• 한국정보시스템학회지:정보시스템연구
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• 제29권4호
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• pp.101-121
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• 2020

Purpose The purpose of this study is to understand the current status of MIS curriculum and to find ways to improve it. In addition, the results of the research can be used as basic data for improving MIS curriculum. Design/methodology/approach A research framework was designed to derive research results using the keyword network analysis method of this study: 1) Keywords were extracted based on the six units of the big data analysis job competency. 2) And based on the extracted keywords, the relationship between the keywords and MIS curriculum for each university was identified. Findings In the MIS curriculum information of a few universities, education related to big data analysis was conducted. 1) In the MIS curriculum of a few universities, education related to big data analysis was conducted. However, MIS curriculum of the university, which is the subject of analysis, education focused on concepts and theory rather than practical education was conducted. 2) And it was confirmed that there is a difference from the education required by the industry.

• 경영정보학연구
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• 제9권3호
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• pp.1-32
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• 2007

본 연구의 주제는 MIS 커리큠럼의 현재와 미래이다. 국내외 주요 대학교의 MIS 커리큠럼 현황을 조사하고, 학계와 산업계의 새로운 요구사항을 분석하며, 이 격과를 토대로 정보기술 발전과 비즈니스 수요 변화에 대응할 수 있는 미래의 MIS 커리큘럼 발전모델을 제시한다. 연구 수행 1단계에서는 MIS 커리큘럼 체계를 파악하기 위하여 기존에 존재하고 있는 커리큘럼 모델인 MSIS 2000, IS 2002, Computing Curricular 2005를 분석하였다. 그리고 실제 상황을 조사하기 위하여 국내외 주요 대학교의 MIS프로그램에서 개설하는 약 800개 과목 데이터를 수집하였으며, 3개 영역, 14개 주제 분야, 49개 단위과목으로 분류하였다. 2단계에서는 현재 개설 과목의 중도와 향후 개설할 필요가 있는 새로운 MIS 과목에 대한 수요를 학계 및 산업계 종사자를 대상으로 분석하였다. MIS 전문가가 갖추어야 할 지식기술은 전통적인 정보시스템 기획/개발/운영 외에도 정보기술 인프라 관리, 비즈니스 문제해결 능력, 비즈니스 혁신 역량이 강조되고 있었다. 3단계에서는 기존 과목의 중요성 및 신규 과목 수요를 토대로 MIS 커리큘럼 발전모델을 제안하였다 발전모델은 크게 5개 커리어 트랙으로 구성된다. (1) IS Development 트랙, (2) IT Management 트랙, (3) Business Application Systems 트랙, (4) Digital Business 트랙, (5) Business Innovation 트랙. 본 연구에서 제시하는 발전모델은 MIS 전공의 정체성을정립하고, 커리큘럼의 유연성을 확보하는데 주안점을 두었다.

• 센서학회지
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• 제5권6호
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• pp.60-67
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• 1996

저온 remote PECVD $SiO_{2}$막을 이용하여 제조된 InSb MIS구조에서의 계면의 전기적 특성에 대하여 연구하였다. $105^{\circ}C$에서 증착시킨 $SiO_{2}$막을 이용한 MIS구조의 중간 에너지 대역폭에서의 계면상태밀도가 $1{\sim}2{\times}10^{11}\;cm^{-2}eV^{-1}$으로 평가되었다. 그러나, $105^{\circ}C$이상의 고온에서 제조된 MIS소자의 계면에는 다량의 계면준위 및 트랩 준위가 존재하였다. G-V측정으로부터 계산된 계면준위들의 시상수는 $10^{-4}{\sim}10^{-5}\;sec$였으며, 증착온도가 증가할수록 트랩밀도가 증가하여 C-V특성곡선의 이력특성이 증대되었다.

• Journal of Korean Neurosurgical Society
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• 제48권3호
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• pp.219-224
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• 2010

Objective : A minimally invasive transforaminal lumbar interbody fusion (MIS TLlF) has recently been introduced. However, MIS TLlF is a technically challenging procedure. The authors performed retrospective analysis about MIS TLlF using a single interbody cage. Methods : Twenty-eight consecutive patients were treated by MIS TLlF. Of these 28 patients, 20 patients were included in this retrospective study. Perioperative, clinical, and radiologic outcomes were assessed. Clinical outcomes were assessed using Oswestry Disability Index (ODI) and Visual Analogue Scores (VAS). Fusion rates and cross-sections of operated spinal canals were assessed by CT. Results : Twelve patients underwent MIS TLlF at one segment and 8 patients at two segments (L3/4: 4, L4/5: 17, L5/S1: 7). Operation time for a single segment was 131.7 min and for two segment was 201.4 min, and corresponding blood losses were 208.3 mL and 481.2 mL, respectively. ODI and VAS scores were significantly improved at 6 months postop (ODI from 30.32 to 15.54, VAS from 7.80 to 2.20, p = 0.001) Twenty-two segments (78.6%) achieved grade I fusion, 4 segments (14.3%) achieved grade II, 2 segments (7.1%) achieved grade III and 0 segments achieved grade IV at 12 months. Postoperatively at 12 months, spinal canal cross sectional areas at disc spaces significantly increased from 157.5 to $294.3\;mm^2$ (p = 0.012). Conclusion : MIS TLlF achieved good clinical outcomes and high fusion rates. Our findings show that MIS TLlF performed with a single Interbody cage and a tubular retractor system can be used as a standard MIS TLlF technique.

• 경영정보학연구
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• 제5권2호
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• pp.219-239
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• 2003

본 연구는 국내 4년제 대학 MIS 교육과정을 실무자 관점에서 평가하고, IS 인력의 업무내용과 수행비중, 그리고 그에 요구되는 핵심 직무 역량을 현업 부서원들과 IS 전문가 관점에서 비교 분석함으로써 4년제 대학 및 IT 전문기관의 교육 프로그램 방향과 교수법에 관해 논의하고자 하는 것이다. 실무자들의 인식에 따르면 향후 NIS 전공자에게 가장 적합한 직무는 IS 기획 및 전략 수립, 어플리케이션 시스템 개발, IT 컨설팅 등으로 나타났고, IS 전문가에게 요구되는 핵심 직무 기술로는 인간관계 기술군이 가장 중요한 것으로 인식되었으며, 경영활동의 흐름과 프로세스에 대한 이해, 경영기능에 대한 지식, 그리고 최신 IT에 대한 지식과 평가 능력, IT 요소기술군 순으로 나타났다.

• 한국제4기학회지
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• 제18권2호통권23호
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• pp.67-73
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• 2004

Dissected erosional surfaces are widely distributed in the western part of Korea (e.g. Icheon, Chungju, Jecheon, Seosan). The deposits with thickness of less than 2m occur on the smooth bedrock surface are composed of poorly sorted subangular gravels with less than 20cm diameter. However, only weathered mantle of granites without the gravel layer are observed at some outcrops. The results of grain size analysis of deposits of Icheon district revealed that the characteristic of the gain size distribution is very similar with the results of sheetflood deposits presented by Blair (1999) in the Death Valley. Loess layer with buried soil layers of MIS7 covers the sheetflood deposits. The loess layer implies that the sheetflood deposits occurred before MIS7 based on the typical Loess sequences presented by Naruse et al.(2003). On the other hand, the climate of Korean Peninsula in MIS2 was very dry and cold (Yoon and Hwnag, 2003) by pollen analysis. This is because Yellow Sea was completely emerged during the MIS2(e.g. Sau\ito, 1998). So, it is thought that the climate in Korean Peninsula of not only MIS2 but also other glacial ages such as MIS8 was similar with present Mongolian climates. Tanaka et al.(2005) pointed out that Hortonian overlandflow occurs in grass vegetated granite basin in Mongolia. Therefore, dissected piedmont gentle slopes in the western Korea were possibly formed by sheetflood erosion during probably MIS8 as pediment widely distributed in Mongolia.

• 한국전기전자재료학회논문지
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• 제21권4호
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• pp.329-334
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• 2008

Aluminum oxide films were deposited on n-type GaN substrates by RF magnetron sputtering technique for MIS devices applications using optimized conditions, Well-behaved C - V characteristics were obtained measured in MIS capacitors structures. The calculated interface trap density measured at $300^{\circ}C$ was about $9\times10^{10}/cm^2$ eV in the upper bandgap. The gate leakage current densities of the MIS structures were about $10^{-9}A/cm^2$ and about $10^{-4}A/cm^2$ measured at room temperature and at $300^{\circ}C$ for $a{\pm}1MV/cm$, respectively. These results indicate that the interface property of this structure is enough quality to MIS devices applications.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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• pp.197-198
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• 2008

이 논문에서는 다양한 SiNx의 band gap을 이용하여 MIS 구조의 메모리 소자를 제작하고 이를 분석하였다. SiNx 박막은 증착 가스비에 따라 다양한 band gap을 가지게 된다. 본 실험에서는 $SiH_4$ 가스와 $NH_3$ 가스를 사용하여 SiNx 박막을 증착하였다. n-type 단결정 실리콘 기판위에 다양한 가스비에 따라 단일 SiNx 박막을 증착 및 분석하였고, 이를 이용하여 NNN 구조의 MIS 소자를 제작하였다. 제작된 소자는 4.6 V의 hysteresis roof 폭과 1000 초 후에 84.8 %의 retention 값을 갖는 우수한 메모리 특성을 보였다.

• KSII Transactions on Internet and Information Systems (TIIS)
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• 제15권4호
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• pp.1360-1388
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• 2021

Shipbuilding and repairing enterprise has the characteristics of many hazards and accidents. Therefore, the safety management ability of shipbuilding and repairing MIS (management information system) must be effectively guaranteed. The verification on safety management is the necessary measure to ensure and improve the safety management ability of MIS. Safety verification can not only increase the safety of MIS, but also make early warning of potential risks in management to avoid the accidents. Based on the authoritative standards in the field of safety in shipbuilding and repairing enterprise, this paper applied modeling and verification method based on ontology to safety verification of MIS, extracted the concepts and associations from related safety standards to construct axiom set to support safety verification on MIS of shipbuilding and repairing enterprise. Then, this paper developed the corresponding safety ontology modeling and verification tool-SOMVT. By the application and comparison of two examples, this paper effectively verified the safety of MIS to prove the modeling method and the SOMVT can improve the safety of MIS in a much more effective and stable way to traditional manual analysis.

• 대한전기학회논문지
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• 제44권4호
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• pp.483-489
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• 1995

To investigate the mechanism generated by irradiation in the insulator layer irradiated MIS (Metal - Insulator - Semiconductor) device, the various types of MIS capacitors depending on insulator thickness, insulator types and implanted impurities are fabricated on the P-type wafer. MIS capacitors exposed by 1Mrad Co$^{60}$ .gamma.-ray are measured for flat band voltage and charge density shifts pre- and post-irradiation. The measuring results of post-irradiation show the flat band voltage shifting toward negative direction and charge density increasing regardless of parameters. This results have a good agreement with calculated data by computer simulation. Si$_{3}$N$_{4}$ layers have a good radiation-hardness than SiO$_{2}$ layers compared to the results of post-irradiation. Also, radiation-induced negative trap is discovered in the implanted insulator layer. Using numerical analysis, four continuty equations (conduction-band electrons continuity equation, valence-band holes continuity equation, trapped electrons continuity equation, trapped holes continuity equation) are solved and charge distributions according to the distance and Si-Insulator interface states are investigated.