• 한국전기전자재료학회논문지
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• 제24권3호
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• pp.200-207
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• 2011

Abstract: The effect of lead free glass frit compositions on the properties of thick film conductor and resistor pastes were investigated. Two types lead free frits, HBF-A(without $Bi_2O_3$) and HBF-B(with $Bi_2O_3$) were made from $SiO_2$, $B_2O_3$, $Al_2O_3$, CaO, MgO, $Na_2O$, $K_2O$, ZnO, MnO, $ZrO_2$, $Bi_2O_3$. And Ag based conductor pastes and $RuO_2$ based resistor paste were prepared by mixed with these frits and functional phase(Ag and $RuO_2$), and organic vehicle. The properties of thick film conductor and resistor sintered at $850^{\circ}C$ were studied after printing on $Al_2O_3$ substrate. The morphology of the sintered films surface were SEM and EDS were carried out to analysis the chemical composition on resistor surface and state of Ru atom in frit matrix.

• 한국전기전자재료학회논문지
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• 제28권9호
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• pp.571-576
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• 2015

In this study, we developed a lead-free $P_2O_5-V_2O_5-ZnO$ glass frit for sealing OLED using laser irradiation. The frit satisfied the characteristics required for laser sealing such as low glass transition temperature, low coefficient of thermal expansion (CTE), high water-resistance, and high absorption at the wavelength of the laser beam. Ceramic fillers were added to the glass frit in order to further reduce and match its CTE with that of the commercial glass substrate. The addition of Zirconium Tungsten Phosphate (ZWP) to the frit yielded the most desirable results, reducing the CTE to $45.4{\times}10^{-7}/^{\circ}C$, which is very close to that of the glass substrate ($44.0{\times}10^{-7}/^{\circ}C$). Successful formation of a solid sealing layer was observed by optical and scanning electron microscopy.

• 한국결정성장학회지
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• 제31권5호
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• pp.218-227
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• 2021

저온 동시 소성용 후막 NTC 서미스터를 Mn_1.5Ni_0.4Co_0.9Cu_0.4O₄ 조성의 NTC 분말과 lead free frit 및 RuO₂를 이용하여 제조한 페이스트를 96 % 알루미나 기판 위에 인쇄와 소결을 통해 제조한 후, 이 후막 NTC의 전기적 특성에 미치는 프릿트 및 RuO₂의 영향을 연구하였다. 후막 NTC 서미스터의 저항은 동일한 온도에서 소결한 벌크 상에 비해 높게 나타났으나 저항-온도 특성에서 부 저항 온도 특성은 더 명확하게 직선적으로 나타남을 알 수 있었다. 한편, 소결온도 증가에 따라 면적저항은 감소하였고 프릿트 첨가량이 많을수록 면적저항은 높게 나타났다. 후막 NTC 서미스터의 B 정수는 3000 K 이상의 값 나타냈는데 그 중 프릿트를 5 wt% 첨가한 페이스트로 만든 후막 NTC를 900℃에서 소결한 시편의 B 정수가 가장 높게 나타남을 알 수 있었다. 또한, RuO₂ 첨가에 따라 면적저항의 감소가 나타남을 알 수 있었으며 RuO₂를 5 wt% 첨가한 페이스트를 900℃에서 소결한 후막 NTC 서미스터의 면적저항 감소의 변화가 가장 뚜렷이 나타남을 알 수 있었다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2010년도 하계학술대회 논문집
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• pp.335-335
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• 2010

$SiO_2$, $B_2O_3$, $Al_2O_3$, CaO, MgO, $Na_2O$, $ZrO_2$, $Bi_2O_3$를 이용하여 성질이 다른 두 종류의 무연계 프릿트를 제조하여 특성을 표준화 하였고, 이들 무연계 프릿트를 이용하여 Ag계 도체 및 $RuO_2$계 저항페이스트롤 제조하여 특성에 미치는 프릿트 조성의 영향을 연구하였다. $B_2O_3$를 첨가하여 퍼짐특성이 큰 프릿트의 경우 더 우수한 페이스트 특성을 나타내었다.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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• pp.373-376
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• 2008

New glass compositions for lead free, low temperature sealing glass frit was examined in $ZnO-V_2O_5-P_2O_5$ glass system which can be used sealing material for PDP to be made of soda lime glass substrates. Among many glass compositions, KFS-C glass showed low glass transition point (Tg) and good fluidity and adhesion characteristics when it was tested by flow button method at low temperature of $420^{\circ}C$. Its Tg was $317^{\circ}C$ and thermal expansion coefficient (CTE) was $70{\times}10^{-7}/K$. The glass frit was mixed with an organic vehicle to make a paste and it was dispensed and sealed with soda lime glass substrates at $420^{\circ}C$ for 10min. Sealed glass panels also showed good adhesion strength even sealed at low temperature of $420^{\circ}C$.

• 한국결정성장학회지
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• 제28권1호
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• pp.28-37
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• 2018

저온에서 소성이 가능한 NTC 서미스터의 제조를 위해 $Mn_{1.85}Ni_{0.25}Co_{0.9}O_4$ 기본 조성의 NTC 서미스터의 전기적 특성에 미치는 무연계 프릿트(frit)와 $RuO_2$ 첨가의 영향에 대하여 연구하였다. 기본 NTC 조성에 프릿트를 10 wt% 첨가하여 $1000^{\circ}C$에서 소결한 시편의 소결특성이 프릿트를 첨가하지 않고 $1200^{\circ}C$에서 소결한 시편과 유사하였다. 그러나 프릿트의 첨가량이 증가할수록 전기저항과 B 정수는 높게 나타났다. 저항을 낮추기 위해 프릿트를 10 wt% 첨가한 조성에 $RuO_2$를 0, 2, 5 wt% 첨가하여 $1000{\sim}1200^{\circ}C$에서 소결하여 NTC 서미스터를 제조 한 후 소결 및 전기적 특성을 측정하였다. $RuO_2$ 첨가량이 많을수록 전기저항과 B 정수는 감소하는 경향을 나타내었으나, $RuO_2$를 5 wt% 첨가하여 $1000^{\circ}C$의 소결온도에서 소결한 소결체가 저항이 가장 낮았고 이후 소결온도 증가에 따라 저항은 오히려 증가하는 경향을 나타내었다. 기본 NTC 조성에 10 wt%의 프릿트와 5 wt%의 $RuO_2$를 첨가하여 $1000^{\circ}C$에서 소결한 NTC 서미스터가 프릿트를 첨가하지 않은 기본 조성의 NTC를 $1200^{\circ}C$에서 소결한 경우와 소결특성과 전기적 특성이 유사하였다.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2006년도 6th International Meeting on Information Display
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• pp.1225-1228
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• 2006

In the CNT paste for field emission, PbO frit had a fatal influence on CNTs by accelerating a decomposition of CNTs during firing. In the thermogravimetric analysis on the mixtures of CNTs and other ingredients, it was evident that CNTs began to burn out at ${\sim}350^{\circ}C$ by reacting with PbO. This problem was overcome by replacing the PbO frit by the Pb-free frit such that most of CNTs could survive during firing. Consequently, the emission current of the CNT paste prepared using the lead-free frit was improved as much as 250 %, compared to the PbO-containing one. The CNT paste was further optimized by adding a dispersant, whose dispersibility was assessed by measuring the resistance of the paste. With 10% dispersant added, the emission properties of the paste was greatly enhanced as 50 times higher as those of the paste without a dispersant.

• 한국전기전자재료학회논문지
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• 제26권9호
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• pp.646-650
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• 2013

$(Na,K)NbO_3$-based piezoelectric ceramics were synthesized by a liquid phase sintering method with a selected glass frit. The effects of the content of the glass frit and the sintering temperature on the microstructure and the electrical properties of the samples were investigated. With the 0.1 wt% of glass frit content, $(Na_{0.52}K_{0.44}Li_{0.06})(Nb_{0.84}Ta_{0.10}Sb_{0.06})O_3$ (NKL-NTS) ceramics showed the maximum values of the relative density (99.1%) and the electro-mechanical coupling factor ($k_p$: 0.32) at the sintering temperature of $1,050^{\circ}C$. It might mean that a liquid phase sintering with a suitable glass frit having the lower flow temperature could improve the relative density and the piezoelectric properties.

• 한국재료학회지
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• 제31권8호
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• pp.471-479
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• 2021

The electrochemical reaction between lead borate glass frit doped with Sn metal filler and Ni-Cr wire of a J-type resistor during a term of Joule heating is investigated. The fusing behavior in which the Ni-Cr wire is melted is not observed for the control group but measured for the Sn-doped specimen under 30 V and 500 mA. The Sn-doped lead borate glass frit shows a fusing property compared with other metal-doped specimens. Meanwhile, the redox reaction significantly contributes to the fusing behavior due to the release of free electrons of the metal toward the glass. The electrons derived from the glass, which used Joule heat to reach the melting point of Ni-Cr wire, increase with increasing corrosion rate at interface of metal/glass. Finally, the confidence interval is 95 ± 1.95₉ %, and the adjusted regression coefficient, R in the optimal linear graph, is 0.93, reflecting 93% of the data and providing great potential for fusible resistor applications.

• 한국신재생에너지학회:학술대회논문집
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• 한국신재생에너지학회 2010년도 춘계학술대회 초록집
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• pp.61.2-61.2
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• 2010

Ag thick-film has usually been used for the front electrode of Si solar cells with the outstanding electrical properties. Ag paste consists of Ag powers, vehicles, frits and additives. Ag paste has broadly been screen-printed on the front side of Si wafer with the merits of low cost and simplicity. The optimal contact formation between Ag electrodes and Si wafer in the front electrode during a fast firing has been considered as the key factor for high efficiency. Although the content of frit in Ag pastes is less than 5wt%, it can profoundly influence the contact formation between Ag and Si under the fast firing. In this study, the effects of lead-free frits on the contacts between Ag and Si were studied with the thermal properties and compositions of various frits. Our experimental results showed that the electrical properties of cells were related to the interface structures between Ag and Si. It was found that current path of electrons from Si to Ag would be possible through the tunneling mechanism assisted by tens of nano-Ag recrystals on $n^+$ emitter as well as Ag recrystals penetrated into $n^+$ emitter layers. These preliminary studies will be helpful for designing the proper frits for the Ag pastes with considering the properties of various Si wafers.