Proceedings of the International Microelectronics And Packaging Society Conference (한국마이크로전자및패키징학회:학술대회논문집)
- 2004.02a
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- Pages.37-59
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- 2004
Board level joint reliability of differently finished PWB pad
PCB Pad finish 방법에 따른 solder의 Board level joint reliability
- Lee W. J. (Interconnect Product & Technology Development Team Samsung Electronics Co., Ltd.) ;
- Moon H. J. (Interconnect Product & Technology Development Team Samsung Electronics Co., Ltd.) ;
- Kim Y. H. (Interconnect Product & Technology Development Team Samsung Electronics Co., Ltd.)
- 이왕주 (삼성전자(주)) ;
- ;
- Published : 2004.02.01
Abstract
In the case of Ni/Au finished pad on the package side, the solder joint of SnAgCu system can bring brittle fracture under impact load such as drop test. Therefore, it's difficult to prevent the brittle fracture of lead-free solder, by controlling Cu content. The failure locus existing on the interface between
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