• 제목/요약/키워드: InSn solder

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The Stability of Plating Solution and the Current Density Characteristics of the Sn-Ag Plating for the Wafer Bumping

  • Kim, Dong-Hyun;Lee, Seong-Jun
    • 한국표면공학회지
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    • 제50권3호
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    • pp.155-163
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    • 2017
  • In this study, the effects of the concentration of metal ions and the applied current density in the Sn-Ag plating solutions were examined in regards to the resulting composition and morphology of the solder bumps' surface. Furthermore the effect of any impurities present in the methanesulfonic acid used as a base acid in the Sn-Ag solder plating solution on the stability of plating solution as well as the characteristics of the Sn-Ag alloys films was also explored. As expected, the uniform bump was obtained by means of removing impurities in the plating solution. Consequently the resultant solder bump was obtained in an optimal current density of the range of $1A/dm^2$ to $15A/dm^2$, which has acceptable bump shape and surface roughness with 12inch wafer trial results.

다양한 유무연 도금 리드프레임에 적용된 Sn-8Zn-3Bi 솔더 접합부의 열충격 신뢰성 평가 (Reliability of Sn-8Zn-3Bi Solder Paste Applied to Lead and Lead-free Plating on Lead-frame under Thermal Shock Test)

  • 한성원;조일제;신영의
    • 마이크로전자및패키징학회지
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    • 제14권2호
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    • pp.35-40
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    • 2007
  • Sn-8Zn-3Bi 무연 솔더 페이스트의 접합부신뢰성 및 적합성을 평가하기 위해 유(SnPb) 무연(Sn, SnBi)도금된 Cu 리드프레임 QFP(Quad Flat Packager)를 사용하여 열충격 조건 하에서의 인장 강도의 변화 및 파괴 기구에 대한 분석을 실시하였다. 리드 도금의 종류에 상관없이 모든 시험 시편에서 열충격 사이클 수의 증가에 비례하여 접합부의 취성 특성이 강화되어 인장 강도가 감소하는 것을 확인하였다. 하지만, 접합부에는 열팽창 계수의 차이에 의해 야기될 수 있는 미세 균열은 발견되지 않았다. 단면 관찰 및 변위 이력 곡선 분석을 통하여 열충격 사이클 수의 증가에 따른 인강 강도의 감소는 접합부의 파괴 기구의 변화에 기인되었음을 확인하였다. 본 실험을 통해 Sn-3Zn-3Bi 솔더의 유 무연 도금 Cu 리드프레임과의 우수한 작업 특성과 열충격 환경 하에서도 우수한 기계적 접합 특성을 유지하는 것을 확인할 수 있었다.

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자동차 전장용 무연솔더 및 솔더 접합부의 신뢰성 평가 (Lead-free Solder for Automotive Electronics and Reliability Evaluation of Solder Joint)

  • 방정환;유동열;고용호;윤정원;이창우
    • Journal of Welding and Joining
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    • 제34권1호
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    • pp.26-34
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    • 2016
  • Automotive today has been transforming to an electronic product by adopting a lot of convenience and safety features, suggesting that joining materials and their mechanical reliabilities are getting more important. In this study, a Sn-Cu-Cr-Ca solder composition having a high melting temperature ($>230^{\circ}C$) was fabricated and its joint properties and reliability was investigated with an aim to evaluate the suitability as a joining material for electronics of engine room. Furthermore, mechanical properties change under complex environment were compared with several existing solder compositions. As a result of contact angle measurement, favorable spreadability of 84% was shown and the average shear strength manufactured with corresponding composition solder paste was $1.9kg/mm^2$. Also, thermo-mechanical reliability by thermal shock and vibration test was compared with that of the representative high temperature solder materials such as Sn-3.5Ag, Sn-0.7Cu, and Sn-5.0Sb. In order to fabricate the test module, solder balls were made in joints with ENIG-finished BGA and then the BGA chip was reflowed on the OPS-finished PCB pattern. During the environmental tests, resistance change was continuously monitored and the joint strength was examined after tests. Sn-3.5Ag alloy exhibited the biggest degradation rate in resistance and shear stress and Sn-0.7Cu resulted in a relatively stable reliability against thermo-mechanical stress coming from thermal shock and vibration.

Sn-3.0Ag-0.5Cu 및 Sn-1.0Ag-0.5Cu 조성의 솔더 볼을 갖는 플립칩에서의 보드레벨 낙하 해석 (Board-Level Drop Analyses having the Flip Chips with Solder balls of Sn-3.0Ag-0.5Cu and Sn-1.0Ag-0.5Cu)

  • 김성걸
    • 한국생산제조학회지
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    • 제20권2호
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    • pp.193-201
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    • 2011
  • Recently, mechanical reliabilities including a drop test have been a hot issue. In this paper, solder balls with new components which are Sn-3.0Ag-0.5Cu and Sn-1.0Ag-0.5Cu-0.05N are introduced, and board level drop test for them are conducted under JEDEC standard in which the board with 15 flip chips is dropped as 1,500g acceleration during 0.5ms. The drop simulations are studied by using a implicit method in the ANSYS LS-DYNA, and modal analysis is made. Through both analyses, the solder balls with new components are evaluated under the drop. It is found that the maximum stress of each chip is occurred between the solder ball and the PCB, and the highest value among the maximum stresses in the chips is occurred on the chip nearest to fixed holes on the board in the drop tests and simulations.

SAC305 및 나노 입자 분산 솔더의 특성 (Characteristics of SAC305 and Nano-Particle Dispersed Solders)

  • 김장백;서성민;강혜준;조도훈;스리 하리니 라젠드란;정재필
    • 마이크로전자및패키징학회지
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    • 제28권1호
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    • pp.31-37
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    • 2021
  • Sn-3wt%Ag-0.5wt%Cu (SAC305) solder is most popular solder in electronics industry. However, SAC305 has also drawbacks such as growth of β-Sn phase, intermetallic compounds (IMCs) of Ag3Sn, Cu6Sn5 and Cu3Sn which can result in deterioration of solder joints in terms of metallurgically, mechanically and electrically. Thus, improvement of SAC305 solders have been investigated continuously by addition of alloying elements, nano-particles and etc. In this paper, recent improvements of SAC solders including nano-composite alloys and related solderabilty and metallurgical and mechanical properties are investigated.

Ni-P/Au UBM을 갖는 Pb-free 솔더 접합부의 전단강도 평가에 관한 연구 (A Study on Evaluation of Shear Strength for Pb-free Solder Joint with Ni-P/Au UBM)

  • 조성근;양성모;유효선
    • 한국생산제조학회지
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    • 제20권2호
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    • pp.187-192
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    • 2011
  • UBM(Under Bump Metallurgy) is very important for successful realization of Flip-Chip technology. In this study, it is investigated the interfacial reactions between various Sn-Ag solder alloys and Ni-P/Au UBM and Cu plate finish. It is also evaluated the shear strength by using the micro shear-punch test method for Sn-37Pb alloy, binary and ternary alloys of environment-friendly Pb-free solder alloys which are applied in the electronic packages. In terms of interfacial microstructure, the Pb-free solder joints have thicker IMCs than the Sn-Pb solder joints. The thickness of IMC is related to Reflow time. The IMC has been observed to grow with the increase in Reflow time. As a result of the shear test, in case of Max. shear strength, Pb-free solder showed the highest strength value and Sn-37Pb showed the lowest strength value 10 be generally condition of Reflow time.

고속 전단시험법을 이용한 Sn-37Pb/Cu 와 Sn-37Pb/ENIG 솔더 접합의 기계적신뢰성 평가 (Mechanical Reliability Evaluation of Sn-37Pb Solder/Cu and Sn-37Pb Solder/ENIG Joints Using a High Speed Lap-shear Test)

  • 전성재;현승민;이후정;이학주
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2008년도 추계학술대회A
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    • pp.250-255
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    • 2008
  • This study utilized a high speed lap-shear test to evaluate the mechanical behavior of Sn-37Pb/Cu and Sn-37Pb/Electroless Nickel immersion Gold under bump metallization solder joints under high speed loading and hence the drop reliability. The samples were aged for 120 h at different temperatures ($120^{\circ}C,\;150^{\circ}C,\;170^{\circ}C$) and afterward tested at different displacement rates (0.01 mm/s to 500 mm/s) to examine the effects of aging on the drop life reliability. The combination of the stress-strain graphs captured from the shear tests and identifying a fracture mode dominant in the samples for different strain rates leads us to conclude that the drop reliability of solder joints degrades as the aging temperature increases, possibly due to the role of the IMC layer. This study successfully demonstrates that the analysis based on a high speed lap-shear test could be critically used to evaluate the drop reliability of solder joints.

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Sn-Cu 무연 도금용액 및 피막의 신뢰성평가 (A Reliability Test for ph-free SnCu Plating Solution and It's Deposit)

  • 이홍기;허진영
    • 한국표면공학회지
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    • 제38권6호
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    • pp.216-226
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    • 2005
  • Pb-Free Technology was born with environmental problems of electronic component, Being connected by big and small project of every country. Also, in each country environment is connected and various standards of IEC, ISO, MIL, JIS, KS, JEDEC, EIAJ etc. All products can divide at solder part and finishing part These can tested each and synthetically divide. This research is reliability evaluation for three kind of ph-free SnCu solder plating solution and it's deposit. First, executed analysis about Pure Sn, SnCu solutions and plating surface by way similar to other plating solution analysis. Next, executed reliability about test method and equipment for reliable analyzer system construction. Next, data comparison and estimation, main estimation test method and item's choice. In this paper the systematic surface analysis and reliability for plating solutions and it's deposit in metal surface finishing processes could be shown.

Sn-1.7Bi-0.7Cu-0.6In 솔더의 특성 연구 (Characteristics of Sn-1.7Bi-0.7Cu-0.6In Lead-free Solder)

  • 박지호;이희열;전지헌;전주선;정재필
    • Journal of Welding and Joining
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    • 제26권5호
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    • pp.43-48
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    • 2008
  • Characteristics of Sn-1.7%Bi-0.7%Cu-0.6%In (hereafter, SBIC) lead-free solder was investigated in this study. The results from SBIC were compared to other lead-free solders such as Sn-3.5%Ag-0.7%Cu (hereafter, SAC), Sn-0.7%Cu (hereafter, SC), and lead-bearing Sn-37%Pb (hereafter, SP) alloy. Tensile properties of bulk solder, wettability, spreading index, bridge and dross were evaluated. As experimental results, tensile strength and elongation of SBIC was 62.5MPa and 21.5%, respectively. The tensile strength was comparable to that of SP solder. The wetting time of SBIC was 1.2 sec at $250^{\circ}C$, and its wetting properties including wetting force were as good as the SAC alloy. However, wettability of the SC was not so good as the SBIC and SAC. The spreading index of SBIC at $250^{\circ}C$ was 71 %, and it was similar level to those of SAC and SC solders. Bridging was not found for all solders of SBIC, SAC and SC in the range from 240 to $260^{\circ}C$. In dross test at $250^{\circ}C$ for an hour, the amount of dross produced from SBIC was about 57% compared to that from SAC.

전해도금 Cu와 Sn-3.5Ag 솔더 접합부의 Kirkendall void 형성과 충격 신뢰성에 관한 연구 (A Study of Kirkendall Void Formation and Impact Reliability at the Electroplated Cu/Sn-3.5Ag Solder Joint)

  • 김종연;유진
    • 마이크로전자및패키징학회지
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    • 제15권1호
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    • pp.33-37
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    • 2008
  • Kirkendall void는 전해도금 Cu/Sn-Ag 솔더 접합부에서 형성되었으며 Cu 도금욕에 함유되는 첨가제에 의존한다. 첨가제로 사용된 SPS의 함량의 증가와 함께 $150^{\circ}C$에서 열처리 후 많은 양의 Kirkendall void가 $Cu/Cu_3Sn$ 계면에 존재하였다. AES 분석은 void 표면에 S가 편석되어 있음을 보여주었다. $Cu/Cu_3Sn$ 계면을 따라 파괴된 시편에서 Cu, Sn, S peak만 검출되었고 AES 깊이 프로파일에서 S는 급격하게 감소하였다. $Cu/Cu_3Sn$ 계면에서 S 편석은 계면에너지를 낮추고 Kirkendall void 핵생성을 위한 에너지장벽을 감소시킨다. 낙하충격시험은 SPS를 사용하여 도금된 Cu의 경우 Kirkendall void가 형성된 $Cu/Cu_3Sn$ 계면에서 파괴가 진행되고 급격하게 신뢰성이 감소됨을 보였다.

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