Board level joint reliability of differently finished PWB pad

PCB Pad finish 방법에 따른 solder의 Board level joint reliability

  • Lee W. J. (Interconnect Product & Technology Development Team Samsung Electronics Co., Ltd.) ;
  • Moon H. J. (Interconnect Product & Technology Development Team Samsung Electronics Co., Ltd.) ;
  • Kim Y. H. (Interconnect Product & Technology Development Team Samsung Electronics Co., Ltd.)
  • Published : 2004.02.01

Abstract

In the case of Ni/Au finished pad on the package side, the solder joint of SnAgCu system can bring brittle fracture under impact load such as drop test. Therefore, it's difficult to prevent the brittle fracture of lead-free solder, by controlling Cu content. The failure locus existing on the interface between $(Ni,Cu)_3Sn_4\;and\;(Cu,Ni)_6Sn_5$ IMC layers must be changed to other site in order to avoid brittle fracture due to impact load. It was not found any clear evidence that there were two IMC layers exist. But it was strongly assumed these were two layers which have different Cu-Ni composition. From the above analysis it was assumed that Cu atom in the solder alloy or substrate seemed to affect IMC composition and cause to IMC brittle fracture.

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