• Proceedings of the Korean Society for Technology of Plasticity Conference
• /
• 2001.05a
• /
• pp.77-80
• /
• 2001

IC lead frame needs the precision shape for good efficiency. In the blanking process, there are many parameter effected the dimensional accuracy : lead width, blanking order, striper force, tool clearance etc. In this research, the4 undesirable defects appeared in the final blanking process. so we measured the deflection of lead according to the stripper force using $PAM-STAMP_{TM}$. In the result, the deflection was decreased by increasing the stripper force properly. and we changed the blanking order on the test model. In the blanking order, deflection is good from the outer line position blanking to center line position. so we can design the precision die without tryout by the prediction of the lead deflection.

• Proceedings of the International Microelectronics And Packaging Society Conference
• /
• 1999.12a
• /
• pp.63-85
• /
• 1999

$\cdot$New CSP using Lead Frame and solder ball techniques. $\cdot$EMC needs high filler content, low CTE and high flexural modulus. $\cdot$Solder Joint Reliability improved by anchor leads. .Uniform inner lead shape would be better at capacitance values. $\cdot$Low Assembly cost CSP.

• Journal of Welding and Joining
• /
• v.13 no.2
• /
• pp.82-95
• /
• 1995

This paper discusses distribution of thermal stress, strain at near the joint and investigates the reliability of solder joints of electronic devices on a printed circuit board. As Electronic devices are composed of different materials, thermal stresses generate at near the interface, such as solder joints and interface between lC device and lead frame pad due to the differences of thermal expansion coefficients, As results of thermal stress, strain, micro crack often occurs thermal fatigue fracture at the interface of different materials, The initiation and propagation of micro crack depend on the environmental conditions, such as storage temperature and thermal cycling. Finally, this paper experimentally shows a way to suppress micro cracks by using Fe-Ni alloy clad lead frame, and investigates crack and thermal fatigue fracture of TSOP(Thin small outline package) type on printed circuit board.

• Journal of the Semiconductor & Display Technology
• /
• v.10 no.3
• /
• pp.61-65
• /
• 2011

The capabilities of finite elements codes allow now accurate simulations of blanking processes when appropriate materials modelling are used. Over the last decade, numerous numerical studies have focused on the influence of process parameters such as punch-die clearance, tools geometry and friction on blanking force and blank profile. In this study, three dimensional finite element analysis is carried out to design a lead frame blanking die using LS-Dyna3D package. After design of the blanking die, an experiment is also carried out to investigate the characteristics of blanking for nickel alloy Alloy42, a kind of IC lead frame material. In this paper, it has been researched the investigation to examine the influence of process parameters such as clearance and air cylinder pressure on the accuracy of sheared plane. Through the experiment results, it is shown that the quality of sheared plane is less affected by clearance and air cylinder pressure.

• Journal of the Korea Computer Industry Society
• /
• v.3 no.9
• /
• pp.1177-1188
• /
• 2002

To classify real time Lead pin images in this paper, The image acquisition system was composed to C.C.D, image frame grabber(DT3153), P.C(PentiumIII). I proposed image processing algorithms. This algorithms were composed to real time monitoring, Lead Pin image acquisition, image noise deletion, object area detection, point detection and pattern classification algorithm. The raw images were acquired from Lead pin images using the system. The result images were obtained from raw images by image processing algorithms. In implemental result, The right recognition was 97 of 100 acceptable products, 95 of 100 defective products. The recognition rate was 96% for total 200 Lead Pins.

• Journal of the Korean Society for Precision Engineering
• /
• v.22 no.2
• /
• pp.133-138
• /
• 2005

The deformation of sheet metal due to the residual stress during blanking or piercing process, is numerically simulated by means of a commercial finite element code. Two dimensional plain strain problem is solved and then its result is applied to the deformation analysis of the lead frame. The plain strain element is applied to the 2D problem to observe the Von Mises equivalent stress concentration at the both shearing edges. As the punch penetrates into the sheet material, the stress concentration generated on both edges is getting increased to be the shearing surface. The limits of the punching depth applied to the simulation is 16% and 24% of the sheet thickness for the plain strain element and the hexahedral element, respectively. The hexahedral element and the limit of punching depth were applied to the deformation analysis of the lead frame for the blanking process. The FEM results for the lead deformation were very good agreement with the experimental ones. This paper shows that the coarse mesh has enabled to analyze the lead deformation generated due to the blanking mechanism. This simple approach to save the calculation time will be very effective to the design of the blanking tools in industries.

• International Journal of Precision Engineering and Manufacturing
• /
• v.2 no.2
• /
• pp.38-47
• /
• 2001

This paper decribes the development of computer-aided design of a very precise progressice die for lead frame of semiconductor chip. The approach to the system is based on knowledgr-based rules. Knowledge of fie이 experts. This system has been written in AutoLISP using AutoCAD ona personal computer and the I-DEAS drafting programming Language on the I-DEAS mater series drafting with on HP9000/715(64) workstation. Data exchange between AutoCAD and I-DEAS master series drafting is accomplished using DXF(drawing exchange format) and IGES(initial graphics exchange specification) files. This system is composed of six main modules, which are input and shape treatment, production feasibility check, strip layout, data conversion, die layout, and post processing modules. Based on Knowledge-based rules, the system considers several factors, such as V-notches, dimple, pad chamfer, spank, cavity punch, camber, coined area, cross bow, material and thickness of product, complexities of blank geometry and punch profiles, specifications of available presses, and the availability of standard parts. As forming processes and the die design system using 2D geometry recognition are integrated with the technology of process planning, die design, and CAE analysis, the standardization of die part for lead frames requiting a high precision process is possible. The die layout drawing generated by the die layout module s displayed in graphic form. The developed system makes it possible to design and manufacture lead frame of a semiconductor more efficiently.

• Journal of Adhesion and Interface
• /
• v.23 no.4
• /
• pp.108-115
• /
• 2022

In this study, we synthesized poly(itaconic acid-co-acrylamide) (IAcAAM) used as a novel polymer adhesion promoter to improve the adhesion strength of surface-treated Cu lead frames and epoxy composites. IAcAAM comprising itaconic acid, acrylamide was prepared through radical aqueous polymerization. The chemical structure and properties of IAcAAM was analyzed by FT-IR, ¹H-NMR, GPC, and DSC. The surface of the copper lead frame was treated with high temperature, alkali, and UV ozone to reduce the water contact angle and increase the surface energy. The adhesive strength of Cu lead frame and epoxy composite increased with the decrease of contact angle. The adhesive strength of Cu lead frame/epoxy composite increased with the addition of IAcAAM in epoxy composite. As silica content increased, the adhesive strength of Cu lead frame and epoxy composite tended to slightly decrease.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2002.07a
• /
• pp.32-35
• /
• 2002

The work focuses on the development of a Cu lead-frame with a single-sided adhesive tape for cost reduction and reliability improvement of LOC (lead on chip) package products, which are widely used for the plastic-encapsulation of memory chips. Most of memory chips are assembled by the LOC packaging process where the top surface of the chip is directly attached to the area of the lead-frame with a double-sided adhesive tape. However, since the lower adhesive layer of the double-sided adhesive tape reveals the disparity in the coefficient of thermal expansion from the silicon chip by more than 20 times, it often causes thermal displacement-induced damage of the IC pattern on the active chip surface during the reliability test. So, in order to solve these problems, in the resent work, the double-sided adhesive tape is replaced by a single-sided adhesive tape. The single-sided adhesive tape does net include the lower adhesive layer but instead, uses adhesive materials, which are filled in clear holes of the base film, just for the attachment of the lead-frame to the top surface of the memory chip. Since thermal expansion of the adhesive materials can be accommodated by the base film, memory product packaged using the lead-flame with the single-sided adhesive tape is shown to have much improved reliability. Author allied this invention to the Korea Patent Office for a patent (4-2000-00097-9).

• Journal of the Microelectronics and Packaging Society
• /
• v.20 no.3
• /
• pp.31-35
• /
• 2013

TSOP(Thin Small Outline Package) is the IC package using lead frame, which is the type of low cost package for white electronics, auto mobile, desktop PC, and so on. Its performance is not excellent compared to BGA or flip-chip CSP, but it has been used mostly because of low price of TSOP package. However, it has been issued in TSOP package that thermal deflection of lead frame occurs frequently during molding process and Au wire between semiconductor die and pad is debonded. It has been required to solve this problem through substituting materials with low CTE and improving structure of lead frame. We focused on developing the lead frame structure having thermal stability, which was carried out by numerical analysis in this study. Thermal deflection of lead frame in TSOP package was simulated with positions of anti-deflection adhesives, which was ranging 198 um~366 um from semiconductor die. It was definitely understood that thermal deflection of TSOP package with anti-deflection adhesives was improved as 30.738 um in the case of inside(198 um), which was compared to that of the conventional TSOP package. This result is caused by that the anti-deflection adhesives is contributed to restrict thermal expansion of lead frame. Therefore, it is expected that the anti-deflection adhesives can be applied to lead frame packages and enhance their thermal deflection without any change of substitutive materials with low CTE.