• Title/Summary/Keyword: Laser grating

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Wavelength-Switchable Fiber Ring Laser Employing a Long-Period Fiber Grating Inscribed on a High Birefringent Fiber (복굴절이 큰 광섬유에 형성된 장주기 광섬유 격자를 이용한 파장 스위칭 가능한 광섬유 고리형 레이저)

  • Lee, Yong-Wook
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.56 no.11
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    • pp.1995-1997
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    • 2007
  • In this paper we propose a wavelength-switchable fiber ring laser that employs a polarization-dependent fiber band stop filter. The fiber filter was fabricated by inscribing a long-period fiber grating on a high birefringent fiber. Dual-wavelength switching operation was accomplished by controlling the rotatable linear polarizer which rotated the polarization plane of the light circulating through the fiber laser cavity. The amplitude variation of both laser lines was measured to be less than 0.5 dB and the signal-to-amplified spontaneous emission ratio was more than 55 dB.

Holographic Data Grating Formation of AsGeSeS Single layer, Ag/AsGeSeS double layer And AsGeSeS/Ag/AsGeSeS Muti-layer Thin Films with the DPSS Laser (DPSS Laser에 의한 AsGeSeS,Ag/AsGeSeS 와 AsGeSeS/Ag/AsGeSeS 박막의 홀로그래픽 데이터 격자형성)

  • Koo, Yong-Woon;Koo, Sang-Mo;Cho, Won-Ju;Chung, Hong-Bay
    • Proceedings of the KIEE Conference
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    • 2006.10a
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    • pp.55-56
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    • 2006
  • We investigated the diffraction grating efficiency by the DPSS laser beam wavelength to improve the diffraction efficiency on AsGeSeS & Ag/ AsGeSeS thin film. Diffraction efficiency was obtained from DPSS(532nm)(P:P)polarized laser beam on AsGeSeS, Ag/ AsGeSeS and AsGeSeS/Ag/AsGeSeS thin films. As a result, for the laser beam intensity, 0.24 mW, single AsGeSeS thin film shows the highest value of 0.161% diffraction efficiency at 300 s and for 2.4 mW, it was recorded with the fastest speed of 50 s, which the diffraction grating forming speed is faster than that of 0.24 mW beam. Ag/ AsGeSeS and AsGeSeS/ Ag/ AsGeSeS multi-layered thin film also show the faster grating forming speed at 2.4 mW and higher value of diffraction efficiency at 0.24 mW.

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2-dimensional hologram formation by selective etching on amorphous As-Ge-Se-S thin film (비정질 As-Ge-Se-S 박막에서 선택적 에칭을 통한 2차원 홀로그램 제작)

  • Kim, Jin-Hong;Kang, Jin-Won;Chung, Hong-Bay
    • Proceedings of the KIEE Conference
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    • 2006.07c
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    • pp.1430-1431
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    • 2006
  • We investigated the formation of 2-dimension hologram grating by means of selective etching characteristic and photo-expansion effect according to photo irradiation on amorphous As-Ge-Se-S thin film. By method of phase holography, we made the 2-dimensional hologram grating by each (S:P) and ($+45^{\circ}:-45^{\circ}$) polarized beam with DPSS laser(532nm) and He-Ne laser(632nm). A recording property was observed at each polarized beam through 2-dimensional hologram surface relief grating. Chalcogenide thin film was etched selectively by NaOH solution after the formation of 1-dimensional diffraction grating. And then etched sample was rotated 90 degree to fabricate 2 dimensional hologram grating. We found that it was observed the formation of 2-dimensional hologram grating by AFM(Atomic Force Microscopy).

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Diffraction-efficiency Correction of Polarization-independent Multilayer Dielectric Gratings (무편광 유전체 다층박막 회절격자의 효율 보정)

  • Cho, Hyun-Ju;Kim, Gwan-Ha;Kim, Dong Hwan;Lee, Yong-Soo;Kim, Sang-In;Cho, Joonyoung;Kim, Hyun Tae
    • Korean Journal of Optics and Photonics
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    • v.33 no.1
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    • pp.22-27
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    • 2022
  • We fabricate a polarization-independent dielectric multilayer thin-film diffraction grating for a spectral-beam-combining (SBC) system with a simple grating structure and low aspect ratio. Due to the refractive index and thickness error of the manufactured thin films, the diffraction efficiency of the fabricated diffraction grating was lower than that of the design. The causes of the errors were analyzed, and it was confirmed through simulation that diffraction efficiency could be compensated through an additional coating on the manufactured diffraction grating. As a result of sputtering an additional Ta2O5 layer on a fabricated diffraction grating, the diffraction efficiency was corrected and a maximum 91.7% of polarization-independent diffraction efficiency was obtained.

Fabrication and Characteristics of Tunable Butt-Coupled Sampled-grating Distributed Bragg Reflector (SG-DBR) Laser Diodes (파장가변 Sampled-grating Distributed Bragg Reflector (SG-DBR) 레이저 다이오드 제작)

  • 이지면;오수환;고현성;박문호
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.17 no.1
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    • pp.16-20
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    • 2004
  • We present the fabrication and performance of wavelength tunable butt coupled (BT) sampled-grating (SG) distributed bragg reflector (DBR) - planar buried heterostructure (PBH) laser diodes (LD). The fabricated LD showed the high optical output power due to the high coupling efficiency between active and passive components by the BT coupling methods. The series resistance and diode ideality factor of LD were measured to be 3.7 $\Omega$ and 1.35, respectively. The average threshold current was 25 ㎃. The output powers of BT-SG DBR-PBH-LD were obtained to be as high as 12.3 and 24.56 ㎽ at 100 and 200 ㎃, respectively. The maximum wavelength tuning range was about 31 nm and the side mode suppression ratio was about 37 dB.

Grating fabrication for DFB laser diode using holographic interferometer system (DFB 레이저 다이오드를 위한 홀로그래픽 시스템을 이용한 회절격자 제작)

  • 강명구;오환술
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.33A no.6
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    • pp.108-113
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    • 1996
  • Periodic gratings for 1.55$\mu$m distributed feedback laser diode (DFB LD) have been fabricated by a holographic interference exposure system using an etalon stabilized Ar ion laser. We obtain a good development condition at developer concentration of 65% and obtain etching rate of 1000$\AA$/min at 20.deg. C by the mixed solution HBr:HNO$_{3}$:H$_{2}$O(1:1:10 in volume ratio). We obtain good first order grating with period of 2400${\AA}[\pm}2{\AA}$ at etching time of 45 sec from grating period and diffraction efficiency measurement, and SEM observation of grating fabricated on InP substrate.

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Holographic Grating Formation of Chalcogenid Thin Films By the DPSS laser (DPSS laser에 의한 비정질 칼코게나이드 박막의 홀로그래픽 격자형성)

  • Koo, Yong-Woon;Nam, Ki-Hyun;Chung, Hong-Bay
    • Proceedings of the KIEE Conference
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    • 2008.07a
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    • pp.1440-1441
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    • 2008
  • In this paper, we investigated the diffraction grating efficiency on AsSeS and Ag-doped amorphous chalcogenide Ag/AsSeS thin film for used to volume hologram. The Chalcogenide film thickness was 0.5um and Ag thin film was varied from 10nm and 20nm. Diffraction efficiency was obtained from (P:P) polarized Diode Pumped Solid State laser(DPSS, 532.0nm: 200mW) beam on AsSeS and Ag/AsSeS thin films. As a results, diffraction grating was not formed at AsSeS thin film but at Ag-doped AsSeS thin film, diffraction grating was formed well compare with the former.

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Control and Monitoring of Wavelengths in Spectral Beam Combining System Based on High Resolution Camera (고해상도 카메라 기반 파장 빔 결합 시스템의 다중 광원의 모니터링과 파장 제어 기법 연구)

  • Seung, Ji Hoon;Lee, Kwang Hyun;Lee, Jung Hwan
    • IEMEK Journal of Embedded Systems and Applications
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    • v.14 no.6
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    • pp.321-327
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    • 2019
  • Spectral Beam Combining (SBC) is used for a high-power fiber laser in order to overcome the power limitation of single fiber laser. In SBC, several laser bwams with different wavelengths are combined to obtain a single-aperture beam by diffraction grating. The combining efficiency is dependent on a linewidth, beam quality and specific wavelength of each beam among others. In this paper, we consider the method of a wavelength monitoring and a feedback control of laser diodes used as seeds of laser beams to obtain optimum combining conditions. In order to measure the wavelengths of multi-beam, we use the high resolution camera and diffraction grating with 1,800l/mm. The experiment results show the possibility of feedback control of a current and temperature of multi-seed laser diodes to obtain optimum wavelengths for SBC.

Measurement of Grating Pitch Standards using Optical Diffractometry and Uncertainty Analysis (광 회절계를 이용한 격자 피치 표준 시편의 측정 및 불확도 해석)

  • Kim Jong-Ahn;Kim Jae-Wan;Park Byong-Chon;Kang Chu-Shik;Eom Tae-Bong
    • Journal of the Korean Society for Precision Engineering
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    • v.23 no.8 s.185
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    • pp.72-79
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    • 2006
  • We measured grating pitch standards using optical diffractometry and analyzed measurement uncertainty. Grating pitch standards have been used widely as a magnification standard for a scanning electron microscope (SEM) and a scanning probe microscope (SPM). Thus, to establish the meter-traceability in nano-metrology using SPM and SEM, it is important to certify grating pitch standards accurately. The optical diffractometer consists of two laser sources, argon ion laser (488 nm) and He-Cd laser (325 nm), optics to make an incident beam, a precision rotary table and a quadrant photo-diode to detect the position of diffraction beam. The precision rotary table incorporates a calibrated angle encoder, enabling the precise and accurate measurement of diffraction angle. Applying the measured diffraction angle to the grating equation, the mean pitch of grating specimen can be obtained very accurately. The pitch and orthogonality of two-dimensional grating pitch standards were measured, and the measurement uncertainty was analyzed according to the Guide to the Expression of Uncertainty in Measurement. The expanded uncertainties (k = 2) in pitch measurement were less than 0.015 nm and 0.03 nm for the specimen with the nominal pitch of 300 nm and 1000 nm. In the case of orthogonality measurement, the expanded uncertainties were less than $0.006^{\circ}$. In the pitch measurement, the main uncertainty source was the variation of measured pitch values according to the diffraction order. The measurement results show that the optical diffractometry can be used as an effective calibration tool for grating pitch standards.