• Journal of the Korea Institute of Information and Communication Engineering
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• v.17 no.10
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• pp.2369-2379
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• 2013

A CMOS x-ray line scan sensor which is used in both medical imaging and non-destructive diagnosis is designed. It has a pixel array of 512 columns ${\times}$ 4 rows and a built-in DC-DC converter. The pixel circuit is newly proposed to have three binning modes such as no binning, $2{\times}2$ binning, and $4{\times}4$ binning in order to select one of pixel sizes of $100{\mu}m$, $200{\mu}m$, and $400{\mu}m$. It is designed to output a fully differential image signal which is insensitive to power supply and input common mode noises. The layout size of the designed line scan sensor with a $0.18{\mu}m$ x-ray CMOS image sensor process is $51,304{\mu}m{\times}5,945{\mu}m$.

• Radioisotope journal
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• v.7 no.1
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• pp.4-5
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• 1992

• Journal of the Korean Ceramic Society
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• v.35 no.1
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• pp.41-47
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• 1998

Cutting and planarization of diamond films have been performed using copper vapor laser under air at-mosphere. Diamond films of about 350${\mu}{\textrm}{m}$ and 800 ${\mu}{\textrm}{m}$ thick have been synthesized with DC plasma assisted chemical vapor deposition. The position of a specimen has been controlled by computer-driven stage. With copper vapor laser beam of 7W cutting depth increases rapidly and saturates with increasing scan number and decreasing scan speed. 8 repetitive scans at scan speed 0.5 mm/sec produce the maximum cutting depth without focus shifting Rod-shape copper vapor laser beam can be made and used effectively in planar-ization of rough diamond surface.

• Journal of the Korean Society for Nondestructive Testing
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• v.17 no.2
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• pp.100-107
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• 1997

It has been required to find flaws smaller than $100{\mu}m$ by fracture mechanic consideration. We prepared the infiltrated and sintered SiC structural ceramic specimens including artificial flaws, Fe, pore, WC, Si particles of size ranging from $36{\mu}m$ to $200{\mu}m$. We performed C-scan for the specimen using a high frequency and broad-band ultrasonic transducer to employ polyvinylidene fluoride(PVDF) and a broad-band electric scanning system. The flaws in the ceramic specimens were detected in the high frequency detection field up to 100MHz. But, the flaws were not detected in lower frequency detection field up to 60MHz. The ratio of the detected smallest flaw size to the wavelength calculated at the center frequency, 80MHz, was about 0.25 in Rayleigh scattering region.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.56 no.11
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• pp.2004-2009
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• 2007

A new high-speed drive method for the plasma display panel is proposed. In this method, the address period is inserted for the rest period of the sustain pulses and the priming pulse is applied on the entire panel at the same time overlapping with the sustain period. The ramp shaped priming pulse can be made with a simple drive circuit in this technology and the stable sustain discharge can be induced even by a narrow scan pulse in help of the space charge generated from the address discharge. From the experiments, it is ascertained that the priming pulse hardly influences the sustain discharge. Moreover, the voltage margin of the sustain discharge is almost constant though that of the address discharge broadens with narrowing the scan pulse width. And, if the time interval between the scan pulse and the sustain pulse is within $6{\mu}s$, the voltage margin of the address and the sustain discharges are unaffected though the applied position of the scan pulse is changed. High-speed driving with the address pulse of $0.7{\mu}s$ width was achieved and the address voltage margin of 20V and the sustain voltage margin of 10V were obtained.

• Journal of the Korean Society for Precision Engineering
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• v.12 no.1
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• pp.78-86
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• 1995

$H_{\infty}$ Controller of seeker scan-loop is designed using LSDP proposed by McFarlane. The performance and robustness of $H_{\infty}$ controller are analyzed using robustness theorems by Lehtomaki and compared with those of the LQG/LTR controller. Especially, structured singular value .mu. -test of Doyle is used to evaluate robust performance of seeker scan-loop. It is demonstated that seeker scan-loop by $H_{\infty}$ controller is very robust to model uncertainties described by additive and multiplicative perturbations.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.15 no.12
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• pp.1065-1069
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• 2002

The addressing time should be reduced by modifying cell structure and/or driving method in order to replace the dual scan system by single scan and increase the luminance in large ac plasma display panel(PDP). In this paper, the effects of the addressing time was decreased with decreasing thickness of dielectric layer on the front glass and thickness of white dielectric layer on the rear glass. the decreasing rate were 160ns/10$\mu\textrm{m}$ and 270ns/10$\mu\textrm{m}$, respectively Also in case of decreasing the height of barrier rib, addressing time was decreased at the rate of Sons/10$\mu\textrm{m}$.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.12
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• pp.149-158
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• 1995

This paper describes the development of a software tool LCD FRAME that may guide the analyzing process for the electrical characteristics and the design procedure for constructing the thin film transistor liquid crystal display(TFT/LCD) packages. LCD FRAME can analyze its electrical characteristics from the TFT/LCD system package configuration, and provide the design variables to meet the user's requirements. These analysis and design procedure can be done in real time according to the model at simplified package level of TFT/LCD. LCD_FRAME is an object-oriented expert system which considers package elements as objects. With this LCD_FRAME software tool, we analyzed the I-V characteristics of a-Si TFT and its signal distortion which has maximum 1.58 $\mu$s delay along the panel scan line of the package containing 480 ${\times}$ 240 pixels. We designed the package structure of maximum 6.35 $\mu$s signal delays and 3360 ${\times}$ 780 pixels, and as a result we showed that the proper structure of 20 $\mu$m scan line width, 60$\mu$m panel TFT gate width and 8 $\mu$m gate length. This LCD_FRAME software tool provides results of the analysis and the design in the form of input files of the SPICE program, text data files, and graphic charts.

• Korean Journal of Optics and Photonics
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• v.5 no.2
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• pp.212-216
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• 1994

We have designed and constructed a scanner optics for thermal imaging system operating in 8 - 12 /lfll band. The scanner consists of rotating polygon and oscillating mirror for serial-parallel scan using 5 elements SPRITE HgCdTe. A spherical mirror is used for scan relay mirror to minimize size of the scan mirrors and pupil aberration. The scanner has $40^{\circ}\times26.67^{\circ}$ wide scan field of view and the calculated diffraction MTF shows diffraction limited performance. As a result we have obtained high resolution thermal image. image.

• Journal of the Korean Society for Nondestructive Testing
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• v.14 no.2
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• pp.112-121
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• 1994

This paper discusses the feasibility of ultrasonic C-scan technique for nondestructive evaluation of spot weld quality. Ultrasonic evaluation for spot weld quality was performed by immersion method with the mechanical and the electronic scanning of point-focussed ultrasonic beam(25 MHz). For the sake of the approach to the quantitative measurement of nugget diameter and the discrimination of the corona bond from nugget, preliminary infinitesimal gap experiment by newton ring is tried in order to set up the optimum ultrasonic test condition. Ultrasonic image data obtained were confirmed and compared by optical microscope and SAM(Scanning Acoustic Microscope) observation of the spot-weld cross section. The results show that the nugget diameter can be measured with the accuracy of 1.0mm, and voids included in nugget can be detected to $10{\mu}m$ extent with simplicity and accuracy. Finally, it was found that it is necessary to make a profound study of definite discrimination of corona bond from nugget and the approach of quantitative evaluation of nugget diameter by utilizing the various image processing techniques.