• Title/Summary/Keyword: MOS structure

Search Result 174, Processing Time 0.029 seconds

A Study on the Characteristic of MOS structure using $HfO_{2}$ as high-k gate dielectric film ($HfO_{2}$를 이용한 MOS 구조의 제작 및 특성)

  • Park, C.I.;Youm, M.S.;Park, J.W.;Kim, J.W.;Sung, M.Y.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2002.11a
    • /
    • pp.163-166
    • /
    • 2002
  • We investigated structural and electrical properties of Metal-Oxide-Semiconductor(MOS) structure using Hafnium $oxide(HfO_{2})$ as high-k gate dielectric material. $HfO_{2}$ films are ultrathin gate dielectric material witch have a thickness less than 2.0nm, so it is spotlighted to be substituted $SiO_{2}$ as gate dielectric material. In this paper We have grown $HfO_{2}$ films with pt electrode on P-type Silicon substrate by RF magnetron sputtering system using $HfO_{2}$ target and oserved the property of semiconductor-oxide interface. Using pt electrode, it is necessary to be annealed at ${300^{\circ}C}$. This process is to increase an adhesion ratio between $HfO_{2}$ films with pt electrode. In film deposition process, the deposition time of $HfO_{2}$ films is an important parameter. Structura1 properties are invetigated by AES depth profile, and electrical properties by Capacitance-Voltage characteristic. Interface trap density are measured to observe the interface between $HfO_{2}$ with Si using High-frequency(1MHz) C-V and Quasi - static C-V characteristic.

  • PDF

A Systematic NMR Determination of α-D-Glucooligosaccharides, Effect of Linkage Type, Anomeric Configuration and Combination of Different Linkages Type on 13C Chemical Shifts for the Determination of Unknown Isomaltooligosaccharides

  • Goffin, Dorothee;Bystricky, Peter;Shashkov, Alexander S.;Lynch, Mary;Hanon, Emilien;Paquot, Michel;Savage, Angela V.
    • Bulletin of the Korean Chemical Society
    • /
    • v.30 no.11
    • /
    • pp.2535-2541
    • /
    • 2009
  • Prebiotic isomaltooligosaccharide preparations contain $\alpha$-D-glucooligosaccharides comprising isomaltooligosaccharides (IMOs) and non-prebiotic maltooligosaccharides (MOs). They are both glucose oligosaccharides characterized by their degree of polymerization (DP) value (from 2 to $\sim$10), linkages types and positions (IMOs: $\alpha$-(1$\rightarrow$2, 3, 6 and in a lower proportion internal 1$\rightarrow$4) linkages, MOs: α-(1$\rightarrow$4) linkages). Their structure is the key factor for their prebiotic potential. In order to determine and elucidate the exact structure of unknown IMOs and MOs, unambiguous assignments of $^{13}C$ and $^1H$ chemical shifts of commercial standards, representative of IMOs and MOs diversity, have been determined using optimized standard one and two-dimensional experiments such as $^1H$ NMR, $^{13}C$ NMR, APT and ${^1}H-{^1}H$ COSY, TOCSY, NOESY and <$^1H-{^{13}}C$ heteronuclear HSQC, HSQC-TOCSY, and HMBC. Here we point out the differential effect of substitution by a glucose residue at different positions on chemical shifts of anomeric as well as ring carbons together with the effect of the reducing end configuration for low DP oligosaccharides and diasteroisotopic effect for H-6 protons. From this study, structural $^{13}C$ specific spectral features can be identified as tools for structural analysis of isomaltooligosaccharides.

Modular Design of Analog Hopfield Network (아날로그 홉필드 신경망의 모듈형 설계)

  • Dong, Sung-Soo;Park, Seong-Beom;Lee, Chong-Ho
    • Proceedings of the KIEE Conference
    • /
    • 1991.11a
    • /
    • pp.189-192
    • /
    • 1991
  • This paper presents a modular structure design of analog Hopfield neural network. Each multiplier consists of four MOS transistors which are connected to an op-amp at the front end of a neuron. A pair of MOS transistor is used in order to maintain linear operation of the synapse and can produce positive or negative synaptic weight. This architecture can be expandable to any size neural network by forming tree structure. By altering the connections, other nework paradigms can also be implemented using this basic modules. The stength of this approach is the expandability and the general applicability. The layout design of a four-neuron fully connected feedback neural network is presented and is simulated using SPICE. The network shows correct retrival of distorted patterns.

  • PDF

Analog MOS circuits for motion detection based on correlation neural networks (상호연관 신경망에 기반을 둔 이동 검출을 위한 아날로그 집적회로)

  • ;;;Masahiro Ohtani;Hiroo Yonezu
    • Proceedings of the IEEK Conference
    • /
    • 2000.11c
    • /
    • pp.149-152
    • /
    • 2000
  • We propose simple analog MOS circuits producing the one-dimensional compact motion-sensing circuits. In the proposed circuit, the optical flow is computed by a number of local motion sensors which are based on biological motion detectors. Mimicking the structure of biological motion detectors made the circuit structure quite simple, compared with conventional velocity sensing circuits. Extensive simulation results by a simulation program of integrated circuit emphasis (SPICE) indicated that the proposed circuits could compute local velocities of a moving light spot and showed direction selectivity for the moving spot

  • PDF

A study on Effect of Surface ion Implantation for Suppression of Hot carrier Degradation of LDD-nMOSFETs (LDD-nMOSFET의 핫 캐리어 열화 억제를 위한 표면 이온주입 효과에 대한 연구)

  • Seo, Yong-Jin;An, Tae-Hyun;Kim, Sang-Yong;Kim, Tae-Hyung;Kim, Chang-Il;Chang, Eui-Goo
    • Proceedings of the KIEE Conference
    • /
    • 1998.11c
    • /
    • pp.735-736
    • /
    • 1998
  • Reduction of hot carrier degradation in MOS devices has been one of the most serious concerns for MOS-ULSIs. In this paper, three types of LDD structure for suppression of hot carrier degradation, such as spacer-induced degradation and decrease of performance due to increase of series resistance will be investigated. LDD-nMOSFETs used in this study had three different drain structure. (1) conventional ${\underline{S}}urface$ type ${\underline{L}}DD$(SL), (2) ${\underline{B}}uried$ type ${\underline{L}}DD$(BL), (3) ${\underline{S}}urface$urface ${\underline{I}}mplantation$ type LDD(SI). As a result, the surface implantation type LDD structure showed that improved hot carrier lifetime to comparison with conventional surface and buried type LDD structure.

  • PDF

Additive Data Insertion into MP3 Bitstream Using linbits Characteristics (Linbits 특성을 이용하여 MP3 비트스트림에 부가적인 정보를 삽입하는 방법에 관한 연구)

  • 김도형;양승진;정재호
    • The Journal of the Acoustical Society of Korea
    • /
    • v.22 no.7
    • /
    • pp.612-621
    • /
    • 2003
  • As the use of MP3 audio compression increased, the demand for the insertion of additive data about copyright or information on music contents has been groved and the related research has been progressed actively. When an additive data is inserted into MP3 bitstream, it should not to happen any distortion of music quality or the change of file size, due to the modification of MP3 bitstream structure. In our study, to make these conditions satisfied, we inserted some additive data to bitstream by modifying some bits of linbits among the quantized integer coefficients having big values. At this time, we consider the characteristics of linbits and their distributions. As a result of subjective sound quality test through MOS test, we confirmed that the quality of MOS 4.6 can be achieved at the data insertion rate of 60 bytes/sec. Using the proposed method, it is possible to effectively insert an additive data such as copyright information or information about media itself, so that various applications like audio database management can be realized.

Electrical Characteristics on MOS Structure with Irradiation of Radiation (방사선이 조사된 MOS구조에서의 전기적 특성)

  • 임규성;고석웅;정학기
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
    • /
    • 2001.10a
    • /
    • pp.644-647
    • /
    • 2001
  • The investigations were discussed on the radiation effects of the electrical properties to the p-type MOS capacitors, which were irradiated by cobalt-60 gamma ray sources. The characteristics of capacitance-bias voltage(C-V) and of dielectric dissipation tarter-bias voltage(D-V) on the capacitors were measured at 1 [MHz] frequency. The microscopic behaviors of spate charges in oxide and silicon-silicon dioxide(Si- $SiO_2$) interface were investigated from the experimental data. The C-V characteristics are statical and convenient for the evaluation of the steady state behavior of carriers and interface states characteristics. While, the distribution and magnitude of space charges in oxide can be found out accurately on the $V_{dp}$ in D-V curves. The density of interface states can be deduced with ease from the magnitude of D-peak at depletion state. Thus, it is also concluded that the D-V curves are more useful and easier than conventional C-V curves for analysis of the microscopic and dynamic behavior of carriers in oxide and Si- $SiO_2$interface.

  • PDF

Characterization of $HfO_2$/Hf/Si MOS Capacitor with Annealing Condition (열처리 조건에 따른 $HfO_2$/Hf/Si 박막의 MOS 커패시터 특성)

  • Lee, Dae-Gab;Do, Seung-Woo;Lee, Jae-Sung;Lee, Yong-Hyun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2006.06a
    • /
    • pp.8-9
    • /
    • 2006
  • Hafnium oxide ($HfO_2$) thin films were deposited on p-type (100) silicon wafers by atomic layer deposition (ALD) using TEMAHf and $O_3$. Prior to the deposition of $HfO_2$ films, a thin Hf ($10\;{\AA}$) metal layer was deposited. Deposition temperature of $HfO_2$ thin film was $350^{\circ}C$ and its thickness was $150\;{\AA}$. Samples were then annealed using furnace heating to temperature ranges from 500 to $900^{\circ}C$. The MOS capacitor of round-type was fabricated on Si substrates. Thermally evaporated $3000\;{\AA}$-thick AI was used as top electrode. In this work, We study the interface characterization of $HfO_2$/Hf/Si MOS capacitor depending on annealing temperature. Through AES(Auger Electron Spectroscopy), capacitance-voltage (C-V) and current-voltage (I-V) analysis, the role of Hf layer for the better $HfO_2$/Si interface property was investigated. We found that Hf meta1 layer in our structure effective1y suppressed the generation of interfacial $SiO_2$ layer between $HfO_2$ film and silicon substrate.

  • PDF

Electrical and Material Characteristics of HfO2 Film in HfO2/Hf/Si MOS Structure (HfO2/Hf/Si MOS 구조에서 나타나는 HfO2 박막의 물성 및 전기적 특성)

  • Bae, Kun-Ho;Do, Seung-Woo;Lee, Jae-Sung;Lee, Yong-Hyun
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.22 no.2
    • /
    • pp.101-106
    • /
    • 2009
  • In this paper, Thin films of $HfO_2$/Hf were deposited on p-type wafer by Atomic Layer Deposition (ALD). We studied the electrical and material characteristics of $HfO_2$/Hf/Si MOS capacitor depending on thickness of Hf metal layer. $HfO_2$ films were deposited using TEMAH and $O_3$ at $350^{\circ}C$. Samples were then annealed using furnace heating to $500^{\circ}C$. Round-type MOS capacitors have been fabricated on Si substrates with $2000\;{\AA}$-thick Pt top electrodes. The composition rate of the dielectric material was analyzed using TEM (Transmission Electron Microscopy), XRD (X-ray Diffraction) and XPS (X-ray Photoelectron Spectroscopy). Also the capacitance-voltage (C-V), conductance-voltage (G-V), and current-voltage (I-V) characteristics were measured. We calculated the density of oxide trap charges and interface trap charges in our MOS device. At the interface between $HfO_2$ and Si, both Hf-Si and Hf-Si-O bonds were observed, instead of Si-O bond. The sandwiched Hf metal layer suppressed the growing of $SiO_x$ layer so that $HfSi_xO_y$ layer was achieved. And finally, the generation of both oxide trap charge and interface trap charge in $HfO_2$ film was reduced effectively by using Hf metal layer.

Large Scale Structures at z~1 in SA22 Field and Environmental Dependence of Galaxy Properties

  • Hyun, Minhee;Im, Myungshin;Kim, Jae-Woo;Lee, Seong-Kook;Paek, Insu
    • The Bulletin of The Korean Astronomical Society
    • /
    • v.46 no.2
    • /
    • pp.68.1-68.1
    • /
    • 2021
  • We study galaxy evolution with the large-scale environment with confirmed galaxy clusters from multi-object spectroscopy (MOS) observation. The observation was performed with Inamori Magellan Areal Camera and Spectrograph (IMACS) mounted on the 6.5 m Magellan/Baade telescope in Las Campanas Observatory. With the MOS observation, we spectroscopically confirm 34 galaxy clusters, including three galaxy clusters discovered in Kim et al. (2016) and 11 of them have halo mass of > 1014.5 M. Among the confirmed clusters, 12 galaxy clusters are part of large-scale structure at z ~ 0.9, and their size stretches to 40 Mpc co-moving scale. In this study, we checked the 'web feeding model,' which postulates that more linked (with their environment) galaxy clusters have less quenched populations by investigating the correlation between properties of confirmed galaxy clusters and the large-scale structure environment. Lastly, we found that galaxy clusters that make up the large-scale structure have larger and widely spread values of total star formation density (ΣSFR/Mhalo) than typical clusters at similar redshifts.

  • PDF