• Title/Summary/Keyword: Magnetic surface anisotropy

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Formation of Induced Anisotropy in Amorphous Sm-Fe Based Alloy Thin Films (비정질 Sm-Fe계 합금 박막의 유도자기이방성 형성)

  • 송상훈;이덕열;한석희;김희중;임상호
    • Journal of the Korean Magnetics Society
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    • v.8 no.5
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    • pp.261-269
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    • 1998
  • Induced anisotropy with the energy of $6{\times}10^4\; J/m^3$ is obtained in amorphous Sm-Fe based thin films which are fabricated by rf magnetron sputtering under a magnetic field of 500~600 Oe. Compared with conventional thin films, the anisotropic thin films exhibit a similar "saturation" magnetostriction, but show a very large anisotropy in magnetorstiction which is of significant practical importance due to increased strain at a particular direction. It is shown from a systematic investigation over a wide composition range for binary Sm-Fe alloys that anisotropy is also induced, though small, during a normal sputtering procedure due to the stray field, and the largest anisotropy is observed in the composition range of 25~30 at.% Sm. Furthermore, induced anisotropy is also found to be formed by magnetic annealing, but the anisotropy energy is much smaller than that by magnetic sputtering. This may be because the volume diffusion by which atoms move during magnetic annealing to from induced anisotropy is much slower than the surface diffusion which is expected to be a dominant factor during magnetic sputtering.puttering.

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Magnetic circular dichroism measurement of Co films on Pd(111) substrate

  • Kwanghyun Cho;C. C. Whang;Kim, Wookje;Kim, Wondong;Kim, H.-J.;Kim, Jae-Young;Hoon Koh;S.-J Oh;Park, J.-H.
    • Journal of Korean Vacuum Science & Technology
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    • v.5 no.2
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    • pp.33-37
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    • 2001
  • We measured x-ray magnetic circular dichroism of Co films on Pd(111) surface with and without Pd capping layer at the Co L$_2$,$_3$ edges. Perpendicular magnetization and orbital-moment enhancement are induced by the capping layer. The increase of perpendicular magnetic anisotropy induced by capping layer is considered to result from the increase of surface anisotropy due to the hybridization at the surface.

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Magnetic Properties of Electrodeposited Iron and Cobalt on Porous Aluminum Oxide Layer (다공성 알루미늄 양극산화 피막에 도금된 철 및 코박트의 자기적 성질)

  • Kim, K. H.;Kang, T.;Sohn, H. J.
    • Journal of the Korean institute of surface engineering
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    • v.23 no.3
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    • pp.150-159
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    • 1990
  • The magnetic properties of electrodeposited iron and cobalt films on porous aluminum oxide film were examined. There exists perpendicular magnetic anisotropy due to the shape anisotropy. The coercivity and squareness ratio of films were strongly dependent on deposited particle diameter. The effect of packing fraction on squareness ratio was also apprecible. Unlike the iron-deposited films, the magnetic properties of cobalt films were changed by preferred orientation because of it's large crystal ansotropy constant.(about 10 times of Fe) The Fe deposited films were found to be more suitable for perpendicular magenetic recording media bacause perpendicular coercivity, squareness ratio and the ratio of perpendicular coercivity to horizontal ones of iron films are greater than those of cobalt films.

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Magnetic Circular Dichroism Study of co Thin Films on Pd(111) Surface

  • Kim, Wookje;Kim, Wondong;Kim, Hyunjo;Kim, Jae-Young;Hoon Kho;Park, J.H.;Oh, S.J.
    • Proceedings of the Korean Vacuum Society Conference
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    • 1999.07a
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    • pp.169-169
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    • 1999
  • We studied magnetic properties of co thin films deposited on Pd (111) surface, which attracted much attention recently due to the perpendicular magnetic anisotropy, using magnetic circular dichroism(MCD). Special attention was paid on the effect of Pd capping and interface roughness on the direction of magnetic easy axis, and for that purpose MCD signals for all Co thicknesses were measured with two different ways : in-plane and out-of-plane geometry. In case of bare Co films deposited on smooth Pd(111) surface, no MCD signal was observed under 4$\AA$ co thickness. At 4$\AA$ Co thickness, MCD signal at the out-of-plane geometry was observed, and for thicker Co films, only in-plane MCD signal was measured. This type of magnetic easy axis transition has been reported for other cases like Co/Pt system. The effect of 5$\AA$ Pd capping on these bare Co films made an remarkable change on the transition of magnetic easy axis. Out-of-plane MCD signals exists up to 20$\AA$ Co thickness, and disappears at 24$\AA$ Co thickness. In-plane MCD signals first appears at 10$\AA$ Co thickness and gradually increases up to 24$\AA$ Co thickness. Between 10$\AA$ and 20$\AA$ Co thickness, in-plane and out-of-plane MCD signal coexist. The formation of multi-domain structure or the existence of tilted magnetic easy axis is an possible scenario for such an interesting coexistence. The effect of interface roughness was also tested by measuring MCD signal on Co films deposited on un-annealed Pd(111) surface. Out-of-plane MCD signal was observed up to 8$\AA$ Co thickness and the anisotropy of MCD signal at 4$\AA$ Co thickness was very large with respect to that of Co film deposited on the smooth substrate. Above 8$\AA$ thickness, there exists only in-plane MCD signal. From above results, it was concluded that both Pd capping and interface roughness induce and reenforce the perpendicular magnetic anisotropy. The large perpendicular magnetic anisotropy of Co/Pd multilayer system made by sputtering method can be well understood from our results.

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The Effected of Amorphous Si Underlayer to Crystallographic Characteristics for Prepared Perpendicular Magnetic Recording Media Thin Film (수직자기기록용 박막의 제작에 있어서 아몰퍼스 실리콘 하지층이 결정학적 특성에 미치는 영향)

  • 박원효;김용진;손인환;가출현;박창옥;김경환
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.07a
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    • pp.463-465
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    • 2002
  • In order to increase perpendicular magnetic anisotropy of magnetic layer and prepare magnetic recording layer with a good quality by epitaxial growth between magnetic layer and, we prepared Co$\_$77/Cr$\_$20/Ta$_3$/Si doublelayer for perpendicular magnetic recording media which was promoted as next generation recording media on slide glass substrate. The thickness of magnetic layer and Underlayer were varied from 20 to 100 nm and 5 to 100 m, respectively. The surface morphology and crystal structure of the CoCrTa/Si film were examined with XRD and AFM. Prepared thin films showed improvement of dispersion angle of c-axis orientation Δ$\theta$$\_$50/ caused by inserting amorphous Si underlayer.

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Angular Modulation of the Giant Magnetoresistance at the Second Antiferromagnetic Maximum in Co/Cu Multilayered System

  • Kang, S.J.;Kim, K.Y.;Ye, W.T.;Lee, J.
    • Journal of Magnetics
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    • v.5 no.4
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    • pp.135-138
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    • 2000
  • In order to study the effect of the magnetic anisotropy on the giant magnetoresistance in a Co/Cu multilayered system, the angle dependent magnetoresistance (MR) was measured. The experimental results showed that the maximum MR ratio depends on the angle between the direction of the applied field and the easy axis. The angular modulation of the MR ratio can be explained by the alignments of the two 'effective' magnetization vectors that are bound to their own easy axes. Two maxima observed in MR loops at the second antiferromagnetic maximum are discussed in relation to the magnetic anisotropy, The simulated results under the assumption of the existence of two in-plane easy axes in the sample are compared with the experiments.

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Angular modulation of the GMR at the 2nd AFM

  • S. J. Kang;Kim, K. Y.;W. T. Ye;Lee, J.
    • Proceedings of the Korean Magnestics Society Conference
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    • 2000.09a
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    • pp.307-314
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    • 2000
  • In order to study the effect of the magnetic anisotropy on the giant magnetoresistance (GMR), the angle dependent magnetoresistance (MR) was measured. The experimental results show that the maximum MR ratio depends on the angle between the direction of the applied field and that of the easy axis. The angular modulation of the MR ratio can be explained by the alignments of the two 'effective' magnetization vectors that are bound to their own easy axes. The typical property of MR loops at 2$\^$nd/ antiferromangtic maximum (AFM) such as two maxima was discussed in relation with the magnetic anisotropy (MA). The simulated results under an assumption of the two in-plane easy axes, which exist in the sample, were compared with the experiments.

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Magnetic and structural properties of ultrathin magnetic films: Ni/Pt(111)

  • Nahm, T.U.;Oh, S.J.
    • Journal of the Korean Vacuum Society
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    • v.12 no.S1
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    • pp.17-20
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    • 2003
  • We have studied magnetic and structural properties of ultrathin Ni films grown on PI(lII) surface using in situ surface magneto-optic Kerr effect and X-ray photoelectron spectroscopy. Perpendicular magnetic anisotropy was absent, and longitudinal Kerr signal was only detectable for Ni films thicker than 6 monolayers. Enhancement in longitudinal Kerr signal by 30% was achieved by post-annealing at temperatures below 800K, but upon annealing at 820K, surface alloy was formed. By using core-level binding-energy shifts, the composition was determined to be Ni 70 at. %.

Temperature dependence of the effective anisotropy in Ni nanowire arrays

  • Meneses, Fernando;Urreta, Silvia E.;Escrig, Juan;Bercoff, Paula G.
    • Current Applied Physics
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    • v.18 no.11
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    • pp.1240-1247
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    • 2018
  • Magnetic hysteresis in Ni nanowire arrays grown by electrodeposition inside the pores of anodic alumina templates is studied as a function of temperature in the range between 5 K and 300 K. Nanowires with different diameters, aspect ratios, inter-wire distance in the array and surface condition (smooth and rough) are synthesized. These microstructure parameters are linked to the different free magnetic energy contributions determining coercivity and the controlling magnetization reversal mechanisms. Coercivity increases with temperature in arrays of nanowires with rough surfaces and small diameters -33 nm and 65 nm- when measured without removing the alumina template and/or the Al substrate. For thicker wires -200 nm in diameter and relatively smooth surfaces- measured without the Al substrate, coercivity decreases as temperature rises. These temperature dependences of magnetic hysteresis are described in terms of an effective magnetic anisotropy $K_a$, resulting from the interplay of magnetocrystalline, magnetoelastic and shape anisotropies, together with the magnetostatic interaction energy density between nanowires in the array. The experimentally determined coercive fields are compared with results of micromagnetic calculations, performed considering the magnetization reversal mode acting in each studied array and microstructure parameters. A method is proposed to roughly estimate the value of $K_a$ experimentally, from the hysteresis loops measured at different temperatures. These measured values are in agreement with theoretical calculations. The observed temperature dependence of coercivity does not arise from an intrinsic property of pure Ni but from the nanowires surface roughness and the way the array is measured, with or without the alumina template and/or the aluminum support.

FERROMAGNETIC RESONANCE STUDIES IN AMORPHOUS Co-Zr FILMS

  • Kim, Y.Y.;Baek, J.S.;Lee, S.J.;Lim, W.Y.;Yu, S.C.;Lee, S.H.;Jang, P.W.
    • Journal of the Korean Magnetics Society
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    • v.5 no.5
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    • pp.528-532
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    • 1995
  • Ferromagnetic resonance experiments have been used to investigate the magnetic properties of amorphous $Co_{89.5}Zr_{10.5}$ thin films deposited by DC magnetron sputtering method. In the thickness range from $350\;{\AA}$ to $3,200\;{\AA}$, measurements were carried out in a static magnetic field perpendicular and parallel to the film plane and in a conventional 9.44 GHz spectrometer at room temperature. The ferromagnetic resonance spectra by the field perpendicular to the film plane showed standing spin wave. The spacing and the relative intensities between the various spin wave resonance peaks are analysed considering surface magnetic anisotropy. The surface magnetic anisotropy constant ($K_{so},\;K_{sd}$) of amorphous $Co_{89.5}Zr_{10.5}$ thin films are $0.02\;erg/\textrm{cm}^2$ and $0.55\;erg/\textrm{cm}^2$ respectively regardless of the film thickness except for $3,200\;{\AA}$ film. In case of $3,200\;{\AA}$ these values are $0.46\;erg/\textrm{cm}^2$ and $0.55\;erg/\textrm{cm}^2$ respectively.

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