• Proceedings of the Optical Society of Korea Conference
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• 2004.02a
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• pp.128-129
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• 2004

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.11a
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• pp.438-439
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• 2007

In this study, we prepared ITO thin film on the polycarbonate(PC) substrate by using Facing Targets sputtering (FTS) system. After the external bending force was applied to as-deposited ITO thin films with fixed face-plate distance (L), we investigated how properties of those change. As a result, the crack density of films was increasing as bending frequency increased. In accordance with crack distribution, we observed that the resistivity value of ITO thin film increased.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.329-329
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• 2013

본 연구에서는 PEDOT:PSS와 crystalline-ITO (c-ITO) 박막 계면에서의 화학적 반응을(박리 및 용해 특성)을 관찰하기위해 spin-coating 및 droplet dropping을 통하여 PEDOT:PSS 용액을 코팅하고 이후 화학적 거동에 따른 전기적, 광학적 및 구조적 특성 변화를 관찰하였다. 강산성을 띄는 PEDOT:PSS (Al 4083) 박막의 코팅 전, 0.4T sodalime glass 위에 열처리를 통하여 성막된 c-ITO 투명전극을 15분 동안 상압 오존 공정을 통하여 계면처리함으로써 다른 변수의 영향을 배제하였으며, 표면 처리 후 spin-coating 및 droplet dropping method를 통하여 PEDOT:PSS를 코팅하여 c-ITO와 PEDOT:PSS 계면사이의 화학적 반응의 영향을 시간 경과에 따라 분석하였다. PEDOT:PSS 코팅 후 솔밴트 제거를 위해 hot plate를 이용하여 $110^{\circ}C$로 열처리되었다. Spin-coating 방법과는 달리 droplet dropping 방법을 통해 형성된 c-ITO 투명전극/PEDOT:PSS 계면에서는 spin coating에서 적용된 동일한 공정변수적용에도 불구하고 PEDOT:PSS의 산성으로 인한 ITO 투명전극 표면에서의 화학적 조성변화가(In, Sn, O의 조성의 변화) 발생됨을 x-ray photoelectron spectroscopy 결과를 통해 확인하였다. 뿐만 아니라 계면 조성반응 변화에 따른 전기적 특성 및 광학적 투과율의 열화가 발생됨을 Hall measurement 측정과 UV/Vis spectrometer 결과를 통하여 도출하였다. 본 결과를 통해 c-ITO/PEDOT:PSS 사이에서 발생되는 내산특성/계면 화학변화가 유기태양전지에서의 산화물 투명전극과 유기물 계면 열화현상에 영향을 받을 수 있음을 나타낸다.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.16 no.12
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• pp.1115-1120
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• 2003

In this paper, we investigated the position dependent stress distribution of indium-tin-oxide (ITO) film on Polycarbonate (PC) substrate by external bending force. It was found that there are the maximum crack density at the center position and decreasing crack density as goes to the edge, In accordance with crack distribution, it was observed that the change of electrical resistivity of ITO islands is maximum at the center and decrease as goes to the edge. From the result that crack density is increasing at same island position as face plate distance (L) decreases, it is evident that the more stress is imposed on same island position as L decreases.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.16 no.10
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• pp.902-907
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• 2003

In this paper, the ITO thin film, which is considered as one of the most currently used material for the high performance transparent conducting films for the PDP cell, was made in a parallel-plate, capacitively coupled DC magnetron sputtering system. Some electrical and optical properties of ITO films were investigated and discussed on the basis of glow discharge characteristics. The optimized thin film fabricating conditions of Ar gas pressure and substrate temperature were derived from the Paschen curve and glow discharge characteristics. The maximum transmittance of 89.61 % in the visible region and optical band gap of 3.89 eV and resistivity of 1.67${\times}$10$\^$-3/ $\Omega$-cm were obtained under the conditions of 300 C of substrate temperature and 10∼15 mtorr of pressure, which corresponds nearly to that of Paschen minimum.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.21 no.7
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• pp.669-673
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• 2008

ITO thin film was deposited on PC substrate in Facing Targets Sputtering (FTS) system with various sputtering conditions. After it is applied to external bending force, we investigated how change the surface and electrical property of as-deposited ITO thin film. As the L(face-plate distance) of substrate decreases, it found that the maximum crack density is increasing at the center position and decreasing crack density as goes to the edge. So to apply same curvature (r) and bending force to PC substrate with ITO thin film, we fixed the L that is equal to curvature radius (2r). Before bending test, ITO thin films that deposited in the input current of 0.4 A and thickness of 200 nm already had biaxial tensile failure because of each different CTE (Coefficient of Thermal Expansion) and Others had been shown no bending or crack. After bending test, all samples had been shown cracks at about 200 times and as increasing the crack density, resistivity increased.

• Solar Energy
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• v.7 no.2
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• pp.7-13
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• 1987

Indium-Tin-Oxide (ITO)/Selenium heterojunction solar cells which fabricated by vacuum deposition technique and annealing process has been investigated. Prior to the Selenium deposition, a thin tellurium layer (about $10{\AA}$) was deposited onto the ITO layers to provide a sufficient mechanical bond between the Oxide and Selenium layers. The amorphous Selenium layer was deposited onto the Te-ITO layers, and then the crystallization of the amorphous Selenium was carried out using a hot plate at about $180^{\circ}C$ for 4 min. Efficient Selenium solar cells with conversion efficiency as high as 4.52% under AM1 condition has been fabricated in polycrystalline Selenium layer ($6{\mu}m$). The optimum data in manufacturing Se solar cell was listed in table.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.07a
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• pp.181-184
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• 2003

In this paper, we investigated the position-dependent stress distribution of indium-tin-oxide (ITO) film on Polycarbonate (PC) substrate by external bending force. It was found that there are the maximum crack density at the center position and decreasing crack density as goes to the edge. In accordance with crack distribution, it was observed that the change of electrical resistivity of ITO islands is maximum at the center and decrease as goes to the edge. From the result that crack density is increasing at same island position as face-plate distance (L) decreases, it is evident that the more stress is imposed on same island position as L decreases.

• Journal of Sensor Science and Technology
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• v.10 no.1
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• pp.80-85
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• 2001

$Hg_{1-x}Cd_xTe$(MCT) thin films were grown onto ITO glass and titanium plate by stationary cathodic electrodeposition in aqueous solution contained $CdSO_4$, $TeO_2$, and $HgCl_2$. During deposition two main fabrication parameters were taken into account deposition potential and growth temperature. MCT films deposited by varying two parameters were studied by X-ray diffraction, electron probe micro analyser(EPMA) and scanning electron microscope measurements. It was shown by XRD and EPMA measurements that the structure of MCT films was zinc blonde and the composition of MCT films can be controlled with the deposition potential.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1990.10a
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• pp.39-44
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• 1990

Polycrystalline CdS films were grown on glass substrate with conducting indium tin oxide(ITO) by electrodeposition. The average size of the plate-shape grains o the CdS films was from 0.3um to 0.05um, and the adhesion to ITO was excellent. The optical band gap of the electrodeposited CdS films was in the range from 2.51eV to 2.68 eV. The optical transmittance was 80% and the electrical resistivity varied from 10$^3$ to 10$\^$5/$\Omega$-cm depending on the deposition condition.