• Natural Product Sciences
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• v.22 no.4
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• pp.246-251
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• 2016

This study investigated the effects of (-)-sesamin on memory deficits in 1-methyl-4-phenyl-1,2,3,6-tetrahydropyridine (MPTP)-lesioned mouse model of Parkinson's disease (PD). MPTP lesion (30 mg/kg/day, 5 days) in mice showed memory deficits including habit learning memory and spatial memory. However, treatment with (-)-sesamin (25 and 50 mg/kg) for 21 days ameliorated memory deficits in MPTP-lesioned mouse model of PD: (-)-sesamin at both doses improved decreases in the retention latency time of the passive avoidance test and the levels of dopamine, norepinephrine, 3,4-dihydroxyphenylacetic acid, and homovanillic acid, improved the decreased transfer latency time of the elevated plus-maze test, reduced the increased expression of N-methyl-D-aspartate (NMDA) receptor, and increased the reduced phosphorylation of extracellular signal-regulated kinase (ERK1/2) and cyclic AMP-response element binding protein (CREB). These results suggest that (-)-sesamin has protective effects on both habit learning memory and spatial memory deficits via the dopaminergic neurons and NMDA receptor-ERK1/2-CREB system in MPTP-lesioned mouse model of PD, respectively. Therefore, (-)-sesamin may serve as an adjuvant phytonutrient for memory deficits in PD patients.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.24 no.10 s.181
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• pp.2461-2468
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• 2000

In this paper, single fiber pull-out test is used to measure the interfacial bonding shear strength of $Ti_{50}-Ni_{50}$ shape memory alloy composite with temperature. Fiber and matrix of $Ti_{50}-Ni_{50}$ shape memory alloy composite are respectively $Ti_{50}-Ni_{50}$ shape memory alloy and epoxy resin. To strengthen the interfacial bonding shear stress, various surface treatments are used. They are the hand-sanded surface treatment, the acid etched surface treatment and the silane coupled surface treatment etc.. The interfacial bonding shear strength of surface treated shape memory alloy fiber is greater than that of surface untreated shape memory alloy fiber by from 10% to 16%. It is assured that the hand-sanded surface treatment and the acid etched surface treatment are the best way to strengthen the interfacial bonding shear strength of $Ti_{50}-Ni_{50}$ shape memory composite. The best treatment condition of surface is 10% HNO$_3$ solution in the etching method to strengthen the interfacial bonding shear strength of $Ti_{50}-Ni_{50}$ shape memory alloy composite.

• Sleep Medicine and Psychophysiology
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• v.5 no.2
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• pp.177-184
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• 1998

Objectives : Disturbance of sleep with or without sleep apnea may impair the memory function. Sleep deficiency, sleepiness, sleep apnea and emotional problem in sleep disorders can induce an impairment of memory function. Methods : In this study, the polysomnographies were administered to 58 sleep apnea patients and 38 sleep disorder patients without sleep apnea. Their clinical symptoms were quantitatively evaluated. Short term and long term memory were evaluated before and after polysom no graphy with Digit symbol test and Rey-Osterrieth complex figure test. And correlations among various sleep, repiratory and clinical variables were statistically studied in order to explore which variables may influence on memory function. Results and Conclusions : Results are as follows. Depth of sleep cis positively correlated with memory function. As sleep apnea increases and average saturation of blood oxygen decreases, memory function is more impaired. Emotional depression, high blood pressure, obesity or alcohol impaired memory function. However, daytime sleepiness was not significantly correlated with memory function. The possible mechanisms how above factors influence on the memory function were discussed.

• The Korean Journal of Rehabilitation Nursing
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• v.13 no.2
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• pp.161-170
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• 2010

Purpose: This study was to confirm the influence of memory intensive training program on the elderly people's cognitive function, memory performance, and self-esteem. Method: Using a quasi-experimental or experimental design, 60 elderly aged over 60 years randomly assigned the experimental and control groups completed pretest-post evaluation. The experimental group participated in the memory intensive training program was offered to the participants in the experimental group for three weeks (2times/week). The t-test and $X^2$-test using SAS program. Results: 1) The cognitive function was significantly higher in the experimental group compared to that in the control group (t=3.26, p=.002). 2) The memory performance that included immediate word recall tasks, word recognition tasks and delayed word recall tasks was significantly higher in the experimental group than in the control group (t=5.30, p<.001). The experimental group showed significantly higher scores for memory performance than the control group (t=5.30, p<.001). 3) The self-esteem was higher in the experimental group than in the control group, but there was no significant difference between the two groups (t=1.94, p=.058). Conclusion: The Memory Intensive Training Program could be an effective intervention for improving cognitive function, and memory performance of the elderly people.

• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.18 no.5
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• pp.462-468
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• 2009

In this study, a workpiece-chucking device that generates a chucking force from a shape memory alloy is introduced. This paper first presents train procedure to transform a commercial one-way shape memory alloy into a two-way shape memory alloy, which makes unclamping mechanism of the chucking device simpler than that using the one-way shape memory alloy Second, it describes a conceptual design of the workpiece-chucking device using the two-way type shape memory alloy. Third, it presents a prototype and its chucking characteristics, such as time-response of clamping/unclamping operations and a relationship between temperatures and chucking forces. Finally, it describes a mill-machining test conducted with the prototype. The results confirm that the proposed workpiece-chucking device is feasible for micro machine-tools.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.9
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• pp.33-40
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• 2008

As the speed of memory is improved vey fast the advanced test equipments are needed to test the ultra-high speed memory devices efficiently. It is necessary to develop the Algorithmic Pattern Generator (ALPG) that tests fast memory devices effectively using the instructions that testers want to use. In this paper, we propose a new parallel ALPG for the ultra-high speed memory testing. The proposed ALPG can generate patterns for fast memory devices at high speed using manual instructions by the Instruction Analyzer.

• Journal of KIISE:Computer Systems and Theory
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• v.35 no.6
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• pp.284-292
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• 2008

The density of Memory has been increased by great challenge for memory technology; therefore, elements of memory become more smaller than before and the sensitivity to faults increases. As a result of these changes, memory testing becomes more complex. In addition, as the number of storage elements per chip increases, the test cost becomes more remarkable as the cost per transistor drops. Recent development in system-on-chip(SoC) technology makes it possible to incorporate large embedded memories into a chip. However, it also complicates the test process, since usually the embedded memories cannot be controlled from the external environment. We present a ARM processor-programmable built-in self-test(BIST) scheme suitable for embedded memory testing in the SoC environment. The proposed BIST circuit can be programmed vis an on-chip microprocessor.

• Korean Journal of Biological Psychiatry
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• v.21 no.4
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• pp.175-181
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• 2014

Objectives It was the aim to examine the association of the thyroid-related hormones with cognitive function, depression, and subjective memory impairment in community-dwelling elders with questionable dementia. Methods The sample consisted of 399 community residents with 'questionable dementia' aged 60 or over in whom serum thyroid-related hormones [thyroid stimulating hormone (TSH) and thyroxine] had been assayed. Cognitive impairment was defined using the Korean version of the Consortium Establish a Registry for Alzheimer's Disease. Depression was diagnosed using the Korean version of Geriatric Depression Scale and subjective memory complaint (SMC) was checked using the subjective memory complaints questionnaire (SMCQ). Age, gender, education, and the presence of apolipoprotein E {\varepsilon}4 were included as covariates. Results There was a significant positive association between verbal fluency test (VFT) score and serum TSH levels (p = 0.01). There was a significant negative association between SMCQ total score and word list memory test (WLMT)(p = 0.002) or word list recall test (WLRT) score (p = 0.013). Conclusions Lower serum TSH levels were associated with semantic memory (VFT), and we found that SMC was associated with episodic memory (WLMT and WLRT) in this sample.

• Journal of the Institute of Electronics and Information Engineers
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• v.51 no.2
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• pp.38-45
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• 2014

This paper proposes a characterization method based on the reference memory to characterize memory compiler quickly and accurately. In order to maintain the accuracy of the memory complier and to minimize characterization time, the proposed method models the trends of the generated memories by selecting the reference memories after analyzing the timing trends of the memory compiler. To validate the proposed method, we characterized the 110nm memory compiler derived from 130nm memroy compiler. The average error rate of the characteristics of the memories generated by the proposed method and SPICE simulation is lower than ${\pm}0.1%$. Furthermore, we designed memory BIST test chips at 110nm and 180nm processes and the results of the function test show that the yield is 98.8% and 98.3%, respectively. Therefore, the proposed method is useful to characterize the memory compiler.

• Journal of the Institute of Electronics and Information Engineers
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• v.51 no.3
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• pp.61-71
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• 2014

As the occupancy rate of the flash memory increases in the storage media market for the embedded system and the semi-conductor industry grows, the demand and supply of flash memory is increasing by a big margin. They are especially used in large quantity in the smart phones, tablets, PC, SSD and Soc(System on Chip) etc. The flash memory is divided into the NOR type and NAND type according to the cell arrangement structure and the NAND type is divided into the SLC(Single Level Cell) and MLC(Multi Level Cell) according to the number of bits that can be stored in each cell. Many tests have been performed on NOR type such as BIST(Bulit-In Self Test) and BIRA(Bulit-In Redundancy Analysis) etc, but there is little study on the NAND type. For the case of the existing BIST, the test can be proceeded using external equipments like ATE of high price. However, this paper is an attempt for the improvement of credibility and harvest rate of the system by proposing the BIST for the MLC NAND type flash memory of Finite State Machine structure on which the pattern test can be performed without external equipment since the necessary patterns are embedded in the interior and which uses the MLC NAND March(x) algorithm and pattern which had been proposed for the MLC NAND type flash memory.