Path planning of the J-lead inspection using hopfield model

홉필드 모델을 이용한 J-리드 검사 경로 생성

As factory automation is required, using the vision system is also essential. Especially, the pateh planning of parts with J-lead on PCB plays a import role of whole automation. Path planning is required because J-lead is scatteed compaed to L-lead on PCB. Therefore, in this paper, we propose path planning of part inspection with J-lead to use Hopfield Model(TSP : Traveling Salesman Problem). Then optical system suited to J-lead inspection is designed and the algorithm of J-lead solder joint and part inspection is proposed.