• Journal of Institute of Control, Robotics and Systems
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• v.5 no.8
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• pp.995-1000
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• 1999

This paper presents a optic system and a visual inspection algorithm looking for solder joint defects of J-lead chip which are more integrate and smaller than ones with Gull-wing on PCBs(Printed Circuit Boards). The visual inspection system is composed of three sections : host PC, imaging and driving parts. The host PC part controls the inspection devices and executes the inspection algorithm. The imaging part acquires and processes image data. And the driving part controls XY-table for automatic inspection. In this paper, the most important five features are extracted from input images to categorize four classes of solder joint defects in the case of J-lead chip and utilized to a back-propagation network for classification. Consequently, good accuracy of classification performance and effectiveness of chosen five features are examined by experiment using proposed inspection algorithm.

• Journal of the Korean Society for Precision Engineering
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• v.15 no.5
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• pp.9-18
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• 1998

The components with J-lead. which are more integrated and smaller than ones with Gull-wing. are rapidly being used in electronic board such as the PCB, for they have the advantage of occupying a small space compared to the other components. However, the development of inspection system for these new components is not so rapid as component development. Component-inspection with J-lead using vision system is difficult because they are hidden from camera optical axis. X-ray inspection, which has the advantage of inspecting the inside of solder state, is used to J-lead inspection. However. it is high cost and dangerous by leaking out X-ray compared to vision system. Therefore, in this paper, we design vision system suited to J-lead inspection and then propose algorithm which have flexibility in mount and rand error.

• 제어로봇시스템학회:학술대회논문집
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• 1997.10a
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• pp.1774-1777
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• 1997

As factory automation is required, using the vision system is also essential. Especially, the pateh planning of parts with J-lead on PCB plays a import role of whole automation. Path planning is required because J-lead is scatteed compaed to L-lead on PCB. Therefore, in this paper, we propose path planning of part inspection with J-lead to use Hopfield Model(TSP : Traveling Salesman Problem). Then optical system suited to J-lead inspection is designed and the algorithm of J-lead solder joint and part inspection is proposed.

• Proceedings of the KWS Conference
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• 1997.05a
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• pp.176-179
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• 1997

• Proceedings of the International Microelectronics And Packaging Society Conference
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• 2004.02a
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• pp.37-59
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• 2004

In the case of Ni/Au finished pad on the package side, the solder joint of SnAgCu system can bring brittle fracture under impact load such as drop test. Therefore, it's difficult to prevent the brittle fracture of lead-free solder, by controlling Cu content. The failure locus existing on the interface between $(Ni,Cu)_3Sn_4\;and\;(Cu,Ni)_6Sn_5$ IMC layers must be changed to other site in order to avoid brittle fracture due to impact load. It was not found any clear evidence that there were two IMC layers exist. But it was strongly assumed these were two layers which have different Cu-Ni composition. From the above analysis it was assumed that Cu atom in the solder alloy or substrate seemed to affect IMC composition and cause to IMC brittle fracture.

• 제어로봇시스템학회:학술대회논문집
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• 1996.10b
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• pp.109-112
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• 1996

The more integrated and smaller SMD are needed, new solder joints packaging technologies are developed in these days such as BGA(Ball Grid Array), Flip Chip, J-lead etc. But, it's unable to inspect solder joints in those devices by visual inspection methods, because they are hided by it's packages. To inspect those new SMD packages, an X-ray system for acquiring a cross-sectional image of a arbitrary plane is necessary. In this paper, an analysis for designing X-ray cross sectional imaging system is presented including the way for correcting the distortion of image intensifier. And we show computer simulation of that system with a simple PCB model to show it's usefulness in applying PCB solder joint inspection.

• Proceedings of the International Microelectronics And Packaging Society Conference
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• 2000.10a
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• pp.195-201
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• 2000

Current Status: Good Electrical performance for high speed device, Solder joint reliability-Passed 1600 cycles for 4M SRAM(3.27mm DNP),-Passed 400 cycles for large die(5.71 mm DNP), Future Plan: Improving Board Level Reliability for large die size, Lead free solder evaluation.