1 |
W. K. Pratt,S. S. Sawkar and K. O'reilly, 'Automatic blemish detection in Liquid Crystal Hat Panel Display,' SPIE Symposium on Electronic Imaging, 1998
|
2 |
Du-Ming Tsai, Tse-Yun Huang, 'Automated Surface Inspection for Statistical Textures,' Image and Vision Computing, pp. 307-323, 2003
|
3 |
C-J Lu and D-M TSAI, 'Defect Inspection of Patterned Thin Film Transistor-Liquid Crystal Display Panels using a Fast Sun-Image-based Singular Value Decomposition,' International Journal of Production Research, vol. 42, No. 20, pp. 4331-4351, Oct., 2004
DOI
ScienceOn
|
4 |
D. A. Forsyth and J. Ponce, 'Computer Vision: A Modem Approach,' Prentice Hall,2003
|
5 |
Liu R. and Tan T., 'An SVD-Based Watermarking Scheme for Protecting Rightful Ownership,' IEEE Transactions on Multimedia, 4, pp. 121-128, 2002
DOI
ScienceOn
|
6 |
D.P. Berrar, W. Dubitzky, M. Granzow, 'Singular Value Decomposition and Principal Component Analysis,' A Practical Approach to Microarray Data Analysis, pp. 91-109, 2004
|
7 |
Nakashima, M, 'Hybrid Inspection System for LCD Color Filter Panels, ' Proceeding of SPIE, San Diego, USA, pp. 407-418,1994
|
8 |
박종성, 정규원, 강찬구, '비젼 시스템을 이용한 LCD용 편광 필름의 결함 검사에 관한 연구', 한국공작기계학회 추계학술대회 논문집, pp.164-169, 2002
과학기술학회마을
|
9 |
Sokolov, S. M. and Treskunov, A. S., 'Automatic Vision System for Final Test of Liquid Crystal Display, ' IEEE Internation Conference on Robotics and Automation, pp. 1578-1582, 1992
|
10 |
Jae Y. Lee and Suk I. Y00, 'Automatic Detection of Region-Mura Defect in TFT-LCD,' IEICE Trans. Inf. & Syst., vol. E87-D, No.10, pp.2371-2378, 2004
|
11 |
Chung K. L., ShenC. H. and Chang L. C, 'A Novel SVD-and VQ-Based Image Hiding Scheme, ' Pattern Recognition Letters, 22,pp. 1051-1058, 2002
|
12 |
B. C. Jiang, c.c. Qangand H. C. Liu, 'Liquid Crystal Display Surface Uniformity Defect Inspection Using Analysis of Variance and Exponentially Weighted Moving Average Techniques,' International Journal of Production Research, vol. 43, No.1, pp.67-80, 2005
DOI
ScienceOn
|