• Proceedings of the Korean Society of Tribologists and Lubrication Engineers Conference
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• 2001.06a
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• pp.36-41
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• 2001

In this work, the changes in the friction force(lateral force) with respect to nanoscale geometric variation were investigated using an Atomic Force Microscope and a Lateral Force Microscope. It could be concluded that the changes in the friction force correspond well to the slope change rather than the surface slope itself, and that the influence of slope change on the frictional behavior is dependent on the magnitude of the slope and the torsional stiffness of the cantilever. Also, the nominal friction force is found to be more significantly affected by the material and the physical-chemical state of the surface rather than by nanoscale geometric steps. However, the change in nanoscale geometric details of the surface cause instantaneous change and slight variation in the friction signal.

• Tribology and Lubricants
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• v.21 no.5
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• pp.221-226
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• 2005

A new calibration method for exact measurement of friction force in atomic force microscope (AFM) is presented. A new conversion factor involves a contact factor affected by tip, cantilever and contact stiffness. Especially the effect of contact stiffness on the conversion factor between lateral force and lateral signal is considered. Conventional conversion factor and a new modified conversion factor were experimentally compared. Results showed that a new calibration method could minimize the effect of normal load on friction force and improve the conventional method. A new method could be applied to the specimens with different physical properties.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2010.05a
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• pp.717-718
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• 2010

• KSTLE International Journal
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• v.7 no.1
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• pp.5-9
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• 2006

The main principle of two widely used methods which were proposed by Ruan and Bhushan, and by Ogletree and Carpick are introduced. Experiments were conducted using the two methods to measure friction force between AFM probe and silicon sample quantitatively. To characterize the frictional properties, the conversion factors of the two methods by which lateral electronic signal is converted into actual friction force were calculated. The experimental results show that that the conversion factors were extraordinarily different from each other. Further research should be done to identity the reasons for these differences.

• Tribology and Lubricants
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• v.17 no.3
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• pp.191-197
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• 2001

Nano adhesion and friction characteristics between SPM(scanning electron microscope) tips and flat plates of different materials were experimentally studied. Tests were performed to measure adhesion and friction in AFM(atomic force microscope) and LFM(lateral force microscope) modes in different conditions of relative humidity. Three different Si$_3$N$_4$ tips (rdaii : 15nm, 22nm and 50 nm) and three different flat plates of Si-wafer(100), W-DLC(tungsten-incorporated diamond-like carbon) and DLC were used. Results generally showed that adhesion and friction increased with the tip radius, and W-DLC and DLC surfaces were superior to Si-wafer. But the adhesion force of Si-wafer showed non linearity with the tip radius while W-DLC and DLC surfaces showed good correlation to the “JKR model”. It was found that high adhesion force between Si-wafer and a large radius of tip was caused by a capillary action due to the condensed water.

• Tribology and Lubricants
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• v.17 no.4
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• pp.276-282
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• 2001

Nano adhesion between SPM (scanning probe microscope) tips and 075 (octadecyltrichlorosilane) SAM (self-assembled monolayer) was experimentally studied. Tests were performed to measure the nano adhesion and friction in both AFM(atomic force microscope) and LFM(lateral force microscope) modes in various conditions of relative humidity. OTS SAM was formed on Si-wafer (100) surfaces, and Si$_3$N$_4$ tips of different radius of curvature were used. When the surface was hydrophobic, the adhesion and friction forces were found lower than those of bare Si-wafer. Results also showed that micro-adhesion force increased as the relative humidity and the tip radius of curvature increased. The main parameter for affecting the micro-adhesion was found absorbed humidity on the contact surface. These results were discussed with the JKR model and a capillary force caused by absorbed water.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.08a
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• pp.288-288
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• 2010

Photonic Force Microscope (PFM) is a scanning force microscope using an optical trap with several piconewton. In PFM, we can have topological information from the bead position trapped in optical trap. Typically the resolutions of lateral and vertical position are 40 nm and 50 nm respectively. To improve the vertical resolution below 10 nm, we use resonance energy transfer which has 5nm resolution in distance. Here we show preliminary results, including performances of scanning bead and fluorescence imaging system.

• Proceedings of the Korean Society of Tribologists and Lubrication Engineers Conference
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• 2001.06a
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• pp.127-134
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• 2001

Nano adhesion and friction between a Sj$_3$N$_4$ AFM tip and thin silver films were experimentally studied. Tests were performed to measure the nano adhesion and friction in both AFM(atomic force microscope) and LFM(lateral force microscope) modes in various ranges of normal load. Thin silver films deposited by IBAD (ion beam assisted deposition) on Si-wafer (100) and Si-wafer of different surface roughness were used. Results showed that nano adhesion and friction decreased as the surface roughness increased. When the Si surfaces were coated by pure silver, the adhesion and friction decreased. But the adhesion and friction were not affected by the thickness of IBAD silver coating. As the normal force increased, the adhesion forces of bare Si-wafer and IBAD silver coating film remained constant, but the friction forces increased linearly. Test results suggested that the friction was mainly governed by the adhesion as long as the normal load was low.

• Journal of Periodontal and Implant Science
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• v.39 no.4
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• pp.385-390
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• 2009

Purpose: In this study we evaluated the morphologic aspects of defects created by a piezoelectric ultrasonic scaler with scaler tip on casting gold alloy using scanning electron microscope (SEM) images and defect surface profiles. Methods: 54 blocks of type III casting gold alloy (Firmilay, Jellenko Inc, CA, USA) were scaled by a piezoelectric ultrasonic scaler (P-MAX, Satelec, France) with scaler tip (No. 1 tip) on a sledge device. 2-dimensional profiles of defects on all samples were investigated by a surface profilometer (a-Step 500, KLA-Tencor, CA, USA). The selected working parameters were lateral force (0.5 N, 1.0 N, 2.0 N), mode (P mode, S mode), and power setting (2, 4, 8). SEM images were obtained. Defect surface profiles were made on Microsoft Excel program using data obtained by a surface profilometer. Results: Among P mode samples, there were similarities on defect surface profiles and SEM images regardless of lateral force. The defects created in P mode were narrow and shallow although the depth and the width increased as power setting changed low (2) to high (8). In P mode samples, the defect depth was the greatest when lateral force of 0.5 N was applied. However all the depths were smaller than 1 m. SEM images of Lateral force of 0.5 N, S mode, power setting 2 and 4 were similar to that of P mode, but the other SEM images of S mode showed discernible changes. Defect depth of S mode samples was the greatest when lateral force of 1.0 N was applied. Conclusions: Within the limitations of this study, it can be concoluded that removing capability of piezoelectric scaler with scaler tip becomes maximized as power level becomes higher but the capability is restricted when excessive lateral force is applied on scaler tip.

• Tribology and Lubricants
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• v.23 no.1
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• pp.9-13
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• 2007

Despite numerous researches on atomic-scale friction have been carried out for understanding the origin of friction, lots of questions about sliding friction still remain. It is known that friction at atomic-scale always shows unique phenomena called 'stick-slips' which reflect atomic lattice of a scanned surface. In this work, experimental study on the effects of system stiffnesses and load on the atomic-scale stick-slip friction of graphite was performed by using an Atomic Force Microscope and various cantilevers/tips. The objective of this research is to figure out the dependency of atomic-scale friction on the nanomechanical properties in sliding contact such as load, stiffness and contact materials systematically. From this work, the experimental observation of transitions in atomic-scale friction from smooth sliding to multiple stick-slips in air was first made, according to the lateral cantilever stiffness and applied normal load. The superlubricity of graphite could be verified from friction vs. load experiments. Based on the results, the relationship between the stickslip behaviors and contact stiffness was carefully discussed in this work. The results or this work indicate that the atomic-scale stick-slip behaviors can be controlled by adjusting the system stiffnesses and contact materials.