• 제목/요약/키워드: Large area thin film

검색결과 207건 처리시간 0.03초

Electrical Characterization of Ultrathin Film Electrolytes for Micro-SOFCs

  • Shin, Eui-Chol;Ahn, Pyung-An;Jo, Jung-Mo;Noh, Ho-Sung;Hwang, Jaeyeon;Lee, Jong-Ho;Son, Ji-Won;Lee, Jong-Sook
    • 한국세라믹학회지
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    • 제49권5호
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    • pp.404-411
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    • 2012
  • The reliability of solid oxide fuel cells (SOFCs) particularly depends on the high quality of solid oxide electrolytes. The application of thinner electrolytes and multi electrolyte layers requires a more reliable characterization method. Most of the investigations on thin film solid electrolytes have been made for the parallel transport along the interface, which is not however directly related to the fuel cell performance of those electrolytes. In this work an array of ion-blocking metallic Ti/Au microelectrodes with about a $160{\mu}m$ diameter was applied on top of an ultrathin ($1{\mu}m$) yttria-stabilized-zirconia/gadolinium-doped-ceria (YSZ/GDC) heterolayer solid electrolyte in a micro-SOFC prepared by PLD as well as an 8-${\mu}m$ thick YSZ layer by screen printing, to study the transport characteristics in the perpendicular direction relevant for fuel cell operation. While the capacitance variation in the electrode area supported the working principle of the measurement technique, other local variations could be related to the quality of the electrolyte layers and deposited electrode points. While the small electrode size and low temperature measurements increaseed the electrolyte resistances enough for the reliable estimation, the impedance spectra appeared to consist of only a large electrode polarization. Modulus representation distinguished two high frequency responses with resistance magnitude differing by orders of magnitude, which can be ascribed to the gadolinium-doped ceria buffer electrolyte layer with a 200 nm thickness and yttria-stabilized zirconia layer of about $1{\mu}m$. The major impedance response was attributed to the resistance due to electron hole conduction in GDC due to the ion-blocking top electrodes with activation energy of 0.7 eV. The respective conductivity values were obtained by model analysis using empirical Havriliak-Negami elements and by temperature adjustments with respect to the conductivity of the YSZ layers.

다양한 Passivation 물질에 따른 IGZO TFT Stability 개선 방법 (IGZO TFT Stability Improvement Based on Various Passivation Materials)

  • 김재민;박진수;윤건주;조재현;배상우;김진석;권기원;이윤정;이준신
    • 한국전기전자재료학회논문지
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    • 제33권1호
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    • pp.6-9
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    • 2020
  • Thin film transistors (TFTs) with large-area, high mobility, and high reliability are important factors for next-generation displays. In particular, thin transistors based on IGZO oxide semiconductors are being actively researched for this application. In this study, several methods for improving the reliability of a-IGZO TFTs by applying various materials on a passivation layer are investigated. In the literature, inorganic SiO2, TiO2, Al2O3, ZTSO, and organic CYTOP have been used for passivation. In the case of Al2O3, excellent stability is exhibited compared to the non-passivation TFT under the conditions of negative bias illumination stress (NBIS) for 3 wavelengths (R, G, B). When CYTOP passivation, SiO2 passivation, and non-passivation devices were compared under the same positive bias temperature stress (PBTS), the Vth shifts were 2.8 V, 3.3 V, and 4.5 V, respectively. The Vth shifts of TiO2 passivation and non-passivation devices under the same NBTS were -2.2 V and -3.8 V, respectively. It is expected that the presented results will form the basis for further research to improve the reliability of a-IGZO TFT.

CuInGaSe2 단일 타겟을 이용한 대면적 CIGS 스퍼터링 박막의 특성 (Characteristics of large-area CIGS thin films fabricated by sputtering CuInGaSe2 single target)

  • 김태원;김영백;송상인;박재철
    • 한국신재생에너지학회:학술대회논문집
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    • 한국신재생에너지학회 2011년도 춘계학술대회 초록집
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    • pp.125.2-125.2
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    • 2011
  • CuInGaSe2 (CIGS)을 포함한 Chalcopyrite계 물질은 직접천이형 반도체이면서, ${\sim}1{\times}10^5cm^{-1}$ 이상의 광흡수계수를 보이며, 조성제어를 통한 밴드갭 조절이 가능해 차세대 고효율 박막태양전지재료로 매우 주목받고 있다. 최근, CIGS 박막태양전지 제조를 위해 CIGS 흡수층의 여러 가지 박막제조 공정들이 개발되고 있으나, 동시증착법과 소위 2단계법이라 일컬어지는 금속 전구체 스퍼터링 증착 후 셀렌화 공정을 가장 대표적인 공정이라 말 할 수 있다. 동시증착법은 실험실 수준의 소면적 셀에서 20%에 가까운 높은 효율의 CIGS 박막태양전지 제조에 성공하였음에도 불구하고, 상용화를 위한 대면적 셀 제조를 위해 해결해야 할 문제들이 아직 남아있다. 또한, 2단계법의 경우는 스퍼터링 공정을 기반으로 대면적 셀 제조에는 용이하나, CIGS/Mo 계면에서의 Ga 응집현상의 발생 및 셀렌화 공정에 사용되는 독성가스($H_2Se$)의 문제 등이 남아 있어 새로운 시각에서의 접근 방법이 요구되고 있다. 본 연구에서는 CIGS 4성분계 단일 타겟을 사용, RF 스퍼터링 공정을 통해 $200{\times}200mm^2$ 기판 위에 CIGS 박막을 제조하여 그 특성을 분석하였다. XRD 분석결과, 동시증착법에서 일반적으로 관찰되는 CIGS/Mo 계면에서의 $MoSe_2$ 상의 존재는 관찰되지 않았으며, CIGS 단일상의 다결정 박막이 제조되었음을 알 수 있었다. 또한, CIGS 박막제조 후, RTA 공정을 통해 CIGS 박막의 결정성이 향상됨을 관찰 할 수 있었으며, SIMS 분석결과, Mo층의 공정 조건에 따라 CIGS/Mo 계면에서의 금속원소 (In, Ga, Mo)의 상호확산이 크게 억제됨을 알 수 있었다. 그 외의 특성평가 결과들을 통하여 CIGS 4성분계 단일 타겟을 사용한 CIGS 박막태양전지 제조의 유용성에 대해 논의하고자 한다.

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The study of silicon etching using the high density hollow cathode plasma system

  • Yoo, Jin-Soo;Lee, Jun-Hoi;Gangopadhyay, U.;Kim, Kyung-Hae;Yi, Jun-Sin
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2003년도 International Meeting on Information Display
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    • pp.1038-1041
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    • 2003
  • In the paper, we investigated silicon surface microstructures formed by reactive ion etching in hollow cathode system. Wet anisotropic chemical etching technique use to form random pyramidal structure on <100> silicon wafers usually is not effective in texturing of low-cost multicrystalline silicon wafers because of random orientation nature, but High density hollow cathode plasma system illustrates high deposition rate, better film crystal structure, improved etching characteristics. The etched silicon surface is covered by columnar microstructures with diameters form 50 to 100nm and depth of about 500nm. We used $SF_{6}$ and $O_{2}$ gases in HCP dry etch process. This paper demonstrates very high plasma density of $2{\times}10^{12}$ $cm^{-3}$ at a discharge current of 20 mA. Silicon etch rate of 1.3 ${\mu}s/min$. was achieved with $SF_{6}/O_{2}$ plasma conditions of total gas pressure=50 mTorr, gas flow rate=40 sccm, and rf power=200 W. Our experimental results can be used in various display systems such as thin film growth and etching for TFT-LCDs, emitter tip formations for FEDs, and bright plasma discharge for PDP applications. In this paper we directed our study to the silicon etching properties such as high etching rate, large area uniformity, low power with the high density plasma.

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Unusual ALD Behaviors in Functional Oxide Films for Semiconductor Memories

  • Hwang, Cheol Seong
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2013년도 제45회 하계 정기학술대회 초록집
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    • pp.77.1-77.1
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    • 2013
  • Atomic layer deposition (ALD) is known for its self-limiting reaction, which offers atomic-level controllability of the growth of thin films for a wide range of applications. The self-limiting mechanism leads to very useful properties, such as excellent uniformity over a large area and superior conformality on complex structures. These unique features of ALD provide promising opportunities for future electronics. Although the ALD of Al2O3 film (using trimethyl-aluminum and water as a metal precursor and oxygen source, respectively) can be regarded as a representative example of an ideal ALD based on the completely self-limiting reaction, there are many cases deviating from the ideal ALD reaction in recently developed ALD processes. The nonconventional aspects of the ALD reactions may strongly influence the various properties of the functional materials grown by ALD, and the lack of comprehension of these aspects has made ALD difficult to control. In this respect, several dominant factors that complicate ALD reactions, including the types of metal precursors, non-metal precursors (oxygen sources or reducing agents), and substrates, will be discussed in this presentation. Several functional materials for future electronics, such as higher-k dielectrics (TiO2, SrTiO3) for DRAM application, and resistive switching materials (NiO) for RRAM application, will be addressed in this talk. Unwanted supply of oxygen atoms from the substrate or other component oxide to the incoming precursors during the precursor pulse step, and outward diffusion of substrate atoms to the growing film surface even during the steady-state growth influenced the growth, crystal structure, and properties of the various films.

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A New Strategy to Fabricate a Colloidal Array Templated $TiO_2$ Photoelectrode for Dye-sensitized Solar Cells

  • 이현정
    • 한국재료학회:학술대회논문집
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    • 한국재료학회 2011년도 춘계학술발표대회
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    • pp.8.1-8.1
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    • 2011
  • Nanocrystalline titanium dioxide ($TiO_2$) materials have been widely used as an electron collector in DSSC. This is required to have an extremely high porosity and surface area such that the dye can be sufficiently adsorbed and be electronically interconnected, resulting in the generation of a high photocurrent within cells. In particular, their geometrical structures and crystalline phase have been extensively investigated as important issues in improving its photovoltaic efficiency. In this study, we present a new strategy to fabricate a photoelectrode having a periodic structured $TiO_2$ film templated from 1D or 3D polystyrene (PS) microspheres array. Monodisperse PS spheres of various radiuses were used for colloidal array on FTO glasses and two types of photoelectrode structures with different $TiO_2$ materials were investigated respectively. One is the igloo-shaped electrode prepared by $TiO_2$ deposition by RF-sputtering onto 2D microsphere-templated substrates. At the interface between the film and substrate, there are voids formed by the decomposition of PS microspheres during the calcination step. These holes might be expected to play the predominant roles as scattering spherical voids to promote a light harvesting effect, a spacious structure for electrolytes with higher viscosity and effective paths for electron transfer. Additionally the nanocrystalline $TiO_2$ phase prepared by the RF-sputtering method was previously reported to improve the electron drift mobility within $TiO_2$ electrodes. This yields solar cells with a cell efficiency of 2.45% or more at AM 1.5 illumination, which is a very remarkable result, considering its $TiO_2$ electrode thickness (<2 ${\mu}m$). This study can be expanded to obtain higher cell efficiency by higher dye loading through the increase of surface area or multi-layered stacking. The other is the inverse opal photonic crystal electrode prepared by titania particles infusion within 3D colloidal arrays. To obtain the enlargement of ordered area and high quality of crystallinity, the synthesis of titania particles coated with a organic thin layer were applied instead of sol-gel process using the $TiO_2$ precursors. They were dispersed so well in most solvents without aggregates and infused successfully within colloidal array structures. This ordered mesoporous structure provides the large surface area leading to the enough adsorption of dye molecules and have an light harvesting effect due to the photonic band gap properties (back-and-forth reflection effects within structures). A major advantage of this colloidal array template method is that the pore size and its distribution within $TiO_2$ photoelectrodes are determined by those of latex beads, which can be controlled easily. These materials may have promising potentials for future applications of membrane, sensor and so on as well as solar cells.

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무전해 니켈-인 도금법을 이용하여 도금된 탄소 섬유의 열처리 과정에서 나타나는 다공성 구조 생성 메커니즘 분석 (Formation Mechanism of Pores in Ni-P Coated Carbon Fiber Prepared by Electroless Plating Upon Annealing)

  • 함승우;심종기;김영독
    • 공업화학
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    • 제24권4호
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    • pp.438-442
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    • 2013
  • 본 연구에서는 무전해 도금법으로 니켈과 인을 탄소섬유 표면에 코팅한 후, 열처리시키는 과정에서 일어나는 변화를 다양한 분석방법을 이용하여 연구하였다. 전자현미경(Scanning Electron Microscopy, SEM)을 이용한 연구에서는, 코팅 후 추가적인 열처리를 하지 않은 경우 평평한 표면구조를 관찰하였으나, 열처리 온도가 $350^{\circ}C$에 이르면서 다공성구조가 생성됨을 알았다. 열처리 온도를 $50^{\circ}C$ 간격으로 증가시키면서 연구한 결과 $650^{\circ}C$까지는 열처리 온도가 증가할수록 기공의 크기는 증가하고, 개수는 감소하는 경향성이 관찰되었다. X-선 회절법(x-ray diffraction, XRD) 측정 결과, 코팅 후 추가 열처리가 없는 경우 금속성 Ni, Ni-P 화합물이 관찰되었으며, 열처리 온도가 증가함에 따라 NiO 봉우리는 세기가 증가하며, 금속성 Ni 봉우리의 세기는 감소하였다. X-선 광전자 분광법(X-ray Photoelectron Spectroscopy, XPS) 측정에서는 $650^{\circ}C$, $700^{\circ}C$의 열처리 후 인 산화물이 표면에서 검출됨을 확인하였는데, 이는 코팅된 니켈 필름의 내부에 존재하던 인 화합물이 열처리 온도가 증가함에 따라서 표면 밖으로 빠져 나오는 현상이 일어나는 결과로 해석할 수 있다. 이상의 분석 데이터를 토대로, 무전해 도금으로 코팅된 Ni-P 화합물($Ni_xP_y$)이 열처리 과정에서 산화되면서, 이때 생성된 인 화합물 기체가 승화하면서 필름에 기공을 생성시키는 것으로 제안할 수 있다. 다공성 물질은 넓은 비표면적 등의 우수한 물성때문에 불균일 촉매 등 다양한 분야에 적용될 수 있으며, 본 연구에서 소개하는 다공성 니켈 필름의 제작법은 대량 생산에 적용이 쉬워 환경 필터 분야 등의 다양한 곳에 응용될 수 있을 것으로 생각된다.

저온 공정 온도에서 $Al_2O_3$ 게이트 절연물질을 사용한 InGaZnO thin film transistors

  • 우창호;안철현;김영이;조형균
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2010년도 하계학술대회 논문집
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    • pp.11-11
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    • 2010
  • Thin-film-transistors (TFTs) that can be deposited at low temperature have recently attracted lots of applications such as sensors, solar cell and displays, because of the great flexible electronics and transparent. Transparent and flexible transistors are being required that high mobility and large-area uniformity at low temperature [1]. But, unfortunately most of TFT structures are used to be $SiO_2$ as gate dielectric layer. The $SiO_2$ has disadvantaged that it is required to high driving voltage to achieve the same operating efficiency compared with other high-k materials and its thickness is thicker than high-k materials [2]. To solve this problem, we find lots of high-k materials as $HfO_2$, $ZrO_2$, $SiN_x$, $TiO_2$, $Al_2O_3$. Among the High-k materials, $Al_2O_3$ is one of the outstanding materials due to its properties are high dielectric constant ( ~9 ), relatively low leakage current, wide bandgap ( 8.7 eV ) and good device stability. For the realization of flexible displays, all processes should be performed at very low temperatures, but low temperature $Al_2O_3$ grown by sputtering showed deteriorated electrical performance. Further decrease in growth temperature induces a high density of charge traps in the gate oxide/channel. This study investigated the effect of growth temperatures of ALD grown $Al_2O_3$ layers on the TFT device performance. The ALD deposition showed high conformal and defect-free dielectric layers at low temperature compared with other deposition equipments [2]. After ITO was wet-chemically etched with HCl : $HNO_3$ = 3:1, $Al_2O_3$ layer was deposited by ALD at various growth temperatures or lift-off process. Amorphous InGaZnO channel layers were deposited by rf magnetron sputtering at a working pressure of 3 mTorr and $O_2$/Ar (1/29 sccm). The electrodes were formed with electron-beam evaporated Ti (30 nm) and Au (70 nm) bilayer. The TFT devices were heat-treated in a furnace at $300^{\circ}C$ and nitrogen atmosphere for 1 hour by rapid thermal treatment. The electrical properties of the oxide TFTs were measured using semiconductor parameter analyzer (4145B), and LCR meter.

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엑시며 레이저에 의해 형성된 다결정 실리콘 박막의 Angle wrapping에 의한 깊이에 따른 특성변화 (New Analysis Approach to the Characteristics of Excimer Laser Annealed Polycrystalline Si Thin Film by use of the Angle wrapping)

  • 이창우;고석중
    • 한국재료학회지
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    • 제8권10호
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    • pp.884-889
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    • 1998
  • 대면적의 비정질 실리콘 박막을 가우스 분포(Gaussian Profile)의 일차원 선형빔(line shape beam)을 가지는 엑시머 레이저를 사용하여 결정화를 시켰다. (Corning 7059 glass)위에 증착된 비정질 실리콘 박막이 재결정화된 실리콘 박막의 경우, 두께에따라 결정화되는 모양이 다르게 나타났다. 따라서 두께에 따라 결정화되는 상태의 변화를 조사하기 위하여 angle wrapping 방법을 새롭게 도입하여 깊이에 따른 Si층이 5${\mu}m$ 이상되도록 angle wrapping한 후에 박막의 두께에 따른 micro-raman spectra를 측정하여 결정화상태에 따른 잔류응력을 조사하였다. 또한 기판의 온도가 상온인 경우에 엑시머 레이저의 밀도가 300mJ/${cm}^2$에서 열처리한 경우에 재결정화된 Si 박막의 잔류응력에 박막의 표면에서 박막의 깊이에 따라 $1.3{\times}10^10$에서 $1.6{\times}10^10$을 거쳐 $1.9{\times}10^10$ dyne/${cm}^2$으로 phase의 변화에 따라 증가하였다. 또한 기판의 온도가 $400^{\circ}C$에서 최적의 열처리 에너지 밀도인 300mJ/${cm}^2$에서는 박막의 깊이에 따른 결정화 상태의변화에 따라 thermal stress 의 값이 $8.1{\times}10^9$에서 $9.0{\times}10^9$를 거쳐 $9.9{\times}10^9$ dyne/${cm}^2$으로 변화하는 것을 알 수 있다. 따라서 liquid phase에서 solid phaserk 변화함에 따라 stress값이 증가하는 것을 알 수 있다.

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용융염 기반의 화학기상증착법을 이용한 원자층 두께의 고품질 MoS2 합성 (Molten-Salt-Assisted Chemical Vapor Deposition for Growth of Atomically Thin High-Quality MoS2 Monolayer)

  • 고재권;육연지;임시헌;주현규;김현호
    • 접착 및 계면
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    • 제22권2호
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    • pp.57-62
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    • 2021
  • 원자층 두께의 이차원 전이금속 칼코겐화합물은 그래핀과 비슷한 형태의 이차원 구조로 이루어져 있으며, 전기적 특성을 비롯한 우수한 물리적특성을 보여 차세대 반도체 물질로 각광받고 있다. 그래핀의 대면적 합성의 경우 이미 기술적으로 성숙되어 화학기상 증착법을 이용하여 웨이퍼 수준의 크기만큼 단결정 합성이 가능해졌으나, 이차원 전이금속 칼코겐화합물의 경우 현재 수에서 수백 ㎛ 수준에 머물러 있는 것이 실정이다. 본 논문에서는 최근에 보고된 용융염 기반의 화학기상증착법을 통한 이차원 단층 MoS22합성법에서 공정변수가 MoS2단결정의 크기에 미치는 영향에 대해 조사하였다. 그 결과, 최적화된 조건에서 약 420 ㎛의 고품질 단층 단결정 MoS2가 합성될 수 있다는 사실을 광학 현미경, 원자력 현미경, 라만 분광, 그리고 광루미네선스 분광 분석을 통하여 밝혀내었다.