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A New Defect Inspection Method for TFT-LCD Panel using Pattern Comparison  

Lee, Kyong-Min (포항공과대학 전자전기공학과)
Jang, Moon-Soo (포항공과대학 전자전기공학과)
Park, Poo-Gyeon (포항공과대학 전자전기공학과)
Publication Information
The Transactions of The Korean Institute of Electrical Engineers / v.57, no.2, 2008 , pp. 307-313 More about this Journal
Abstract
In this paper, we propose a novel defects inspection algorithm for TFT-LCD panels. We first compensate the distorted image caused by the camera distortion and the uneven illumination environment using the least squares method and the bezier surface. We find a starting point of each pattern for restricting each pattern. A clean image is compared to each pattern to find defects using modified PCSR-G algorithm. The simulation example shows that our algorithm not only inspects the defects well, but also is robust to the 1-pixel error.
Keywords
PCSR-G; TFT-LCD;
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