• 한국정밀공학회지
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• 제16권2호통권95호
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• pp.145-152
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• 1999

This paper presents the principle and experimental results of a non-contact surface roughness measurement by means of screen projected pattern of lase beam reflected from a polished surface. In the reflected laser beam pattern especially from a fine surface like ground or polished one, light intensity varies from the center fo the image to its boundary as the Gaussian distribution. The standard deviation of a light intensity distribution is assumed to be a good non-contact estimator for measuring the surface roughnes, because the light reflectivity is known to be well related with the surface roughness. This method doesn't need to discriminate between the specularly reflected light and the diffusely reflected one, whereas the scattered laser intensity method must do. Nor it needs to adjust the change of light intensity caused by environmental lights or specimen materials. Reflected laser beam pattern narrowly spreads out in the vertical direction to tiny scratches on the polished surface due to abrasives. The deeper the scratch the more the dispersion, which means the rougher surface. The standard deviation of the pattern is nearly in proportion to the surface roughness. Measurement errors by this method are shown to be below 10 percent compared with those obtained by a common contact method. The inclination of measuring unit from the normal axis causes the measurement errors up to 10 percent for an angle of 4 degree. Therefore the proposed method can be used as an on-the-machine quick roughness estimator within 10 percent measurement error.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2002년도 춘계학술대회 논문집
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• pp.263-266
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• 2002

An optical method for surface roughness estimation based on statistical analysis of the light intensity of a scattered laser beam pattern. The method is very simple but has a disadvantage that no more information than the averaged roughness is estimated. In this study a new try was conducted to derive more advanced surface information from the details of the light intensity distribution. Some periodic ripples among the light intensity distribution being assumed to relate with scratch left on the machined surface, a corresponding surface profile is estimated from the ripples using FFT and IFFT algorithm. IFFT technique is used to extract some dominant signal components among the intensity distribution. Compared to the measured profiles by a stylus type surf-tester, the profiles obtained through the proposed method are probably acceptable in a sense of the profile shape. Calibration of the amplitude needs more works in the future.

• 한국정밀공학회지
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• 제30권3호
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• pp.340-348
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• 2013

In Projection Stereolithography Apparatus (PSLA), Digital Micromirror Device (DMD) and Liquid Crystal Display (LCD) are used as a beam pattern generator. The DMD shows high resolution, but it is mostly applied in micro stereolithography due to high cost and fabricable area. In LCD, the size of pattern beam is freely controlled due to various panel sizes. The LCD, however, has some limitations such as short life time by the high power light source, non-uniform light intensity of pattern beam and low transmittance of UV-light. To solve these problems in LCD-based PSLA, a Scanbeam-SLA with LCD of 19 inches and visible LED-array is developed. In this system, the light module works like a scanner for uniform illumination. The system configuration, working principle and fabrication examples are addressed in this study.

• 전자공학회논문지
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• 제52권4호
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• pp.156-163
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• 2015

본 논문은 광패턴 조사를 통한 능동형 수위 및 거리 측정 기법을 제안한다. 기존 압력식, 부자식, 초음파식, 레이더식 등의 수위측정기법과 달리 최근에는 수위측정의 정확성과 모니터링 편리성을 강조한 영상기반 수위측정기법이 활용되고 있다. 본 논문에서는 참조용 광패턴을 교각이나 제방 등에 동적으로 조사(照射)하고, 카메라 장치로부터 조사된 광패턴 영상을 실시간 분석 처리하여 자동 수위측정 및 조사(照射) 대상물까지의 거리측정을 위한 새로운 방법을 제시한다. 기존 방법이 교각에 기(旣) 부착된 수위표나 마커 인식을 위해 수동적으로 영상데이터를 분석하는 것이었다면, 본 기법은 교각 설치 환경에 대응하여 능동적으로 참조 광패턴을 생성하여 사용함으로써, 난시야(難視野) 환경 및 잡음 대응에 효과적이고, 포터블 형태로 주야간 이용이 가능하며, 별도 조명 설치를 요구하지 않는 등의 강건한 수위 측정을 지원한다. 본 실험은 실내 시험 환경을 구성하여 시뮬레이션 하였으며, 0.4-1.4m 거리 13.5-32.5cm 높이에서 수위 및 거리 측정을 수행하였다.

• 한국광학회지
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• 제15권2호
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• pp.171-176
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• 2004

광 편향기가 집적된 레이저 다이오드를 제작하고 편향기 주입전류에 따른 레이저 다이오드의 특성 변화 및 출력광의 편향을 조사하였다. 레이저 다이오드와 집적된 수동 도파로의 상부 클래드 층의 일부분에 광 편향기를 집적하고, 편향기의 전류 주입에 따른 굴절률 변화를 유도하여 출력광의 편향이 발생하도록 하였다. 편향기의 전류 주입에 따른 출력광의 특성변화를 조사하기 위하여 편향기 주입 전류에 따른 레이저 다이오드의 문턱 전류(threshold current), 발진 효율(slope efficiency) 및 출력광 스펙트럼을 측정하였다. 측정 결과, 편향기 전류의 증가에 따라 출력광의 문턱 전류는 증가하고, 발진 효율은 감소하는 경향을 나타내었으나 출력광의 스펙트럼에는 영향을 주지 않는 특성을 나타내었다. 또한, 이론적 계산을 통해 광 편향기를 지나는 광이 편향됨을 확인하고, 편향기 집적 레이저 다이오드에서 출력되는 광의 far-field pattern을 측정하여 편향기 주입 전류에 따른 출력광의 편향을 실험적으로 확인하였다. 제작된 광 편향기 집적 레이저 다이오드에서 15 ㎃의 광 편향기 주입 전류 변화에 대해서 1.9$^{\circ}$의 편향각 변화를 측정 할 수 있었다.

• 한국정밀공학회지
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• 제18권11호
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• pp.51-57
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• 2001

A light beam reflected from a machined surface generally containes information concerning about its surface roughness. This study examines and proposes a surface roughness measurement technique for on-machine measurement of machined surfaces. The technique is based on the measurement of a reflected laser beam pattern and the statistical analysis of its light intensity distribution. The surface roughness was found to be closely related to the standard deviation of the light intensity on the primary axis of the reflected pattern. An image acquisition device is made up of a laser diode, a half mirror, a screen, and a CCD camera. The exact image with the primary and secondary axes of a reflected laser beam pattern is calculated through such image processing algorithm as thresholding, edge detection, image rotation, segmentation, etc. A median filter and a surrounding light correction algorithm are improve the image quality and reduce the measuring error. Using the developed measuring device the effect of screen materials and workpiece and workpiece materials was investigated. Experimental results regarding to relatively high-quality surfaces machined by grinding, polishing, lapping processes have shown the measurement error is within 10% in the range of $0.1{mu}m~0.8{\mu}m R_q.$Therefore, the proposed method is thought to be effectively used when quick measurements is needed with workpieces fixed on the machine.

• Current Optics and Photonics
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• 제5권5호
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• pp.506-513
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• 2021

An arrayed diffractive optical element design for the beam-shaping of a multi-array light source is proposed. This is an essential device for recent optical security and face recognition applications. In practice, we devise a DC noise reduction technique featuring high fabrication error tolerance regarding the multi-array light source diffractive optical elements, as a necessary part of the proposed design method. The spherical diverging illumination leads to DC-conjugate noise spreading. The main idea is tested experimentally, and the multi-array light source diffraction pattern is investigated numerically.

• 한국광학회지
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• 제21권1호
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• pp.6-11
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• 2010

아크릴레이트계 모노머를 사용한 최적화 된 포토폴리머에 안트라센 형광폴리머를 첨가하여 형광 특성을 가지는 포토폴리머를 제조하고, 514 nm 레이저를 이용하여 2-beam coupling 방법으로 형광 포토폴리머 필름 위에 회절격자를 형성하였다. 기록 시작 후 30초 이내에 선명한 fluorescent line pattern 이 형성되었으며, 회절격자 형성 뒤, 패턴이 형성된 부분에서 형광 세기의 증가가 관찰되었다. 기록 시 간섭 빔 앞에 mask pattern 을 이용하여 $50\;{\mu}m$ gap electrode 패턴을 형성하였다. 이 때 형성된 패턴은 micron scale gap패턴 안에 회절격자로부터 생성된 submicron scale의 grating line을 보였다. 이는 beam의 광 고분자 film 표면에 대한 각도($3.6^{\circ}$, $15^{\circ}$), 패턴에 사용된 광 고분자의 굴절률 등으로부터 Bragg's equation 을 사용하여 계산된 이론적인 grating 간격 ($0.6\;{\mu}m$) 과 오차범위 안에서 일치 하였다.

• Journal of the Optical Society of Korea
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• 제15권4호
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• pp.362-367
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• 2011

Organic ($Alq_3$) film, which was coated on a donor plate, was transferred to an organic light emitting diode (OLED) substrate with help of heat generated by a dithering laser beam. The laser beam was diffracted in an acousto-optic modulator (AOM), then focused on the laser-to-heat converting layer of the donor plate; the focused spot followed trajectories guided by rotation of a Galvano-mirror. Three different functional waveforms, sine wave, square wave, and saw tooth wave were applied to the AOM as modulation signal to generate the dithering beam. The fluorescence microscope images of the donor plate showed that the patterns of removed $Alq_3$ film were affected considerably by the modulation waveforms and the phase difference between adjacent dithering beams. Further, the printed images of Alq3 film on the OLED substrate were different from the patterns of removed Alq3 film. Atomic force microscope images indicated that not only direct transfer but also deposition by sublimated vapor of Alq3 contributed to the pattern formation. Printed patterns affected considerably the electricity-to-light conversion characteristics of OLEDs. For uniform transfer, not only the phase relation of dithering beam lines but also adequate waveform were important.

• 한국광학회:학술대회논문집
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• 한국광학회 1999년도 제16회 광학 및 양자전자 학술발표회Proceedings of 16th Optics and Quantum Electronics Conference, 1999
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• pp.126-127
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• 1999