• Title/Summary/Keyword: Metal silicon

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Influence of Trap Passivation by Hydrogen on the Electrical Properties of Polysilicon-Based MSM Photodetector

  • Lee, Jae-Sung
    • Transactions on Electrical and Electronic Materials
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    • v.18 no.6
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    • pp.316-319
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    • 2017
  • A new approach to improving the electrical characteristics and optical response of a polysilicon-based metal-semiconductor-metal (MSM) photodetector is proposed. To understand the cause of current restriction in the MSM photodetector, modified trap mechanisms are suggested, which include interfacial electron traps at the metal/polysilicon interface and silicon dangling bonds between silicon crystallite grains. Those traps were passivated using hydrogen ion implantation with subsequent post-annealing. Photodetectors that were ion-implanted under optima conditions exhibited improved photoconductivity and reduced dark current instability, implying that the hydrogen bonds in the polysilicon influence the simultaneous decreases in the density of dangling bonds at grain boundaries and the trapped positive charges at the contact interface.

A study on the Fabrication and Characterization of Alumina Electrostatic Chuck for Silicon Wafer Processing (실리콘웨이퍼 공정용 알루미나 정전척의 제작과 특성에 관한 연구)

  • Jeong, Kwang-Jin;Park, Yong-Gyun;Lee, Young-Seop;Cho, Tong-Yul;Chun, Hui-Gon
    • Journal of Sensor Science and Technology
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    • v.8 no.6
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    • pp.481-486
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    • 1999
  • Alumina electrostatic chucks for silicon wafer process with wide range of electrical resistivity were fabricated by controlling the amount of $TiO_2$ addition(0, 1.3, 2.0, 2.8 wt%). The dependence of electrostatic force on applied voltage, temperature and humidity was investigated. In addition, response characteristics on applied voltage and relationship between electrical resistivity and electrostatic force characteristics such as Coulomb force and Johnsen-Rahbeck force were discussed.

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Numerical Analysis for Thermal Isolation on Plasma Etched silicon micro-structures (DRIE 식각을 이용한 대면적 실리콘 미세 구조물 부유 시 발생하는 열고립 현상 해석)

  • Lee, Yong-Seok;Jang, Yun-Ho;Kim, Jung-Mu;Kim, Yong-Kweon
    • Proceedings of the KIEE Conference
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    • 2011.07a
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    • pp.1684-1685
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    • 2011
  • This paper presents a theoretical and numerical analysis for thermal isolation of silicon micro-structures, especially for a large size with poor thermal conductivity, as well as straightforward solution for such an issue. Additional metal patterns underneath the silicon structures effectively reduces the thermal isolation. Heat transfer mechanism is analyzed using an equivalent circuit of thermal network including plasma, a heat source, heat capacitors, and thermal resistances. The FEM simulation was carried out to investigate the temperature change of silicon micro-structures according to process time. The temperature of silicon micro-structures with 2 ${\mu}m$ thick chrome layer at a steady state is $86^{\circ}C$, an approximately 40% decrease from the silicon microstructure without thin metal ($122^{\circ}C$)

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Alkali metal free texturing for mono-crystalline silicon solar cell (알카리 금속을 배재한 단결정 실리콘 태양전지의 텍스쳐링 공정)

  • Kim, Taeyoon;Kim, Hoechang;Kim, Bumho
    • 한국신재생에너지학회:학술대회논문집
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    • 2010.11a
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    • pp.48.1-48.1
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    • 2010
  • Mono-crystalline silicon solar cell is fabricated by using alkali metals. These alkali metal, used in wet etching process, must be removed for the high efficiency solar cell. As wet etching process has been adapted due to its low cost. But lots of alkali metals like potassium remains on the silicon surface and acts as impurities. To remove these alkali metals many of cleaning process have to be applied when solar cell manufacturing process. In terms of alkali metal removal, modified etchant solution is required for concise cleaning process. In this paper ethylenediamine was used and proposed for the substituion of postassium hydroxide.

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Sample Pretreatment for the Determination of Metal Impurities in Silicon Wafer (실리콘 웨이퍼 중의 금속 불순물 분석을 위한 시료 전처리)

  • Chung, H.Y.;Kim, Y. H.;Yoo, H.D.;Lee, S.H.
    • Journal of the Korean Chemical Society
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    • v.43 no.4
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    • pp.412-417
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    • 1999
  • The analytical results obtained by microwave digestion and acid digestion methods for sample pretreatment to determine metal impurities in silicon wafer by inductively coupled plasma-mass spectrometry (ICP-MS) were compared. In order to decompose the silicon wafer, a mixed solution of $HNO_3$ and HF was added to the sample and the metal elements were determined after removing the silicon matrix by evaporating silicon in the form of Si-F. The recovery percentages of Ni,Cr and Fe were found to be 95∼106% for both microwave digestion and acid digestion methods. The recovery percentage of Cu obtained by the acid digestion method was higher than that obtained by the microwave digestion method. For Zn, however, the microwave digestion method gave better result than the acid digestion method. Fe was added to a silicon wafer using a spin coater. The concentration of Fe in this sample was determined by lCP-MS, and the same results were obtained in the two pretreatment methods.

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Photoelectrochemical Hydrogen Production on Textured Silicon Photocathode

  • Oh, Il-Whan
    • Journal of the Korean Electrochemical Society
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    • v.14 no.4
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    • pp.191-195
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    • 2011
  • Wet chemical etching methods were utilized to conduct Si surface texturing, which could enhance photoelectrochemical hydrogen generation rate. Two different etching methods tested, which were anisotropic metal-catalyzed electroless etching and isotropic etching. The Si nano-texture that was fabricated by the anisotropic etching showed ~25% increase in photocurrent for H2 generation. The photocurrent enhancement was attributed to the reduced reflection loss at the nano-textured Si surface, which provided a layer of intermediate density between water and the Si substrate.

Reaction of Organic Halogen Compounds with metals (Part III) Metal Distribution in the Reaction Products and System of a Reaction between Organo Chloro Acid or Ester and Metals under Various Solvents (有機할로겐化合物과 金屬과의 反應 (第 3 報) 有機클로로酸 및 에스터와 各種金屬과의 反應生成物 및 反應系中의 金屬分布에 關하여)

  • Kim, You-Sun
    • Journal of the Korean Chemical Society
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    • v.9 no.1
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    • pp.61-65
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    • 1965
  • Metal distribution in the reaction products and system of reactions between organo chloro acid or ester and zinc, silicon, magnesium, and tin under acetonitrile, dioxane, and toluene solvent were determined by means of radioactive tracer prepared by means of a (n, ${\gamma}$) reaction. It was found that the solubility of the organo halogen metal complex was markedly increased in a hydrophilic solvent and was decreased in a nonpolar solvent which resulted in an increased metal distribution in the recovered metal or water washing of the recovered metal mixture. This was also true in the case of the reaction conducted in the presence of a carbonyl compound. The relative increase of the solubility of the metal complex in a hydrophilic solvent was in order of zinc, silicon, tin and magnesium, and in a nonpolar solvent, it was in order of silicon, tin, magnesium, and zinc. There was no formation of organo metallics throughout the reaction sequence. The result was discussed and the observed solvent influence on the present reaction path was criticized.

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The Effect of Deoxidizers in a Wire on Spatter Generation in Gas Metal Arc Welding (GMA용접에 있어서 스패터 발생에 미치는 와이어 탈산원소의 영향)

  • 방국수;안영호
    • Journal of Welding and Joining
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    • v.14 no.5
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    • pp.145-150
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    • 1996
  • The variation of spatter generation in gas metal arc welding with welding conditions and wire compositions was investigated and interpreted in terms of arc stability. The transition range from a short circuit mode to a spray mode in the mixed gas welding showed an unstable arc and generated the largest amount of spatters. Titanium reduced spatters only in the globular mode of $CO_2$welding and silicon and manganese showed the same effect The effect of silicon and manganese, however, was no longer seen when titanium was added simultaneously to the wire. It is believed that deoxidizers easily form oxides on the anode and make the arc stable even in DCRP welding. The wires with deoxidizers also showed low short circuit frequency, resulting in the increase of large size spatters.

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Metal induced crystallization of amorphous silicon using metal solution

  • Yoon, Soo-Young;Oh, Jae-Young;Kim, Chae-Ok;Jang, Jin
    • Journal of the Korean Vacuum Society
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    • v.7 no.s1
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    • pp.123-133
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    • 1998
  • Amorphous silicon (a-Si) was crystallized by metal induced crystallization using metal solution. The a-Si films spin coated with a 50,000 ppm Ni solution were crystallized at as low as $500^{\circ}C$. Needlelike morphology, developed as a result of the migration of $NiSi_2$, precipitates, appears in the MIC poly-Si. The growth of the needlelike crystallites proceeds to a direction parallel to (111). The crystallization temperature can be lowered to $450^{\circ}C$ by Au addition. The enhancement of crystallization results from the decrease of interfacial energy at the NiSi2/Si interface by Au addition.

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Study on Q Improvement of CMOS Spiral Inductor Using Multi Metal Layer for Silicon Substrate (실리콘 기판에서 다층 메탈을 이용한 CMOS 나선형 인덕터의 Q향상에 관한 연구)

  • 손주호;최석우;김동용
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.52 no.1
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    • pp.6-11
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    • 2003
  • The multi layer spiral inductors, which enhance the quality factor Q of an inductor fabricated on the silicon substrate, has been designed using a TSMC CMOS 0.2sum 1-poly 5-metal layer technology. To investigate the performance of the designed inductors, a 2.5-dimensional field simulation tool(Momentum) is used. The simulation results show that the quality factor Q of the 5-metal inductor is improved 1.8 times over that of a convention31 spiral inductor at 2GHz for wireless LAN applications.