• 전기학회논문지
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• 제61권3호
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• pp.407-412
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• 2012

This study investigated the process of thermal-induced growth of micro-crack developed at the crystalline solar cell using EL image, determined the output characteristic according to the pattern of micro-crack, analyzed the I-V characteristic according to the pattern of crack growth, and predicted the output value using simulation. The purpose of this study was, therefore, to investigate the process of thermal-induced growth of micro-crack developed at the early stage of PV module completion using EL image, to analyze the resulting decrement of output and predict the output value using simulation. It was observed that the crack grew increasingly by the thermal condition, and accordingly the lowering of output was accelerated. The output values of crack patterns with various direction were predicted using simulation, resulting in close I-V curve with only around 4% of error rate. It is considered that it is possible to predict the electric characteristic of solar cell module using only pattern of micro-crack occurred at solar cell based on our results.

• 대한전자공학회논문지
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• 제20권1호
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• pp.45-49
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• 1983

Metal/insulator/n epi-layer/p+구조의 CID(controlled inversion device)를 제조하였다. I-V 특성 곡선에서 ON상태와 OFF상태사이에 부성저항(negative resistance)영역이 나타났다. CID를 제조하기 위해서 행한 산화층 형성 과정에서 600℃에서 5분간 산화시킨 소자의 스위칭 및 홀딩 전압은 각각 5.0V와 2.5V였다. 그리고 입사된 광에 의해서 스위칭 전압은 감소하였으나 홀딩 전압은 변하지 않았다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2009년도 하계학술대회 논문집
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• pp.132-132
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• 2009

A 2D-simulation using a quantum model of silicon nanowire (SiNW) field-effect transistors (FETs) have been performed by the effective mass theory. We have investigated very close for real device analysis, so we used to the non-equilibrium Green's function (NEGF) and the density gradient of quantum model. We investigated I-V characteristics curve and C-V characteristics curve of the channel thickness from 5nm to 200nm. As a result of simulation, even higher drain current in SiNW using a quantum model was observed than in SiNW using a non-quantum model. The reason of higher drain current can be explained by the quantum confinement effect.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 추계학술대회 논문집 Vol.16
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• pp.108-111
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• 2003

Currently, molecular devices are reported utilizing active self-assembled monolayers containing the nitro group as the active component, which has active redox centers[1]. We confirm the electrical properties of 4,4-di(ethynylphenyl)-2'-nitro-1-benzenethiolate. To deposit the SAM layer onto gold electrode, we transfer the prefabricated Au(111) substrates into a 1mM self-assembly molecules in THF solution. Au(111) substrates were prepared by ion beam sputtering method of gold onto the silicon wafer. As a result, we measured current-voltage curve using ultra high vacuum scanning tunneling microscopy (UHV STM), I-V curve also clearly shows several current peaks between the negative bias region (-0.3958V) and the positive bias region (0.4658V), respectively.

• 반도체디스플레이기술학회지
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• 제21권3호
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• pp.135-139
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• 2022

The current-voltage modeling plays an important role in characterizing photovoltaic systems. A solar cell has a nonlinear characteristic with various parameters influenced by the external environments such as the irradiance and the temperature. In order to accurately predict current-voltage characteristics at low irradiance, the artificial neural networks are applied to effectively quantify nonlinear behaviors. In this paper, a multi-layer perceptron scheme that can make accurate predictions is employed to learn complex formulas for large amounts of continuous data. The simulated results of artificial neural networks model show the accuracy improvement by using MATLAB/Simulink.

• 한국태양에너지학회 논문집
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• 제34권1호
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• pp.91-97
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• 2014

This paper proposes a modeling of fuel cell which replaces dc source during simulation. Fuel cells are electrochemical devices that convert chemical energy in fuels into electrical energy. This system has high efficiency and heat, no environmental chemical pollutions and noise. Proton exchange membrane fuel cells (PEMFC) are commonly used as a residential generator. These fuel cells have different electrical characteristics such as a low voltage and high current compared with solar cells. And there are different behaviors in the V-I curve in the temperature and pressure. Therefore, the modeling of fuel cell should consider wide voltage range and slow current response and the resulting electrical model is applied to boost converter with fuel cell as an input source.

• Nuclear Engineering and Technology
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• 제53권7호
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• pp.2323-2333
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• 2021

The paper proposes a technique for reconstructing the true hardening curve of isotropic materials from ring tensile tests. Neutron irradiated 42XNM alloy tensile properties were investigated. The calculation of the true hardening curve for tensile and compression tests of standard cylindrical samples was performed at the first step. After that, the FEM-model was developed and validated using the ring tension and compression tests (with the hardening curve defined in step 1). Finally, the true hardening curve was calculated by selecting the FEM-model parameters and its validation by ring sample tests in different states using an iterative method. For these samples, experimental and calculated gauge length values were obtained, and the corresponding material's constants were estimated.

• 한국정보통신학회:학술대회논문집
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• 한국해양정보통신학회 2000년도 추계종합학술대회
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• pp.490-493
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• 2000

소자의 고집적을 위한 특성분석 기술은 빠른 변화를 보이고 있다. 이에 따라 고집적 소자의 특성을 시뮬레이션을 통하여 이해하고 이에 맞게 제작하는 기술은 매우 중요한 과제 중의 하나가 되었다. 소자가 마이크론급 이하로 작아지면서 그에 맞는 소자개발을 위해 여러 가지 구조가 제시되고 있는데 본 논문에서는 TCAD를 이용하여 여러 가지 구조 중on서 고농도로 도핑된 ground plane 위에 적층하여 만든 EPI MOSFET를 조사하였다. 이 구조의 특성과 임펙트 이온화와 전계 그리고 I-V특성 곡선을 저 농도로 도핑된 Drain(LDD) MOSFET와 비교 분석하였다. 또한 TCAD의 유용성을 조사하여 시뮬레이터로서 적합함을 제시하였다.

• 한국표면공학회:학술대회논문집
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• 한국표면공학회 2003년도 추계학술발표회초록집
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• pp.119-119
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• 2003

Plasma polymerized organic thin films were deposited on Si(100) glass and Copper substrates at 25 ∼ 100 $^{\circ}C$ using cyclohexane and ethylcyclohexane precursors by PECVD method. In order to compare physical and electrochemical properties of the as-grown thin films, the effects of the RF plasma power in the range of 20∼50 W and deposition temperature on both corrosion protection efficiency and physical properties were studied. We found that the corrosion protection efficiency (P$\_$k/), which is one of the important factors for corrosion protection in the interlayer dielectrics of microelectronic devices application, was increased with increasing RF power. The highest P$\_$k/ value of plasma polymerized ethylcyclohexane film (92.1% at 50 W) was higher than that of the plasma polymerized cyclohexane film (85.26% at 50 W), indicating inhibition of oxygen reduction. Impedance analyzer was utilized for the determination of I-V curve for leakage current density and C-V for dielectric constants. To obtain C-V curve, we used a MIM structure of metal(Al)-insulator(plasma polymerized thin film)-metal(Pt) structure. Al as the electrode was evaporated on the ethylcyclohexane films that grew on Pt coated silicon substrates, and the dielectric constants of the as-grown films were then calculated from C-V data measured at 1㎒. From the electrical property measurements such as I-V ana C-V characteristics, the minimum dielectric constant and the best leakage current of ethylcyclohexane thin films were obtained to be about 3.11 and 5 ${\times}$ 10$\^$-12/ A/$\textrm{cm}^2$ and cyclohexane thin films were obtained to be about 2.3 and 8 ${\times}$ 10$\^$-12/ A/$\textrm{cm}^2$.

• 한국재료학회지
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• 제24권7호
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• pp.375-380
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• 2014

Solar cells exhibit different power outputs in different climates. In this study, the temperature dependence of open-circuit voltage(V-oc), short-circuit current(I-sc), fill factor(FF) and the efficiency of screen-printed single-crystal silicon solar cells were studied. One group was fabricated with homogeneously-doped emitters and another group was fabricated with selectively-doped emitters. While varying the temperature (25, 40, 60 and $80^{\circ}C$), the current-voltage characteristics of the cells were measured and the leakage currents extracted from the current-voltage curve. As the temperature increased, both the homogeneously-doped and selectively-doped emitters showed a slight increase in I-sc and a rapid degradation of V-oc. The FF and efficiency also decreased as temperature increased in both groups. The temperature coefficient for each factor was calculated. From the current-voltage curve, we found that the main cause of V-oc degradation was an increase in the intrinsic carrier concentration. The temperature coefficients of the two groups were compared, leading to the idea that structural effects could also affect the temperature dependence of current-voltage characteristics.