature DC magnetron sputtering (DMS) ITO thin film were. Also, AOS (a-IGZO) TFTs fabricated by MFSS process without higher temperature post annealing showed very comparable electrical performance with those by DMS process with $400^{\circ}C$ post annealing. They are important to note that the bombardment of a negative oxygen ion which is accelerated by dc self-bias during rf sputtering could degrade the electrical performance of ITO electrodes and a-IGZO TFTs. Finally, we found that reduction of damage from the high energy negative oxygen ions bombardment drives improvement of crystalline structure in the ITO thin film and suppression of the sub-gab states in a-IGZO semiconductor thin film. For realization of organic flexible electronic devices based on plastic substrates, gas barrier coatings are required to prevent the permeation of water and oxygen because organic materials are highly susceptible to water and oxygen. In particular, high efficiency flexible AMOLEDs needs an extremely low water vapor transition rate (WVTR) of $1{\times}10^{-6}gm^{-2}day^{-1}$. The key factor in high quality inorganic gas barrier formation for achieving the very low WVTR required (under ${\sim}10^{-6}gm^{-2}day^{-1}$) is the suppression of nano-sized defect sites and gas diffusion pathways among the grain boundaries. For formation of high quality single inorganic gas barrier layer, we developed high density nano-structured Al2O3 single gas barrier layer usinga NBAS process. The NBAS process can continuously change crystalline structures from an amorphous phase to a nano- crystalline phase with various grain sizes in a single inorganic thin film. As a result, the water vapor transmission rates (WVTR) of the NBAS processed $Al_2O_3$ gas barrier film have improved order of magnitude compared with that of conventional $Al_2O_3$ layers made by the RF magnetron sputteringprocess under the same sputtering conditions; the WVTR of the NBAS processed $Al_2O_3$ gas barrier film was about $5{\times}10^{-6}g/m^2/day$ by just single layer.

• 비파괴검사학회지
• /
• 제32권4호
• /
• pp.393-400
• /
• 2012

최근 나노 박막은 MEMS/NEMS, 광학 코팅, 반도체 산업 등 다양한 분야에서 사용이 되고 있다. 박막은 마모, 침식, 부식, 고온 산화를 방지하기 위한 목적으로 사용될 뿐 아니라 특성화된 자기, 유전적 특성을 만들기 위한 목적으로 사용된다. 많은 연구자들이 이러한 박막 구조의 특성(밀도, 입자 크기, 탄성 특성, 필름/기지 계면의 특성)을 평가하기 위하여 많은 연구를 진행하고 있다. 이들 중에 박막과 기지 사이의 접합 특성을 평가하는 것이 많은 연구자들의 주 관심사가 되어 왔다. 본 연구에서는 나노 박막의 접합 특성을 평가하기 위하여 각기 다른 접합 특성을 가지는 폴리머 박막 시험편을 제작하였다. 제작된 시험편의 접합 특성을 측정하기 위하여 초음파현미경의 V(z) 곡선법을 이용하여 표면파의 속도를 측정하였다. 또한 계면을 포함하는 시험편의 표면을 전파하는 표면파의 속도와 접합력의 상관관계를 확인하기 위해 나노 스크래치 시험을 적용하였다. 그 결과 초음파현미경을 이용하여 측정된 표면파의 속도와 나노스크래치 시험을 이용한 임계하중이 일치하는 경향성을 나타내었다. 결론적으로 초음파현미경의 V(z) 곡선법은 나노 스케일 박막 계면에서의 접합 상태를 평가할 수 있는 기법으로 그 가능성을 나타내었다.

• Environmental Engineering Research
• /
• 제19권3호
• /
• pp.255-259
• /
• 2014

In this research, we compared the COD removal efficiencies of titanium dioxide ($TiO_2$) thin films coated on the surfaces of borosilicate glass that prepared by three different numbers of coating layer; i) 3 layers ii) 4 layers and iii) 5 layers by sol-gel method. All of the prepared $TiO_2$ thin films consisted of pure anatase crystalline structure with grain sizes in the range 20-250 nm. The calculated optical band gaps of the $TiO_2$ thin films were 3.24. The total apparent surface area per total weight of $TiO_2$ thin films were 4.74, 3.86 and $2.79m^2g^{-1}$ for 3, 4 and 5 layers coating, respectively. The kinetics of the photodegradation reactions of COD under UVA light source were described by the Langmuir-Hinshelwood (L-H) kinetic model. The specific rates of the photodegradation of $TiO_2$ thin films at 3 layers coating was $1.40{\times}10^{-4}min^{-1}mW^{-1}$, while for the 4 layers coating and the 5 layers coating were $1.50{\times}10^{-4}$ and $4.60{\times}10^{-4}min^{-1}mW^{-1}$, respectively. The photocatalytic performance of COD degradation was higher with smaller grain size, higher surface area and narrow optical band gaps. Moreover, the numbers of coating layer on substrate also have great influence for kinetic of COD removal.

• 한국자기학회지
• /
• 제5권1호
• /
• pp.48-53
• /
• 1995

동시 열진공증착한 Ag-Co 미세입상 합금박막의 구조, 자기적 성질 및 거대자기저항 현상에 관하여 연구하였다. 증착된 상태에서 합금박막은 과포화된 Ag 기지와 석출된 Co 입자들이 공존하는 준안정한 fcc 구조를 이루고 있다. Co의 양이 20에서 55 at.%로 증가함에 따라 Ag 기지의 입자크기는 평균 147에서 $67{\AA}$으로 감소하였고 Ag 기지에 Co의 고용량은 2.5에서 6.7%로 증가하였다. 25 at.% 이하의 조성을 갖는 합금박막은 주로 초상자성 특성을 보였으며 그 이상의 조성에서는 초상자성과 강자성이 혼합된 거동을 보였다. 증착된 상태의 30 at.% 합금 박막에서(상온, 10 kOe) 최대 19%의 자기저항비를 얻었다. 증착된 상태에서 대부분의 코발트가 석출되어 있기 때문에 Cu-Co계와는 달리 열처리에 의해 MR비의 증가는 보이 지 않았다.

• 한국재료학회지
• /
• 제22권8호
• /
• pp.409-415
• /
• 2012

$TiO_2$ thin films for high energy density capacitors were prepared by r.f. magnetron sputtering at room temperature. Flexible PET (Polyethylene terephtalate) substrate was used to maintain the structure of the commercial film capacitors. The effects of deposition pressure on the crystallization and electrical properties of $TiO_2$ films were investigated. The crystal structure of $TiO_2$ films deposited on PET substrate at room temperature was unrelated to deposition pressure and showed an amorphous structure unlike that of films on Si substrate. The grain size and surface roughness of films decreased with increasing deposition pressure due to the difference of mean free path. X-ray photoelectron spectroscopy (XPS) analysis revealed the formation of chemically stable $TiO_2$ films. The dielectric constant of $TiO_2$ films was significantly changed with deposition pressure. $TiO_2$ films deposited at low pressure showed high dissipation factor due to the surface microstructure. The dielectric constant and dissipation factor of films deposited at 70 mTorr were found to be 100~120 and 0.83 at 1 kHz, respectively. The temperature dependence of the capacitance of $TiO_2$ films showed the properties of class I ceramic capacitors. $TiO_2$ films deposited at 10~30 mTorr showed dielectric breakdown at applied voltage of 7 V. However, the films of 500~300 nm thickness deposited at 50 and 70 mTorr showed a leakage current of ${\sim}10^{-8}{\sim}10^{-9}$ A at 100 V.

• 한국세라믹학회지
• /
• 제51권5호
• /
• pp.375-379
• /
• 2014

Nanocrystalline TiAlN coatings were prepared by reactively sputtering TiAl metal target with $N_2$ gas. This was done using a magnetron sputtering system operated in DC and ICP (inductively coupled plasma) conditions at various power levels. The effect of ICP power (from 0 to 300 W) on the coating microstructure, corrosion and mechanical properties were systematically investigated using FE-SEM, AFM and nanoindentation. The results show that ICP power has a significant influence on coating microstructure and mechanical properties of TiAlN coatings. With increasing ICP power, the coating microstructure evolved from the columnar structure typical of DC sputtering processes to a highly dense one. Average grain size of TiAlN coatings decreased from 15.6 to 5.9 nm with increasing ICP power. The maximum nano-hardness (67.9 GPa) was obtained for the coatings deposited at 300 W of ICP power. The smoothest surface morphology (Ra roughness 5.1 nm) was obtained for the TiAlN coating sputtered at 300 W ICP power.

• 한국군사과학기술학회지
• /
• 제11권4호
• /
• pp.83-91
• /
• 2008

The development of the equal channel angular pressing(ECAP) process in metals has recently provided a feasible solution to produce ultra-fine or nano-grained bulk materials with tailored material properties. However, ECAP process is difficult to scale up commercially due to requirements of an excessive load. In this paper, a new Hybrid-ECAP process with torsional die is considered to obtain materials of ultra-fine grain structure under low forming load. An upper bound analysis and numerical simulation (DEFORM 3D, a commercial FEM code) are carried out on the torsional die. By the upper bound analysis, analytical expression for the compression force and rotation speed are obtained. By the FEM analysis, the distribution of strain, stress and deformation are obtained. These results show that the Hybrid-ECAP is a useful process because this process can obtain the homogeneous deformations with relatively low forming load. Additionally, due to decreased forming load, die life can be improve.

• 한국전기전자재료학회논문지
• /
• 제27권11호
• /
• pp.760-765
• /
• 2014

MgZnO has attracted a lot of attention for flexible device. In the flexible substrate, the crystal structure of the thin films as well as the surface morphology is not good. Therefore, in this study, we studied on the effects of the oxygen pressure on the structure and crystallinity of $Mg_{0.3}Zn_{0.7}O$ thin films deposited on PES substrate by using pulsed laser deposition. We used X-ray diffraction and atomic force microscopy in order to observe the structural characteristics of $Mg_{0.3}Zn_{0.7}O$ thin films. The crystallinity of $Mg_{0.3}Zn_{0.7}O$ thin films with increasing temperature was improved, Grain size and RMS of the films were increased. UV-visible spectrophotometer was used to get the band gap energy and transmittance. $Mg_{0.3}Zn_{0.7}O$ thin films showed high transmittance over 90% in the visible region. As increased working pressure from 30 mTorr to 200 mTorr, the bandgap energy of $Mg_{0.3}Zn_{0.7}O$ thin film were decreased from 3.59 eV to 3.50 eV.