• Journal of applied mathematics & informatics
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• 제10권1_2호
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• pp.75-81
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• 2002

Lipschitz stability and Lipschitz ø$_{o}$ - equistability of the functional differential equation x'= B(x)f(t, x, $x_{t}$), $x_{to}$ =$\theta$$_{o}$ are discussed. Sufficient conditions are given using the comparison with the corresponding scalar equation.ion.n.

• 대한수학회보
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• 제53권1호
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• pp.303-323
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• 2016

For a canonical threefold X, it is known that $p_n$ does not vanish for a sufficiently large n, where $p_n=h^0(X,\mathcal{O}_X(nK_X))$. We have shown that $p_n$ does not vanish for at least one n in {6, 8, 10}. Assuming an additional condition $p_2{\geq}1$ or $p_3{\geq}1$, we have shown that $p_{12}{\geq}2$ and $p_n{\geq}2$ for $n{\geq}14$ with one possible exceptional case. We have also found some inequalities between ${\chi}(\mathcal{O}_X)$ and $K^3_X$.

• 한국재료학회:학술대회논문집
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• 한국재료학회 1996년도 재료학회 추계학술발표회
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• pp.140-140
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• 1996

• Kyungpook Mathematical Journal
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• 제43권4호
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• pp.513-518
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• 2003

In this paper, we have proved a theorem on Hausdorff summability of Fourier series which generalizes various known results. We prove that if $${\int}_{o}^{t}\;{\mid}{\phi}(u){\mid}\;du=o(t)\;as\;t{\rightarrow}0\; and\;\lim_{n{\rightarrow}{\infty}}{\int}^{\eta}_{{\pi}/n}{\frac{{\mid}{\phi}(t)-{\phi}(t+{\pi}/n){\mid}}{t}}dt=o(n)$$ where 0 < ${\eta}$ < 1, then the Fourier series is (H, ${\mu}_n$) summable to s at t = x where the sequence ${\mu}_n$ is given by ${\mu}_n={\int}^1_0x^n{\chi}(x)\;dx\;n=0,1,2\;and\;K_n(t)=\limits\sum_{{\nu}=0}^n(\array {n\\{\nu}})({\Delta}^{{n}-{\nu}}{\mu}_{\nu}){\frac{sin{\nu}t}{t}}$.

• Corrosion Science and Technology
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• 제9권2호
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• pp.81-86
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• 2010

The mechanisms of selective oxidation of intercritically annealed CMnAl TRIP steels in a Continuous Galvanizing Line (GCL) were studied by cross-sectional observation of the surface and sub-surface regions by means of High Resolution Transmission Electron Microscopy (HR-TEM). The selective oxidation and nitriding of an intercritically annealed CMnAl TRIP steel in a controlled dew point 10%$H_2+N_2$ atmosphere resulted in the formation of c-xMnO.$MnO_2$ (1${\leq}$x<3) and c-xMnO.$Al_2O_3$ ($x{\geq}1$) particles on the steel surface. Single crystal c-xMnO.$SiO_2$ ($2{\leq}x{\leq}4$) oxide particles were also observed on the surface. A thin film of crystalline c-xMnO.$SiO_2$ (2${\leq}$x<3) and c-xMnO.$Al_2O_3$ ($x{\geq}1$) was present between these particles. In the sub-surface region, internal oxidation, nitriding and intermetallic compound formation were observed. In the first region, large crystalline c-xMnO.$SiO_2$ ($1{\geq}x{\geq}2$) and c-xMnO.$Al_2O_3$ ($x{\geq}1$) oxides particles were present. In the second region, c-AlN particles were observed, and in a third region, small $MnAl_x$ (x>1) intermetallic compound particles were observed.

• 한국세라믹학회지
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• 제31권12호
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• pp.1577-1587
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• 1994

TiO2 thin films with the substitution of oxygen with nitrogen were deposited on silicon substrate by metalorganic chemical vapor deposition (MOCVD) using Ti(OCH(CH3)2)4 (titanium tetraisopropoxide, TTIP) and N2O as source materials. X-ray diffraction (XRD) results indicated that the crystal structure of the deposited thin films was anatase TiO2 with only (101) plane observed at the deposition temperatures of 36$0^{\circ}C$ and 38$0^{\circ}C$, and with (101) and (200) plane at above 40$0^{\circ}C$. Raman spectroscopic results indicated that the crystal structure was anatase TiO2 in accordance with the XRD results without any rutile, fcc TiN, or hcp TiN structure. No fundamental difference was observed with temperature increase, but the peak intensity at 194.5 cm-1 increased with strong intensity at 143.0 cm-1 for all samples. The crystalline size of the films varied from 49.2 nm to 63.9 nm with increasing temperature as determined by slow-scan XRD experiments. The refractive index of the films increased from 2.40 to 2.55 as temperature increased. X-ray photoelectron spectroscopy (XPS) study showed only Ti 2s, Ti 2p, C 1s, O 1s and O 2s peaks at the surface of the film. The composition of the surface was estimated to be TiO1.98 from the quatitative analysis. In the bulk of the film Ti 2s, Ti 2p, O 1s, O 2s, N 1s and N 2s were detected, and Ti-N bonding was observed due to the substitution of oxygen with nitrogen. A satellite structure was observed in the Ti 2p due to the Ti-N bonding, and the composition of titanium nitride was determined to be about TiN1.0 from the position of the binding energy of Ti-N 2p3/2 and the quatitative analysis. The spectrum of Ti 2p energy level could be the sum of a 4, 5, or 6 Gaussian curve reconstruction, and the case of the sum of the 6 Gaussian curve reconstruction was physically most meaningful. From the results of Auger electron spectroscopy (AES), it was known that the composition was not varied significantly throughout the whole thickness of the film, and silicon oxide was not observed at the interface between the film and the substrate. The composition of the film was possible (TiO2)1-x.(TiN)x or TiO2-2xNx and in this experimental condition x was found to be about 0.21-0.16.

• 한국재료학회지
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• 제7권2호
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• pp.102-106
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• 1997

박막형 접촉연소식을 포함한 마이크로 가스센서에서 membrane은 Si식각시 식각정지용으로서 또 센서 소자를 지지하는 층으로서 응력이 없어야 하며 이는 응력이 membrane파괴의 주 원인으로 작용하기 때문이다. 이에 따라 본 연구에서는 증착조건이 low pressure chemical vapor deposition(LPCVD)법과 sputtering법으로 제작된 $SiN_{x}$과 $SiN_{x}/SiO_{x}/(NON)$막의 응력고 굴절율 변화에 미치는 효과에 대한 실험을 행하였다. LPCVD의 경우 단일막인 $SiN_{x}$의 압축응력 및 굴절율을 나타내었다. Sputtering의 경우 $SiN_{x}$는 공정압력이 1mtorr에서 30torr까지 증가할수록 인가전력밀도가 $2.74W/cm^2$에서 $1.10W/cm^2$으로 감소할수록 응력값은 압축에서 인장으로 전환되었으며 본 실험에서 응력이 가장 낮게 나온 시편의경우 압축응력으로 $1.2{\times}10^{9}dyne/cm^2$가 공정압력 10mtorr, 인가전력밀도 $1.37W/cm^2$에서 얻어졌다. 굴절율은 공정압력이 1motorr에서 30motorr까지 증가할수혹 인가전력밀도가 $2.74W/cm^2$에서 $1.10W/cm^2$으로 감소할수록 감소하여 2.05에서 1.89의 변화를 보였다. LPCVD와 sputtering으로 증착된 막들은 모두 온도가 증가함에 따라 응력이 감소하였으며 온도감소시 소성적인 특성을 나타내었다.

• 한국진공학회:학술대회논문집
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• 한국진공학회 1993년도 제5회 학술발표회 논문개요집
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• pp.87-88
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• 1993

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제49권1호
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• pp.1-7
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• 2000

The SNOSFET memory devices with ultrathin ONO(tunnel oxide-nitride-blocking oxide) gate dielectric were fabricated using n-well CMOS process and investigated its characteristics. The thicknesses of tunnel oxide, nitride and blocking oxide were $23{\AA},\; 53{\AA}\; and\; 33{\AA}$, respectively. Auger analysis shows that the ONO layer is made up of $SiO_2(upper layer of blocking oxide)/O-rich\; SiO_x\N\_y$. It clearly shows that the converting layer with $SiO_x\N\_y(lower layer of blocking oxide)/N-rich SiO_x\N\_y(nitride)/O-rich SiO_x\N\_y(tunnel oxide)$. It clearly shows that the converting layer with $SiO_x\N\_y$ phase exists near the interface between the blocking oxide and nitride. The programming condition of +8 V, 20 ms, -8 V, 50 ms is determined and data retention over 10 years is obtained. Under the condition of 8 V programming, it was confirmed that the modified Fowler-Nordheim tunneling id dominant charge transport mechanism. The programmed threshold voltage is distributed less than 0.1 V so that the reading error of memory stated can be minimized. An $8\times8$ NAND type flash EEPROM with SONOSFET memory cell was designed and simulated with the extracted SPICE parameters. The sufficient read cell current was obtained and the upper limit of $V_{TH}$ for write state was over 2V.

• 한국입자에어로졸학회지
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• 제6권4호
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• pp.165-172
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• 2010

Titania is widely used as an effective photocatalyst for the photodegradation of environmental pollutants in air. In this study, novel N-doped $ZrO_2/TiO_2$ photocatalysts were synthesized via sol-gel method and characterized by UV-Vis spectrophotometer, transmission electron microscope, and X-ray diffractometer. N-doped $ZrO_2/TiO_2$ photocatalysts were nano-sized with an average particle size of about 20 nm. The XRD pattern of N-doped $ZrO_2/TiO_2$ photocatalysts showed both anatase and rutile phases. The photocatalytic activity of N-doped $ZrO_2/TiO_2$ photocatalysts was evaluated by degradation of NO under UV and visible light irradiation at various parameters such as amount of photocatalyst, concentration of NO, and intensity of light. The photocatalytic activity of N-doped $ZrO_2/TiO_2$ photocatalysts was effective for the enhancement of the degradation of NO and higher than that of $TiO_2$ photocatlysts under UV and visible light irradiation.