• 제어로봇시스템학회:학술대회논문집
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• 2004.08a
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• pp.126-131
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• 2004

The popularity of flat-panel display(FPD), including plasma display panel(PDP) and liquid-crystal display(LCD), has given rise to the need to streamline their production. In these days, PDP is one of the most popular display devices because of its expansion of manufacturing process and simplicity. Bus electrodes, sustain electrodes, barrier ribs and RGB phosphors are patterned on PDP panel to display an image. Since a minute damage on the pattern can cause a serious defect to display, it is important to inspect the pattern precisely. In this paper, an automatic inspection system of repeated pattern in PDP panel has been introduced to find the defect, such as open, short, dirt, island, and so on. And the inspection system has been operated in the mass production line of PDP.

• Design & Manufacturing
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• v.14 no.2
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• pp.21-27
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• 2020

Recently, LCD (Liquid Crystal Display) has been replaced by OLDE (Organic Light Emitting Diode) in high resolution display industry. In the process of OLDE production, it inspects defective products by sending a signal using a probe during OLED panel inspection. At this time, the cause of the detection of failure is divided into two. One is the self-defect of the OLED panel and the other is the poor contact occurring in the process of contact between the two. The second case is unknown at the time of testing, which increases the time for retesting. To this end, we made a system that can identify in real time whether the probe is in contact during the inspection. A contact probe unit was designed for the system, and a stage system was implemented. An inspection system was constructed through S / W and circuit configuration for actual inspection. Finally, a system that can check contact and non-contact in real time was constructed.

• Proceedings of the IEEK Conference
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• 2003.11a
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• pp.351-354
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• 2003

To inspect point-defect in LCD pannel, calculate period and eliminated pattern. And then find point-defect to compare block image with each period. First processing, Founded over point defects. To reduce wrong point defect. Next, label point-defects and eliminated not surpass fixed limit-size.

• Industrial Engineering and Management Systems
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• v.8 no.3
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• pp.148-154
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• 2009

In recent days, large-sized flat-panel display (FPD) has been increasingly applied to computer monitors and TVs. Mura defects, appearing as low contrast or non-uniform brightness region, sometimes occur in manufacturing of the Thin-Film Transistor Liquid-Crystal Displays (TFT-LCD). Implementation of automatic Mura inspection methods is necessary for TFT-LCD production. Various existing Mura detection methods based on regression diagnostics, surface fitting and data transformation have been presented with good performance. This paper proposes an efficient Mura detection method that is based on a regression diagnostics using studentized residuals for automatic Mura inspection of FPD. The input image is estimated by a linear model and then the studentized residuals are calculated for filtering Mura regions. After image dilation, the proposed threshold is determined for detecting the non-uniform brightness region in TFT-LCD by means of monitoring the every pixel in the image. The experimental results obtained from several test images are used to illustrate the effectiveness and efficiency of the proposed method for Mura detection.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.57 no.2
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• pp.307-313
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• 2008

In this paper, we propose a novel defects inspection algorithm for TFT-LCD panels. We first compensate the distorted image caused by the camera distortion and the uneven illumination environment using the least squares method and the bezier surface. We find a starting point of each pattern for restricting each pattern. A clean image is compared to each pattern to find defects using modified PCSR-G algorithm. The simulation example shows that our algorithm not only inspects the defects well, but also is robust to the 1-pixel error.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.21 no.6
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• pp.1161-1166
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• 2017

Recently, with the development of display technology, AMOLED(Active Matrix OLED) panel production and demand are increasing. Unlike LCD, AMOLED panel basically does not need backlight, so it can output clear images with low power consumption. Therefore, the AMOLED market is growing globally. Accordingly, the demand for inspection devices required for production is also expanding. The inspection device of the AMOLED panel aging system operates in conjunction with MES(Manufacturing Execution System) and MIS(Management Information System), and it is efficient to construct network environment. The inspection device used for panel aging is a pattern generator capable of outputting multiple signals. Efficient design is required to operate multiple signal generators. To solve this problem, the proposed system proposed a method for remotely controlling the signal generator remotely and a method for driving the AMOLED panel. And the timing and power setting results are presented.

• Journal of Korea Multimedia Society
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• v.15 no.6
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• pp.784-793
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• 2012

Defects of TFT-LCD is detected by thresholding the difference image between the input image and template one because LCD panel has its inherent patterns. However, the pitch corresponding to pattern period is gradually changed according to the distance from the center of camera due to geometric distortion of camera characteristics. This paper presents a method to detect defects through comparing the pitch area with neighbor pitch areas where the perspective transform is performed with the extracted features to correct the distortion. The experimental results show that the performance of the proposed method is very effective for real data.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.46 no.4
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• pp.58-63
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• 2009

The appearance inspection of various electronic products and parts was executed by the eyesight of human. The appearance inspection is applied to the most electronic component of LCD Panel, flexible PCB and remote control. If the appearance of electronic products of small and minute size is inspected by the eyesight of human, we can't expect the stable inspection result because inspection result is changed by condition of physical and spirit of the checker. Therefore currently machine vision systems are used to many appearance inspection fields instead of inspection by human. The many problems of inspection by the checker are not occurred in machine vision circumstance. However, the inspection by automatic machine vision system is mainly influenced by illumination of workplace. In this paper, we propose a histogram transform method for improving accuracy of machine visual inspection.

• The KIPS Transactions:PartA
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• v.11A no.4
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• pp.235-242
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• 2004

When manufacturing information and communication device that consists of lots of part, it is important to improve the quality of the produced system by inspecting the system accurately and exclude the defected part. In case of LCD which is recently in a great demand, the inspection process of the nut which bonds the back frame to protect the LCD panel has to be done by human labor. It highly required an automatic inspection system which can inspect the nut without wasting human resources. In this paper, we describe the process of developing a system which automatically inspect the status of nuts inserted during the manufacturing of LCD. The nut inspection vision system developed measures the number of nut's spiral, the distance between pitches, the width of a pitch, and the inside diameter of nut. We have adopted lens with high magnifying power and calibration tool and intended to produce automatic lighting for maintaining a stable environment for a high precision system. We also developed the algorithms for analyzing the nut. We apply the system to real factory field and verify that it is better than the man power in terms of error rate.

• Journal of the Korean Society for Precision Engineering
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• v.20 no.4
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• pp.92-102
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• 2003

To detect electrical faults of a TFT (Thin Film Transistor) panel for the LCD (Liquid Crystal Display), techniques of converting electric field to an image are used One of them is the PDLC (polymer-dispersed liquid crystal) modulator which changes light transmittance under electric field. The advantage of PDLC modulator in the electric field detection is that it can be used without physically contacting the TFT panel surface. Specific pattern signals are applied to the data and gate electrodes of the panel to charge the pixel electrodes and the image sensor detects the change of transmittance of PDLC positioned in proximity distance above the pixel electrodes. The image represents the status of electric field reflected on the PDLC so that the characteristic of the PDLC itself plays an important role to accurately quantify the defects of TFT panel. In this paper, the image of the PDLC modulator caused by the change of electric field of the pixel electrodes on the TFT panel is acquired and how the characteristics of PDLC reflect the change of electric field to the image is analyzed. When the holding time of PDLC is short, better contrast of electric field image can be obtained by changing the instance of applying the driving voltage to the PDLC.