• Proceedings of the Korean Vacuum Society Conference
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• 2000.02a
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• pp.60-60
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• 2000

The adhesion interface formation between copper and poly(ethylene terephthalate)(PET), poly(methyl methacrylate)(PMMA) and Polyimide films was treated using Ion assisted reaction system to sequential sputter deposition by High-Frequency ion source. The ion beam modification system used a new type of low power HF ion thruster for space application as new low thruster electric propulsion system. Low power HF ion thruster with diameter 100mm gives the opportunity to obtain beams of Ar+ with currents 20~150 mA (current density 0.5~3.5 mA/cm2) and energy 200~2500eV at HF power level 10~150 W. Using Ar as a working gas it is possible to obtain thrust within 3~8 mN. Contact angles for untreated films were over 95$^{\circ}$ and 80 for Pet, 10o for PMMA and 12o for PI samples as a condition of ion assisted reaction at the ion dose of 10$\times$1016 ions/cm2, the ion beam potential of 1.2 keV and 4 ml/min for environmental gas flow rate. 900o peel tests yielded values of 15 to 35 for PET, 18 to 40 and 12 to 36 g/min. respectively. High resolution X-ray photoelectron spectrocopy is the Cls region for Cu metal on these polymer substrates showed increases in C=O-O groups for polymide, whereas PET and PMMA treated samples showed only C=O groups with increase the ion dose. Finally, unstable polymer surface can be changed from hydrophobic to hydrophilic formation such as C-O and C=O that were confirmed by the XPS analysis, conclusionally, the ion assisted reaction is very effective tools to attach reactive ion species to form functional groups on C-C bond chains of PET, PMMA and PI.

• Applied Microscopy
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• v.47 no.2
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• pp.77-83
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• 2017

Drastic development of ubiquitous devices requires more advanced batteries with high specific capacitance and high rate capability. Large-area microstructure characterization across the stacks of cathode, electrolyte and anode might reveal the origin of the instability or degradation of batteries upon cycling charge. In this study, sample preparation methods to observe the cross-section view of the electrodes for battery in SEM and several imaging tips are reviewed. For an accurate evaluation of the microstructure, ion milling which flats the surface uniformly is recommended. Pros and cons of cross-section polishing (CP) with Ar ion and focused ion beam (FIB) with Ga ion were compared. Additionally, a modified but new cross-section milling technique utilizing precision ion polishing system (PIPS) which can be an alternative method of CP is developed. This simple approach will make the researchers have more chances to prepare decent large-area cross-section electrode for batteries.

• Journal of the Korean institute of surface engineering
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• v.53 no.3
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• pp.116-123
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• 2020

Ion beam irradiation induces self-organization of nanostructure on the surface of polymer film. We show that the incident angle of Ar ions on polyethylene naphthalate(PEN) film changes self-organized nanostructure. PEN film was irradiated by argon ion beams with the ion incident angle of 0°, 30°, 45°, 60°, and 80°. Nanostructure was altered from dimple to ripple structure as the angle increases. The ripple structure changed to pillar structure after 60°due to that the shallow incident angle increased the ion energy transfer per depth up to 50 eV/Å, which value could induce excessive surface heating and oligomer formation reacting as a physical mask for anisotropic etching. And quantitative analysis of the nanostructures was adapted by using ABC model and fractal dimension theory.

• Applied Microscopy
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• v.51
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• pp.19.1-19.7
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• 2021

The main purpose of this paper is the preparation of transmission electron microscopy (TEM) samples from the microsized powders of lithium-ion secondary batteries. To avoid artefacts during TEM sample preparation, the use of ion slicer milling for thinning and maintaining the intrinsic structure is described. Argon-ion milling techniques have been widely examined to make optimal specimens, thereby making TEM analysis more reliable. In the past few years, the correction of spherical aberration (Cs) in scanning transmission electron microscopy (STEM) has been developing rapidly, which results in direct observation at an atomic level resolution not only at a high acceleration voltage but also at a deaccelerated voltage. In particular, low-kV application has markedly increased, which requires a sufficiently transparent specimen without structural distortion during the sample preparation process. In this study, sample preparation for high-resolution STEM observation is accomplished, and investigations on the crystal integrity are carried out by Cs-corrected STEM.

• Journal of Satellite, Information and Communications
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• v.9 no.1
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• pp.33-37
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• 2014

This paper introduces homogeneous liquid crystal (LC) orientations on chemically modulated polystyrene (PS) surfaces using various ion beam (IB) exposure time. Transparent PS was replaced with conventional polyimide material. As a non-contact process, IB bombardment process induced LC orientation in the direction parallel to the IB process. Through x-ray photoelectron spectroscopy, it was shown that the chemical compositional changes of the IB-irradiated PS surfaces were determined as a function of IB exposure time.Using this analysis, the optimal IB bombardment condition was determined at IB exposure time of up to 15 s. Moreover, thermal stability on IB-irradiated PS surfaces were carried out which showed that a relatively high IB exposure time induced a thermally stable LC alignment property.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.11a
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• pp.302-303
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• 2006

The response surface modeling of the pretilt angle control using ion-beam (IB) alignment on nitrogen doped diamond-like carbon (NDLC) thin film layer is investigated. The response surface model is used to analyze the variation of the pretilt angle under various process conditions IB exposure angle and IB exposure time are considered as Input factors. The analysis of variance technique is used to analyze the statistical significance, and effect plots are also investigated to examine the relationships betweenthe process parameters and the response. The model can allow us to reliably predict the pretilt angle with respect to the varying process conditions.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.245-246
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• 2013

한국과학기술연구원에서는 2007년부터 시작된 중대형가속기구축사업을 통하여 3기의 정전형 가속기를 설치하였다. 1996년에 도입된 2.0 MV Pelletron을 비롯하여 신규 도입된 6 MVTandetron과 400 kV implanter 등 모두 3기의 정전형가속기로 30 keV부터 ~60 MeV까지의 단색 이온빔을 인출, 이용할 수 있는 실험설비의 구축이 완성되었다. 정전형가속기의 주요 활용분야는 femto~atto mole정도의 동위원소를 측정하는 가속기질량분석법(AMS)를 비롯하여 RBS/ERD로 대표되는 이온빔분석법(ion beam analysis, IBA) 그리고 고에너지 이온빔을 이용한 물질 개질분야(ion beam material modification, IBMM)로 크게 분류된다. 이 시설은 당 연구원의 연구 수요 뿐 아니라 국내 연구자의 수요를 아우르는 시설로 계획하고 있다. 여타 실험/분석장비와 달리 가속기시설은본체의 완성 후 활용목적에 맞춰 빔라인의 증설이 필요하며 최근 가장활용성이 큰 가속기질량분석(accelerator mass spectrometry, AMS)의 경우는 활용분야별 시료 전처리 시설과 기술의 개발이 요구된다. 따라서 KIST에서는 향후 수년간 활용 분야별 대표적인 주제를 선정하고 필요한 선행연구를 통하여 KIST 이온빔시설에 대한 연구자들의 접근편의성을 제고하고자한다. 본 발표에서는 지난 6년간의 수행된 가속기 시설의 개요와 함께 장차 수행할 선행연구의 방향과 내용을 소개한다(Figure capture). Layout of the newly constructed KIST ion beam facility.

• Korean Journal of Optics and Photonics
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• v.11 no.2
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• pp.73-79
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• 2000

We measure a beam diameter of scan and sub-scan direction of LSD (Laser Scanning Urnt) which uses $fheta$ lens produced by injecLion molding method as a scanning lens. While the measured beam diameter in scan direction, which is $62muextrm{m}$ to $68\mu\textrm{m}$, shows similar size comparing to the design beam diameter, the sub-scan beam diameter shows sIzable beam diameter deviation as much as 37 11m ranging from $78\mu\textrm{m}$ to $115\mu\textrm{m}$. Injection molding lens has the surface figure error due to the shrinkage III the cooling time and the internal distortion (birefringence) due to the uneven cooling conditIOn so that these bring about wavefront aberration (i.e., the enlargement of beam size), and are eventually expre~sed as the deterioration of the pdnting image. In this paper. we first measure and analyze beam diameter, birefringence (polanzation ratio), and asphedcal figure error of mIens in order to know the principle cause of the beam diameter deviation in sub-scan directIOn. And Lhen. through the analysis of a designed depth of focus and a calculated field curvature (imaging position of the optical axis directIon) using the above figure elTor data, we know Lhat the birefringence IS the main factor of sizable beam diameter deVIation in sub-scan direction. ction.

• Journal of the Korean institute of surface engineering
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• v.41 no.3
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• pp.88-93
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• 2008

Ir-Re thin films with Ti interlayer were deposited onto the tungsten carbide substrate by ion beam assisted DC magnetron sputtering. The Ir-Re films were prepared with targets of having two atomic percent of 7:3 and 5:5. The microstructure and surface analysis of the specimen were conducted by using SEM, XRD and AFM. Mechanical properties such as hardness and adhesion strength of Ir-Re thin film also were examined. The interlayer of pure titanium was formed with 100 nm thickness. The film growth of Ir-30at.%Re was faster than that of Ir-50at.%Re in the same deposition conditions. Ir-Re thin films consisted of dense and columnar structure irrespective of the different target compositions. The values of hardness and adhesion strength of Ir-30at.%Re thin film coated on WC substrate were higher than those of Ir-50at.%Re thin film.

• Journal of Radiation Industry
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• v.6 no.1
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• pp.23-29
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• 2012

In this study, we investigated the genetic variation in the general of monocot model plant (rice) in response to various ionizing irradiations including gamma-ray, ion beam and cosmic-ray. The non-irradiated and three irradiated (200 Gy of gamma-ray and 40 Gy of ion beam and cosmic-ray) plants were analyzed by AFLP technique using capillary electrophoresis with ABI3130xl genetic analyzer. The 29 primer combinations tested produced polymorphism results showing a total of 2,238 bands with fragments sizes ranged from 30 bp to 600 bp. The number of polymorphism generated by each primer combinations was varied significantly, ranging from 2 (M-CAC/E-ACG) to 158 (M-CAT/E-AGG) with an average of 77 bands. Polymorphic peaks were detected as 1,269 with an average of 44 per primer combinations. By UPGMA (Unweighted Pair Group Method using Arithmetic clustering) analysis method, the clusters were divided into non-irradiated sample and three irradiated samples at a similarity coefficient of 0.41 and three irradiation samples was subdivided into cosmic-ray and two irradiation samples (200 Gy of gamma-ray and 40 Gy of ion beam) at similarity coefficient of 0.48. Similarity coefficient values ranged from 0.41 to 0.55.