• Korean Journal of Materials Research
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• v.14 no.1
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• pp.46-51
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• 2004

The annealing of a Cu(4.5at.% Mg)/$SiO_2$/Si structure in ambient $O_2$, at 10 mTorr, and $300-500^{\circ}C$, allows for the outdiffusion of the Mg to the Cu surface, forming a thin MgO (15 nm) layer on the surface. The surface MgO layer was patterned, and successfully served as a hard mask, for the subsequent dry etching of the underlying Mg-depleted Cu films using an $O_2$ plasma and hexafluoroacetylacetone [H(hfac)] chemistry. The resultant MgO/Cu structure, with a taper slope of about $30^{\circ}C$ shows the feasibility of the dry etching of Cu(Mg) alloy films using a surface MgO mask scheme. A dry-etched Cu(4.5at.% Mg) gate a-Si:H TFT has a field effect mobility of 0.86 $\textrm{cm}^2$/Vs, a subthreshold swing of 1.08 V/dec, and a threshold voltage of 5.7 V. A novel process for the dry etching of Cu(Mg) alloy films, which eliminates the use of a hard mask, such as Ti, and results in a reduction in the process steps is reported for the first time in this work.

• 한국정보디스플레이학회:학술대회논문집
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• 2003.07a
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• pp.806-809
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• 2003

Ion-induced secondary electron emission coefficient $({\gamma})$. of the patterned MgO thin film with geometrical structures has been measured by ${\gamma}$ - FIB(focused ion beam) system. The patterned MgO thin film with geometrical structures has been formed by the mask (mesh of ${\sim}$ $10{\mu}m^{2})$ under electron beam evaporation method. It is found that the higher ${\gamma}$. has been achieved by the patterned MgO thin film than the normal ones without patterning.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.200-200
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• 2013

기존 메모리 반도체에 비교해 빠른 재생속도와 높은 집적도, 비휘발성 등의 특성을 가지는 MRAM (Magnetic Random Access Memory)은 DRAM, flash memory 등을 대체할 수 있는 차세대 기억 소자로서 CoFeB/MgO/CoFeB로 구성된 한 개의 MTJ (Magnetic Tunnel Junction)를 단위 메모리로 사용한다. 이 MTJ 물질들은 고밀도 플라즈마를 이용한 건식 식각공정시 Cl2, BCl3 등과 같은 chlorine 을 포함한 가스를 이용하여 왔으나 식각 후 sidewall에서 발생하는 부식과 식각 선택비 확보의 어려움 등으로 마스크 물질에 제약을 받고 소자 특성이 감소하게 되는 등의 문제가 있다. 따라서 이러한 식각 문제점을 해결하기 위한 대안으로 noncorrosive 가스인 CO/NH3, CH3OH, CH4 등을 이용한 MTJ 식각 연구가 진행되어 오고 있으며 이중 CO/NH3 혼합가스는 부식성이 없고 hard mask와의 높은 선택비를 가지는 기체로 CO gas에 NH3 gas를 첨가하게 되면 etch rate이 증가하는 특성을 보인다. 또한 rf pulse-biased power를 이용하여 이온의 입사를 시간에 따라 제어함으로써 pulse off time 때 etch gas와 MTJ 물질간의 chemical reaction을 향상시킬 수 있다. 따라서 본 연구에서는 CO/NH3 혼합가스를 이용하여 다양한 rf pulse-biased power 조건에서 MTJ 물질인 CoFeB, MgO와 hard mask 물질인 W을 식각 한 뒤 식각특성을 분석하였으며 MTJ surface의 chemical binding state, surface roughness 측정을 진행하였다. 식각 샘플의 측정은 Alpha step profiler, XPS (X-ray Photoelectron Spectroscopy), AFM (Atomic Force Microscopy)를 통해 진행되었다. Time-averaged pulse bias에서는 duty ratio가 감소할수록 etch rate의 큰 감소 없이 CoFeB/W, MgO/W 물질의 etch selectivity가 향상됨을 확인할 수 있었으며 pulse off time 구간에서의 chemical reaction 향상으로 인해 식각부산물의 재증착이 감소하고 CoFeB의 surface roughness가 감소하는 것을 확인하였다.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.387-387
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• 2013

Currently, the flash memory and the dynamic random access memory (DRAM) have been used in a variety of applications. However, the downsizing of devices and the increasing density of recording medias are now in progress. So there are many demands for development of new semiconductor memory for next generation. Magnetic random access memory (MRAM) is one of the prospective semiconductor memories with excellent features including non-volatility, fast access time, unlimited read/write endurance, low operating voltage, and high storage density. MRAM is composed of magnetic tunnel junction (MTJ) stack and complementary metal-oxide semiconductor (CMOS). The MTJ stack consists of various magnetic materials, metals, and a tunneling barrier layer. Recently, MgO thin films have attracted a great attention as the prominent candidates for a tunneling barrier layer in the MTJ stack instead of the conventional Al2O3 films, because it has low Gibbs energy, low dielectric constant and high tunneling magnetoresistance value. For the successful etching of high density MRAM, the etching characteristics of MgO thin films as a tunneling barrier layer should be developed. In this study, the etch characteristics of MgO thin films have been investigated in various gas mixes using an inductively coupled plasma reactive ion etching (ICPRIE). The Cl2/Ar, CH3OH/Ar, and CH4/Ar gas mix were employed to find an optimized etching gas for MgO thin film etching. TiN thin films were employed as a hard mask to increase the etch selectivity. The etch rates were obtained using surface profilometer and etch profiles were observed by using the field emission scanning electron microscopy (FESEM).

• Proceedings of the Korean Vacuum Society Conference
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• 1999.07a
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• pp.223-223
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• 1999

PZT(PbZr1-xTixO3) 박막은 고유전율과 같은 remanent polarization을 가져서 고집적 소자의 커패시터 유전율층 또는 비휘발성 메모리 소자의 제조에 이용되고 있으나, fatigue 와 aging 문제로 인하여 새로운 물질의 개발이 필요한데, 그 대표적으로 연구되고 있는 것이 PMN-PT(Pb(Mg1/3Nb2/3)O-PbTiO3) 이다. 본 실험에서는 sol-gel 법에 의하여 제조된 PMN-PT막을 ICP(Inductively coupled plasma)에 의하여 식각하였고 mask층으로는 PR을 사용하였다. 식각 가스로는 Ar, Cl, BCl를 단독 또는 혼합하여 사용하였으며, 식각 특성을 보기 위하여 RF Power, Substrate bias, Operation pressure, Substrate temperature를 변화시켰다. 식각속도는 stylus profiler를 이용하여 측정하였고, 단면 profile은 scanning electron microscopy (SEM)를 이용하여 관찰하였다. 식각 메커니즘을 규명하고자 식각된 박막의 표면을 X-ray photoelectron spectroscopy (XPS)로 관찰하였고, optical emission spectroscopy (OES)로 플라즈마 특성을 규명하고자 하였다. 식각속도는 Ar 또는 Cl2 플라즈마에 BCl3 가스를 혼합하였을 경우 증가되었고, BCl3 가스를 단독으로 사용하여도 높은 식각속도를 나타내었으며, BCl3의 첨가량이 늘어날수록 PR의 식각속도는 감소하여 높은 선택비를 보였다. 90% BCl3/10%Cl2 플라즈마에서 2800$\AA$/min의 식각속도 그리고 1.37:1의 PR 선택비를 얻을 수 있었다. Power나 기판 bias 증가에 따라 식각속도는 증가하였으나 기판 온도변화에는 민감하지 않았다. BCl3 rich에서의 식각속도 증가와 선택비 증가는 B2O3의 형성에 의한 것으로 생각된다.

• Journal of Korean Society of Water and Wastewater
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• v.22 no.2
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• pp.227-232
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• 2008

The masking effect of chlorine on algae-related taste and odor(T&O) compounds has long been an important issue for water suppliers. In this study, masking experiments with chlorine were performed on two kinds of treated water and one of raw water. After adding chlorine(0 to 0.8 mg/L) to water samples, odor intensity was evaluated by a newly developed sensory method(2-out-of-5 odor test) for three days along with the measurement of residual chlorine concentration. Even though the relationship between the residual chlorine concentration and odor reported by the sensory analysts was not always coincident, it was proved that residual chlorine more than a certain concentration could completely mask both added geosmin and naturally occurring T&O compounds. For the sand-filtered water spiked with 10 ng/L of geosmin, 0.12-0.18 mg/L of residual chlorine was necessary to achieve complete masking. In the case of GAC-filtered water, 10 ng/L of spiked geosmin was completely masked by 0.15-0.1 mg/L of residual chlorine. Combined ozone and GAC was not enough to treat raw water spiked with 300 ng/L of geosmin. In this experiment, sensory analysts were able to detect earthy or musty odors from the treated water. From a masking experiment with raw water taken from the Daechung Reservoir, it was found that fishy odor was more difficult to mask with chlorine than earthy odor. As the chlorine residual declined, the analysts began to notice the original odor and the fishy odor was noticed earlier than the earthy odor.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.112-112
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• 2011

유기박막 트랜지스터(Organic Thin Film Transistor: OTFT)는 낮은 공정비용과 기존의 고체 실리콘 트랜지스터로서 실혐 할 수 없는 플렉시블 디스플레이, 스마트카드, 태양전지 등의 매우 넓은 활용범위로 각광받고 있는 연구 분야 중 하나이다. 본 연구에서는 열 증발 증착장비(Thermal Evaporator)를 이용하여 펜타센을 활성층으로 사용한 유기박막 트랜지스터를 제작하였다. Heavily doped된 N형 실리콘 기판을 메탄올, 에탄올, 불산 처리를 하여 세척을 한 후 PECVD를 이용하여 SiO2를 200 nm 증착하였다. 그 후 열 증발 증착 장비를 사용하여 펜타센을 활성층으로 사용하였고, 분말 형태의 펜타센의 질량을 15~60 mg으로 조절하여 활성층의 두께를 조절하였다. 펜타센 증착 후 100도에서 열처리를 하고, 그 후 Shadow Mask를 이용하여 전극을 150nm 증착하였다. 이때 전극은 Au, Al, Ni 세가지 종류를 사용하였다. 펜타센의 질량을 조절하여 증착한 활성층의 두께는 60 mg일 때 약 60 nm, 45 mg일 때 약 45 nm로 1:1의 비율로 올라가는 것을 확인 할 수 있었고, 펜타센의 두께가 30 nm일 때 특성이 가장 잘 나오는 것을 볼 수 있었다. 펜타센의 두께가 두꺼울수록 게이트에서 인가되는 전압의 필드가 제대로 걸리지 않아 특성이 나쁘게 나온 것으로 보인다. 또한 활성층을 30 nm로 고정하고 전극의 종류를 바꿔가며 전기적 특성(캐리어 이동도, 문턱전압, 전달특성 등)을 측정 했을 때 전극으로 Al보다는 Au와 Ni를 사용했을 때 전기적 특성이 더 우수하게 나오는 것을 볼 수 있었다. 메탈과 펜타센과의 일함수 차이에 따른 결과로 보여진다.

• Journal of Korean Society of Occupational and Environmental Hygiene
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• v.9 no.1
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• pp.14-22
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• 1999

This study was conducted to evaluate workplace protection factors(WPF) for two half-facepiece respirators (HR-1, HR-2) in welding workplace and to provide data on the workplace performance of negative-pressure, half-facepiece respirators against airborne particulate contaminants. The outside iron oxide(Fe2O3) concentration of welding fume for the respirator HR-1 ranged from 0.177 to $12.508mg/m^3$ with a geometric mean of $1.118mg/m^3$ and the HR-2 respirator showed a iron oxide range of 0.500 to $3.494mg/m^3$ with a geometric mean of $1.082mg/m^3$. But the inside oxide concentration of welding fume for the respirator HR-1 ranged from 0.002 to $0.364mg/m^3$ with a geometric mean of $0.019mg/m^3$ and the HR-2 respirator showed a iron oxide range of 0.012 to $0.639mg/m^3$ with a geometric mean of $0.041mg/m^3$. The iron oxide inside concentrations were significantly less than $5mg/m^3$(TLV) for both of respirators. The WPF were ranged from 3 to 3744 with a geometric mean of 60 for HR-1 and range from 2 to 129 a geometric mean of 26 for HR-2. And, in this study, the 5th percentile of the workplace protection factors for half-facepiece aspirators (HR-1, HR-2) were 11.2 and 7.1, respectively. The correlation relationship between the Quantative Fit Factors(QNFT) and the WPF for half-mask negative pressure respirators were 0.099 and 0.460.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.448-448
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• 2010

Magnetic random access memory (MRAM) has made a prominent progress in memory performance and has brought a bright prospect for the next generation nonvolatile memory technologies due to its excellent advantages. Dry etching process of magnetic thin films is one of the important issues for the magnetic devices such as magnetic tunneling junctions (MTJs) based MRAM. CoFeB is a well-known soft ferromagnetic material, of particular interest for magnetic tunnel junctions (MTJs) and other devices based on tunneling magneto-resistance (TMR), such as spin-transfer-torque MRAM. One particular example is the CoFeB - MgO - CoFeB system, which has already been integrated in MRAM. In all of these applications, knowledge of control over the etching properties of CoFeB is crucial. Recently, transferring the pattern by using milling is a commonly used, although the redeposition of back-sputtered etch products on the sidewalls and the low etch rate of this method are main disadvantages. So the other method which has reported about much higher etch rates of >$50{\AA}/s$ for magnetic multi-layer structures using $Cl_2$/Ar plasmas is proposed. However, the chlorinated etch residues on the sidewalls of the etched features tend to severely corrode the magnetic material. Besides avoiding corrosion, during etching facets format the sidewalls of the mask due to physical sputtering of the mask material. Therefore, in this work, magnetic material such as CoFeB was etched in an ICP etching system using the gases which can be expected to form volatile metallo-organic compounds. As the gases, carbon monoxide (CO) and ammonia ($NH_3$) were used as etching gases to form carbonyl volatiles, and the etched features of CoFeB thin films under by Ta masking material were observed with electron microscopy to confirm etched resolution. And the etch conditions such as bias power, gas combination flow, process pressure, and source power were varied to find out and control the properties of magnetic layer during the process.

• Journal of Chest Surgery
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• v.36 no.6
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• pp.451-455
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• 2003

In August 2000, the American Heart Association and the European Resuscitation Council published the conclusions of tile International Guidelines 2000 Conference on Cardiopulmonary Resuscitation and Emergency Cardiovascular Care which contains both the new recommendations and an in-depth review. The most important changes in the recommendations according to the authors are discontinuation of the pulse-check for lay people, 500 ml instead of 800∼1,200 ml tidal volume during bag-valve-mask ventilation (FiO2 > 0.4) of a patient with an unprotected airway, unifying correct endotracheal intubation size as 8.0 mm, vasopressin (40 units) and epinephrine (1 mg) as comparable drugs to treat patients with ventricular fibrillation, early prehospital survey and intravenous lysis for patients who have suffered coronary artery syndrome and stroke.