• Journal of the Korean Society for Precision Engineering
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• v.16 no.2 s.95
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• pp.145-152
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• 1999

This paper presents the principle and experimental results of a non-contact surface roughness measurement by means of screen projected pattern of lase beam reflected from a polished surface. In the reflected laser beam pattern especially from a fine surface like ground or polished one, light intensity varies from the center fo the image to its boundary as the Gaussian distribution. The standard deviation of a light intensity distribution is assumed to be a good non-contact estimator for measuring the surface roughnes, because the light reflectivity is known to be well related with the surface roughness. This method doesn't need to discriminate between the specularly reflected light and the diffusely reflected one, whereas the scattered laser intensity method must do. Nor it needs to adjust the change of light intensity caused by environmental lights or specimen materials. Reflected laser beam pattern narrowly spreads out in the vertical direction to tiny scratches on the polished surface due to abrasives. The deeper the scratch the more the dispersion, which means the rougher surface. The standard deviation of the pattern is nearly in proportion to the surface roughness. Measurement errors by this method are shown to be below 10 percent compared with those obtained by a common contact method. The inclination of measuring unit from the normal axis causes the measurement errors up to 10 percent for an angle of 4 degree. Therefore the proposed method can be used as an on-the-machine quick roughness estimator within 10 percent measurement error.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2002.05a
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• pp.263-266
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• 2002

An optical method for surface roughness estimation based on statistical analysis of the light intensity of a scattered laser beam pattern. The method is very simple but has a disadvantage that no more information than the averaged roughness is estimated. In this study a new try was conducted to derive more advanced surface information from the details of the light intensity distribution. Some periodic ripples among the light intensity distribution being assumed to relate with scratch left on the machined surface, a corresponding surface profile is estimated from the ripples using FFT and IFFT algorithm. IFFT technique is used to extract some dominant signal components among the intensity distribution. Compared to the measured profiles by a stylus type surf-tester, the profiles obtained through the proposed method are probably acceptable in a sense of the profile shape. Calibration of the amplitude needs more works in the future.

• Journal of the Korean Society for Precision Engineering
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• v.30 no.3
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• pp.340-348
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• 2013

In Projection Stereolithography Apparatus (PSLA), Digital Micromirror Device (DMD) and Liquid Crystal Display (LCD) are used as a beam pattern generator. The DMD shows high resolution, but it is mostly applied in micro stereolithography due to high cost and fabricable area. In LCD, the size of pattern beam is freely controlled due to various panel sizes. The LCD, however, has some limitations such as short life time by the high power light source, non-uniform light intensity of pattern beam and low transmittance of UV-light. To solve these problems in LCD-based PSLA, a Scanbeam-SLA with LCD of 19 inches and visible LED-array is developed. In this system, the light module works like a scanner for uniform illumination. The system configuration, working principle and fabrication examples are addressed in this study.

• Journal of the Institute of Electronics and Information Engineers
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• v.52 no.4
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• pp.156-163
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• 2015

In this paper, we propose an active water level and distance measurement algorithm using a light beam pattern. On behalf of conventional water level gauge types of pressure, float-well, ultrasonic, radar, and others, recently, extensive research for video analysis based water level measurement methods is gradually increasing as an importance of accurate measurement, monitoring convenience, and much more has been emphasized. By turning a reference light beam pattern on bridge or embankment actively, we suggest a new approach that analyzes and processes the projected light beam pattern image obtained from camera device, measures automatically water level and distance between a camera and a bridge or a levee. As contrasted with conventional methods that passively have to analyze captured video information for recognition of a watermark attached on a bridge or specific marker, we actively use the reference light beam pattern suited to the installed bridge environment. So, our method offers a robust water level measurement. The reasons are as follows. At first, our algorithm is effective against unfavorable visual field, pollution or damage of watermark, and so on, and in the next, this is possible to monitor in real-time the portable-based local situation by day and night. Furthermore, our method is not need additional floodlight. Tests are simulated under indoor environment conditions from distance measurement over 0.4-1.4m and height measurement over 13.5-32.5cm.

• Korean Journal of Optics and Photonics
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• v.15 no.2
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• pp.171-176
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• 2004

A light deflector integrated laser diode(LD) was fabricated and the characteristics of LD and ourput beam deflection as a function of deflector injection current were measured. To integrate the deflector with LD, a passive waveguide was integrated with the LD and a triangular-type light deflector was fabricated on the upper clad of the passive waveguide section. Light deflection from the fabricated light deflector is controlled by the effective refractive index variation induced by carrier injection. To characterize the effect of the deflector injection current, threshold current, slope efficiency, and output beam spectrum were measured as a function of deflector injection current. From these measured data, the increment in the threshold current and the decrement of the slope efficiency were observed. However, the output beam spectrum was not affected by the deflector. The Beam Propagation Method(BPM) was used to simulate the proposed device and the light deflection was measured by the far-field pattern of the output beam as a function of the deflector injection current. In the fabricated deflector integrated LD, the deflection angle of 1.9$^{\circ}$ at the injection current of 15 ㎃ was obtained.

• Journal of the Korean Society for Precision Engineering
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• v.18 no.11
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• pp.51-57
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• 2001

A light beam reflected from a machined surface generally containes information concerning about its surface roughness. This study examines and proposes a surface roughness measurement technique for on-machine measurement of machined surfaces. The technique is based on the measurement of a reflected laser beam pattern and the statistical analysis of its light intensity distribution. The surface roughness was found to be closely related to the standard deviation of the light intensity on the primary axis of the reflected pattern. An image acquisition device is made up of a laser diode, a half mirror, a screen, and a CCD camera. The exact image with the primary and secondary axes of a reflected laser beam pattern is calculated through such image processing algorithm as thresholding, edge detection, image rotation, segmentation, etc. A median filter and a surrounding light correction algorithm are improve the image quality and reduce the measuring error. Using the developed measuring device the effect of screen materials and workpiece and workpiece materials was investigated. Experimental results regarding to relatively high-quality surfaces machined by grinding, polishing, lapping processes have shown the measurement error is within 10% in the range of $0.1{mu}m~0.8{\mu}m R_q.$Therefore, the proposed method is thought to be effectively used when quick measurements is needed with workpieces fixed on the machine.

• Current Optics and Photonics
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• v.5 no.5
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• pp.506-513
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• 2021

An arrayed diffractive optical element design for the beam-shaping of a multi-array light source is proposed. This is an essential device for recent optical security and face recognition applications. In practice, we devise a DC noise reduction technique featuring high fabrication error tolerance regarding the multi-array light source diffractive optical elements, as a necessary part of the proposed design method. The spherical diverging illumination leads to DC-conjugate noise spreading. The main idea is tested experimentally, and the multi-array light source diffraction pattern is investigated numerically.

• Korean Journal of Optics and Photonics
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• v.21 no.1
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• pp.6-11
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• 2010

Fluorescent photopolymer film was prepared with composition containing acrylate monomer, binder, a visible light sensitive photo initiator, and fluorescent anthracene polymer. A fluorescent grating pattern was inscribed on the photopolymer film using a 2-beam coupling method. A 514 nm laser was coupled to generate a beam-interference pattern. A highly fluorescent diffractive line pattern was formed on the fluorescent photopolymer within 30 sec. of exposure. The fluorescence intensity was highly enhanced in the patterned area, possibly due to the change in the environment of the fluorescent polymers by the photo-polymerization of monomers. Under a photo-mask, a gap electrode pattern was formed of fluorescent gratings with a sub-micron scale, which was matched well to the calculated value ($2.5\;{\mu}m$ and $0.6\;{\mu}m$) based on the refractive index of the photopolymer and beam incident angle ($3.4^{\circ}$, $15^{\circ}$) to the photopolymer surface.

• Journal of the Optical Society of Korea
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• v.15 no.4
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• pp.362-367
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• 2011

Organic ($Alq_3$) film, which was coated on a donor plate, was transferred to an organic light emitting diode (OLED) substrate with help of heat generated by a dithering laser beam. The laser beam was diffracted in an acousto-optic modulator (AOM), then focused on the laser-to-heat converting layer of the donor plate; the focused spot followed trajectories guided by rotation of a Galvano-mirror. Three different functional waveforms, sine wave, square wave, and saw tooth wave were applied to the AOM as modulation signal to generate the dithering beam. The fluorescence microscope images of the donor plate showed that the patterns of removed $Alq_3$ film were affected considerably by the modulation waveforms and the phase difference between adjacent dithering beams. Further, the printed images of Alq3 film on the OLED substrate were different from the patterns of removed Alq3 film. Atomic force microscope images indicated that not only direct transfer but also deposition by sublimated vapor of Alq3 contributed to the pattern formation. Printed patterns affected considerably the electricity-to-light conversion characteristics of OLEDs. For uniform transfer, not only the phase relation of dithering beam lines but also adequate waveform were important.

• Proceedings of the Optical Society of Korea Conference
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• 1999.08a
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• pp.126-127
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• 1999