• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2002.10a
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• pp.164-169
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• 2002

Recently, LCD(Liquid Crystal Display) is the display product widely used on various fields of industry. This is generally composed of many parts. Among many parts, polarizer film control the intensity of the transmitted light according to the degree of rotation of the polarizer axis. Therefore, this film must be free from defects. But it contains many defects such as the defects caused by dust or different thing, adhesive badness, scratch. Presently, the inspection of these defects is depending on the sight of operator. In this paper, we propose the vision system composed of telecentric lens and optical mirror. This system use the coaxial illumination and the light is specularly reflected on the optical mirror. And we develop the image processing algorithm using the threshold and morphological technique.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.11 no.5
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• pp.997-1003
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• 2007

In this paper, we propose a global approach for automatic inspection of defects in the polarizer film image. The proposed method does not rely on local feature of the defect. It is based on a global image reconstruction scheme using the singular value decomposition(SVD). SVD is used to decompose the image and then obtain a diagonal matrix of the singular values. Among the singular values, the first singular value is used to reconstruct a image. In reconstructed image, the normal pixels in background region have a different characteristics from the pixels in defect region. It is obtained the ratio of pixels in the reconstructed image to ones in the original image and then the defects are detected based on the the statistical process of the ratio. The experiment results show that the proposed method is efficient for defect inspection of polarizer lam image.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2006.10a
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• pp.1-2
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• 2006

• Proceedings of the Korean Society Of Semiconductor Equipment Technology
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• 2004.05a
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• pp.249-252
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• 2004

냉음극관(CCFL) 램프를 이용한 멀티램프 구동용 인버터를 제작 한 후 이를 이용하여 휘도 $20,000 cd/\textrm{m}^2$, 휘도 균일도 85%의 장비용 백라이트를 제작하였다. 이러한 고휘도, 높은 휘도 균일도의 직하방식 백라이트를 이용하여 기존의 형광등을 이용한 검사장비 보다 고휘도, 박형의 장수명 백라이트를 제작하였다.

• Proceedings of the KIEE Conference
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• 2007.07a
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• pp.1760-1761
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• 2007

액정 디스플레이(LCD)의 핵심 재료인 편광필름은 제조 과정이나 운반 과정에서 실오라기 같은 이물 및 찍힘 등의 결함이 발생하며 이를 사람이 육안으로 검사하고 있다. 본 논문에서는 이런 편광필름의 결함을 자동으로 검출하기위한 방법으로 히스토그램의 통계적 모멘트를 사용하여 주변 밝기에 따라 검사 영역의 밝기의 기울기를 구하고, 이를 통해 결함의 유무를 판단하는 편광필름 검사 방법을 제안한다.

• Journal of Korea Multimedia Society
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• v.15 no.4
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• pp.439-448
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• 2012

TFT-LCD panel images have non-uniform brightness, noise signal and defect signal. It is hard to divide defect signal because of non-uniform brightness and noise signal, so various divide methods have being developed. In this paper, we suggest method to divide defective regions on TFT-LCD panel image by estimating a menas of two different size of windows, which is suggested by Eikvil et al., and using difference of them. But in this method, the size of detectable defects is restricted by the size of window, hence it has inefficient problem that the size of window have to increase to divide a large defect region. To solve this problem we suggest an algorithm which can divide various size of defects, by using Multi-scale and restrict a detectable size of defects in each scale. To prove an efficiency of suggested algorithm, we show that resulting images of real TFT-LCD panel images and an artificial image with various defects.

• Journal of the Korean Magnetics Society
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• v.22 no.3
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• pp.91-96
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• 2012

In this paper, a three-dimensional finite element model based on the multi-pixel was constructed to accurately predict electric field distributions including an interference phenomenon between adjacent pixels in the liquid crystal of a complicated TFT-LCD panel. Utilizing the elaborate numerical model, the characteristics of spatial electric field distributions depending on various fault-electrode conditions are thoroughly examined on the basis of the field distribution of a normal electrode condition. The validity of the proposed model is proved by comparing the simulation results with those of the existing optical inspection equipments.

• Journal of Korea Multimedia Society
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• v.13 no.8
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• pp.1115-1127
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• 2010

In order to increase the productivity in manufacturing TFT-LCD(thin film transistor-liquid crystal display), it is essential to classify defects that occur during the production and make an appropriate decision on whether the product with defects is scrapped or not. The decision mainly depends on classifying the defects accurately. In this paper, we present an effective classification method for film defects acquired in the panel production line by analyzing the intensity distribution and shape feature of the defects. We first generate a binary image for each defect by separating defect regions from background (non-defect) regions. Then, we extract various features from the defect regions such as the linearity of the defect, the intensity distribution, and the shape characteristics considering intensity, and construct a referential image database that stores those feature values. Finally, we determine the type of a defect by matching a defect image with a referential image in the database through the matching cost function between the two images. To verify the effectiveness of our method, we conducted a classification experiment using defect images acquired from real TFT-LCD production lines. Experimental results show that our method has achieved highly effective classification enough to be used in the production line.

• Journal of the Optical Society of Korea
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• v.17 no.5
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• pp.392-398
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• 2013

As the essential techniques for the CD (Critical Dimension) measurement of the LCD pattern, there are various modules such as an optics design, auto-focus [1-4], and precise edge detection. Since the operation of image enhancement to improve the CD measurement repeatability, a ring type of the reflected lighting optics is devised. It has a simpler structure than the transmission light optics, but it delivers the same output. The edge detection is the most essential function of the CD measurements. The CD measurement is a vital inspection for LCDs [5-6] and semiconductors [7-8] to improve the production yield rate, there are numbers of techniques to measure the CD. So in this study, a new subpixel algorithm is developed through facet modeling, which complements the previous sub-pixel edge detection algorithm. Currently this CD measurement system is being used in LCD manufacturing systems for repeatability of less than 30 nm.

• Proceedings of the KIEE Conference
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• 2007.07a
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• pp.1864-1865
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• 2007

In this paper, we proposed pre-filter algorithms which using frequency domain analysis method, for the detections of defects in large-sized Thin Film Transistor-Liquid Crystal Display(TFT-LCD) panel surfaces. We performed frequency analysis with 1-D, 2-D FFT methods for extract periodic patterns of lattice structures in TFT-LCDs. To remove this patterns, band-stop filters were used for eliminating specific frequency components. In order to acquire only defected images, we used 2-D inverse FFT methods which can be reverts images that remains defects.