• Title/Summary/Keyword: Machine Fault Classification

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A Model for Machine Fault Diagnosis based on Mutual Exclusion Theory and Out-of-Distribution Detection

  • Cui, Peng;Luo, Xuan;Liu, Jing
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.16 no.9
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    • pp.2927-2941
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    • 2022
  • The primary task of machine fault diagnosis is to judge whether the current state is normal or damaged, so it is a typical binary classification problem with mutual exclusion. Mutually exclusive events and out-of-domain detection have one thing in common: there are two types of data and no intersection. We proposed a fusion model method to improve the accuracy of machine fault diagnosis, which is based on the mutual exclusivity of events and the commonality of out-of-distribution detection, and finally generalized to all binary classification problems. It is reported that the performance of a convolutional neural network (CNN) will decrease as the recognition type increases, so the variational auto-encoder (VAE) is used as the primary model. Two VAE models are used to train the machine's normal and fault sound data. Two reconstruction probabilities will be obtained during the test. The smaller value is transformed into a correction value of another value according to the mutually exclusive characteristics. Finally, the classification result is obtained according to the fusion algorithm. Filtering normal data features from fault data features is proposed, which shields the interference and makes the fault features more prominent. We confirm that good performance improvements have been achieved in the machine fault detection data set, and the results are better than most mainstream models.

Fault Detection and Classification with Optimization Techniques for a Three-Phase Single-Inverter Circuit

  • Gomathy, V.;Selvaperumal, S.
    • Journal of Power Electronics
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    • v.16 no.3
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    • pp.1097-1109
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    • 2016
  • Fault detection and isolation are related to system monitoring, identifying when a fault has occurred, and determining the type of fault and its location. Fault detection is utilized to determine whether a problem has occurred within a certain channel or area of operation. Fault detection and diagnosis have become increasingly important for many technical processes in the development of safe and efficient advanced systems for supervision. This paper presents an integrated technique for fault diagnosis and classification for open- and short-circuit faults in three-phase inverter circuits. Discrete wavelet transform and principal component analysis are utilized to detect the discontinuity in currents caused by a fault. The features of fault diagnosis are then extracted. A fault dictionary is used to acquire details about transistor faults and the corresponding fault identification. Fault classification is performed with a fuzzy logic system and relevance vector machine (RVM). The proposed model is incorporated with a set of optimization techniques, namely, evolutionary particle swarm optimization (EPSO) and cuckoo search optimization (CSO), to improve fault detection. The combination of optimization techniques with classification techniques is analyzed. Experimental results confirm that the combination of CSO with RVM yields better results than the combinations of CSO with fuzzy logic system, EPSO with RVM, and EPSO with fuzzy logic system.

Semi-Supervised Learning for Fault Detection and Classification of Plasma Etch Equipment (준지도학습 기반 반도체 공정 이상 상태 감지 및 분류)

  • Lee, Yong Ho;Choi, Jeong Eun;Hong, Sang Jeen
    • Journal of the Semiconductor & Display Technology
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    • v.19 no.4
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    • pp.121-125
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    • 2020
  • With miniaturization of semiconductor, the manufacturing process become more complex, and undetected small changes in the state of the equipment have unexpectedly changed the process results. Fault detection classification (FDC) system that conducts more active data analysis is feasible to achieve more precise manufacturing process control with advanced machine learning method. However, applying machine learning, especially in supervised learning criteria, requires an arduous data labeling process for the construction of machine learning data. In this paper, we propose a semi-supervised learning to minimize the data labeling work for the data preprocessing. We employed equipment status variable identification (SVID) data and optical emission spectroscopy data (OES) in silicon etch with SF6/O2/Ar gas mixture, and the result shows as high as 95.2% of labeling accuracy with the suggested semi-supervised learning algorithm.

Fault Classification for Rotating Machinery Using Support Vector Machines with Optimal Features Corresponding to Each Fault Type (결함유형별 최적 특징과 Support Vector Machine 을 이용한 회전기계 결함 분류)

  • Kim, Yang-Seok;Lee, Do-Hwan;Kim, Seong-Kook
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.34 no.11
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    • pp.1681-1689
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    • 2010
  • Several studies on the use of Support Vector Machines (SVMs) for diagnosing rotating machinery have been successfully carried out, but the fault classification depends on the input features as well as a multi-classification scheme, binary optimizer, kernel function, and the parameter to be used in the kernel function. Most of the published papers on multiclass SVM applications report the use of the same features to classify the faults. In this study, simple statistical features are determined on the basis of time domain vibration signals for various fault conditions, and the optimal features for each fault condition are selected. Then, the optimal features are used in the SVM training and in the classification of each fault condition. Simulation results using experimental data show that the results of the proposed stepwise classification approach with a relatively short training time are comparable to those for a single multi-class SVM.

An Availability of Low Cost Sensors for Machine Fault Diagnosis

  • SON, JONG-DUK
    • Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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    • 2012.10a
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    • pp.394-399
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    • 2012
  • In recent years, MEMS sensors show huge attraction in machine condition monitoring, which have advantages in power, size, cost, mobility and flexibility. They can integrate with smart sensors and MEMS sensors are batch product. So the prices are cheap. And the suitability of it for condition monitoring is researched by experimental study. This paper presents a comparative study and performance test of classification of MEMS sensors in target machine fault classification by 3 intelligent classifiers. We attempt to signal validation of MEMS sensor accuracy and reliability and performance comparisons of classifiers are conducted. MEMS accelerometer and MEMS current sensors are employed for experiment test. In addition, a simple feature extraction and cross validation methods were applied to make sure MEMS sensors availabilities. The result of application is good for using fault classification.

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Comparing machine fault diagnosis performances on current, vibration and flux based smart sensors (전류, 진동 및 자속센서기반 스마트센서를 이용한 기계결함진단 성능비교)

  • Son, Jong-Duk;Tae, Sung-Do;Yang, Bo-Suk;Hwang, Don-Ha;Kang, Dong-Sik
    • Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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    • 2008.04a
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    • pp.809-816
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    • 2008
  • With increasing demands for reducing cost of maintenance which can detect machine fault automatically; low cost and intelligent functionality sensors are required. Rapid developments, in semiconductor, computing, and communication have led to a new generation of sensor called "smart" sensors with functionality and intelligence. The purpose of this research is comparison of machine fault classification between general analyzer signals and smart sensor signals. Three types of sensors are used in induction motors faults diagnosis, which are vibration, current and flux. Classification results are satisfied.

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One-class Classification based Fault Classification for Semiconductor Process Cyclic Signal (단일 클래스 분류기법을 이용한 반도체 공정 주기 신호의 이상분류)

  • Cho, Min-Young;Baek, Jun-Geol
    • IE interfaces
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    • v.25 no.2
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    • pp.170-177
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    • 2012
  • Process control is essential to operate the semiconductor process efficiently. This paper consider fault classification of semiconductor based cyclic signal for process control. In general, process signal usually take the different pattern depending on some different cause of fault. If faults can be classified by cause of faults, it could improve the process control through a definite and rapid diagnosis. One of the most important thing is a finding definite diagnosis in fault classification, even-though it is classified several times. This paper proposes the method that one-class classifier classify fault causes as each classes. Hotelling T2 chart, kNNDD(k-Nearest Neighbor Data Description), Distance based Novelty Detection are used to perform the one-class classifier. PCA(Principal Component Analysis) is also used to reduce the data dimension because the length of process signal is too long generally. In experiment, it generates the data based real signal patterns from semiconductor process. The objective of this experiment is to compare between the proposed method and SVM(Support Vector Machine). Most of the experiments' results show that proposed method using Distance based Novelty Detection has a good performance in classification and diagnosis problems.

A New Support Vector Machine Model Based on Improved Imperialist Competitive Algorithm for Fault Diagnosis of Oil-immersed Transformers

  • Zhang, Yiyi;Wei, Hua;Liao, Ruijin;Wang, Youyuan;Yang, Lijun;Yan, Chunyu
    • Journal of Electrical Engineering and Technology
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    • v.12 no.2
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    • pp.830-839
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    • 2017
  • Support vector machine (SVM) is introduced as an effective fault diagnosis technique based on dissolved gases analysis (DGA) for oil-immersed transformers with maximum generalization ability; however, the applicability of the SVM is highly affected due to the difficulty of selecting the SVM parameters appropriately. Therefore, a novel approach combing SVM with improved imperialist competitive algorithm (IICA) for fault diagnosis of oil-immersed transformers was proposed in the paper. The improved ICA, which is proved to be an effective optimization approach, is employed to optimize the parameters of SVM. Cross validation and normalizations were applied in the training processes of SVM and the trained SVM model with the optimized parameters was established for fault diagnosis of oil-immersed transformers. Three classification benchmark sets were studied based on particle swarm optimization SVM (PSOSVM) and IICASVM with four multiple classification schemes to select the best scheme for transformer fault diagnosis. The results show that the proposed model can obtain higher diagnosis accuracy than other methods. The comparisons confirm that the proposed model is an effective approach for classification problems.

CNN-based Automatic Machine Fault Diagnosis Method Using Spectrogram Images (스펙트로그램 이미지를 이용한 CNN 기반 자동화 기계 고장 진단 기법)

  • Kang, Kyung-Won;Lee, Kyeong-Min
    • Journal of the Institute of Convergence Signal Processing
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    • v.21 no.3
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    • pp.121-126
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    • 2020
  • Sound-based machine fault diagnosis is the automatic detection of abnormal sound in the acoustic emission signals of the machines. Conventional methods of using mathematical models were difficult to diagnose machine failure due to the complexity of the industry machinery system and the existence of nonlinear factors such as noises. Therefore, we want to solve the problem of machine fault diagnosis as a deep learning-based image classification problem. In the paper, we propose a CNN-based automatic machine fault diagnosis method using Spectrogram images. The proposed method uses STFT to effectively extract feature vectors from frequencies generated by machine defects, and the feature vectors detected by STFT were converted into spectrogram images and classified by CNN by machine status. The results show that the proposed method can be effectively used not only to detect defects but also to various automatic diagnosis system based on sound.

Research Status on Machine Learning for Self-Healing of Mobile Communication Network (이동통신망 자가 치유를 위한 기계학습 연구동향)

  • Kwon, D.S.;Na, J.H.
    • Electronics and Telecommunications Trends
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    • v.35 no.5
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    • pp.30-42
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    • 2020
  • Unlike in previous generations of mobile technology, machine learning (ML)-based self-healing research trend are currently attracting attention to provide high-quality, effective, and low-cost 5G services that need to operate in the HetNets scenario where various wireless transmission technologies are added. Self-healing plays a vital role in detecting and mitigating the faults, and confirming that there is still room for improvement. We analyzed the research trend in self-healing framework and ML-based fault detection, fault diagnosis, and fault compensation. We propose that to ensure that self-healing is a proactive instead of being reactive, we have to design an ML-based self-healing framework and select a suitable ML algorithm for fault detection, diagnosis, and outage compensation.